JP6657149B2 - 炭化珪素半導体素子の製造方法 - Google Patents

炭化珪素半導体素子の製造方法 Download PDF

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JP6657149B2
JP6657149B2 JP2017150408A JP2017150408A JP6657149B2 JP 6657149 B2 JP6657149 B2 JP 6657149B2 JP 2017150408 A JP2017150408 A JP 2017150408A JP 2017150408 A JP2017150408 A JP 2017150408A JP 6657149 B2 JP6657149 B2 JP 6657149B2
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gas
silicon carbide
etching
carbide substrate
silicon
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JP2017195422A5 (https=
JP2017195422A (ja
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尚弥 池本
尚弥 池本
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SPP Technologies Co Ltd
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SPP Technologies Co Ltd
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  • Drying Of Semiconductors (AREA)
JP2017150408A 2017-08-03 2017-08-03 炭化珪素半導体素子の製造方法 Active JP6657149B2 (ja)

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JP2017150408A JP6657149B2 (ja) 2017-08-03 2017-08-03 炭化珪素半導体素子の製造方法

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JP2017150408A JP6657149B2 (ja) 2017-08-03 2017-08-03 炭化珪素半導体素子の製造方法

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JP2016058531A Division JP6208275B2 (ja) 2016-03-23 2016-03-23 炭化珪素半導体素子の製造方法

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JP2017195422A JP2017195422A (ja) 2017-10-26
JP2017195422A5 JP2017195422A5 (https=) 2019-03-07
JP6657149B2 true JP6657149B2 (ja) 2020-03-04

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Publication number Priority date Publication date Assignee Title
GB201917734D0 (en) * 2019-12-04 2020-01-15 Spts Technologies Ltd Method, substrate and apparatus
GB202119119D0 (en) * 2021-12-30 2022-02-16 Spts Technologies Ltd Plasma etched silicon carbide

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5842138B2 (ja) * 2012-08-24 2016-01-13 パナソニックIpマネジメント株式会社 SiC基板のエッチング方法
JP6279933B2 (ja) * 2014-02-28 2018-02-14 Sppテクノロジーズ株式会社 炭化珪素半導体素子の製造方法
JP2017112293A (ja) * 2015-12-18 2017-06-22 パナソニックIpマネジメント株式会社 溝を有するシリコンカーバイド基板の製造方法

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