JP6485972B2 - Tsv/mems/パワーデバイスエッチング用の化学物質 - Google Patents

Tsv/mems/パワーデバイスエッチング用の化学物質 Download PDF

Info

Publication number
JP6485972B2
JP6485972B2 JP2016571169A JP2016571169A JP6485972B2 JP 6485972 B2 JP6485972 B2 JP 6485972B2 JP 2016571169 A JP2016571169 A JP 2016571169A JP 2016571169 A JP2016571169 A JP 2016571169A JP 6485972 B2 JP6485972 B2 JP 6485972B2
Authority
JP
Japan
Prior art keywords
fluid
hydrogen
etching
silicon
polymer deposition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2016571169A
Other languages
English (en)
Japanese (ja)
Other versions
JP2017518645A (ja
JP2017518645A5 (enExample
Inventor
ペン・シェン
クリスチャン・デュサラ
カーティス・アンダーソン
ラウル・グプタ
ヴィンセント・エム・オマージー
ネイサン・スタッフォード
Original Assignee
レール・リキード−ソシエテ・アノニム・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by レール・リキード−ソシエテ・アノニム・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード filed Critical レール・リキード−ソシエテ・アノニム・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード
Publication of JP2017518645A publication Critical patent/JP2017518645A/ja
Publication of JP2017518645A5 publication Critical patent/JP2017518645A5/ja
Application granted granted Critical
Publication of JP6485972B2 publication Critical patent/JP6485972B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H10P50/244
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • C09K13/04Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C09K13/08Etching, surface-brightening or pickling compositions containing an inorganic acid containing a fluorine compound

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Drying Of Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Plasma & Fusion (AREA)
  • Micromachines (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • ing And Chemical Polishing (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
JP2016571169A 2014-06-18 2015-06-17 Tsv/mems/パワーデバイスエッチング用の化学物質 Active JP6485972B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201462013959P 2014-06-18 2014-06-18
US62/013,959 2014-06-18
PCT/JP2015/003044 WO2015194178A1 (en) 2014-06-18 2015-06-17 Chemistries for tsv/mems/power device etching

Publications (3)

Publication Number Publication Date
JP2017518645A JP2017518645A (ja) 2017-07-06
JP2017518645A5 JP2017518645A5 (enExample) 2018-06-07
JP6485972B2 true JP6485972B2 (ja) 2019-03-20

Family

ID=54935182

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016571169A Active JP6485972B2 (ja) 2014-06-18 2015-06-17 Tsv/mems/パワーデバイスエッチング用の化学物質

Country Status (8)

