JP5808026B2 - 電荷計測システム - Google Patents

電荷計測システム Download PDF

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Publication number
JP5808026B2
JP5808026B2 JP2013554056A JP2013554056A JP5808026B2 JP 5808026 B2 JP5808026 B2 JP 5808026B2 JP 2013554056 A JP2013554056 A JP 2013554056A JP 2013554056 A JP2013554056 A JP 2013554056A JP 5808026 B2 JP5808026 B2 JP 5808026B2
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JP
Japan
Prior art keywords
charge
transistor
voltage
switch
transistors
Prior art date
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Expired - Fee Related
Application number
JP2013554056A
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English (en)
Japanese (ja)
Other versions
JP2014506094A (ja
JP2014506094A5 (enExample
Inventor
ジビグニフ ソシン
ジビグニフ ソシン
マーチェイ ソシン
マーチェイ ソシン
マレック アダムチェク
マレック アダムチェク
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Uniwersytet Jagiellonski
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Uniwersytet Jagiellonski
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Publication date
Application filed by Uniwersytet Jagiellonski filed Critical Uniwersytet Jagiellonski
Publication of JP2014506094A publication Critical patent/JP2014506094A/ja
Publication of JP2014506094A5 publication Critical patent/JP2014506094A5/ja
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Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/52—Circuit arrangements for protecting such amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/52—Circuit arrangements for protecting such amplifiers
    • H03F1/523—Circuit arrangements for protecting such amplifiers for amplifiers using field-effect devices

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)
JP2013554056A 2011-02-22 2012-02-22 電荷計測システム Expired - Fee Related JP5808026B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PL393985A PL220994B1 (pl) 2011-02-22 2011-02-22 Układ do pomiaru ładunku elektrycznego
PLPL393985 2011-02-22
PCT/IB2012/050816 WO2012114291A1 (en) 2011-02-22 2012-02-22 A system for measuring electrical charge

Publications (3)

Publication Number Publication Date
JP2014506094A JP2014506094A (ja) 2014-03-06
JP2014506094A5 JP2014506094A5 (enExample) 2015-04-02
JP5808026B2 true JP5808026B2 (ja) 2015-11-10

Family

ID=46045036

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013554056A Expired - Fee Related JP5808026B2 (ja) 2011-02-22 2012-02-22 電荷計測システム

Country Status (7)

Country Link
US (1) US9103860B2 (enExample)
EP (1) EP2678697B1 (enExample)
JP (1) JP5808026B2 (enExample)
KR (1) KR101606964B1 (enExample)
CN (1) CN103518140B (enExample)
PL (1) PL220994B1 (enExample)
WO (1) WO2012114291A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8810262B2 (en) * 2012-11-13 2014-08-19 National Tsing Hua University Integrated low-noise sensing circuit with efficient bias stabilization
PL227598B1 (pl) * 2013-12-14 2018-01-31 Uniwersytet Jagiellonski Sposób pomiaru wolnozmiennego ładunku elektrycznego i układ do pomiaru wolnozmiennego ładunku elektrycznego
CN112557777B (zh) * 2019-09-09 2024-07-09 戴尔产品有限公司 电力转换器设备健康检查系统
CN111751632B (zh) * 2020-07-22 2023-03-14 北京卫星环境工程研究所 一种空间环境微弱电荷测量系统

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4047113A (en) * 1976-05-13 1977-09-06 Sheller-Globe Corporation Feedback circuitry for charge digitizer
JPS58201410A (ja) * 1982-05-20 1983-11-24 Matsushita Electric Ind Co Ltd 増幅器
JPS60117639A (ja) * 1983-11-30 1985-06-25 Fujitsu Ltd 電荷積分回路
JPH01183905A (ja) * 1988-01-18 1989-07-21 Nec Corp 差動増幅回路
US5374897A (en) * 1993-10-21 1994-12-20 National Semiconductor Corporation Balanced, high-speed differential input stage for Op-amps
JPH0837284A (ja) * 1994-07-21 1996-02-06 Nippondenso Co Ltd 半導体集積回路装置
US5537078A (en) 1995-03-31 1996-07-16 Linear Technology Corporation Operational amplifier with JFET inputs having low input bias current and methods for using same
DE19841308A1 (de) * 1998-09-10 2000-04-06 Schwerionenforsch Gmbh Vorrichtung und Verfahren zum Umwandeln von Ladungsfluß in ein Frequenzsignal
US6307223B1 (en) 1998-12-11 2001-10-23 Lovoltech, Inc. Complementary junction field effect transistors
US6680837B1 (en) * 2001-06-14 2004-01-20 Analog Devices, Inc. Hiccup-mode short circuit protection circuit and method for linear voltage regulators
DE102005038875A1 (de) * 2005-05-25 2006-11-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kapazitätsmessschaltung
US7339402B2 (en) * 2006-02-13 2008-03-04 Texas Instruments Incorporated Differential amplifier with over-voltage protection and method
TWI385616B (zh) * 2006-12-29 2013-02-11 Novatek Microelectronics Corp 驅動裝置及其驅動方法
US8354847B2 (en) * 2007-08-15 2013-01-15 Electrostatic Answers Llc Electrometer with in-measurement range adjustment and methods thereof for measuring electrostatic charge
JP4366540B2 (ja) * 2007-09-10 2009-11-18 オンキヨー株式会社 パルス幅変調回路及びそれを用いたスイッチングアンプ
US8260565B2 (en) * 2008-08-22 2012-09-04 Brookhaven Science Associates, Llc High dynamic range charge measurements

Also Published As

Publication number Publication date
KR101606964B1 (ko) 2016-04-11
EP2678697A1 (en) 2014-01-01
PL220994B1 (pl) 2016-02-29
KR20140004735A (ko) 2014-01-13
EP2678697B1 (en) 2016-02-17
US9103860B2 (en) 2015-08-11
CN103518140B (zh) 2016-06-01
WO2012114291A1 (en) 2012-08-30
CN103518140A (zh) 2014-01-15
PL393985A1 (pl) 2012-08-27
US20140049269A1 (en) 2014-02-20
JP2014506094A (ja) 2014-03-06

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