JP6842443B2 - プラズマ処理装置及びプラズマを生成する方法 - Google Patents

プラズマ処理装置及びプラズマを生成する方法 Download PDF

Info

Publication number
JP6842443B2
JP6842443B2 JP2018119084A JP2018119084A JP6842443B2 JP 6842443 B2 JP6842443 B2 JP 6842443B2 JP 2018119084 A JP2018119084 A JP 2018119084A JP 2018119084 A JP2018119084 A JP 2018119084A JP 6842443 B2 JP6842443 B2 JP 6842443B2
Authority
JP
Japan
Prior art keywords
frequency power
signal
pulsed
high frequency
period
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2018119084A
Other languages
English (en)
Japanese (ja)
Other versions
JP2019220435A (ja
JP2019220435A5 (enExample
Inventor
紳治 久保田
紳治 久保田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2018119084A priority Critical patent/JP6842443B2/ja
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to PCT/JP2019/022954 priority patent/WO2019244698A1/ja
Priority to CN201980004388.3A priority patent/CN111052874B/zh
Priority to KR1020207006605A priority patent/KR102723098B1/ko
Priority to US16/645,188 priority patent/US10978274B2/en
Priority to TW108120965A priority patent/TWI812738B/zh
Publication of JP2019220435A publication Critical patent/JP2019220435A/ja
Publication of JP2019220435A5 publication Critical patent/JP2019220435A5/ja
Application granted granted Critical
Publication of JP6842443B2 publication Critical patent/JP6842443B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • H01J37/32183Matching circuits
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32137Radio frequency generated discharge controlling of the discharge by modulation of energy
    • H01J37/32146Amplitude modulation, includes pulsing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32715Workpiece holder
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065Plasma etching; Reactive-ion etching
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/46Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/002Cooling arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32Processing objects by plasma generation
    • H01J2237/33Processing objects by plasma generation characterised by the type of processing
    • H01J2237/334Etching
    • H01J2237/3341Reactive etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32623Mechanical discharge control means
    • H01J37/32642Focus rings

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Metallurgy (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Plasma Technology (AREA)
  • Chemical Vapour Deposition (AREA)
  • Drying Of Semiconductors (AREA)
  • Treatment Of Fiber Materials (AREA)
JP2018119084A 2018-06-22 2018-06-22 プラズマ処理装置及びプラズマを生成する方法 Active JP6842443B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2018119084A JP6842443B2 (ja) 2018-06-22 2018-06-22 プラズマ処理装置及びプラズマを生成する方法
CN201980004388.3A CN111052874B (zh) 2018-06-22 2019-06-10 等离子体处理装置和生成等离子体的方法
KR1020207006605A KR102723098B1 (ko) 2018-06-22 2019-06-10 플라즈마 처리 장치 및 플라즈마를 생성하는 방법
US16/645,188 US10978274B2 (en) 2018-06-22 2019-06-10 Plasma processing apparatus and method for generating plasma
PCT/JP2019/022954 WO2019244698A1 (ja) 2018-06-22 2019-06-10 プラズマ処理装置及びプラズマを生成する方法
TW108120965A TWI812738B (zh) 2018-06-22 2019-06-18 電漿處理裝置及電漿產生方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018119084A JP6842443B2 (ja) 2018-06-22 2018-06-22 プラズマ処理装置及びプラズマを生成する方法

Publications (3)

Publication Number Publication Date
JP2019220435A JP2019220435A (ja) 2019-12-26
JP2019220435A5 JP2019220435A5 (enExample) 2021-02-04
JP6842443B2 true JP6842443B2 (ja) 2021-03-17

Family

ID=68983385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018119084A Active JP6842443B2 (ja) 2018-06-22 2018-06-22 プラズマ処理装置及びプラズマを生成する方法

Country Status (6)

