JP6149674B2 - 放射線ct装置 - Google Patents
放射線ct装置 Download PDFInfo
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- JP6149674B2 JP6149674B2 JP2013211738A JP2013211738A JP6149674B2 JP 6149674 B2 JP6149674 B2 JP 6149674B2 JP 2013211738 A JP2013211738 A JP 2013211738A JP 2013211738 A JP2013211738 A JP 2013211738A JP 6149674 B2 JP6149674 B2 JP 6149674B2
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| JP2013211738A JP6149674B2 (ja) | 2013-10-09 | 2013-10-09 | 放射線ct装置 |
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| Application Number | Priority Date | Filing Date | Title |
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| JP2013211738A JP6149674B2 (ja) | 2013-10-09 | 2013-10-09 | 放射線ct装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015075394A JP2015075394A (ja) | 2015-04-20 |
| JP2015075394A5 JP2015075394A5 (enExample) | 2016-02-18 |
| JP6149674B2 true JP6149674B2 (ja) | 2017-06-21 |
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| Application Number | Title | Priority Date | Filing Date |
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| JP2013211738A Active JP6149674B2 (ja) | 2013-10-09 | 2013-10-09 | 放射線ct装置 |
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| JP (1) | JP6149674B2 (enExample) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1119082A (ja) * | 1997-06-30 | 1999-01-26 | Toshiba Corp | 画像再構成装置 |
| US6333960B1 (en) * | 1999-03-22 | 2001-12-25 | Siemens Corporate Research, Inc. | Exact region of interest cone beam imaging without circle scans |
| EP1933170A1 (en) * | 2006-12-07 | 2008-06-18 | Universiteit Gent | Method and system for computed tomography using transmission and fluorescence measurements |
| JP2009276163A (ja) * | 2008-05-14 | 2009-11-26 | Shimadzu Corp | X線断層像撮影装置 |
| JP5536607B2 (ja) * | 2010-10-13 | 2014-07-02 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | X線ct装置 |
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| JP2015075394A (ja) | 2015-04-20 |
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