Country Link
US (3) US9892932B2 (enExample)
EP (1) EP3158579A4 (enExample)
JP (1) JP6485972B2 (enExample)
KR (3) KR102444697B1 (enExample)
CN (2) CN111816559B (enExample)
SG (1) SG11201610342YA (enExample)
TW (3) TWI695423B (enExample)
WO (1) WO2015194178A1 (enExample)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI695423B (zh) * 2014-06-18 2020-06-01 法商液態空氣喬治斯克勞帝方法研究開發股份有限公司 用於tsv/mems/功率元件蝕刻的化學物質
EP3375008B1 (en) 2015-11-10 2020-05-20 L'Air Liquide Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude Plasma-free etching process
JP6587580B2 (ja) * 2016-06-10 2019-10-09 東京エレクトロン株式会社 エッチング処理方法
CN110546742B (zh) * 2017-04-06 2023-09-29 关东电化工业株式会社 干式蚀刻气体组合物及干式蚀刻方法
KR102594444B1 (ko) * 2017-06-08 2023-10-25 도쿄엘렉트론가부시키가이샤 황 기반 화학물을 이용한 실리콘 함유 유기 막의 플라즈마 에칭 방법
TWI757545B (zh) * 2017-09-15 2022-03-11 日商關東電化工業股份有限公司 使用酸鹵化物之原子層蝕刻
US10607999B2 (en) 2017-11-03 2020-03-31 Varian Semiconductor Equipment Associates, Inc. Techniques and structure for forming dynamic random access device
KR102504833B1 (ko) * 2017-11-16 2023-03-02 삼성전자 주식회사 식각 가스 혼합물과 이를 이용한 패턴 형성 방법과 집적회로 소자의 제조 방법
JP7145031B2 (ja) 2017-12-25 2022-09-30 東京エレクトロン株式会社 基板を処理する方法、プラズマ処理装置、及び基板処理装置
KR102450580B1 (ko) 2017-12-22 2022-10-07 삼성전자주식회사 금속 배선 하부의 절연층 구조를 갖는 반도체 장치
CN110010464B (zh) * 2017-12-25 2023-07-14 东京毅力科创株式会社 处理基板的方法
KR20200123481A (ko) * 2018-03-16 2020-10-29 램 리써치 코포레이션 유전체들의 고 종횡비 피처들의 플라즈마 에칭 화학물질들
JP6874778B2 (ja) * 2019-01-09 2021-05-19 ダイキン工業株式会社 シクロブタンの製造方法
US11257678B2 (en) * 2019-04-19 2022-02-22 Hitachi High-Tech Corporation Plasma processing method
CN112786441B (zh) 2019-11-08 2026-01-23 东京毅力科创株式会社 蚀刻方法及等离子体处理装置
SG10202010798QA (en) * 2019-11-08 2021-06-29 Tokyo Electron Ltd Etching method and plasma processing apparatus
WO2021090516A1 (ja) * 2019-11-08 2021-05-14 東京エレクトロン株式会社 エッチング方法
US11456180B2 (en) 2019-11-08 2022-09-27 Tokyo Electron Limited Etching method
CN116169018A (zh) * 2019-11-08 2023-05-26 东京毅力科创株式会社 蚀刻方法
KR102389081B1 (ko) * 2020-04-06 2022-04-20 아주대학교산학협력단 PIPVE(perfluoroisopropyl vinyl ether)를 이용한 플라즈마 식각 방법
KR102388963B1 (ko) * 2020-05-07 2022-04-20 아주대학교산학협력단 퍼플루오로프로필카비놀(Perfluoropropyl carbinol)을 이용한 플라즈마 식각 방법
KR102244862B1 (ko) * 2020-08-04 2021-04-27 (주)원익머트리얼즈 식각 가스 혼합물과 이를 이용한 패턴 형성 방법
US20230230810A1 (en) * 2020-10-05 2023-07-20 Spp Technologies Co., Ltd. Plasma processing gas, plasma processing method, and plasma processing apparatus
KR102900581B1 (ko) * 2020-10-15 2025-12-16 가부시끼가이샤 레조낙 플루오로-2-부텐의 보관 방법
JPWO2022080275A1 (enExample) * 2020-10-15 2022-04-21
JP7775835B2 (ja) * 2020-10-15 2025-11-26 株式会社レゾナック エッチングガス及びその製造方法、並びに、エッチング方法、半導体素子の製造方法
CN116323527A (zh) * 2020-10-15 2023-06-23 株式会社力森诺科 氟-2-丁烯的保存方法
CN116348438A (zh) * 2020-10-15 2023-06-27 株式会社力森诺科 氟丁烯的保存方法
KR20230161474A (ko) * 2021-03-30 2023-11-27 도쿄엘렉트론가부시키가이샤 에칭 방법 및 에칭 장치
JP7679464B2 (ja) 2021-05-07 2025-05-19 東京エレクトロン株式会社 エッチング方法及びエッチング装置
WO2025182815A1 (ja) * 2024-02-27 2025-09-04 セントラル硝子株式会社 エッチング方法、半導体デバイスの製造方法、エッチング装置及びエッチングガス組成物
JP7737066B1 (ja) 2024-03-01 2025-09-10 ダイキン工業株式会社 デポジションガス
WO2025258395A1 (ja) * 2024-06-11 2025-12-18 セントラル硝子株式会社 エッチング方法、半導体デバイスの製造方法、エッチング装置及びエッチングガス組成物

