JP5826178B2 - 電極用ガラス組成物、及びそれを用いた電極用ペースト、並びにそれを適用した電子部品 - Google Patents
電極用ガラス組成物、及びそれを用いた電極用ペースト、並びにそれを適用した電子部品 Download PDFInfo
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- JP5826178B2 JP5826178B2 JP2012528656A JP2012528656A JP5826178B2 JP 5826178 B2 JP5826178 B2 JP 5826178B2 JP 2012528656 A JP2012528656 A JP 2012528656A JP 2012528656 A JP2012528656 A JP 2012528656A JP 5826178 B2 JP5826178 B2 JP 5826178B2
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- 239000011521 glass Substances 0.000 title claims description 373
- 239000000203 mixture Substances 0.000 title claims description 276
- 239000002003 electrode paste Substances 0.000 title claims description 95
- 239000002245 particle Substances 0.000 claims description 156
- 239000010949 copper Substances 0.000 claims description 75
- 239000000758 substrate Substances 0.000 claims description 35
- 239000011230 binding agent Substances 0.000 claims description 33
- 239000011347 resin Substances 0.000 claims description 33
- 229920005989 resin Polymers 0.000 claims description 33
- 239000002904 solvent Substances 0.000 claims description 33
- 239000002923 metal particle Substances 0.000 claims description 32
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 28
- 229910052720 vanadium Inorganic materials 0.000 claims description 25
- 229910052723 transition metal Inorganic materials 0.000 claims description 23
- 150000003624 transition metals Chemical class 0.000 claims description 23
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- 229910052760 oxygen Inorganic materials 0.000 claims description 21
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- 230000003647 oxidation Effects 0.000 claims description 19
- 238000007254 oxidation reaction Methods 0.000 claims description 19
- 229910052782 aluminium Inorganic materials 0.000 claims description 16
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical group CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 claims description 14
- 229910052751 metal Inorganic materials 0.000 claims description 14
- 239000001856 Ethyl cellulose Substances 0.000 claims description 13
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical group CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 claims description 13
- 229920001249 ethyl cellulose Polymers 0.000 claims description 13
- 235000019325 ethyl cellulose Nutrition 0.000 claims description 13
- 229910052698 phosphorus Inorganic materials 0.000 claims description 12
- 229910052710 silicon Inorganic materials 0.000 claims description 12
- 229910052709 silver Inorganic materials 0.000 claims description 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 11
- 229910052802 copper Inorganic materials 0.000 claims description 11
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- 239000002184 metal Substances 0.000 claims description 11
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- 239000011572 manganese Substances 0.000 claims description 9
- 239000000463 material Substances 0.000 claims description 9
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 8
- 229910052742 iron Inorganic materials 0.000 claims description 8
- 239000004332 silver Substances 0.000 claims description 8
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 7
- 229910052748 manganese Inorganic materials 0.000 claims description 7
- 229910052750 molybdenum Inorganic materials 0.000 claims description 7
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 230000001747 exhibiting effect Effects 0.000 claims description 6
- 239000000020 Nitrocellulose Substances 0.000 claims description 5
- 239000004020 conductor Substances 0.000 claims description 5
- 229920001220 nitrocellulos Polymers 0.000 claims description 5
- 239000011574 phosphorus Substances 0.000 claims description 5
- 229910052721 tungsten Inorganic materials 0.000 claims description 5
- WUOACPNHFRMFPN-SECBINFHSA-N (S)-(-)-alpha-terpineol Chemical compound CC1=CC[C@@H](C(C)(C)O)CC1 WUOACPNHFRMFPN-SECBINFHSA-N 0.000 claims description 4
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 claims description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 4
- OVKDFILSBMEKLT-UHFFFAOYSA-N alpha-Terpineol Natural products CC(=C)C1(O)CCC(C)=CC1 OVKDFILSBMEKLT-UHFFFAOYSA-N 0.000 claims description 4
