DE112020006830T5 - Messvorrichtung für biologische komponenten - Google Patents

Messvorrichtung für biologische komponenten Download PDF

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Publication number
DE112020006830T5
DE112020006830T5 DE112020006830.7T DE112020006830T DE112020006830T5 DE 112020006830 T5 DE112020006830 T5 DE 112020006830T5 DE 112020006830 T DE112020006830 T DE 112020006830T DE 112020006830 T5 DE112020006830 T5 DE 112020006830T5
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DE
Germany
Prior art keywords
conductive layer
sample
probe light
optical medium
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112020006830.7T
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German (de)
English (en)
Inventor
Yuki Tsuda
Koichi Akiyama
Shusaku Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
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Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE112020006830T5 publication Critical patent/DE112020006830T5/de
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/171Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133Refractometers, e.g. differential
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1725Modulation of properties by light, e.g. photoreflectance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1731Temperature modulation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133Refractometers, e.g. differential
    • G01N2021/4153Measuring the deflection of light in refractometers

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE112020006830.7T 2020-03-04 2020-03-04 Messvorrichtung für biologische komponenten Pending DE112020006830T5 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/009073 WO2021176583A1 (ja) 2020-03-04 2020-03-04 生体成分測定装置

Publications (1)

Publication Number Publication Date
DE112020006830T5 true DE112020006830T5 (de) 2022-12-15

Family

ID=73219999

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112020006830.7T Pending DE112020006830T5 (de) 2020-03-04 2020-03-04 Messvorrichtung für biologische komponenten

Country Status (5)

Country Link
US (1) US12222288B2 (https=)
JP (1) JP6786027B1 (https=)
CN (1) CN115190968B (https=)
DE (1) DE112020006830T5 (https=)
WO (1) WO2021176583A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022185454A1 (ja) * 2021-03-03 2022-09-09 三菱電機株式会社 成分測定装置および成分測定方法
JP6956930B1 (ja) * 2021-03-23 2021-11-02 三菱電機株式会社 生体成分測定装置および生体成分測定方法
US12292400B2 (en) 2022-02-17 2025-05-06 Mitsubishi Electric Corporation Non-invasive substance analysis apparatus
CN118679373A (zh) * 2022-02-17 2024-09-20 三菱电机株式会社 非侵入式物质分析装置
JP2024112539A (ja) 2023-02-08 2024-08-21 株式会社東芝 センシングシステム、及び反射光学素子
WO2025017856A1 (ja) * 2023-07-19 2025-01-23 三菱電機株式会社 分析装置
JP7736944B1 (ja) * 2024-04-16 2025-09-09 三菱電機株式会社 生体成分測定装置
JP7638461B1 (ja) * 2024-08-21 2025-03-03 三菱電機株式会社 非侵襲物質分析装置及び非侵襲物質分析方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
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US4682897A (en) * 1984-12-10 1987-07-28 Canon Kabushiki Kaisha Light scattering measuring apparatus
JPS61137047A (ja) * 1984-12-10 1986-06-24 Canon Inc 光散乱計測装置
JPS6239731A (ja) * 1985-08-16 1987-02-20 Canon Inc 薄膜の光物性測定装置
JPH06273328A (ja) * 1993-03-22 1994-09-30 Kyoto Electron Mfg Co Ltd 屈折率測定方法及びその装置
JP3254465B2 (ja) * 1993-04-21 2002-02-04 株式会社日立製作所 光熱変位信号検出方法とその装置
JP3844688B2 (ja) * 2000-12-25 2006-11-15 富士写真フイルム株式会社 全反射減衰を利用したセンサー
JP2002277376A (ja) * 2001-03-16 2002-09-25 Toshiba Corp 近接場光プローブおよび近接場光記録再生装置
JP2004286578A (ja) * 2003-03-20 2004-10-14 Asahi Kasei Corp 反射型熱レンズ分光分析装置
JP4701739B2 (ja) * 2005-02-17 2011-06-15 パナソニック株式会社 蛍光測定装置
KR101395908B1 (ko) * 2006-11-21 2014-05-15 브라운 유니버시티 광학 공동을 통합한 피코초 초음파 시스템
JP4975000B2 (ja) * 2007-12-07 2012-07-11 キヤノン株式会社 電磁波発生素子、電磁波集積素子、及び電磁波検出装置
JP5553717B2 (ja) * 2010-09-17 2014-07-16 富士フイルム株式会社 光電場増強デバイスを用いた光の測定方法および測定装置
DE102014108424B3 (de) * 2014-06-16 2015-06-11 Johann Wolfgang Goethe-Universität Nicht-invasive Stoffanalyse
DE102014113134A1 (de) * 2014-09-11 2015-07-23 Rofin-Baasel Lasertech Gmbh & Co. Kg Optische Einrichtung
EP3248544B1 (en) * 2015-01-21 2021-12-08 National Institutes for Quantum Science and Technology Device for measuring concentration of substance in blood, and method for measuring concentration of substance in blood
US11280728B2 (en) * 2015-12-09 2022-03-22 Diamontech Ag Device and method for analyzing a material
WO2018123169A1 (ja) * 2016-12-26 2018-07-05 三菱電機株式会社 生体物質測定装置および生体物質測定方法
WO2019110084A1 (de) * 2017-12-04 2019-06-13 Diamontech Gmbh Vorrichtung und verfahren zum analysieren eines stoffs
CN111670356A (zh) * 2018-02-02 2020-09-15 三菱电机株式会社 生物体物质测定装置

Also Published As

Publication number Publication date
JPWO2021176583A1 (https=) 2021-09-10
WO2021176583A1 (ja) 2021-09-10
CN115190968B (zh) 2026-03-17
US20230053065A1 (en) 2023-02-16
US12222288B2 (en) 2025-02-11
CN115190968A (zh) 2022-10-14
JP6786027B1 (ja) 2020-11-18

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