CN115190968B - 生物体成分测定装置 - Google Patents

生物体成分测定装置

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Publication number
CN115190968B
CN115190968B CN202080097731.6A CN202080097731A CN115190968B CN 115190968 B CN115190968 B CN 115190968B CN 202080097731 A CN202080097731 A CN 202080097731A CN 115190968 B CN115190968 B CN 115190968B
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CN
China
Prior art keywords
high thermal
sample
optical medium
light
thermal conductivity
Prior art date
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Active
Application number
CN202080097731.6A
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English (en)
Chinese (zh)
Other versions
CN115190968A (zh
Inventor
津田祐树
秋山浩一
林周作
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
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Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of CN115190968A publication Critical patent/CN115190968A/zh
Application granted granted Critical
Publication of CN115190968B publication Critical patent/CN115190968B/zh
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/171Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133Refractometers, e.g. differential
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1725Modulation of properties by light, e.g. photoreflectance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1731Temperature modulation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133Refractometers, e.g. differential
    • G01N2021/4153Measuring the deflection of light in refractometers

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CN202080097731.6A 2020-03-04 2020-03-04 生物体成分测定装置 Active CN115190968B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/009073 WO2021176583A1 (ja) 2020-03-04 2020-03-04 生体成分測定装置

Publications (2)

Publication Number Publication Date
CN115190968A CN115190968A (zh) 2022-10-14
CN115190968B true CN115190968B (zh) 2026-03-17

Family

ID=73219999

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080097731.6A Active CN115190968B (zh) 2020-03-04 2020-03-04 生物体成分测定装置

Country Status (5)

Country Link
US (1) US12222288B2 (https=)
JP (1) JP6786027B1 (https=)
CN (1) CN115190968B (https=)
DE (1) DE112020006830T5 (https=)
WO (1) WO2021176583A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022185454A1 (ja) * 2021-03-03 2022-09-09 三菱電機株式会社 成分測定装置および成分測定方法
JP6956930B1 (ja) * 2021-03-23 2021-11-02 三菱電機株式会社 生体成分測定装置および生体成分測定方法
US12292400B2 (en) 2022-02-17 2025-05-06 Mitsubishi Electric Corporation Non-invasive substance analysis apparatus
CN118679373A (zh) * 2022-02-17 2024-09-20 三菱电机株式会社 非侵入式物质分析装置
JP2024112539A (ja) 2023-02-08 2024-08-21 株式会社東芝 センシングシステム、及び反射光学素子
WO2025017856A1 (ja) * 2023-07-19 2025-01-23 三菱電機株式会社 分析装置
JP7736944B1 (ja) * 2024-04-16 2025-09-09 三菱電機株式会社 生体成分測定装置
JP7638461B1 (ja) * 2024-08-21 2025-03-03 三菱電機株式会社 非侵襲物質分析装置及び非侵襲物質分析方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106535760A (zh) * 2014-06-16 2017-03-22 迪亚蒙泰克有限公司 非侵入性物质分析
WO2019110084A1 (de) * 2017-12-04 2019-06-13 Diamontech Gmbh Vorrichtung und verfahren zum analysieren eines stoffs

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US4682897A (en) * 1984-12-10 1987-07-28 Canon Kabushiki Kaisha Light scattering measuring apparatus
JPS61137047A (ja) * 1984-12-10 1986-06-24 Canon Inc 光散乱計測装置
JPS6239731A (ja) * 1985-08-16 1987-02-20 Canon Inc 薄膜の光物性測定装置
JPH06273328A (ja) * 1993-03-22 1994-09-30 Kyoto Electron Mfg Co Ltd 屈折率測定方法及びその装置
JP3254465B2 (ja) * 1993-04-21 2002-02-04 株式会社日立製作所 光熱変位信号検出方法とその装置
JP3844688B2 (ja) * 2000-12-25 2006-11-15 富士写真フイルム株式会社 全反射減衰を利用したセンサー
JP2002277376A (ja) * 2001-03-16 2002-09-25 Toshiba Corp 近接場光プローブおよび近接場光記録再生装置
JP2004286578A (ja) * 2003-03-20 2004-10-14 Asahi Kasei Corp 反射型熱レンズ分光分析装置
JP4701739B2 (ja) * 2005-02-17 2011-06-15 パナソニック株式会社 蛍光測定装置
KR101395908B1 (ko) * 2006-11-21 2014-05-15 브라운 유니버시티 광학 공동을 통합한 피코초 초음파 시스템
JP4975000B2 (ja) * 2007-12-07 2012-07-11 キヤノン株式会社 電磁波発生素子、電磁波集積素子、及び電磁波検出装置
JP5553717B2 (ja) * 2010-09-17 2014-07-16 富士フイルム株式会社 光電場増強デバイスを用いた光の測定方法および測定装置
DE102014113134A1 (de) * 2014-09-11 2015-07-23 Rofin-Baasel Lasertech Gmbh & Co. Kg Optische Einrichtung
EP3248544B1 (en) * 2015-01-21 2021-12-08 National Institutes for Quantum Science and Technology Device for measuring concentration of substance in blood, and method for measuring concentration of substance in blood
US11280728B2 (en) * 2015-12-09 2022-03-22 Diamontech Ag Device and method for analyzing a material
WO2018123169A1 (ja) * 2016-12-26 2018-07-05 三菱電機株式会社 生体物質測定装置および生体物質測定方法
CN111670356A (zh) * 2018-02-02 2020-09-15 三菱电机株式会社 生物体物质测定装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106535760A (zh) * 2014-06-16 2017-03-22 迪亚蒙泰克有限公司 非侵入性物质分析
WO2019110084A1 (de) * 2017-12-04 2019-06-13 Diamontech Gmbh Vorrichtung und verfahren zum analysieren eines stoffs

Also Published As

Publication number Publication date
JPWO2021176583A1 (https=) 2021-09-10
WO2021176583A1 (ja) 2021-09-10
US20230053065A1 (en) 2023-02-16
US12222288B2 (en) 2025-02-11
CN115190968A (zh) 2022-10-14
DE112020006830T5 (de) 2022-12-15
JP6786027B1 (ja) 2020-11-18

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