JP6319523B2 - 検出素子 - Google Patents

検出素子 Download PDF

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Publication number
JP6319523B2
JP6319523B2 JP2017544471A JP2017544471A JP6319523B2 JP 6319523 B2 JP6319523 B2 JP 6319523B2 JP 2017544471 A JP2017544471 A JP 2017544471A JP 2017544471 A JP2017544471 A JP 2017544471A JP 6319523 B2 JP6319523 B2 JP 6319523B2
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JP
Japan
Prior art keywords
electrode
detection element
layer
substrate
anode electrode
Prior art date
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JP2017544471A
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English (en)
Japanese (ja)
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JPWO2017061336A1 (ja
Inventor
浩平 太田
浩平 太田
本村　知久
知久 本村
貴正 高野
貴正 高野
浩一 中山
浩一 中山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
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Publication of JPWO2017061336A1 publication Critical patent/JPWO2017061336A1/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/06—Proportional counter tubes

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
JP2017544471A 2015-10-08 2016-09-30 検出素子 Active JP6319523B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2015200561 2015-10-08
JP2015200561 2015-10-08
JP2015201243 2015-10-09
JP2015201243 2015-10-09
PCT/JP2016/079110 WO2017061336A1 (ja) 2015-10-08 2016-09-30 検出素子

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2018072218A Division JP6569763B2 (ja) 2015-10-08 2018-04-04 検出素子

Publications (2)

Publication Number Publication Date
JPWO2017061336A1 JPWO2017061336A1 (ja) 2018-03-29
JP6319523B2 true JP6319523B2 (ja) 2018-05-09

Family

ID=58487527

Family Applications (2)

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JP2017544471A Active JP6319523B2 (ja) 2015-10-08 2016-09-30 検出素子
JP2018072218A Active JP6569763B2 (ja) 2015-10-08 2018-04-04 検出素子

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2018072218A Active JP6569763B2 (ja) 2015-10-08 2018-04-04 検出素子

Country Status (5)

Country Link
US (1) US10712453B2 (de)
EP (1) EP3361492B1 (de)
JP (2) JP6319523B2 (de)
CN (1) CN108140534B (de)
WO (1) WO2017061336A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6977807B2 (ja) * 2015-10-29 2021-12-08 大日本印刷株式会社 放射線検出素子
JP6645529B2 (ja) * 2018-02-28 2020-02-14 大日本印刷株式会社 検出素子、検出素子の製造方法、および検出装置
JP6645528B2 (ja) * 2018-02-28 2020-02-14 大日本印刷株式会社 検出素子、検出素子の製造方法、および検出装置
JP7032738B2 (ja) * 2018-09-13 2022-03-09 国立大学法人京都大学 検出素子、放射線検出装置、およびコンプトンカメラ
JP6737316B2 (ja) * 2018-10-26 2020-08-05 大日本印刷株式会社 放射線検出素子
JP7287116B2 (ja) * 2019-05-30 2023-06-06 セイコーエプソン株式会社 振動デバイスおよび電子機器
JP7342722B2 (ja) * 2020-01-30 2023-09-12 大日本印刷株式会社 電子増幅器、検出素子及び検出装置
CN114469118A (zh) * 2020-10-23 2022-05-13 Oppo广东移动通信有限公司 电子设备及可穿戴设备

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4303798A (en) 1979-04-27 1981-12-01 Kollmorgen Technologies Corporation Heat shock resistant printed circuit board assemblies
ATE176120T1 (de) * 1993-04-16 1999-02-15 Heinze Dyconex Patente Kern für elektrische verbindungssubstrate und elektrische verbindungssubstrate mit kern, sowie verfahren zu deren herstellung
JP3535045B2 (ja) 1999-07-01 2004-06-07 独立行政法人 科学技術振興機構 ＭＳＧＣによる反跳電子の軌跡映像からのγ線入射方向決定装置
JP3354551B2 (ja) * 2000-06-27 2002-12-09 科学技術振興事業団 ピクセル型電極によるガス増幅を用いた粒子線画像検出器
US7091589B2 (en) * 2002-12-11 2006-08-15 Dai Nippon Printing Co., Ltd. Multilayer wiring board and manufacture method thereof
JP4391391B2 (ja) 2004-11-12 2009-12-24 大日本印刷株式会社 放射線検出器の製造方法
JP4716819B2 (ja) * 2005-08-22 2011-07-06 新光電気工業株式会社 インターポーザの製造方法
JP5540471B2 (ja) * 2008-04-28 2014-07-02 大日本印刷株式会社 ガス増幅を用いた放射線検出器
JP5471051B2 (ja) * 2008-06-23 2014-04-16 大日本印刷株式会社 ガス増幅を用いた放射線検出器、及び放射線検出器の製造方法
JP5246103B2 (ja) * 2008-10-16 2013-07-24 大日本印刷株式会社 貫通電極基板の製造方法
JP5471268B2 (ja) * 2008-12-26 2014-04-16 大日本印刷株式会社 貫通電極基板及びその製造方法
JP2011017695A (ja) * 2009-06-09 2011-01-27 Dainippon Printing Co Ltd 放射線検出器、及び放射線検出方法
JP6281268B2 (ja) * 2013-12-06 2018-02-21 大日本印刷株式会社 ガス増幅を用いた放射線検出器

Also Published As

Publication number Publication date
JP6569763B2 (ja) 2019-09-04
JPWO2017061336A1 (ja) 2018-03-29
EP3361492B1 (de) 2022-08-24
CN108140534B (zh) 2020-07-07
JP2018142543A (ja) 2018-09-13
US20180246226A1 (en) 2018-08-30
US10712453B2 (en) 2020-07-14
CN108140534A (zh) 2018-06-08
WO2017061336A1 (ja) 2017-04-13
EP3361492A1 (de) 2018-08-15
EP3361492A4 (de) 2019-06-05

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