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- 239000011733 molybdenum Substances 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 claims description 4
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- 239000011701 zinc Substances 0.000 claims description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 3
- 239000001301 oxygen Substances 0.000 claims description 3
- 229910052714 tellurium Inorganic materials 0.000 claims description 3
- 229910052788 barium Inorganic materials 0.000 claims description 2
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims description 2
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 claims description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims 1
- 229910052793 cadmium Inorganic materials 0.000 claims 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 claims 1
- 229910052804 chromium Inorganic materials 0.000 claims 1
- 239000011651 chromium Substances 0.000 claims 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 claims 1
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- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Chemical compound [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 27
- 229910052745 lead Inorganic materials 0.000 description 26
- 239000010419 fine particle Substances 0.000 description 25
- 238000001035 drying Methods 0.000 description 23
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- 229910052797 bismuth Inorganic materials 0.000 description 21
- 238000006243 chemical reaction Methods 0.000 description 21
- 229910015902 Bi 2 O 3 Inorganic materials 0.000 description 20
- HTUMBQDCCIXGCV-UHFFFAOYSA-N lead oxide Chemical compound [O-2].[Pb+2] HTUMBQDCCIXGCV-UHFFFAOYSA-N 0.000 description 18
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 14
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- 238000004519 manufacturing process Methods 0.000 description 7
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- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 239000000919 ceramic Substances 0.000 description 6
- 238000002425 crystallisation Methods 0.000 description 6
- 230000008025 crystallization Effects 0.000 description 6
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- 238000009792 diffusion process Methods 0.000 description 6
- 239000011159 matrix material Substances 0.000 description 6
- 238000001878 scanning electron micrograph Methods 0.000 description 6
- 239000012798 spherical particle Substances 0.000 description 6
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 5
- 230000008859 change Effects 0.000 description 5
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- 102100039851 DNA-directed RNA polymerases I and III subunit RPAC1 Human genes 0.000 description 2
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- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 2
- 239000000395 magnesium oxide Substances 0.000 description 2
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 238000001556 precipitation Methods 0.000 description 2
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- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 101500027749 Mus musculus Serpinin Proteins 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- GHPGOEFPKIHBNM-UHFFFAOYSA-N antimony(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Sb+3].[Sb+3] GHPGOEFPKIHBNM-UHFFFAOYSA-N 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 229910000416 bismuth oxide Inorganic materials 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
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- 238000000151 deposition Methods 0.000 description 1
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 description 1
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 1
- YWEUIGNSBFLMFL-UHFFFAOYSA-N diphosphonate Chemical compound O=P(=O)OP(=O)=O YWEUIGNSBFLMFL-UHFFFAOYSA-N 0.000 description 1
- GNTDGMZSJNCJKK-UHFFFAOYSA-N divanadium pentaoxide Chemical compound O=[V](=O)O[V](=O)=O GNTDGMZSJNCJKK-UHFFFAOYSA-N 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
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- 230000000873 masking effect Effects 0.000 description 1
