JP6318084B2 - 半導体装置及びその製造方法 - Google Patents

半導体装置及びその製造方法 Download PDF

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Publication number
JP6318084B2
JP6318084B2 JP2014254997A JP2014254997A JP6318084B2 JP 6318084 B2 JP6318084 B2 JP 6318084B2 JP 2014254997 A JP2014254997 A JP 2014254997A JP 2014254997 A JP2014254997 A JP 2014254997A JP 6318084 B2 JP6318084 B2 JP 6318084B2
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Japan
Prior art keywords
wiring layer
electronic component
plated wiring
resin
cavity
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JP2014254997A
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English (en)
Japanese (ja)
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JP2016115870A5 (https=
JP2016115870A (ja
Inventor
亮 深澤
亮 深澤
堀内 道夫
道夫 堀内
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Shinko Electric Industries Co Ltd
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Shinko Electric Industries Co Ltd
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Publication date
Application filed by Shinko Electric Industries Co Ltd filed Critical Shinko Electric Industries Co Ltd
Priority to JP2014254997A priority Critical patent/JP6318084B2/ja
Priority to US14/946,953 priority patent/US9721876B2/en
Publication of JP2016115870A publication Critical patent/JP2016115870A/ja
Publication of JP2016115870A5 publication Critical patent/JP2016115870A5/ja
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/811Multiple chips on leadframes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/01Manufacture or treatment
    • H10W74/012Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/15Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/70Fillings or auxiliary members in containers or in encapsulations for thermal protection or control
    • H10W40/77Auxiliary members characterised by their shape
    • H10W40/778Auxiliary members characterised by their shape in encapsulations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/40Leadframes
    • H10W70/411Chip-supporting parts, e.g. die pads
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/40Leadframes
    • H10W70/411Chip-supporting parts, e.g. die pads
    • H10W70/417Bonding materials between chips and die pads
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/111Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed

Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Physics & Mathematics (AREA)
  • Geometry (AREA)
JP2014254997A 2014-12-17 2014-12-17 半導体装置及びその製造方法 Active JP6318084B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014254997A JP6318084B2 (ja) 2014-12-17 2014-12-17 半導体装置及びその製造方法
US14/946,953 US9721876B2 (en) 2014-12-17 2015-11-20 Semiconductor device and method of making the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014254997A JP6318084B2 (ja) 2014-12-17 2014-12-17 半導体装置及びその製造方法

Publications (3)

Publication Number Publication Date
JP2016115870A JP2016115870A (ja) 2016-06-23
JP2016115870A5 JP2016115870A5 (https=) 2017-08-17
JP6318084B2 true JP6318084B2 (ja) 2018-04-25

Family

ID=56130319

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014254997A Active JP6318084B2 (ja) 2014-12-17 2014-12-17 半導体装置及びその製造方法

Country Status (2)

Country Link
US (1) US9721876B2 (https=)
JP (1) JP6318084B2 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10229901B2 (en) * 2016-06-27 2019-03-12 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion interconnections for semiconductor devices and methods of manufacture thereof
JP2018107394A (ja) 2016-12-28 2018-07-05 新光電気工業株式会社 配線基板及び電子部品装置とそれらの製造方法
US10957672B2 (en) * 2017-11-13 2021-03-23 Taiwan Semiconductor Manufacturing Company, Ltd. Package structure and method of manufacturing the same

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001015644A (ja) * 1999-06-28 2001-01-19 Toshiba Corp 半導体パッケージ及びその製造方法
AU2003299866A1 (en) * 2003-02-25 2004-09-28 Tessera, Inc. High frequency chip packages with connecting elements
JP2004319530A (ja) * 2003-02-28 2004-11-11 Sanyo Electric Co Ltd 光半導体装置およびその製造方法
JP4243178B2 (ja) * 2003-12-25 2009-03-25 新光電気工業株式会社 半導体装置の製造方法
US20060091516A1 (en) * 2004-11-01 2006-05-04 Akira Matsunami Flexible leaded stacked semiconductor package
US7462925B2 (en) * 2004-11-12 2008-12-09 Macronix International Co., Ltd. Method and apparatus for stacking electrical components using via to provide interconnection
JP2006165175A (ja) * 2004-12-06 2006-06-22 Alps Electric Co Ltd 回路部品モジュールおよび電子回路装置並びに回路部品モジュールの製造方法
US8093694B2 (en) * 2005-02-14 2012-01-10 Stats Chippac Ltd. Method of manufacturing non-leaded integrated circuit package system having etched differential height lead structures
JP4897451B2 (ja) 2006-12-04 2012-03-14 ルネサスエレクトロニクス株式会社 半導体装置
JP2009026960A (ja) * 2007-07-19 2009-02-05 Mitsubishi Electric Corp 半導体装置
JP5068133B2 (ja) * 2007-10-17 2012-11-07 新光電気工業株式会社 半導体チップ積層構造体及び半導体装置
JP5707902B2 (ja) * 2010-12-02 2015-04-30 ソニー株式会社 半導体装置及びその製造方法

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Publication number Publication date
US9721876B2 (en) 2017-08-01
US20160181190A1 (en) 2016-06-23
JP2016115870A (ja) 2016-06-23

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