JP6134975B2 - 測定用デバイス、測定装置および方法 - Google Patents

測定用デバイス、測定装置および方法 Download PDF

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Publication number
JP6134975B2
JP6134975B2 JP2013080164A JP2013080164A JP6134975B2 JP 6134975 B2 JP6134975 B2 JP 6134975B2 JP 2013080164 A JP2013080164 A JP 2013080164A JP 2013080164 A JP2013080164 A JP 2013080164A JP 6134975 B2 JP6134975 B2 JP 6134975B2
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Japan
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light
convex structure
measurement
fine concavo
sample
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JP2013080164A
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Japanese (ja)
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JP2014202650A5 (enExample
JP2014202650A (ja
Inventor
納谷　昌之
昌之 納谷
昇吾 山添
昇吾 山添
芽実 塩田
芽実 塩田
誠 末松
誠 末松
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Fujifilm Corp
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Fujifilm Corp
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Priority to JP2013080164A priority Critical patent/JP6134975B2/ja
Priority to PCT/JP2014/001985 priority patent/WO2014167828A1/ja
Publication of JP2014202650A publication Critical patent/JP2014202650A/ja
Priority to US14/875,129 priority patent/US9728388B2/en
Publication of JP2014202650A5 publication Critical patent/JP2014202650A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/068—Optics, miscellaneous
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2013080164A 2013-04-08 2013-04-08 測定用デバイス、測定装置および方法 Expired - Fee Related JP6134975B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2013080164A JP6134975B2 (ja) 2013-04-08 2013-04-08 測定用デバイス、測定装置および方法
PCT/JP2014/001985 WO2014167828A1 (ja) 2013-04-08 2014-04-07 測定用デバイス、測定装置および方法
US14/875,129 US9728388B2 (en) 2013-04-08 2015-10-05 Measurement device, measurement apparatus, and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013080164A JP6134975B2 (ja) 2013-04-08 2013-04-08 測定用デバイス、測定装置および方法

Publications (3)

Publication Number Publication Date
JP2014202650A JP2014202650A (ja) 2014-10-27
JP2014202650A5 JP2014202650A5 (enExample) 2016-01-21
JP6134975B2 true JP6134975B2 (ja) 2017-05-31

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JP2013080164A Expired - Fee Related JP6134975B2 (ja) 2013-04-08 2013-04-08 測定用デバイス、測定装置および方法

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US (1) US9728388B2 (enExample)
JP (1) JP6134975B2 (enExample)
WO (1) WO2014167828A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11282688B2 (en) 2015-03-06 2022-03-22 Micromass Uk Limited Spectrometric analysis of microbes
EP3265822B1 (en) 2015-03-06 2021-04-28 Micromass UK Limited Tissue analysis by mass spectrometry or ion mobility spectrometry
US10777398B2 (en) 2015-03-06 2020-09-15 Micromass Uk Limited Spectrometric analysis
CN108700590B (zh) 2015-03-06 2021-03-02 英国质谱公司 细胞群体分析
WO2016181908A1 (ja) * 2015-05-08 2016-11-17 旭硝子株式会社 質量分析用試料プレート、質量分析方法および質量分析装置
GB201517195D0 (en) * 2015-09-29 2015-11-11 Micromass Ltd Capacitively coupled reims technique and optically transparent counter electrode
JP6534215B2 (ja) * 2016-01-05 2019-06-26 日本電子株式会社 測定方法
JP6549309B2 (ja) * 2016-03-18 2019-07-24 シチズンファインデバイス株式会社 試料積載プレート及びその製造方法
EP3443354B1 (en) 2016-04-14 2025-08-20 Micromass UK Limited Spectrometric analysis of plants
US11075065B2 (en) * 2016-12-13 2021-07-27 University-Industry Foundation (Uif), Yonsei University Sample plate, method of fabricating the same and mass spectrometer analysis by using the same
JP7205271B2 (ja) * 2019-02-08 2023-01-17 株式会社デンソー センシングシステム
CN113092374B (zh) * 2021-04-12 2022-11-15 青岛科技大学 小型真空光电测试系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9518429D0 (en) 1995-09-08 1995-11-08 Pharmacia Biosensor A rapid method for providing kinetic and structural data in molecular interaction analysis
JP2007171003A (ja) * 2005-12-22 2007-07-05 Fujifilm Corp 質量分析用基板並びに分析方法および装置
JP5049549B2 (ja) 2006-10-25 2012-10-17 キヤノン株式会社 質量分析用基板、その製造方法および質量分析測定装置
JP5069497B2 (ja) 2007-05-24 2012-11-07 富士フイルム株式会社 質量分析用デバイス及びそれを用いた質量分析装置
JP4993360B2 (ja) * 2007-06-08 2012-08-08 富士フイルム株式会社 微細構造体及びその製造方法、光電場増強デバイス
US8071938B2 (en) * 2008-03-20 2011-12-06 The Mitre Corporation Multi-modal particle detector
WO2010044274A1 (ja) * 2008-10-17 2010-04-22 国立大学法人東京工業大学 光学式センサーおよびその製造方法並びに光学式センサーを用いた検出方法
JP5521177B2 (ja) 2010-04-28 2014-06-11 株式会社島津製作所 質量分析装置
JP2011246307A (ja) * 2010-05-26 2011-12-08 Panasonic Electric Works Co Ltd 膜硬度計測方法及び成膜装置
JP5553717B2 (ja) * 2010-09-17 2014-07-16 富士フイルム株式会社 光電場増強デバイスを用いた光の測定方法および測定装置
JP5763910B2 (ja) 2010-11-30 2015-08-12 パナソニック株式会社 排水構造
JP5709582B2 (ja) * 2011-02-28 2015-04-30 キヤノン株式会社 ラマン振動の強度分布情報と質量分布情報とを位置合わせする方法
JP5947182B2 (ja) * 2012-09-28 2016-07-06 富士フイルム株式会社 光電場増強デバイスを用いた測定装置

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US9728388B2 (en) 2017-08-08
US20160027631A1 (en) 2016-01-28
WO2014167828A1 (ja) 2014-10-16
JP2014202650A (ja) 2014-10-27

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