JP6311469B2 - 物理量センサ - Google Patents
物理量センサ Download PDFInfo
- Publication number
- JP6311469B2 JP6311469B2 JP2014121688A JP2014121688A JP6311469B2 JP 6311469 B2 JP6311469 B2 JP 6311469B2 JP 2014121688 A JP2014121688 A JP 2014121688A JP 2014121688 A JP2014121688 A JP 2014121688A JP 6311469 B2 JP6311469 B2 JP 6311469B2
- Authority
- JP
- Japan
- Prior art keywords
- sensor
- angular velocity
- acceleration sensor
- physical quantity
- acceleration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000001133 acceleration Effects 0.000 claims description 98
- 239000000853 adhesive Substances 0.000 claims description 33
- 230000001070 adhesive effect Effects 0.000 claims description 33
- 230000002093 peripheral effect Effects 0.000 claims description 11
- 239000002184 metal Substances 0.000 claims description 9
- 238000002955 isolation Methods 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 description 27
- 239000000758 substrate Substances 0.000 description 13
- 230000004308 accommodation Effects 0.000 description 9
- 239000004065 semiconductor Substances 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 5
- 230000003071 parasitic effect Effects 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 2
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000005459 micromachining Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5607—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks
- G01C19/5621—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks the devices involving a micromechanical structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/02—Microstructural systems; Auxiliary parts of microstructural devices or systems containing distinct electrical or optical devices of particular relevance for their function, e.g. microelectro-mechanical systems [MEMS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5607—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks
- G01C19/5628—Manufacturing; Trimming; Mounting; Housings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5783—Mountings or housings not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/071—Mounting of piezoelectric or electrostrictive parts together with semiconductor elements, or other circuit elements, on a common substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/072—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
- H10N30/073—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies by fusion of metals or by adhesives
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/101—Piezoelectric or electrostrictive devices with electrical and mechanical input and output, e.g. having combined actuator and sensor parts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/30—Piezoelectric or electrostrictive devices with mechanical input and electrical output, e.g. functioning as generators or sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/80—Constructional details
- H10N30/88—Mounts; Supports; Enclosures; Casings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0808—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate
- G01P2015/0811—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass
- G01P2015/0814—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass for translational movement of the mass, e.g. shuttle type
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Gyroscopes (AREA)
- Pressure Sensors (AREA)
- Micromachines (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014121688A JP6311469B2 (ja) | 2014-06-12 | 2014-06-12 | 物理量センサ |
| MYPI2016704072A MY186015A (en) | 2014-06-12 | 2015-06-11 | Physical quantity sensor |
| PCT/JP2015/002921 WO2015190105A1 (ja) | 2014-06-12 | 2015-06-11 | 物理量センサ |
| DE112015002777.7T DE112015002777T5 (de) | 2014-06-12 | 2015-06-11 | Sensor für eine physikalische Grösse |
| US15/308,866 US20170074653A1 (en) | 2014-06-12 | 2015-06-11 | Physical quantity sensor |
| CN201580030809.1A CN106662601A (zh) | 2014-06-12 | 2015-06-11 | 物理量传感器 |
| US16/444,160 US20190301866A1 (en) | 2014-06-12 | 2019-06-18 | Physical quantity sensor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014121688A JP6311469B2 (ja) | 2014-06-12 | 2014-06-12 | 物理量センサ |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016001156A JP2016001156A (ja) | 2016-01-07 |
| JP2016001156A5 JP2016001156A5 (OSRAM) | 2016-06-16 |
| JP6311469B2 true JP6311469B2 (ja) | 2018-04-18 |
Family
ID=54833216
