JP5979740B2 - 炭化ケイ素単結晶成長装置及びその方法 - Google Patents
炭化ケイ素単結晶成長装置及びその方法 Download PDFInfo
- Publication number
- JP5979740B2 JP5979740B2 JP2014518794A JP2014518794A JP5979740B2 JP 5979740 B2 JP5979740 B2 JP 5979740B2 JP 2014518794 A JP2014518794 A JP 2014518794A JP 2014518794 A JP2014518794 A JP 2014518794A JP 5979740 B2 JP5979740 B2 JP 5979740B2
- Authority
- JP
- Japan
- Prior art keywords
- silicon carbide
- crucible
- single crystal
- crystal growth
- carbide single
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000013078 crystal Substances 0.000 title claims description 88
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title claims description 72
- 229910010271 silicon carbide Inorganic materials 0.000 title claims description 67
- 238000000034 method Methods 0.000 title description 18
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 46
- 238000010438 heat treatment Methods 0.000 claims description 28
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 18
- 238000006243 chemical reaction Methods 0.000 claims description 18
- 229910002804 graphite Inorganic materials 0.000 claims description 18
- 239000010439 graphite Substances 0.000 claims description 18
- 239000010703 silicon Substances 0.000 claims description 18
- 229910052710 silicon Inorganic materials 0.000 claims description 18
- 239000012530 fluid Substances 0.000 claims description 11
- 239000007770 graphite material Substances 0.000 claims description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- 239000007789 gas Substances 0.000 claims description 5
- 239000011148 porous material Substances 0.000 claims description 5
- 230000002093 peripheral effect Effects 0.000 claims description 4
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 239000001307 helium Substances 0.000 claims description 3
- 229910052734 helium Inorganic materials 0.000 claims description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 3
- 230000006698 induction Effects 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 3
- 239000000843 powder Substances 0.000 claims description 3
- 230000001939 inductive effect Effects 0.000 claims 1
- 229910052799 carbon Inorganic materials 0.000 description 28
- 239000004065 semiconductor Substances 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 239000007791 liquid phase Substances 0.000 description 4
- 238000005092 sublimation method Methods 0.000 description 4
- 125000004432 carbon atom Chemical group C* 0.000 description 3
- 238000000815 Acheson method Methods 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 239000011572 manganese Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B17/00—Single-crystal growth onto a seed which remains in the melt during growth, e.g. Nacken-Kyropoulos method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2011-0063656 | 2011-06-29 | ||
KR1020110063656A KR20130007109A (ko) | 2011-06-29 | 2011-06-29 | 탄화규소 단결정 성장 장치 및 그 방법 |
PCT/KR2012/005048 WO2013002540A2 (en) | 2011-06-29 | 2012-06-26 | Apparatus and method for growing silicon carbide single crystal |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014518195A JP2014518195A (ja) | 2014-07-28 |
JP5979740B2 true JP5979740B2 (ja) | 2016-08-31 |
Family
ID=47424654
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014518794A Expired - Fee Related JP5979740B2 (ja) | 2011-06-29 | 2012-06-26 | 炭化ケイ素単結晶成長装置及びその方法 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5979740B2 (ko) |
KR (1) | KR20130007109A (ko) |
WO (1) | WO2013002540A2 (ko) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101636435B1 (ko) * | 2014-10-22 | 2016-07-06 | 한국세라믹기술원 | 다공성 흑연도가니 및 이를 이용한 탄화규소 단결정의 용액성장 제조방법 |
KR101633183B1 (ko) * | 2014-10-27 | 2016-06-24 | 오씨아이 주식회사 | 잉곳 제조 장치 |
JP2017119594A (ja) * | 2015-12-28 | 2017-07-06 | 東洋炭素株式会社 | 単結晶SiCの製造方法及び収容容器 |
WO2017183747A1 (ko) * | 2016-04-21 | 2017-10-26 | 한국세라믹기술원 | 용액성장용 도가니 및 도가니 내의 용액성장 방법 |
