JP6786027B1 - 生体成分測定装置 - Google Patents

生体成分測定装置 Download PDF

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Publication number
JP6786027B1
JP6786027B1 JP2020543133A JP2020543133A JP6786027B1 JP 6786027 B1 JP6786027 B1 JP 6786027B1 JP 2020543133 A JP2020543133 A JP 2020543133A JP 2020543133 A JP2020543133 A JP 2020543133A JP 6786027 B1 JP6786027 B1 JP 6786027B1
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conductive film
high thermal
thermal conductive
biological component
probe light
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JPWO2021176583A1 (https=
Inventor
祐樹 津田
祐樹 津田
浩一 秋山
浩一 秋山
周作 林
周作 林
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133—Refractometers, e.g. differential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1725—Modulation of properties by light, e.g. photoreflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1731—Temperature modulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133—Refractometers, e.g. differential
    • G01N2021/4153—Measuring the deflection of light in refractometers

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2020543133A 2020-03-04 2020-03-04 生体成分測定装置 Active JP6786027B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/009073 WO2021176583A1 (ja) 2020-03-04 2020-03-04 生体成分測定装置

Publications (2)

Publication Number Publication Date
JP6786027B1 true JP6786027B1 (ja) 2020-11-18
JPWO2021176583A1 JPWO2021176583A1 (https=) 2021-09-10

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JP2020543133A Active JP6786027B1 (ja) 2020-03-04 2020-03-04 生体成分測定装置

Country Status (5)

Country Link
US (1) US12222288B2 (https=)
JP (1) JP6786027B1 (https=)
CN (1) CN115190968B (https=)
DE (1) DE112020006830T5 (https=)
WO (1) WO2021176583A1 (https=)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6966028B1 (ja) * 2021-03-03 2021-11-10 三菱電機株式会社 成分測定装置および成分測定方法
JP7205002B1 (ja) * 2022-02-17 2023-01-16 三菱電機株式会社 非侵襲物質分析装置
JPWO2023157163A1 (https=) * 2022-02-17 2023-08-24
CN117043580A (zh) * 2021-03-23 2023-11-10 三菱电机株式会社 生物体成分测定装置以及生物体成分测定方法
JP7736944B1 (ja) * 2024-04-16 2025-09-09 三菱電機株式会社 生体成分測定装置
US12596068B2 (en) 2023-02-08 2026-04-07 Kabushiki Kaisha Toshiba Sensing systems and reflective optical element

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025017856A1 (ja) * 2023-07-19 2025-01-23 三菱電機株式会社 分析装置
JP7638461B1 (ja) * 2024-08-21 2025-03-03 三菱電機株式会社 非侵襲物質分析装置及び非侵襲物質分析方法

Citations (9)

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JPS61137047A (ja) * 1984-12-10 1986-06-24 Canon Inc 光散乱計測装置
JPS6239731A (ja) * 1985-08-16 1987-02-20 Canon Inc 薄膜の光物性測定装置
JPH06308095A (ja) * 1993-04-21 1994-11-04 Hitachi Ltd 光熱変位信号検出方法とその装置
JP2009158926A (ja) * 2007-12-07 2009-07-16 Canon Inc 電磁波発生素子、電磁波集積素子、及び電磁波検出装置
US20100157316A1 (en) * 2006-11-21 2010-06-24 Maris Humphrey J Picosecond ultrasonic system incorporating an optical cavity
JP2017519214A (ja) * 2014-06-16 2017-07-13 ディアモンテク、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツングＤｉａｍｏｎｔｅｃｈ Ｇｍｂｈ 非侵襲物質分析
WO2018123169A1 (ja) * 2016-12-26 2018-07-05 三菱電機株式会社 生体物質測定装置および生体物質測定方法
JP2019507319A (ja) * 2015-12-09 2019-03-14 ディアモンテク、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツングＤｉａｍｏｎｔｅｃｈ Ｇｍｂｈ 物質を分析するための装置及び方法
WO2019150543A1 (ja) * 2018-02-02 2019-08-08 三菱電機株式会社 生体物質測定装置