Country Link
US (1) US10978274B2 (enExample)
JP (1) JP6842443B2 (enExample)
KR (1) KR102723098B1 (enExample)
CN (1) CN111052874B (enExample)
TW (1) TWI812738B (enExample)
WO (1) WO2019244698A1 (enExample)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10510575B2 (en) 2017-09-20 2019-12-17 Applied Materials, Inc. Substrate support with multiple embedded electrodes
US11476145B2 (en) 2018-11-20 2022-10-18 Applied Materials, Inc. Automatic ESC bias compensation when using pulsed DC bias
JP7451540B2 (ja) 2019-01-22 2024-03-18 アプライド マテリアルズ インコーポレイテッド パルス状電圧波形を制御するためのフィードバックループ
US11508554B2 (en) 2019-01-24 2022-11-22 Applied Materials, Inc. High voltage filter assembly
KR102593142B1 (ko) * 2020-05-19 2023-10-25 세메스 주식회사 기판 처리 장치 및 그의 페라이트 코어 온도 제어 방법
US11462389B2 (en) 2020-07-31 2022-10-04 Applied Materials, Inc. Pulsed-voltage hardware assembly for use in a plasma processing system
KR20230073145A (ko) 2020-09-29 2023-05-25 램 리써치 코포레이션 Rf 생성기들의 동기화
US11901157B2 (en) 2020-11-16 2024-02-13 Applied Materials, Inc. Apparatus and methods for controlling ion energy distribution
US11798790B2 (en) 2020-11-16 2023-10-24 Applied Materials, Inc. Apparatus and methods for controlling ion energy distribution
US11495470B1 (en) 2021-04-16 2022-11-08 Applied Materials, Inc. Method of enhancing etching selectivity using a pulsed plasma
US11948780B2 (en) 2021-05-12 2024-04-02 Applied Materials, Inc. Automatic electrostatic chuck bias compensation during plasma processing
US11791138B2 (en) 2021-05-12 2023-10-17 Applied Materials, Inc. Automatic electrostatic chuck bias compensation during plasma processing
US11967483B2 (en) 2021-06-02 2024-04-23 Applied Materials, Inc. Plasma excitation with ion energy control
US20220399185A1 (en) 2021-06-09 2022-12-15 Applied Materials, Inc. Plasma chamber and chamber component cleaning methods
US12148595B2 (en) 2021-06-09 2024-11-19 Applied Materials, Inc. Plasma uniformity control in pulsed DC plasma chamber
US11810760B2 (en) 2021-06-16 2023-11-07 Applied Materials, Inc. Apparatus and method of ion current compensation
US11569066B2 (en) 2021-06-23 2023-01-31 Applied Materials, Inc. Pulsed voltage source for plasma processing applications
US11776788B2 (en) 2021-06-28 2023-10-03 Applied Materials, Inc. Pulsed voltage boost for substrate processing
US11476090B1 (en) 2021-08-24 2022-10-18 Applied Materials, Inc. Voltage pulse time-domain multiplexing
US12106938B2 (en) 2021-09-14 2024-10-01 Applied Materials, Inc. Distortion current mitigation in a radio frequency plasma processing chamber
US11694876B2 (en) * 2021-12-08 2023-07-04 Applied Materials, Inc. Apparatus and method for delivering a plurality of waveform signals during plasma processing
US11990319B2 (en) * 2022-01-05 2024-05-21 Applied Materials, Inc. Methods and apparatus for processing a substrate
US11972924B2 (en) 2022-06-08 2024-04-30 Applied Materials, Inc. Pulsed voltage source for plasma processing applications
US12315732B2 (en) 2022-06-10 2025-05-27 Applied Materials, Inc. Method and apparatus for etching a semiconductor substrate in a plasma etch chamber
US12272524B2 (en) 2022-09-19 2025-04-08 Applied Materials, Inc. Wideband variable impedance load for high volume manufacturing qualification and on-site diagnostics
US12111341B2 (en) 2022-10-05 2024-10-08 Applied Materials, Inc. In-situ electric field detection method and apparatus
JP2024062195A (ja) * 2022-10-24 2024-05-09 東京エレクトロン株式会社 周波数可変電源及びプラズマ処理装置