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- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
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- 238000010298 pulverizing process Methods 0.000 description 1
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- KKCBUQHMOMHUOY-UHFFFAOYSA-N sodium oxide Chemical compound [O-2].[Na+].[Na+] KKCBUQHMOMHUOY-UHFFFAOYSA-N 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 1
- 238000004448 titration Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/005—Electrodes
- H01G4/008—Selection of materials
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/02—Frit compositions, i.e. in a powdered or comminuted form
- C03C8/08—Frit compositions, i.e. in a powdered or comminuted form containing phosphorus
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
- C03C8/16—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions with vehicle or suspending agents, e.g. slip
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
- C03C8/18—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions containing free metals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/14—Conductive material dispersed in non-conductive inorganic material
- H01B1/16—Conductive material dispersed in non-conductive inorganic material the conductive material comprising metals or alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Geochemistry & Mineralogy (AREA)
- Organic Chemistry (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Inorganic Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Sustainable Development (AREA)
- Computer Hardware Design (AREA)
- Sustainable Energy (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Glass Compositions (AREA)
- Conductive Materials (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Photovoltaic Devices (AREA)
- Non-Insulated Conductors (AREA)
- Gas-Filled Discharge Tubes (AREA)
- Ceramic Capacitors (AREA)
Description
Claims (23)
- 金属とガラス組成物とを含む電極に用いられる材料であって、銀、リン及び酸素を含み、かつ、実質的に鉛を含まず、テルル又はバナジウムを含み、バリウム、タングステン、モリブデン、鉄、マンガン及び亜鉛のうち一種以上を含むことを特徴とする電極用ガラス組成物。
- 酸化物換算で、Ag2Oが5〜60重量%、P2O5が5〜50重量%、V2O5が0〜50重量%、TeO2が0〜30重量%、その他の酸化物が0〜40重量%であり、さらに、Ag2OとV2O5との合計が30〜86重量%、P2O5とTeO2との合計が14〜50重量%であることを特徴とする請求項1記載の電極用ガラス組成物。
- 前記その他の酸化物は、BaO、WO3、MoO3、Fe2O3、MnO2及びZnOからなる群から選択される一種以上であることを特徴とする請求項2記載の電極用ガラス組成物。
- 酸化物換算で、Ag2OとV2O5との合計が40〜70重量%であって、Ag2Oが10〜50重量%であり、かつ、V2O5が20〜50重量%であり、P2O5とTeO2との合計が25〜50重量%であって、P2O5が10〜30重量%であり、かつ、TeO2が0〜30重量%であり、BaOとWO3とFe2O3とZnOとの合計が0〜30重量%であって、BaOが0〜20重量%であり、かつ、WO3が0〜10重量%であり、かつ、Fe2O3が0〜10重量%であり、かつ、ZnOが0〜15重量%であることを特徴とする請求項1記載の電極用ガラス組成物。
- 転移点が392℃以下であることを特徴とする請求項1記載の電極用ガラス組成物。
- 前記転移点が310℃以下であることを特徴とする請求項5記載の電極用ガラス組成物。
- 銀、アルミニウム及び銅のうちいずれか一種以上の金属元素を含む金属粒子と、請求項1記載の電極用ガラス組成物の粒子と、樹脂バインダーと、溶剤とを含むことを特徴とする電極用ペースト。
- 前記金属粒子100重量部と、前記電極用ガラス組成物0.2〜20重量部とを含むことを特徴とする請求項7記載の電極用ペースト。
- 前記金属粒子は、銀を主成分とし、前記金属粒子100重量部と、前記電極用ガラス組成物3〜15重量部とを含むことを特徴とする請求項7記載の電極用ペースト。
- 前記金属粒子は、アルミニウムを主成分とし、前記金属粒子100重量部と、前記電極用ガラス組成物0.2〜20重量部とを含むことを特徴とする請求項7記載の電極用ペースト。
- 前記金属粒子は、銅を主成分とし、前記金属粒子100重量部と、前記電極用ガラス組成物3〜15重量部とを含むことを特徴とする請求項7記載の電極用ペースト。
- 前記樹脂バインダーは、エチルセルロース又はニトロセルロースであり、前記溶剤は、ブチルカルビトールアセテート又はα-テルピネオールであることを特徴とする請求項7記載の電極用ペースト。
- 請求項7記載の電極用ペーストを用いて形成した電極を含むことを特徴とする電子部品。
- 前記電極に含まれる前記電極用ガラス組成物は、0.1〜30体積%であることを特徴とする請求項13記載の電子部品。
- 前記電極は、銀を金属導体の主成分とするものであり、前記電極に含まれる前記電極用ガラス組成物は、5〜30体積%であることを特徴とする請求項14記載の電子部品。
- 前記電極は、アルミニウムを金属導体の主成分とするものであり、前記電極に含まれる前記電極用ガラス組成物は、0.1〜15体積%であることを特徴とする請求項14記載の電子部品。
- 前記電極は、銅を金属導体の主成分とするものであり、前記電極に含まれる前記電極用ガラス組成物は、5〜20体積%であることを特徴とする請求項14記載の電子部品。
- 太陽電池素子、画像表示デバイス、積層コンデンサー又は多層回路基板であることを特徴とする請求項13記載の電子部品。
- シリコン基板を用いた太陽電池素子であることを特徴とする請求項13記載の電子部品。
- 前記集電電極に含まれる前記導電性ガラス組成物が0.1〜5体積%であることを特徴とする請求項20記載の太陽電池素子。
- 前記出力取出し電極は、請求項7記載の電極用ペーストを用いて形成されたものであることを特徴とする請求項20記載の太陽電池素子。
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PCT/JP2011/067881 WO2012020694A1 (ja) | 2010-08-11 | 2011-08-04 | 電極用ガラス組成物、及びそれを用いた電極用ペースト、並びにそれを適用した電子部品 |
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WO2012020694A1 (ja) | 2012-02-16 |
TWI448444B (zh) | 2014-08-11 |
TW201213268A (en) | 2012-04-01 |
JPWO2012020694A1 (ja) | 2013-10-28 |
KR20130041076A (ko) | 2013-04-24 |
KR101414091B1 (ko) | 2014-07-02 |
CN103052605B (zh) | 2016-01-20 |
CN103052605A (zh) | 2013-04-17 |
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