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US4682897A (en) * 1984-12-10 1987-07-28 Canon Kabushiki Kaisha Light scattering measuring apparatus
JPH06273328A (ja) * 1993-03-22 1994-09-30 Kyoto Electron Mfg Co Ltd 屈折率測定方法及びその装置
JP3844688B2 (ja) * 2000-12-25 2006-11-15 富士写真フイルム株式会社 全反射減衰を利用したセンサー
JP2002277376A (ja) * 2001-03-16 2002-09-25 Toshiba Corp 近接場光プローブおよび近接場光記録再生装置
JP2004286578A (ja) * 2003-03-20 2004-10-14 Asahi Kasei Corp 反射型熱レンズ分光分析装置
JP4701739B2 (ja) * 2005-02-17 2011-06-15 パナソニック株式会社 蛍光測定装置
JP5553717B2 (ja) * 2010-09-17 2014-07-16 富士フイルム株式会社 光電場増強デバイスを用いた光の測定方法および測定装置
DE102014113134A1 (de) * 2014-09-11 2015-07-23 Rofin-Baasel Lasertech Gmbh & Co. Kg Optische Einrichtung
EP3248544B1 (en) * 2015-01-21 2021-12-08 National Institutes for Quantum Science and Technology Device for measuring concentration of substance in blood, and method for measuring concentration of substance in blood
WO2019110084A1 (de) * 2017-12-04 2019-06-13 Diamontech Gmbh Vorrichtung und verfahren zum analysieren eines stoffs

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61137047A (ja) * 1984-12-10 1986-06-24 Canon Inc 光散乱計測装置
JPS6239731A (ja) * 1985-08-16 1987-02-20 Canon Inc 薄膜の光物性測定装置
JPH06308095A (ja) * 1993-04-21 1994-11-04 Hitachi Ltd 光熱変位信号検出方法とその装置
US20100157316A1 (en) * 2006-11-21 2010-06-24 Maris Humphrey J Picosecond ultrasonic system incorporating an optical cavity
JP2009158926A (ja) * 2007-12-07 2009-07-16 Canon Inc 電磁波発生素子、電磁波集積素子、及び電磁波検出装置
JP2017519214A (ja) * 2014-06-16 2017-07-13 ディアモンテク、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツングＤｉａｍｏｎｔｅｃｈ Ｇｍｂｈ 非侵襲物質分析
JP2019507319A (ja) * 2015-12-09 2019-03-14 ディアモンテク、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツングＤｉａｍｏｎｔｅｃｈ Ｇｍｂｈ 物質を分析するための装置及び方法
WO2018123169A1 (ja) * 2016-12-26 2018-07-05 三菱電機株式会社 生体物質測定装置および生体物質測定方法
WO2019150543A1 (ja) * 2018-02-02 2019-08-08 三菱電機株式会社 生体物質測定装置

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116917713A (zh) * 2021-03-03 2023-10-20 三菱电机株式会社 成分测定装置及成分测定方法
WO2022185454A1 (ja) * 2021-03-03 2022-09-09 三菱電機株式会社 成分測定装置および成分測定方法
US12144617B2 (en) 2021-03-03 2024-11-19 Mitsubishi Electric Corporation Component measurement device and component measurement method
JP6966028B1 (ja) * 2021-03-03 2021-11-10 三菱電機株式会社 成分測定装置および成分測定方法
CN117043580A (zh) * 2021-03-23 2023-11-10 三菱电机株式会社 生物体成分测定装置以及生物体成分测定方法
JPWO2023157163A1 (https=) * 2022-02-17 2023-08-24
WO2023157163A1 (ja) * 2022-02-17 2023-08-24 三菱電機株式会社 非侵襲物質分析装置
JP7476317B2 (ja) 2022-02-17 2024-04-30 三菱電機株式会社 非侵襲物質分析装置
JP7205002B1 (ja) * 2022-02-17 2023-01-16 三菱電機株式会社 非侵襲物質分析装置
US12292400B2 (en) 2022-02-17 2025-05-06 Mitsubishi Electric Corporation Non-invasive substance analysis apparatus
US12596068B2 (en) 2023-02-08 2026-04-07 Kabushiki Kaisha Toshiba Sensing systems and reflective optical element
JP7736944B1 (ja) * 2024-04-16 2025-09-09 三菱電機株式会社 生体成分測定装置
WO2025220129A1 (ja) * 2024-04-16 2025-10-23 三菱電機株式会社 生体成分測定装置

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Publication number Publication date
JPWO2021176583A1 (https=) 2021-09-10
WO2021176583A1 (ja) 2021-09-10
CN115190968B (zh) 2026-03-17
US20230053065A1 (en) 2023-02-16
US12222288B2 (en) 2025-02-11
CN115190968A (zh) 2022-10-14
DE112020006830T5 (de) 2022-12-15

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