CN105970295B (zh) * | 2016-06-24 | 2018-04-10 | 山东天岳先进材料科技有限公司 | 一种液相法生长碳化硅晶体的装置及方法 |
KR102103884B1 (ko) * | 2016-09-30 | 2020-04-23 | 주식회사 엘지화학 | 실리콘카바이드 단결정의 제조 장치 및 제조 방법 |
KR102088924B1 (ko) * | 2018-09-06 | 2020-03-13 | 에스케이씨 주식회사 | 탄화규소 단결정 잉곳 성장 장치 |
KR102479334B1 (ko) * | 2018-10-11 | 2022-12-19 | 주식회사 엘지화학 | 실리콘카바이드 단결정의 제조 장치 및 제조 방법 |
KR102166640B1 (ko) * | 2018-11-09 | 2020-10-16 | 일진디스플레이(주) | 탄화규소 단결정 성장장치용 지그 |
CN111676519A (zh) * | 2020-08-05 | 2020-09-18 | 郑红军 | 碳化硅晶体熔体生长装置 |
CN114525587B (zh) * | 2022-04-22 | 2022-07-19 | 中电化合物半导体有限公司 | 基于pvt法生长碳化硅单晶的设备及方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5795893A (en) * | 1980-12-03 | 1982-06-14 | Fujitsu Ltd | Liquid phase epitaxially growing method |
JPH02221187A (ja) * | 1989-02-20 | 1990-09-04 | Sumitomo Electric Ind Ltd | 液相エピタキシャル成長方法 |
JP3893012B2 (ja) * | 1999-05-22 | 2007-03-14 | 独立行政法人科学技術振興機構 | Clbo単結晶の育成方法 |
JP4561000B2 (ja) * | 2001-05-31 | 2010-10-13 | 住友金属工業株式会社 | 炭化珪素(SiC)単結晶の製造方法 |
US7794842B2 (en) * | 2004-12-27 | 2010-09-14 | Nippon Steel Corporation | Silicon carbide single crystal, silicon carbide single crystal wafer, and method of production of same |
JP4225296B2 (ja) * | 2005-06-20 | 2009-02-18 | トヨタ自動車株式会社 | 炭化珪素単結晶の製造方法 |
JP2008037729A (ja) * | 2006-08-10 | 2008-02-21 | Shin Etsu Chem Co Ltd | 単結晶炭化珪素及びその製造方法 |
JP5304600B2 (ja) * | 2009-11-09 | 2013-10-02 | トヨタ自動車株式会社 | SiC単結晶の製造装置及び製造方法 |
-
2011
- 2011-06-29 KR KR1020110063656A patent/KR20130007109A/ko not_active Application Discontinuation
-
2012
- 2012-06-26 WO PCT/KR2012/005048 patent/WO2013002540A2/en active Application Filing
- 2012-06-26 JP JP2014518794A patent/JP5979740B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR20130007109A (ko) | 2013-01-18 |
WO2013002540A2 (en) | 2013-01-03 |
JP2014518195A (ja) | 2014-07-28 |
WO2013002540A3 (en) | 2013-04-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5979740B2 (ja) | 炭化ケイ素単結晶成長装置及びその方法 | |
JP5979739B2 (ja) | 炭化珪素単結晶の成長装置およびその方法 | |
JP5827338B2 (ja) | 炭化珪素単結晶の製造方法及び装置 | |
JP5218348B2 (ja) | 炭化珪素単結晶の製造方法 | |
JP5304600B2 (ja) | SiC単結晶の製造装置及び製造方法 | |
KR102022693B1 (ko) | 탄화규소 단결정의 제조 장치 | |
CN104451885A (zh) | 一种碳化硅晶体生长方法和装置 | |
TW201241248A (en) | DEVICE FOR PRODUCING SiC SINGLE CRYSTALS, JIG USED IN SAID PRODUCTION DEVICE, AND METHOD OF PRODUCING SiC SINGLE CRYSTALS | |
JP2008169098A (ja) | 炭化珪素単結晶の製造方法および製造装置 | |
KR20190058963A (ko) | 탄화규소 단결정 성장 장치 | |
CN204325549U (zh) | 一种碳化硅晶体生长装置 | |
US9783911B2 (en) | Apparatus for producing SiC single crystal by solution growth method, and method for producing SiC single crystal by using the production apparatus and crucible used in the production apparatus | |
KR102103884B1 (ko) | 실리콘카바이드 단결정의 제조 장치 및 제조 방법 | |
KR20150095259A (ko) | 탄화규소 단결정 성장 장치 | |
KR102166640B1 (ko) | 탄화규소 단결정 성장장치용 지그 | |
KR20190070404A (ko) | 탄화규소 단결정 성장 장치 | |
JP6821896B2 (ja) | シリコン系溶融組成物及びこれを用いるシリコンカーバイド単結晶の製造方法 | |
KR100485023B1 (ko) | SiC 단결정 성장장치 | |
JP6961893B2 (ja) | シリコン系溶融組成物およびこれを用いるシリコンカーバイド単結晶の製造方法 | |
He et al. | Selective growth of zinc blende, wurtzite and hybrid SiC nanowires via a simple chemical vapor deposition route | |
KR20210004200A (ko) | 실리콘카바이드 단결정 제조 장치 | |
JP2008050174A (ja) | 単結晶SiC及びその製造方法 | |
JP2009023846A (ja) | 炭化ケイ素単結晶の製造方法及びその製造装置 | |
JP4347325B2 (ja) | 単結晶SiC、その製造方法及び単結晶SiCの製造装置 | |
JP2014201448A (ja) | SiC単結晶の製造方法及びSiC単結晶の製造装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20150609 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20151211 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20151222 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20160322 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20160628 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20160721 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5979740 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
LAPS | Cancellation because of no payment of annual fees |