JP6200092B2 - ヒーター部材及びそれを有する基板処理装置 - Google Patents
ヒーター部材及びそれを有する基板処理装置 Download PDFInfo
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- JP6200092B2 JP6200092B2 JP2016538486A JP2016538486A JP6200092B2 JP 6200092 B2 JP6200092 B2 JP 6200092B2 JP 2016538486 A JP2016538486 A JP 2016538486A JP 2016538486 A JP2016538486 A JP 2016538486A JP 6200092 B2 JP6200092 B2 JP 6200092B2
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- 239000000758 substrate Substances 0.000 title claims description 90
- 238000000034 method Methods 0.000 claims description 36
- 238000010438 heat treatment Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 6
- 238000007665 sagging Methods 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims description 3
- 239000012466 permeate Substances 0.000 claims description 3
- 239000010453 quartz Substances 0.000 claims description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 230000005855 radiation Effects 0.000 claims description 2
- 239000002184 metal Substances 0.000 claims 32
- 238000010926 purge Methods 0.000 claims 5
- 238000006073 displacement reaction Methods 0.000 claims 1
- 239000007789 gas Substances 0.000 description 46
- 238000000231 atomic layer deposition Methods 0.000 description 6
- 238000002347 injection Methods 0.000 description 6
- 239000007924 injection Substances 0.000 description 6
- 239000012495 reaction gas Substances 0.000 description 6
- 238000000151 deposition Methods 0.000 description 4
- 230000008021 deposition Effects 0.000 description 4
- 239000010408 film Substances 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 238000005137 deposition process Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 239000006227 byproduct Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
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- C23C16/45565—Shower nozzles
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
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- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
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Description
輻射方式に伝達するための輻射熱の伝達空間が成されることができる。
ガスの供給部材が使用されたが、工程の特性によって3つ以上の互に異なる
反応ガスを供給できるように複数個のガスの供給部材が適用されることは当然である。
本発明が属する記述分野で通常の知識を有する者であれば、本発明の本質的な特性から逸脱しない範囲で多様な修正及び変形が可能である。したがって、本発明に開示された実施形態は、本発明の技術思想を限定することではなく、単なる説明するためのことであり、このような実施形態によって本発明の技術思想の範囲が限定されることではない。本発明の保護範囲は、下の請求の範囲によって解釈しなければならないし、それと同等な範囲内にある全ての技術思想は、本発明の権利範囲に含まれることとして解釈されるべきである。
Claims (13)
- 基板処理装置において、
工程チャンバーと、
前記工程チャンバーに設置されて同一の平面上に複数の基板が置かれ、回転軸に連結されて回転される基板サセプタと、
前記基板サセプタの底面に位置されるヒーター部材と、
前記基板サセプタに置かれた複数の基板が各々に対応する位置で基板の処理面の全体にガスを噴射する噴射部材と、を含み、
前記ヒーター部材は、
内部空間を有し、前記内部空間に前記基板サセプタを加熱するための熱金属線が前記基板サセプタの回転軸を中心に同心円上に水平及び垂直に複数の列に配置されることと、
前記熱金属線の熱膨張による熱金属線の垂れ及びずれを防止するために前記熱金属線を支持する熱金属線サポーターをさらに含むことと
を特徴とし、
前記熱金属線サポーターは、
下敷きブロックと、
前記下敷きブロックの上面に設置され、前記熱金属線との接触面を最少化して熱損失を防止し、前記熱金属線の高熱による前記熱金属線サポーターの破損を防止するために前記熱金属線と点接触される棒形状の支持棒と、を含むことを特徴とする基板処理装置。 - 前記熱金属線サポーターは、
前記熱金属線の熱膨張による流動性の確保のために前記熱金属線の長手方向と直交する方向に形成されて凹んだ支持面を含むことを特徴とする、請求項1に記載の基板処理装置。 - 前記支持棒は、前記熱金属線と同一の材質であることを特徴とする請求項1に記載の基板処理装置。
- 前記支持棒は、
前記熱金属線の長手方向と直交する方向により長い形状で提供されることを特徴とする請求項1に記載の基板処理装置。 - 前記ヒーター部材は、
前記熱金属線が設置された内部空間が前記工程チャンバーの内部と隔離されるように上部壁と下部壁、そして側壁によって提供されるハウジングをさらに含む請求項1に記載の基板処理装置。 - 前記ヒーター部材は、
前記下部壁に提供され、工程ガスが前記内部空間に浸透することができないように前記内部空間にパージガスを供給する供給ポートをさらに含むことを特徴とする請求項5に記載の基板処理装置。 - 前記ヒーター部材は、
前記下部壁に提供され、前記供給ポートを通じて前記内部空間に供給されたパージガスが排気される排気ポートをさらに含むことを特徴とする請求項6に記載の基板処理装置。 - 前記ヒーター部材は、
前記ハウジングの側壁に形成され、前記供給ポートを通じて前記内部空間に供給されたパージガスが排気されるサイドホールを含むことを特徴とする請求項6に記載の基板処理装置。 - 前記上部壁は、前記熱金属線から放出される輻射熱を通過させる透明な石英の材質で成されることを特徴とする請求項5に記載の基板処理装置。
- 前記基板サセプタと前記ヒーター部材との間に前記熱金属線の熱源を輻射方式に伝達するための輻射熱の伝達空間が形成されていることを特徴とする請求項1に記載の基板処理装置。
- 基板サセプタを加熱するためのヒーター部材において、
