JP6723131B2 - 基板搬送装置および基板搬送方法 - Google Patents
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- 239000000758 substrate Substances 0.000 title claims description 544
- 238000012546 transfer Methods 0.000 title claims description 103
- 238000000034 method Methods 0.000 title claims description 16
- 230000007246 mechanism Effects 0.000 claims description 163
- 230000007723 transport mechanism Effects 0.000 claims description 40
- 230000002093 peripheral effect Effects 0.000 claims description 30
- 230000001133 acceleration Effects 0.000 claims description 19
- 230000032258 transport Effects 0.000 claims description 16
- 230000036544 posture Effects 0.000 description 91
- 238000012545 processing Methods 0.000 description 51
- 239000007788 liquid Substances 0.000 description 31
- 239000000126 substance Substances 0.000 description 17
- 230000003028 elevating effect Effects 0.000 description 13
- 238000001035 drying Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 7
- 230000008859 change Effects 0.000 description 6
- 238000001514 detection method Methods 0.000 description 4
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- FGRBYDKOBBBPOI-UHFFFAOYSA-N 10,10-dioxo-2-[4-(N-phenylanilino)phenyl]thioxanthen-9-one Chemical compound O=C1c2ccccc2S(=O)(=O)c2ccc(cc12)-c1ccc(cc1)N(c1ccccc1)c1ccccc1 FGRBYDKOBBBPOI-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
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Description
9 基板
43 ハンド要素
47 支持部
93 ノッチ
100 制御部
101 記憶部
203 ノッチアライナー
S11〜S14,S141,S142 ステップ
Claims (8)
- 基板搬送装置であって、
水平姿勢にて載置された基板を搬送する搬送機構と、
前記搬送機構上に載置される予定の前記基板を周方向に回転し、前記基板の周縁部に設けられたノッチの前記周方向の位置を変更するノッチ位置変更機構と、
前記基板の反り状態と、前記反り状態にて前記基板が前記搬送機構上に載置される際に適切な姿勢となるノッチ位置との複数の組み合わせを含む反り−ノッチ位置情報を記憶する記憶部と、
前記ノッチ位置変更機構を制御する制御部と、
を備え、
前記搬送機構が、前記基板の前記周縁部の下面と対向する4つの支持部を備え、
前記基板の反り状態について入力された入力情報、および、前記反り−ノッチ位置情報に基づいて、前記制御部が前記ノッチ位置変更機構を制御し、前記基板の前記ノッチの前記周方向の位置を決定することにより、前記搬送機構上に載置された状態における前記基板の前記下面と前記搬送機構の前記4つの支持部とが接触することを特徴とする基板搬送装置。 - 請求項1に記載の基板搬送装置であって、
前記搬送機構が、前記4つの支持部のうちそれぞれ2つの支持部が上部に設けられる2本のハンド要素を備え、
前記搬送機構上に載置された状態における前記基板が、各ハンド要素の鉛直上方、かつ、前記各ハンド要素の前記2つの支持部の間において、上向きに凸であることを特徴とする基板搬送装置。 - 請求項1または2に記載の基板搬送装置であって、
前記搬送機構が、他の基板を前記基板と共に搬送し、
前記ノッチ位置変更機構が、前記他の基板および前記基板を順次また同時に前記周方向に回転し、前記他の基板の周縁部に設けられたノッチの前記周方向の位置を前記基板と同様に決定し、
前記搬送機構が、前記他の基板の前記周縁部の下面と対向する他の4つの支持部を備え、
前記搬送機構上に載置された状態における前記他の基板の前記下面と前記搬送機構の前記他の4つの支持部とが接触することを特徴とする基板搬送装置。 - 基板搬送装置であって、
水平姿勢にて載置された基板を搬送する搬送機構と、
前記搬送機構上に載置される予定の前記基板を周方向に回転し、前記基板の周縁部に設けられたノッチの前記周方向の位置を変更するノッチ位置変更機構と、
前記基板の反り状態と、前記反り状態にて前記基板が前記搬送機構上に載置される際に適切な姿勢となるノッチ位置との複数の組み合わせを含む反り−ノッチ位置情報を記憶する記憶部と、
前記ノッチ位置変更機構を制御する制御部と、
を備え、
前記搬送機構が、前記基板の前記周縁部の下面と対向する支持部を備え、
前記基板の反り状態について入力された入力情報、および、前記反り−ノッチ位置情報に基づいて、前記制御部が前記ノッチ位置変更機構を制御することにより、前記基板の前記ノッチの前記周方向の位置を決定し、
前記基板の上端と前記基板の周縁部のうち前記支持部に当接する当接部との間の厚さ方向の距離を、前記記憶部に記憶されている基板の反り状態から推定される閾値と比較した結果に基づいて、前記制御部が前記搬送機構を制御することにより、前記搬送機構の移動開始時および移動停止時の加速度を制御することを特徴とする基板搬送装置。 - 請求項1ないし4のいずれかに記載の基板搬送装置であって、
前記基板が、
第1の径方向において厚さ方向の一方側に第1の曲率にて湾曲し、
前記第1の径方向に直交する第2の径方向において、前記厚さ方向の前記一方側に前記第1の曲率よりも大きい第2の曲率にて湾曲することを特徴とする基板搬送装置。 - 請求項1ないし4のいずれかに記載の基板搬送装置であって、
前記基板が、
第1の径方向において厚さ方向の一方側に湾曲し、
前記第1の径方向に直交する第2の径方向において前記厚さ方向の他方側に湾曲することを特徴とする基板搬送装置。 - 基板搬送方法であって、
a)水平姿勢にて搬送機構上に載置される予定の基板の反り状態と、前記反り状態にて前記基板が前記搬送機構上に載置される際に適切な姿勢となるノッチ位置との複数の組み合わせを含む反り−ノッチ位置情報を記憶する工程と、
b)前記基板を周方向に回転し、前記基板の周縁部に設けられたノッチの前記周方向の位置を決定する工程と、
c)前記基板を前記搬送機構上に水平姿勢にて載置して搬送する工程と、
を備え、
前記搬送機構が、前記基板の前記周縁部の下面と対向する4つの支持部を備え、
前記b)工程において、前記基板の反り状態について入力された入力情報、および、前記反り−ノッチ位置情報に基づいて、前記基板の前記ノッチの前記周方向の位置が決定されることにより、前記c)工程において、前記搬送機構上に載置された前記基板の前記下面と前記搬送機構の前記4つの支持部とが接触することを特徴とする基板搬送方法。 - 基板搬送方法であって、
a)基板の反り状態と、前記反り状態にて前記基板が搬送機構上に載置される際に適切な姿勢となるノッチ位置との複数の組み合わせを含む反り−ノッチ位置情報を記憶する工程と、
b)前記基板の反り状態について入力された入力情報、および、前記反り−ノッチ位置情報に基づいて、前記搬送機構上に載置される予定の前記基板を周方向に回転し、前記基板の前記ノッチの前記周方向の位置を決定する工程と、
c)前記基板を水平姿勢にて前記搬送機構により支持する工程と、
d)前記搬送機構の移動を開始する工程と、
e)前記搬送機構の移動を停止する工程と、
を備え、
前記d)工程において、前記基板の上端と前記基板の周縁部のうち前記支持部に当接する当接部との間の厚さ方向の距離を、前記記憶部に記憶されている基板の反り状態から推定される閾値と比較した結果に基づいて、前記搬送機構の移動開始時の加速度が制御され、
前記e)工程において、前記距離を前記閾値と比較した結果に基づいて前記搬送機構の移動停止時の加速度が制御されることを特徴とする基板搬送方法。
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JP2016190861A JP6723131B2 (ja) | 2016-09-29 | 2016-09-29 | 基板搬送装置および基板搬送方法 |
KR1020170108539A KR102091392B1 (ko) | 2016-09-29 | 2017-08-28 | 기판 반송 장치 및 기판 반송 방법 |
US15/693,717 US10734266B2 (en) | 2016-09-29 | 2017-09-01 | Substrate transporter and substrate transport method |
CN201710791335.3A CN107887311B (zh) | 2016-09-29 | 2017-09-05 | 基板搬运装置及基板搬运方法 |
TW106130473A TWI668786B (zh) | 2016-09-29 | 2017-09-06 | 基板搬送裝置及基板搬送方法 |
US16/881,044 US11276595B2 (en) | 2016-09-29 | 2020-05-22 | Substrate transporter and substrate transport method |
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JP6685213B2 (ja) * | 2016-09-29 | 2020-04-22 | 株式会社Screenホールディングス | 基板整列装置、基板処理装置、基板配列装置、基板整列方法、基板処理方法および基板配列方法 |
JP6862163B2 (ja) * | 2016-12-09 | 2021-04-21 | 東京エレクトロン株式会社 | 基板処理装置 |
KR102166343B1 (ko) * | 2018-06-14 | 2020-10-15 | 세메스 주식회사 | 스토커 |
CN109411403B (zh) * | 2018-10-24 | 2021-07-02 | 上海华力微电子有限公司 | 一种减少硅片颗粒污染的机械手 |
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US20200286762A1 (en) | 2020-09-10 |
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