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03154337A (ja) * 1989-11-13 1991-07-02 Hitachi Ltd 半導体装置の製造方法
DE4241045C1 (de) 1992-12-05 1994-05-26 Bosch Gmbh Robert Verfahren zum anisotropen Ätzen von Silicium
DE19736370C2 (de) 1997-08-21 2001-12-06 Bosch Gmbh Robert Verfahren zum anisotropen Ätzen von Silizium
US6074959A (en) * 1997-09-19 2000-06-13 Applied Materials, Inc. Method manifesting a wide process window and using hexafluoropropane or other hydrofluoropropanes to selectively etch oxide
DE19826382C2 (de) 1998-06-12 2002-02-07 Bosch Gmbh Robert Verfahren zum anisotropen Ätzen von Silicium
US6284666B1 (en) 2000-05-31 2001-09-04 International Business Machines Corporation Method of reducing RIE lag for deep trench silicon etching
US6569774B1 (en) 2000-08-31 2003-05-27 Micron Technology, Inc. Method to eliminate striations and surface roughness caused by dry etch
JP2002110647A (ja) * 2000-09-29 2002-04-12 Hitachi Ltd 半導体集積回路装置の製造方法
US6746961B2 (en) * 2001-06-19 2004-06-08 Lam Research Corporation Plasma etching of dielectric layer with etch profile control
US6900136B2 (en) 2002-03-08 2005-05-31 Industrial Technology Research Institute Method for reducing reactive ion etching (RIE) lag in semiconductor fabrication processes
US6916746B1 (en) 2003-04-09 2005-07-12 Lam Research Corporation Method for plasma etching using periodic modulation of gas chemistry
US7453150B1 (en) * 2004-04-01 2008-11-18 Rensselaer Polytechnic Institute Three-dimensional face-to-face integration assembly
US20050266691A1 (en) 2004-05-11 2005-12-01 Applied Materials Inc. Carbon-doped-Si oxide etch using H2 additive in fluorocarbon etch chemistry
US7755197B2 (en) * 2006-02-10 2010-07-13 Macronix International Co., Ltd. UV blocking and crack protecting passivation layer
JP2008270348A (ja) * 2007-04-17 2008-11-06 Seiko Epson Corp ドライエッチング装置及び被加工物の加工方法
CN100468664C (zh) * 2007-05-18 2009-03-11 西安交通大学 氧化锌紫外焦平面成像阵列制作工艺中的化学刻蚀方法
US20090068767A1 (en) 2007-09-12 2009-03-12 Lam Research Corporation Tuning via facet with minimal rie lag
JP5192214B2 (ja) * 2007-11-02 2013-05-08 東京エレクトロン株式会社 ガス供給装置、基板処理装置および基板処理方法
US8614151B2 (en) * 2008-01-04 2013-12-24 Micron Technology, Inc. Method of etching a high aspect ratio contact
JP4978512B2 (ja) 2008-02-29 2012-07-18 日本ゼオン株式会社 プラズマエッチング方法
WO2010100254A1 (en) 2009-03-06 2010-09-10 Solvay Fluor Gmbh Use of unsaturated hydrofluorocarbons
KR101422155B1 (ko) * 2010-02-01 2014-07-22 샌트랄 글래스 컴퍼니 리미티드 드라이 에칭제 및 그것을 사용한 드라이 에칭 방법
US8574447B2 (en) * 2010-03-31 2013-11-05 Lam Research Corporation Inorganic rapid alternating process for silicon etch
JP2013030531A (ja) * 2011-07-27 2013-02-07 Central Glass Co Ltd ドライエッチング剤
US8808563B2 (en) * 2011-10-07 2014-08-19 Applied Materials, Inc. Selective etch of silicon by way of metastable hydrogen termination
US8652969B2 (en) * 2011-10-26 2014-02-18 International Business Machines Corporation High aspect ratio and reduced undercut trench etch process for a semiconductor substrate
KR102048959B1 (ko) 2012-10-30 2019-11-27 레르 리키드 쏘시에떼 아노님 뿌르 레?드 에렉스뿔라따시옹 데 프로세데 조르즈 클로드 규소-함유 필름의 에칭을 위한 방법 및 에칭 가스
CN103824767B (zh) 2012-11-16 2017-05-17 中微半导体设备(上海)有限公司 一种深硅通孔的刻蚀方法
JP6017936B2 (ja) * 2012-11-27 2016-11-02 東京エレクトロン株式会社 プラズマ処理装置およびプラズマ処理方法
US20160284523A1 (en) 2013-03-28 2016-09-29 The Chemours Company Fc, Llc Hydrofluoroolefin Etching Gas Mixtures
TWI642809B (zh) 2013-09-09 2018-12-01 法商液態空氣喬治斯克勞帝方法研究開發股份有限公司 用蝕刻氣體蝕刻半導體結構的方法
JP6358263B2 (ja) 2013-10-09 2018-07-18 旭硝子株式会社 2,3,3,3−テトラフルオロプロペンの精製方法
TWI695423B (zh) * 2014-06-18 2020-06-01 法商液態空氣喬治斯克勞帝方法研究開發股份有限公司 用於tsv/mems/功率元件蝕刻的化學物質