外部環境と隔離されるように上部壁と下部壁、そして側壁によって内部空間が提供されるハウジングと、
前記内部空間に前記基板サセプタを加熱するための熱金属線と、
前記熱金属線の熱膨張による熱金属線の垂れ及びずれを防止するために前記熱金属線を支持する熱金属線サポーターと、を含み、
前記熱金属線が前記基板サセプタを中心に同心円上に水平及び垂直に複数の列に配置されることを特徴とし、
前記熱金属線サポーターは、
下敷きブロックと、
前記下敷きブロックの上面に設置され、前記熱金属線との接触面を最少化して熱損失を防止し、前記熱金属線の高熱による前記熱金属線サポーターの破損を防止するために前記熱金属線と点で接触される棒形状の支持棒と、を含むことを特徴とするヒーター部材。 - 前記熱金属線サポーターは、
前記熱金属線の熱膨張による流動性の確保のために前記熱金属線の長手方向と直交する方向に形成されて凹んだ支持面を含むことを特徴とする請求項11に記載のヒーター部材。 - 前記ヒーター部材は、
工程ガスが前記内部空間に浸透することができないように前記内部空間にパージガスを供給する供給ポートと、
前記供給ポートを通じて前記内部空間に供給されたパージガスが排気される排気ポートと、をさらに含むことを特徴とする請求項11に記載のヒーター部材。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2013-0112841 | 2013-09-23 | ||
KR1020130112841A KR101466816B1 (ko) | 2013-09-23 | 2013-09-23 | 히터 부재 및 그것을 갖는 기판 처리 장치 |
PCT/KR2014/002385 WO2015041392A1 (ko) | 2013-09-23 | 2014-03-21 | 히터 부재 및 그것을 갖는 기판 처리 장치 |
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CN (1) | CN105580127B (ja) |
TW (1) | TWI580813B (ja) |
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US20170353994A1 (en) * | 2016-06-06 | 2017-12-07 | Applied Materials, Inc. | Self-centering pedestal heater |
IT201600099783A1 (it) * | 2016-10-05 | 2018-04-05 | Lpe Spa | Reattore per deposizione epitassiale con riflettore esterno alla camera di reazione e metodo di raffreddamento di un suscettore e di substrati |
KR102238016B1 (ko) * | 2019-11-07 | 2021-04-08 | 주식회사 한화 | 열 구멍이 마련된 기판 처리 장치 |
KR102621848B1 (ko) * | 2020-12-18 | 2024-01-09 | 세메스 주식회사 | 지지 유닛 및 기판 처리 장치 |
DE102023100077A1 (de) * | 2023-01-03 | 2024-07-04 | Aixtron Se | Vorrichtung und Verfahren zum Behandeln von Substraten |
WO2024201596A1 (ja) * | 2023-03-24 | 2024-10-03 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法及びプログラム |
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US5062386A (en) * | 1987-07-27 | 1991-11-05 | Epitaxy Systems, Inc. | Induction heated pancake epitaxial reactor |
JP2966397B1 (ja) * | 1998-06-17 | 1999-10-25 | 助川電気工業株式会社 | 板体加熱装置 |
US6576062B2 (en) * | 2000-01-06 | 2003-06-10 | Tokyo Electron Limited | Film forming apparatus and film forming method |
JP4374746B2 (ja) * | 2000-07-21 | 2009-12-02 | パナソニック株式会社 | 誘導加熱調理器 |
JP3713220B2 (ja) * | 2001-06-15 | 2005-11-09 | 日本特殊陶業株式会社 | セラミックヒータ |
KR100890493B1 (ko) * | 2003-04-18 | 2009-03-26 | 가부시키가이샤 히다치 고쿠사이 덴키 | 반도체 제조 장치 |
JP2004342450A (ja) * | 2003-05-15 | 2004-12-02 | Kokusai Electric Semiconductor Service Inc | 高周波誘導加熱装置及び半導体製造装置 |
KR20060064067A (ko) * | 2003-09-03 | 2006-06-12 | 동경 엘렉트론 주식회사 | 가스 처리 장치 및 처리 가스 토출 기구의 방열 방법 |
KR101289344B1 (ko) * | 2006-05-15 | 2013-07-29 | 주성엔지니어링(주) | 기판 처리 장치 |
JP5056735B2 (ja) * | 2008-12-02 | 2012-10-24 | 東京エレクトロン株式会社 | 成膜装置 |
JP5181100B2 (ja) * | 2009-04-09 | 2013-04-10 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法及び記憶媒体 |
JP5087657B2 (ja) * | 2009-08-04 | 2012-12-05 | 株式会社日立国際電気 | 半導体装置の製造方法及び基板処理装置 |
US20120170241A1 (en) * | 2009-09-16 | 2012-07-05 | Hideo Nakako | Printing ink, metal nanoparticles used in the same, wiring, circuit board, and semiconductor package |
JP5787563B2 (ja) * | 2010-05-11 | 2015-09-30 | 株式会社日立国際電気 | ヒータ支持装置及び加熱装置及び基板処理装置及び半導体装置の製造方法及び基板の製造方法及び保持用ピース |
JP5743188B2 (ja) * | 2011-02-15 | 2015-07-01 | 横河電機株式会社 | ヒータ管 |
KR20130007149A (ko) * | 2011-06-29 | 2013-01-18 | 세메스 주식회사 | 기판처리장치 |
JP5712879B2 (ja) * | 2011-09-22 | 2015-05-07 | 東京エレクトロン株式会社 | 成膜装置及び基板処理装置 |
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TW201512450A (zh) | 2015-04-01 |
WO2015041392A1 (ko) | 2015-03-26 |
CN105580127B (zh) | 2019-05-21 |
CN105580127A (zh) | 2016-05-11 |
TWI580813B (zh) | 2017-05-01 |
US20160230282A1 (en) | 2016-08-11 |
KR101466816B1 (ko) | 2014-12-10 |
JP2016537822A (ja) | 2016-12-01 |
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