JP6872312B2 - 偏光板の製造方法 - Google Patents

偏光板の製造方法 Download PDF

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Publication number
JP6872312B2
JP6872312B2 JP2015193960A JP2015193960A JP6872312B2 JP 6872312 B2 JP6872312 B2 JP 6872312B2 JP 2015193960 A JP2015193960 A JP 2015193960A JP 2015193960 A JP2015193960 A JP 2015193960A JP 6872312 B2 JP6872312 B2 JP 6872312B2
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Prior art keywords
polarizing plate
long
cutting
polarizing
polarized
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English (en)
Japanese (ja)
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JP2017068062A (ja
Inventor
岡野 彰
彰 岡野
前田 実
実 前田
宏太 仲井
宏太 仲井
将寛 八重樫
将寛 八重樫
雄基 大瀬
雄基 大瀬
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Nitto Denko Corp
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Nitto Denko Corp
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Priority to JP2015193960A priority Critical patent/JP6872312B2/ja
Priority to TW105128731A priority patent/TWI743048B/zh
Priority to KR1020160123369A priority patent/KR102379797B1/ko
Priority to CN201610865376.8A priority patent/CN107144908B/zh
Publication of JP2017068062A publication Critical patent/JP2017068062A/ja
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Publication of JP6872312B2 publication Critical patent/JP6872312B2/ja
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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1738Optionally different kinds of measurements; Method being valid for different kinds of measurement
    • G01N2021/1742Optionally different kinds of measurements; Method being valid for different kinds of measurement either absorption or reflection

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Polarising Elements (AREA)
JP2015193960A 2015-09-30 2015-09-30 偏光板の製造方法 Active JP6872312B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015193960A JP6872312B2 (ja) 2015-09-30 2015-09-30 偏光板の製造方法
TW105128731A TWI743048B (zh) 2015-09-30 2016-09-06 偏光板之製造方法及偏光板之製造裝置
KR1020160123369A KR102379797B1 (ko) 2015-09-30 2016-09-26 편광판의 제조 방법
CN201610865376.8A CN107144908B (zh) 2015-09-30 2016-09-29 偏振板的制造方法和偏振板的制造装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015193960A JP6872312B2 (ja) 2015-09-30 2015-09-30 偏光板の製造方法

Publications (2)

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JP2017068062A JP2017068062A (ja) 2017-04-06
JP6872312B2 true JP6872312B2 (ja) 2021-05-19

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JP2015193960A Active JP6872312B2 (ja) 2015-09-30 2015-09-30 偏光板の製造方法

Country Status (4)

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JP (1) JP6872312B2 (ko)
KR (1) KR102379797B1 (ko)
CN (1) CN107144908B (ko)
TW (1) TWI743048B (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6742188B2 (ja) * 2016-08-02 2020-08-19 日東電工株式会社 偏光板の打ち抜き方法、および該方法に用いられる打ち抜き装置
JP2020020973A (ja) * 2018-08-01 2020-02-06 日東電工株式会社 偏光子、偏光板、および、画像表示装置
JP7191578B2 (ja) * 2018-08-01 2022-12-19 日東電工株式会社 偏光子、偏光板、および、画像表示装置
JP2020024240A (ja) * 2018-08-06 2020-02-13 日東電工株式会社 偏光子の製造方法
KR102542729B1 (ko) * 2018-12-18 2023-06-12 주식회사 엘지화학 편광판 면취 장치 및 이를 이용한 편광판의 면취 방법

