JP6755168B2 - インプリントシステム、レプリカ製造装置、管理装置、インプリント装置、および物品製造方法 - Google Patents
インプリントシステム、レプリカ製造装置、管理装置、インプリント装置、および物品製造方法 Download PDFInfo
- Publication number
- JP6755168B2 JP6755168B2 JP2016239776A JP2016239776A JP6755168B2 JP 6755168 B2 JP6755168 B2 JP 6755168B2 JP 2016239776 A JP2016239776 A JP 2016239776A JP 2016239776 A JP2016239776 A JP 2016239776A JP 6755168 B2 JP6755168 B2 JP 6755168B2
- Authority
- JP
- Japan
- Prior art keywords
- imprint
- replica
- mold
- substrate
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/38—Moulds or cores; Details thereof or accessories therefor characterised by the material or the manufacturing process
- B29C33/3842—Manufacturing moulds, e.g. shaping the mould surface by machining
- B29C33/3857—Manufacturing moulds, e.g. shaping the mould surface by machining by making impressions of one or more parts of models, e.g. shaped articles and including possible subsequent assembly of the parts
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C59/00—Surface shaping of articles, e.g. embossing; Apparatus therefor
- B29C59/02—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C59/00—Surface shaping of articles, e.g. embossing; Apparatus therefor
- B29C59/02—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing
- B29C59/026—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing of layered or coated substantially flat surfaces
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67294—Apparatus for monitoring, sorting or marking using identification means, e.g. labels on substrates or labels on containers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016239776A JP6755168B2 (ja) | 2016-12-09 | 2016-12-09 | インプリントシステム、レプリカ製造装置、管理装置、インプリント装置、および物品製造方法 |
| PCT/JP2017/042311 WO2018105418A1 (ja) | 2016-12-09 | 2017-11-27 | インプリントシステム、および物品製造方法 |
| KR1020197019699A KR102204105B1 (ko) | 2016-12-09 | 2017-11-27 | 임프린트 시스템 및 물품 제조 방법 |
| TW106142506A TWI641027B (zh) | 2016-12-09 | 2017-12-05 | Imprinting system and article manufacturing method |
| US16/432,173 US11235495B2 (en) | 2016-12-09 | 2019-06-05 | Imprint system and article manufacturing meihod |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016239776A JP6755168B2 (ja) | 2016-12-09 | 2016-12-09 | インプリントシステム、レプリカ製造装置、管理装置、インプリント装置、および物品製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018098306A JP2018098306A (ja) | 2018-06-21 |
| JP2018098306A5 JP2018098306A5 (enExample) | 2020-01-23 |
| JP6755168B2 true JP6755168B2 (ja) | 2020-09-16 |
Family
ID=62491148
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016239776A Active JP6755168B2 (ja) | 2016-12-09 | 2016-12-09 | インプリントシステム、レプリカ製造装置、管理装置、インプリント装置、および物品製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11235495B2 (enExample) |
| JP (1) | JP6755168B2 (enExample) |
| KR (1) | KR102204105B1 (enExample) |
| TW (1) | TWI641027B (enExample) |
| WO (1) | WO2018105418A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12087604B2 (en) | 2021-03-16 | 2024-09-10 | Kioxia Corporation | Template, manufacturing method of template, and manufacturing method of semiconductor device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3650224B1 (de) * | 2018-11-09 | 2023-06-21 | Phoenix Contact GmbH & Co. KG | Vorrichtung und verfahren zum bedrucken eines artikels |
| JP7190942B2 (ja) * | 2019-03-08 | 2022-12-16 | キヤノン株式会社 | インプリントシステム、管理装置、および物品製造方法 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US736085A (en) | 1902-10-15 | 1903-08-11 | Carroll W Kjelgaard | Combination shade and curtain bracket. |
| US7360851B1 (en) | 2006-02-15 | 2008-04-22 | Kla-Tencor Technologies Corporation | Automated pattern recognition of imprint technology |
| JP2010052175A (ja) * | 2008-08-26 | 2010-03-11 | Fuji Electric Device Technology Co Ltd | ナノインプリント用マスターモールドの製造方法およびレプリカモールドの製造方法 |
| EP2256549A1 (en) * | 2009-05-29 | 2010-12-01 | Obducat AB | Fabrication of Metallic Stamps for Replication Technology |
| JP2012190877A (ja) * | 2011-03-09 | 2012-10-04 | Fujifilm Corp | ナノインプリント方法およびそれに用いられるナノインプリント装置 |
| JP2012234901A (ja) * | 2011-04-28 | 2012-11-29 | Toshiba Corp | インプリント装置の動作方法及びインプリント用テンプレートの管理装置の動作方法 |
| JP6053266B2 (ja) * | 2011-09-01 | 2016-12-27 | キヤノン株式会社 | インプリント装置、物品の製造方法及びインプリント方法 |
| JP2013074115A (ja) | 2011-09-28 | 2013-04-22 | Fujifilm Corp | ナノインプリント装置およびナノインプリント方法、並びに、歪み付与デバイスおよび歪み付与方法 |
| JP5935385B2 (ja) | 2012-02-27 | 2016-06-15 | 大日本印刷株式会社 | ナノインプリント用レプリカテンプレートの製造方法及びレプリカテンプレート |
| JP5942551B2 (ja) * | 2012-04-03 | 2016-06-29 | 大日本印刷株式会社 | ナノインプリント用マスターテンプレート及びレプリカテンプレートの製造方法 |
| JP6478565B2 (ja) * | 2014-11-06 | 2019-03-06 | キヤノン株式会社 | インプリントシステム及び物品の製造方法 |
| JP6438332B2 (ja) * | 2015-03-18 | 2018-12-12 | キヤノン株式会社 | インプリントシステム、および物品の製造方法 |
| JP6138189B2 (ja) * | 2015-04-08 | 2017-05-31 | キヤノン株式会社 | インプリント装置および物品の製造方法 |
-
2016
- 2016-12-09 JP JP2016239776A patent/JP6755168B2/ja active Active
-
2017
- 2017-11-27 KR KR1020197019699A patent/KR102204105B1/ko active Active
- 2017-11-27 WO PCT/JP2017/042311 patent/WO2018105418A1/ja not_active Ceased
- 2017-12-05 TW TW106142506A patent/TWI641027B/zh active
-
2019
- 2019-06-05 US US16/432,173 patent/US11235495B2/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12087604B2 (en) | 2021-03-16 | 2024-09-10 | Kioxia Corporation | Template, manufacturing method of template, and manufacturing method of semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102204105B1 (ko) | 2021-01-18 |
| TW201822251A (zh) | 2018-06-16 |
| US20190283281A1 (en) | 2019-09-19 |
| US11235495B2 (en) | 2022-02-01 |
| JP2018098306A (ja) | 2018-06-21 |
| TWI641027B (zh) | 2018-11-11 |
| WO2018105418A1 (ja) | 2018-06-14 |
| KR20190089213A (ko) | 2019-07-30 |
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