JP6655415B2 - 磁気計測装置 - Google Patents

磁気計測装置 Download PDF

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Publication number
JP6655415B2
JP6655415B2 JP2016026993A JP2016026993A JP6655415B2 JP 6655415 B2 JP6655415 B2 JP 6655415B2 JP 2016026993 A JP2016026993 A JP 2016026993A JP 2016026993 A JP2016026993 A JP 2016026993A JP 6655415 B2 JP6655415 B2 JP 6655415B2
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Prior art keywords
excitation light
diamond sensor
diamond
magnetic
fluorescence
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Japanese (ja)
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JP2017146158A5 (OSRAM
JP2017146158A (ja
Inventor
雄治 波多野
雄治 波多野
隆 吉野
隆 吉野
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Renesas Electronics Corp
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Renesas Electronics Corp
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Priority to JP2016026993A priority Critical patent/JP6655415B2/ja
Priority to US15/432,250 priority patent/US10502796B2/en
Publication of JP2017146158A publication Critical patent/JP2017146158A/ja
Publication of JP2017146158A5 publication Critical patent/JP2017146158A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/1284—Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
    • A61B5/0071—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence by measuring fluorescence emission

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2016026993A 2016-02-16 2016-02-16 磁気計測装置 Active JP6655415B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016026993A JP6655415B2 (ja) 2016-02-16 2016-02-16 磁気計測装置
US15/432,250 US10502796B2 (en) 2016-02-16 2017-02-14 Magnetometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016026993A JP6655415B2 (ja) 2016-02-16 2016-02-16 磁気計測装置

Publications (3)

Publication Number Publication Date
JP2017146158A JP2017146158A (ja) 2017-08-24
JP2017146158A5 JP2017146158A5 (OSRAM) 2018-11-08
JP6655415B2 true JP6655415B2 (ja) 2020-02-26

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JP2016026993A Active JP6655415B2 (ja) 2016-02-16 2016-02-16 磁気計測装置

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US (1) US10502796B2 (OSRAM)
JP (1) JP6655415B2 (OSRAM)

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DE102018214617A1 (de) * 2018-08-29 2020-03-05 Robert Bosch Gmbh Sensoreinrichtung
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JP7186963B2 (ja) * 2018-10-16 2022-12-12 国立大学法人東京工業大学 磁気計測装置
JP7209176B2 (ja) * 2018-10-26 2023-01-20 スミダコーポレーション株式会社 磁場発生源検出装置および磁場発生源検出方法
DE102018219750A1 (de) * 2018-11-19 2020-05-20 Robert Bosch Gmbh Licht-Wellenleiterstruktur für effiziente Lichtanregung und Photonen-Detektion für Farbzentren in Diamant
JP7209182B2 (ja) * 2018-12-27 2023-01-20 スミダコーポレーション株式会社 励起光照射装置および励起光照射方法
DE102019203929A1 (de) * 2019-03-22 2020-09-24 Robert Bosch Gmbh Sensoreinrichtung und Verfahren zur Herstellung einer Spiegelanordnung für eine Sensoreinrichtung
JP7223272B2 (ja) * 2019-04-22 2023-02-16 スミダコーポレーション株式会社 励起光照射装置および励起光照射方法
JP7417220B2 (ja) * 2019-05-24 2024-01-18 国立大学法人大阪大学 撮像装置および撮像方法
CN110398300A (zh) * 2019-06-24 2019-11-01 中北大学 一种基于集群nv色心金刚石的温度传感器
EP4014056A1 (en) 2019-10-02 2022-06-22 X Development LLC Magnetometry based on electron spin defects
US11226381B2 (en) * 2019-10-28 2022-01-18 Palo Alto Research Center Incorporated Compact diamond NV center imager
DE102021101577A1 (de) * 2020-01-30 2021-08-05 Elmos Semiconductor Se Optisches System mit NV-Zentren und optisch transparenten Folienstrukturen
JP7428322B2 (ja) * 2020-06-04 2024-02-06 スミダコーポレーション株式会社 励起光照射装置および励起光照射方法
DE102020210245B3 (de) 2020-08-12 2022-02-03 Universität Stuttgart Gradiometer zur Erfassung eines Gradientenfeldes einer physikalischen Größe
WO2022056232A1 (en) 2020-09-10 2022-03-17 X Development Llc Magnetometry based on electron spin defects
DE102020214279A1 (de) 2020-11-13 2022-05-19 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zur Vitalfunktionsmessung mittels Magnetfeldmessung und Verfahren zur Personenerkennung mittels Magnetfeldmessung
JP7530284B2 (ja) * 2020-12-22 2024-08-07 矢崎総業株式会社 センサ
DE102020134883A1 (de) 2020-12-23 2022-06-23 Quantum Technologies UG (haftungsbeschränkt) Vorrichtung zur Bestimmung einer magnetischen Flussdichte und Verfahren zur Bestimmung einer magnetischen Flussdichte mit einer solchen Vorrichtung sowie Verfahren zur Herstellung einer Vorrichtung zur Bestimmung der magnetischen Flussdichte
US11531073B2 (en) 2020-12-31 2022-12-20 X Development Llc Fiber-coupled spin defect magnetometry
US11774384B2 (en) 2021-01-15 2023-10-03 X Development Llc Spin defect magnetometry pixel array
CN116745632A (zh) * 2021-01-27 2023-09-12 住友电气工业株式会社 金刚石磁传感器单元及金刚石磁传感器系统
US12449457B2 (en) 2021-01-27 2025-10-21 Sumitomo Electric Industries, Ltd. Diamond sensor unit
JP7738019B2 (ja) * 2021-01-27 2025-09-11 日新電機株式会社 ダイヤモンドセンサユニット及びダイヤモンドセンサシステム
WO2022210695A1 (ja) * 2021-03-31 2022-10-06 住友電気工業株式会社 ダイヤモンド光磁気センサ
CN113176238B (zh) * 2021-04-22 2023-10-31 国网安徽省电力有限公司电力科学研究院 基于金刚石薄膜的磁成像装置
JP7675365B2 (ja) * 2021-05-18 2025-05-13 スミダコーポレーション株式会社 磁場測定装置および磁場測定方法
DE102021113197A1 (de) 2021-05-20 2022-11-24 Endress + Hauser Wetzer Gmbh + Co. Kg Kit, Sensoranordnung und Temperiervorrichtung zur Temperaturbestimmung
JPWO2022249995A1 (OSRAM) * 2021-05-25 2022-12-01
CN113834801A (zh) * 2021-09-09 2021-12-24 国仪量子(合肥)技术有限公司 金属无损探伤设备、方法及存储介质
DE102021132974B3 (de) * 2021-12-14 2023-01-05 Balluff Gmbh Sensor, Magnetfeld-Positionsmesssystem und Verfahren zur Positionsbestimmung
CN114706022A (zh) * 2022-03-31 2022-07-05 中国科学技术大学 一种探头装置以及磁力计
JP2024057947A (ja) * 2022-10-13 2024-04-25 スミダコーポレーション株式会社 磁場測定装置
DE102022212536A1 (de) * 2022-11-24 2024-05-29 Hahn-Schickard-Gesellschaft für angewandte Forschung e.V. Quantenvorrichtung
JPWO2024181575A1 (OSRAM) * 2023-03-01 2024-09-06

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US20170234941A1 (en) 2017-08-17
JP2017146158A (ja) 2017-08-24
US10502796B2 (en) 2019-12-10

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