JP6473455B2 - 炭化ケイ素シードを用いたバルクの炭化ケイ素の製造方法及び装置 - Google Patents
炭化ケイ素シードを用いたバルクの炭化ケイ素の製造方法及び装置 Download PDFInfo
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- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title claims description 206
- 229910010271 silicon carbide Inorganic materials 0.000 title claims description 203
- 238000004519 manufacturing process Methods 0.000 title description 9
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 58
- 239000002243 precursor Substances 0.000 claims description 50
- 238000000034 method Methods 0.000 claims description 45
- 239000010410 layer Substances 0.000 claims description 37
- 229910002804 graphite Inorganic materials 0.000 claims description 32
- 239000010439 graphite Substances 0.000 claims description 32
- 238000000859 sublimation Methods 0.000 claims description 29
- 230000008022 sublimation Effects 0.000 claims description 29
- 238000010438 heat treatment Methods 0.000 claims description 27
- 239000011241 protective layer Substances 0.000 claims description 16
- 239000007787 solid Substances 0.000 claims description 14
- 229920002120 photoresistant polymer Polymers 0.000 claims description 10
- 239000011247 coating layer Substances 0.000 claims description 6
- 238000007789 sealing Methods 0.000 claims description 3
- 239000011810 insulating material Substances 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 description 29
- 238000009413 insulation Methods 0.000 description 27
- 229910052799 carbon Inorganic materials 0.000 description 25
- 229910052710 silicon Inorganic materials 0.000 description 25
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 24
- 239000010703 silicon Substances 0.000 description 24
- 239000013078 crystal Substances 0.000 description 23
- 239000000203 mixture Substances 0.000 description 21
- 230000007547 defect Effects 0.000 description 19
- 239000002245 particle Substances 0.000 description 18
- 239000000463 material Substances 0.000 description 10
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 230000006698 induction Effects 0.000 description 6
- 239000010453 quartz Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000003153 chemical reaction reagent Substances 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 239000013618 particulate matter Substances 0.000 description 4
- 239000011856 silicon-based particle Substances 0.000 description 4
- 239000002131 composite material Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 239000000356 contaminant Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- -1 graphite Chemical compound 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 2
- 238000007873 sieving Methods 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000011800 void material Substances 0.000 description 2
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 1
- DEXFNLNNUZKHNO-UHFFFAOYSA-N 6-[3-[4-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]piperidin-1-yl]-3-oxopropyl]-3H-1,3-benzoxazol-2-one Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C1CCN(CC1)C(CCC1=CC2=C(NC(O2)=O)C=C1)=O DEXFNLNNUZKHNO-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000000110 cooling liquid Substances 0.000 description 1
- 229930003836 cresol Natural products 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 235000012489 doughnuts Nutrition 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
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- 239000011261 inert gas Substances 0.000 description 1
- 239000012774 insulation material Substances 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
- C30B23/025—Epitaxial-layer growth characterised by the substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/30—Self-sustaining carbon mass or layer with impregnant or other layer
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- Organic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Vapour Deposition (AREA)
- Crucibles And Fluidized-Bed Furnaces (AREA)
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Description
本出願は、2013年9月6日出願の米国仮特許出願第61/874620号に関連する。当該特許出願の全内容は参照により本明細書に組み込まれる。
本発明は、昇華炉及び低い欠陥密度を有するバルクの炭化ケイ素を製造する方法に関する。
Claims (7)
- 以下の工程
i)炉殻、炉殻の外側に位置する少なくとも一つの加熱素子、及び断熱材に囲まれ炉殻内部に位置するホットゾーンを含む昇華炉を提供することであり、当該ホットゾーンが以下を含む昇華炉を提供すること、
a)上部領域と下部領域を有し、1又は複数の通気口を有するるつぼ;
b)るつぼを密封するるつぼカバー;
c)るつぼの下部領域に位置する炭化ケイ素前駆体;
d)るつぼの上部領域に位置するシードモジュールであり、少なくとも一つの蒸気放出開口部を有するシードホルダー、及び上面と底面を有する炭化ケイ素シードをシードホルダー内に含む、シードモジュール、
ここで、炭化ケイ素シードの上面は、るつぼの上部領域に露出しているか又はシード保護層を有しており、炭化ケイ素シードの底面は、るつぼの上部領域に露出し、かつ実質的に固体の炭化ケイ素前駆体に向いている;及び
e)1又は複数の孔を有する少なくとも一つの蒸気放出リングであり、シードホルダーの頂部に配置され、少なくとも一つの孔がるつぼの通気口の少なくとも一つとそろえられている蒸気放出リング、
ii)炭化ケイ素前駆体を昇華させるために加熱素子によってホットゾーンを加熱すること、及び
iii)炭化ケイ素シードの底面の上に炭化ケイ素を形成すること
を含む、炭化ケイ素の製造方法。 - シードホルダーが炭化ケイ素シードの底面に垂直な中心軸を有し、複数の蒸気放出開口部が当該中心軸の周囲に対称的に配置される、請求項1に記載の方法。
- 蒸気放出開口部が炭化ケイ素シードの底面より下に位置する、請求項1に記載の方法。
- 炭化ケイ素シードの上面がシード保護層を含む、請求項1に記載の方法。
- シード保護層が少なくとも2つのコーティング層を含む、請求項4に記載の方法。
- コーティング層の少なくとも一つが硬化したフォトレジスト層である、請求項5に記載の方法。
- コーティング層の少なくとも一つがグラファイトコーティング層である、請求項5に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US201361874620P | 2013-09-06 | 2013-09-06 | |
US61/874,620 | 2013-09-06 | ||
PCT/US2014/054274 WO2015035152A1 (en) | 2013-09-06 | 2014-09-05 | Method and apparatus for producing bulk silicon carbide using a silicon carbide seed |
Publications (3)
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JP2016534973A JP2016534973A (ja) | 2016-11-10 |
JP2016534973A5 JP2016534973A5 (ja) | 2017-10-19 |
JP6473455B2 true JP6473455B2 (ja) | 2019-02-20 |
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US (2) | US10793971B2 (ja) |
JP (1) | JP6473455B2 (ja) |
KR (1) | KR102245507B1 (ja) |
CN (2) | CN110578172B (ja) |
DE (1) | DE112014004088T5 (ja) |
TW (2) | TWI665343B (ja) |
WO (1) | WO2015035152A1 (ja) |
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KR102245507B1 (ko) * | 2013-09-06 | 2021-04-28 | 지티에이티 코포레이션 | 탄화규소 시드를 사용하여 벌크 탄화규소를 제조하기 위한 방법 및 장치 |
DE112014004096T5 (de) * | 2013-09-06 | 2016-06-23 | Gtat Corporation | Verfahren zur Herstellung von Massen-Siliciumcarbid |
CN105518191B (zh) * | 2013-09-06 | 2021-05-11 | Gtat公司 | 具有低缺陷密度的大块硅碳化物 |
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RU2770838C1 (ru) * | 2021-05-04 | 2022-04-22 | Юрий Николаевич Макаров | СПОСОБ ВЫРАЩИВАНИЯ МОНОКРИСТАЛЛОВ КАРБИДА КРЕМНИЯ С ПРОВОДИМОСТЬЮ n-ТИПА |
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CN105518189A (zh) | 2016-04-20 |
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US11421343B2 (en) | 2022-08-23 |
KR102245507B1 (ko) | 2021-04-28 |
TWI647348B (zh) | 2019-01-11 |
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US20210095392A1 (en) | 2021-04-01 |
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US20150068446A1 (en) | 2015-03-12 |
US10793971B2 (en) | 2020-10-06 |
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