Also Published As

Publication number Publication date
EP3158579A4 (en) 2018-02-21
KR102679289B1 (ko) 2024-06-27
US10103031B2 (en) 2018-10-16
CN106663624A (zh) 2017-05-10
TWI695423B (zh) 2020-06-01
US9892932B2 (en) 2018-02-13
TWI733431B (zh) 2021-07-11
EP3158579A1 (en) 2017-04-26
TWI658509B (zh) 2019-05-01
TW202030312A (zh) 2020-08-16
CN111816559B (zh) 2024-06-11
US20180076046A1 (en) 2018-03-15
WO2015194178A1 (en) 2015-12-23
US10720335B2 (en) 2020-07-21
US20170103901A1 (en) 2017-04-13
US20180366336A1 (en) 2018-12-20
JP2017518645A (ja) 2017-07-06
SG11201610342YA (en) 2017-01-27
KR20220124825A (ko) 2022-09-14
TW201606867A (zh) 2016-02-16
TW201929071A (zh) 2019-07-16
CN111816559A (zh) 2020-10-23
KR102539241B1 (ko) 2023-06-01
CN106663624B (zh) 2020-08-14
KR102444697B1 (ko) 2022-09-16
KR20230079491A (ko) 2023-06-07
KR20170020434A (ko) 2017-02-22

Similar Documents

Publication Publication Date Title
JP6485972B2 (ja) Tsv/mems/パワーデバイスエッチング用の化学物質
JP6811284B2 (ja) 3d nandフラッシュメモリの製造方法
EP3563406B1 (en) Iodine-containing compounds for etching semiconductor structures
JP6871233B2 (ja) シリコン含有膜をエッチングするための方法
TW201543567A (zh) 無鹵素之氣相矽蝕刻
US20220293430A1 (en) Isotropic silicon nitride removal
TWI846218B (zh) 用於蝕刻半導體結構的含氧和碘的氫氟烴化合物
US12315739B2 (en) Isotropic silicon nitride removal
JP2026504698A (ja) 酸素含有ハイドロフルオロカーボンを使用するエッチング方法

Legal Events

Date Code Title Description
RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20161220

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20161222

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180418

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20180418

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20181114

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20190128

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20190213

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20190218

R150 Certificate of patent or registration of utility model

Ref document number: 6485972

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250