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100525961B1 (ko) 1996-11-04 2005-12-21 어플라이드 머티어리얼스, 인코포레이티드 플라즈마시스에서발생하는고주파를필터링하는플라즈마처리장치및방법
JP3629705B2 (ja) 1997-06-06 2005-03-16 東京エレクトロン株式会社 プラズマ処理装置
JP4120051B2 (ja) * 1998-07-31 2008-07-16 株式会社日立国際電気 高周波共振装置
JP3027572B1 (ja) * 1998-12-24 2000-04-04 日本高周波株式会社 プラズマ処理用インピーダンス測定装置
KR100807724B1 (ko) * 2003-08-07 2008-02-28 가부시키가이샤 히다치 고쿠사이 덴키 기판처리장치 및 기판처리방법
JP3998630B2 (ja) * 2003-11-19 2007-10-31 株式会社東芝 電力増幅器
JP4879548B2 (ja) * 2005-09-30 2012-02-22 株式会社ダイヘン 高周波電源装置
JP2007134849A (ja) * 2005-11-09 2007-05-31 Nagano Japan Radio Co 増幅装置
JP5210659B2 (ja) * 2008-02-28 2013-06-12 株式会社日立ハイテクノロジーズ プラズマ処理装置
JP5319150B2 (ja) * 2008-03-31 2013-10-16 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法及びコンピュータ読み取り可能な記憶媒体
JP4891384B2 (ja) * 2009-12-10 2012-03-07 株式会社新川 プラズマ発生装置
JP5484375B2 (ja) * 2011-02-17 2014-05-07 三菱電機株式会社 プラズマ成膜装置及びプラズマ成膜方法
JP2012174668A (ja) * 2011-02-24 2012-09-10 Mitsubishi Electric Corp 高周波電力供給装置、プラズマ処理装置、及び半導体薄膜の製造方法
JP5867701B2 (ja) * 2011-12-15 2016-02-24 東京エレクトロン株式会社 プラズマ処理装置
JP5808012B2 (ja) * 2011-12-27 2015-11-10 東京エレクトロン株式会社 プラズマ処理装置
US9462672B2 (en) * 2012-02-22 2016-10-04 Lam Research Corporation Adjustment of power and frequency based on three or more states
US9171700B2 (en) * 2012-06-15 2015-10-27 COMET Technologies USA, Inc. Plasma pulse tracking system and method
JP6202644B2 (ja) * 2013-08-26 2017-09-27 株式会社日立国際電気 プラズマ生成用電源装置
JP6512962B2 (ja) * 2014-09-17 2019-05-15 東京エレクトロン株式会社 プラズマ処理装置
KR101677748B1 (ko) * 2014-10-29 2016-11-29 삼성전자 주식회사 펄스 플라즈마 장치 및 펄스 플라즈마 장치 구동 방법
CN105826154B (zh) 2015-01-06 2017-12-19 北京北方华创微电子装备有限公司 针对脉冲射频电源的阻抗匹配方法及装置
JP6396822B2 (ja) * 2015-02-16 2018-09-26 東京エレクトロン株式会社 プラズマ処理装置のサセプタの電位を制御する方法
US9741539B2 (en) * 2015-10-05 2017-08-22 Applied Materials, Inc. RF power delivery regulation for processing substrates
JP6541623B2 (ja) 2016-06-20 2019-07-10 東京エレクトロン株式会社 プラズマ処理装置、及び波形補正方法
KR102260998B1 (ko) * 2016-08-25 2021-06-04 한국전기연구원 펄스 전원 보상 장치 및 이를 포함하는 고전압 펄스 전원 시스템
WO2018061617A1 (ja) * 2016-09-28 2018-04-05 株式会社日立国際電気 高周波電源装置
US10546724B2 (en) * 2017-05-10 2020-01-28 Mks Instruments, Inc. Pulsed, bidirectional radio frequency source/load

Also Published As

Publication number Publication date
US10978274B2 (en) 2021-04-13
CN111052874A (zh) 2020-04-21
TW202002727A (zh) 2020-01-01
US20200286714A1 (en) 2020-09-10
KR102723098B1 (ko) 2024-10-28
TWI812738B (zh) 2023-08-21
JP2019220435A (ja) 2019-12-26
CN111052874B (zh) 2023-02-28
KR20210021441A (ko) 2021-02-26
WO2019244698A1 (ja) 2019-12-26

Similar Documents

Publication Publication Date Title
JP6842443B2 (ja) プラズマ処理装置及びプラズマを生成する方法
CN113451101B (zh) 等离子体处理方法和等离子体处理装置
JP7374362B2 (ja) プラズマ処理方法及びプラズマ処理装置
JPWO2020145051A1 (ja) プラズマ処理装置及びプラズマ処理方法
JP7395645B2 (ja) プラズマ処理装置
CN111524781B (zh) 高频电源及等离子体处理装置
JP2020205361A (ja) プラズマ処理方法及びプラズマ処理装置
JP6180890B2 (ja) プラズマ処理方法
TWI828773B (zh) 電漿處理方法及電漿處理裝置
KR20210032904A (ko) 실리콘 산화막을 에칭하는 방법 및 플라즈마 처리 장치
JP2021015930A (ja) プラズマ処理方法及びプラズマ処理装置
JP2022018484A (ja) プラズマ処理装置及びプラズマ処理方法
JP6960421B2 (ja) プラズマ処理装置及びプラズマ処理方法
CN121148980A (zh) 等离子体处理方法及等离子体处理装置
JP2016111033A (ja) アッシング処理を行う方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20201217

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20201217

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20201217

TRDD Decision of grant or rejection written
A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20210113

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20210126

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20210219

R150 Certificate of patent or registration of utility model

Ref document number: 6842443

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250