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US3200373A (en) * 1960-11-22 1965-08-10 Control Data Corp Handwritten character reader
FR2570315B1 (fr) * 1984-09-18 1988-06-10 Loriot Jean Marc Procede de reperage de la position et de la forme de gabarits disposes sur un materiau en plaque ou en feuille
DE4100534C1 (ko) * 1991-01-10 1992-01-23 Duerkopp Systemtechnik Gmbh, 4800 Bielefeld, De
IT243960Y1 (it) * 1998-04-23 2002-03-06 Fotoba Internat S A S Di Pietr Dispositivo automatico di taglio in squadra di carta ed altrisupporti grafici e fotografici
JP2001154186A (ja) * 1999-11-25 2001-06-08 Advanced Display Inc 偏光板の切断方法
DE20009427U1 (de) * 2000-05-26 2000-09-28 Felber Thea Vorrichtung zur Bearbeitung eines Materials oder eines Gegenstandes
US6672187B2 (en) * 2001-04-05 2004-01-06 Mikkelsen Graphic Engineering, Inc. Method and apparatus for rapid precision cutting of graphics areas from sheets
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JP2003019697A (ja) * 2001-07-06 2003-01-21 Eastern Giken Kk 枚葉シート打抜き製造機における送り制御装置
US20040212555A1 (en) 2003-04-23 2004-10-28 Falco Mark A. Portable electronic device with integrated display and camera and method therefore
JP4646951B2 (ja) 2007-06-06 2011-03-09 株式会社半導体エネルギー研究所 センサ付き表示装置
WO2009128115A1 (ja) * 2008-04-15 2009-10-22 日東電工株式会社 光学フィルム積層体ロールならびにその製造方法および装置
KR101380204B1 (ko) * 2008-12-31 2014-04-01 동우 화인켐 주식회사 편광판의 결함 제거방법 및 그 방법이 구현된 시스템
JP5434457B2 (ja) 2009-10-09 2014-03-05 ソニー株式会社 光学ユニットおよび撮像装置
JP5569791B2 (ja) * 2010-04-14 2014-08-13 住友化学株式会社 光学フィルム作製用原反フィルム、および光学フィルムの製造方法
JP5474869B2 (ja) * 2010-09-03 2014-04-16 日東電工株式会社 偏光膜を有する積層体ストリップロールの製造方法
US8467177B2 (en) 2010-10-29 2013-06-18 Apple Inc. Displays with polarizer windows and opaque masking layers for electronic devices
KR101293210B1 (ko) 2010-12-15 2013-08-05 주식회사 엘지화학 디스플레이 기기용 편광판의 구멍 형성 장치 및 방법
JP2012194475A (ja) * 2011-03-17 2012-10-11 Sumitomo Chemical Co Ltd 偏光板、偏光板の製造方法および液晶表示装置
CN102156318B (zh) * 2011-03-25 2013-03-13 明基材料有限公司 提升偏光板的吸收轴精度的制造方法及偏光板
KR101495759B1 (ko) 2011-04-18 2015-02-26 주식회사 엘지화학 디스플레이 장치용 편광판, 이를 이용한 액정 패널 및 디스플레이 장치
TWI616293B (zh) * 2012-04-04 2018-03-01 住友化學股份有限公司 薄膜切斷方法及薄膜切斷系統
JP2014081482A (ja) * 2012-10-16 2014-05-08 Nitto Denko Corp 偏光子および画像表示装置
JP6027850B2 (ja) * 2012-10-26 2016-11-16 日東電工株式会社 偏光板の製造方法
US9075199B2 (en) 2012-10-30 2015-07-07 Apple Inc. Displays with polarizer layers for electronic devices
WO2014125993A1 (ja) * 2013-02-14 2014-08-21 住友化学株式会社 切断装置、切断方法、および光学部材貼合体の製造装置
KR20150086159A (ko) * 2014-01-17 2015-07-27 주식회사 엘지화학 국지적으로 편광 해소 영역을 갖는 편광자 제조 방법, 이를 이용하여 제조된 편광자 및 편광판
CN105247395B (zh) * 2014-03-26 2018-09-14 Lg化学株式会社 制造含有局部漂白区域的偏光元件的方法、制造偏光元件辊的方法以及制造单片式偏光元件的方法
JP6146921B2 (ja) * 2014-12-02 2017-06-14 日東電工株式会社 光学フィルムの製造方法および製造装置

Also Published As

Publication number Publication date
KR102379797B1 (ko) 2022-03-28
CN107144908A (zh) 2017-09-08
KR20170038689A (ko) 2017-04-07
JP2017068062A (ja) 2017-04-06
CN107144908B (zh) 2021-09-28
TWI743048B (zh) 2021-10-21
TW201721197A (zh) 2017-06-16

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