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014121688A Active JP6311469B2 (ja) | 2014-06-12 | 2014-06-12 | 物理量センサ |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US20170074653A1 (OSRAM) |
| JP (1) | JP6311469B2 (OSRAM) |
| CN (1) | CN106662601A (OSRAM) |
| DE (1) | DE112015002777T5 (OSRAM) |
| MY (1) | MY186015A (OSRAM) |
| WO (1) | WO2015190105A1 (OSRAM) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6464749B2 (ja) * | 2015-01-06 | 2019-02-06 | セイコーエプソン株式会社 | 物理量センサー、電子機器および移動体 |
| JP6641878B2 (ja) * | 2015-10-21 | 2020-02-05 | セイコーエプソン株式会社 | 物理量センサー、電子機器および移動体 |
| US10352960B1 (en) * | 2015-10-30 | 2019-07-16 | Garmin International, Inc. | Free mass MEMS accelerometer |
| US10495663B2 (en) * | 2016-02-19 | 2019-12-03 | The Regents Of The University Of Michigan | High aspect-ratio low noise multi-axis accelerometers |
| JP2019120559A (ja) * | 2017-12-28 | 2019-07-22 | セイコーエプソン株式会社 | 物理量センサー、物理量センサーの製造方法、物理量センサーデバイス、電子機器および移動体 |
| US11493531B2 (en) * | 2019-11-07 | 2022-11-08 | Honeywell International Inc. | Resonator electrode configuration to avoid capacitive feedthrough for vibrating beam accelerometers |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4332944A1 (de) * | 1993-09-28 | 1995-03-30 | Bosch Gmbh Robert | Sensor mit einer Quarz-Stimmgabel |
| CN101189489B (zh) * | 2005-06-09 | 2011-12-07 | 松下电器产业株式会社 | 复合传感器 |
| JP4534912B2 (ja) * | 2005-08-30 | 2010-09-01 | 株式会社デンソー | 角速度センサの取付構造 |
| JP2007248328A (ja) * | 2006-03-17 | 2007-09-27 | Matsushita Electric Ind Co Ltd | 複合センサ |
| JP2008082812A (ja) * | 2006-09-27 | 2008-04-10 | Denso Corp | センサ装置およびその製造方法 |
| CN101796374A (zh) * | 2007-09-03 | 2010-08-04 | 松下电器产业株式会社 | 惯性力传感器 |
| JP2009092545A (ja) * | 2007-10-10 | 2009-04-30 | Panasonic Corp | 角速度および加速度検出用複合センサ |
| JP4973443B2 (ja) * | 2007-10-22 | 2012-07-11 | 株式会社デンソー | センサ装置 |
| JP2011117858A (ja) * | 2009-12-04 | 2011-06-16 | Seiko Epson Corp | 物理量検出装置 |
| WO2012049825A1 (ja) * | 2010-10-15 | 2012-04-19 | 日立オートモティブシステムズ株式会社 | 物理量検出装置 |
| WO2012124282A1 (ja) * | 2011-03-11 | 2012-09-20 | パナソニック株式会社 | センサ |
| JP2014021038A (ja) * | 2012-07-23 | 2014-02-03 | Seiko Epson Corp | 振動片、振動片の製造方法、振動子、電子デバイス、電子機器、および移動体 |
-
2014
- 2014-06-12 JP JP2014121688A patent/JP6311469B2/ja active Active
-
2015
- 2015-06-11 CN CN201580030809.1A patent/CN106662601A/zh active Pending
- 2015-06-11 MY MYPI2016704072A patent/MY186015A/en unknown
- 2015-06-11 US US15/308,866 patent/US20170074653A1/en not_active Abandoned
- 2015-06-11 DE DE112015002777.7T patent/DE112015002777T5/de not_active Ceased
- 2015-06-11 WO PCT/JP2015/002921 patent/WO2015190105A1/ja not_active Ceased
-
2019
- 2019-06-18 US US16/444,160 patent/US20190301866A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| WO2015190105A1 (ja) | 2015-12-17 |
| US20170074653A1 (en) | 2017-03-16 |
| JP2016001156A (ja) | 2016-01-07 |
| CN106662601A (zh) | 2017-05-10 |
| DE112015002777T5 (de) | 2017-03-02 |
| US20190301866A1 (en) | 2019-10-03 |
| MY186015A (en) | 2021-06-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6311469B2 (ja) | 物理量センサ | |
| CN103376100B (zh) | 振动片和陀螺传感器、以及电子设备和移动体 | |
| JP6372361B2 (ja) | 複合センサ | |
| JP6258051B2 (ja) | 角速度センサ、センサ素子及びセンサ素子の製造方法 | |
| JP2018162976A (ja) | 物理量センサー、電子機器および移動体 | |
| JP6409351B2 (ja) | 物理量センサ | |
| JP6512006B2 (ja) | センサ装置 | |
| JP6627663B2 (ja) | 物理量センサ | |
| JP5775281B2 (ja) | Memsセンサおよびその製造方法 | |
| JP6604170B2 (ja) | 振動型角速度センサ | |
| JP6464770B2 (ja) | 物理量センサおよびその製造方法 | |
| JP2006302943A (ja) | マイクロ構造体 | |
| JP2013003067A (ja) | Memsデバイス | |
| JP7403069B2 (ja) | 物理量センサ | |
| JP5776184B2 (ja) | センサ装置 | |
| JP2012194032A (ja) | センサ装置 | |
| WO2014030492A1 (ja) | 慣性力センサ | |
| JP2014119369A (ja) | 物理量検出センサー、物理量検出装置、電子機器および移動体 | |
| JP5954531B2 (ja) | 物理量検出デバイス、物理量検出器、および電子機器 | |
| JP2006226799A (ja) | 力学量センサ | |
| JP2014157162A (ja) | 慣性力センサ | |
| CN120528379A (zh) | 振动器件及其制造方法 | |
| JP2010266320A (ja) | 角速度センサ装置およびその製造方法 | |
| JP2017020812A (ja) | 発振装置および力学量センサ | |
| JP2017022461A (ja) | 発振装置および力学量センサ |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20160426 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20170217 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20180220 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20180305 |
|
| R151 | Written notification of patent or utility model registration |
Ref document number: 6311469 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R151 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |