JP6446827B2 - 分析装置 - Google Patents

分析装置 Download PDF

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Publication number
JP6446827B2
JP6446827B2 JP2014100925A JP2014100925A JP6446827B2 JP 6446827 B2 JP6446827 B2 JP 6446827B2 JP 2014100925 A JP2014100925 A JP 2014100925A JP 2014100925 A JP2014100925 A JP 2014100925A JP 6446827 B2 JP6446827 B2 JP 6446827B2
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JP
Japan
Prior art keywords
state
analysis
unit
analyzer
control computer
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JP2014100925A
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English (en)
Japanese (ja)
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JP2015219039A5 (enExample
JP2015219039A (ja
Inventor
祐介 横井
祐介 横井
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Shimadzu Corp
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Shimadzu Corp
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Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2014100925A priority Critical patent/JP6446827B2/ja
Priority to CN201510236387.5A priority patent/CN105095640B/zh
Priority to US14/708,574 priority patent/US10788799B2/en
Publication of JP2015219039A publication Critical patent/JP2015219039A/ja
Publication of JP2015219039A5 publication Critical patent/JP2015219039A5/ja
Application granted granted Critical
Publication of JP6446827B2 publication Critical patent/JP6446827B2/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B15/00—Systems controlled by a computer
    • G05B15/02—Systems controlled by a computer electric
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00712—Automatic status testing, e.g. at start-up or periodic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N2001/002—Devices for supplying or distributing samples to an analysing apparatus
    • G01N2001/007—Devices specially adapted for forensic samples, e.g. tamper-proofing, sample tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G01N2035/0091—GUI [graphical user interfaces]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00871—Communications between instruments or with remote terminals

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2014100925A 2014-05-14 2014-05-14 分析装置 Active JP6446827B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2014100925A JP6446827B2 (ja) 2014-05-14 2014-05-14 分析装置
CN201510236387.5A CN105095640B (zh) 2014-05-14 2015-05-11 分析装置
US14/708,574 US10788799B2 (en) 2014-05-14 2015-05-11 Sample analyzing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014100925A JP6446827B2 (ja) 2014-05-14 2014-05-14 分析装置

Publications (3)

Publication Number Publication Date
JP2015219039A JP2015219039A (ja) 2015-12-07
JP2015219039A5 JP2015219039A5 (enExample) 2017-02-23
JP6446827B2 true JP6446827B2 (ja) 2019-01-09

Family

ID=54538440

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014100925A Active JP6446827B2 (ja) 2014-05-14 2014-05-14 分析装置

Country Status (3)

Country Link
US (1) US10788799B2 (enExample)
JP (1) JP6446827B2 (enExample)
CN (1) CN105095640B (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017033598A1 (ja) * 2015-08-26 2017-03-02 株式会社日立ハイテクノロジーズ 自動分析装置
CN109496422B (zh) * 2016-07-29 2020-12-01 富士胶片株式会社 相机、相机的设定方法及存储介质
JP6804939B2 (ja) * 2016-11-02 2020-12-23 ソニーモバイルコミュニケーションズ株式会社 情報処理装置及び情報処理方法
EP3584578B1 (en) * 2017-02-16 2021-05-12 FUJIFILM Corporation Immunological test device and operation method for same
JP6822553B2 (ja) * 2017-04-14 2021-01-27 株式会社島津製作所 分析デバイス、コントローラ及び分析システム
JP7238300B2 (ja) * 2018-09-04 2023-03-14 株式会社島津製作所 分析システム、表示制御方法および表示制御プログラム
JP7259859B2 (ja) * 2018-09-27 2023-04-18 株式会社島津製作所 バリデーション装置、バリデーション方法およびバリデーションプログラム
JP7099344B2 (ja) * 2019-02-01 2022-07-12 株式会社島津製作所 化学発光硫黄検出器
JP7794000B2 (ja) * 2022-01-31 2026-01-06 株式会社島津製作所 ユニット型分析装置

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0351760A (ja) * 1989-07-19 1991-03-06 Hitachi Ltd 自動分析装置
US5366896A (en) * 1991-07-30 1994-11-22 University Of Virginia Alumni Patents Foundation Robotically operated laboratory system
JP3849343B2 (ja) * 1998-04-21 2006-11-22 株式会社日立製作所 自動分析装置
JP3898374B2 (ja) * 1999-04-16 2007-03-28 株式会社島津製作所 自動分析装置
JP2000311146A (ja) * 1999-04-28 2000-11-07 Rigaku Industrial Co 蛍光ｘ線分析装置
JP2003121449A (ja) * 2001-10-12 2003-04-23 Hitachi High-Technologies Corp 検体分析システム
JP2003185670A (ja) * 2001-12-20 2003-07-03 Jeol Ltd 分析システム
JP2003329691A (ja) * 2002-05-14 2003-11-19 Fuji Photo Film Co Ltd 生化学分析装置
JP2004286663A (ja) * 2003-03-24 2004-10-14 Shimadzu Corp 自動分析装置
JP4765295B2 (ja) * 2004-10-27 2011-09-07 株式会社島津製作所 分析機器管理装置
JP4840241B2 (ja) * 2007-04-23 2011-12-21 株式会社島津製作所 分析機器制御装置
JP5496912B2 (ja) * 2007-12-27 2014-05-21 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッド グラフィカルな遠隔マルチプロセス監視のための方法及び装置
JP4683397B2 (ja) * 2009-09-18 2011-05-18 株式会社ソニー・コンピュータエンタテインメント 電子機器
JP5275958B2 (ja) * 2009-11-04 2013-08-28 株式会社日立ハイテクノロジーズ 液体クロマトグラフ装置
JP5469000B2 (ja) * 2010-06-17 2014-04-09 株式会社マキタ 電動工具、ロック状態発生判定装置、及びプログラム
JP2012032307A (ja) * 2010-07-30 2012-02-16 Shimadzu Corp 分光光度計
JP5406809B2 (ja) * 2010-09-17 2014-02-05 株式会社日立ハイテクノロジーズ クロマトグラフ装置
JP5480399B2 (ja) * 2010-11-26 2014-04-23 株式会社日立ハイテクノロジーズ 自動分析装置
JP5714970B2 (ja) * 2011-04-20 2015-05-07 シスメックス株式会社 検体処理システム
JP5598435B2 (ja) * 2011-07-07 2014-10-01 株式会社島津製作所 タッチパネルつき液晶表示装置を備えた分析装置
CN102937920B (zh) * 2011-08-15 2016-04-27 联想(北京)有限公司 一种防误操作的方法、装置及电子设备
JP5919838B2 (ja) * 2012-01-20 2016-05-18 株式会社島津製作所 分析装置制御システム
JP5708555B2 (ja) * 2012-04-25 2015-04-30 コニカミノルタ株式会社 操作表示装置及び操作表示方法プログラム
US9117251B2 (en) * 2012-12-18 2015-08-25 ThinkEco, Inc. Systems and methods for plug load control and management

Also Published As

Publication number Publication date
US10788799B2 (en) 2020-09-29
JP2015219039A (ja) 2015-12-07
CN105095640A (zh) 2015-11-25
CN105095640B (zh) 2019-07-05
US20150331401A1 (en) 2015-11-19

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