CN103518140B - 用于测量电荷的系统 - Google Patents

用于测量电荷的系统 Download PDF

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Publication number
CN103518140B
CN103518140B CN201280009795.1A CN201280009795A CN103518140B CN 103518140 B CN103518140 B CN 103518140B CN 201280009795 A CN201280009795 A CN 201280009795A CN 103518140 B CN103518140 B CN 103518140B
Authority
CN
China
Prior art keywords
charge
charge integrator
voltage
input
transistors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201280009795.1A
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English (en)
Chinese (zh)
Other versions
CN103518140A (zh
Inventor
兹比格涅夫·索辛
马切伊·索辛
马列克·亚当奇克
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Uniwersytet Jagiellonski
Original Assignee
Uniwersytet Jagiellonski
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Uniwersytet Jagiellonski filed Critical Uniwersytet Jagiellonski
Publication of CN103518140A publication Critical patent/CN103518140A/zh
Application granted granted Critical
Publication of CN103518140B publication Critical patent/CN103518140B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/52—Circuit arrangements for protecting such amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/52—Circuit arrangements for protecting such amplifiers
    • H03F1/523—Circuit arrangements for protecting such amplifiers for amplifiers using field-effect devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)
CN201280009795.1A 2011-02-22 2012-02-22 用于测量电荷的系统 Expired - Fee Related CN103518140B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PL393985A PL220994B1 (pl) 2011-02-22 2011-02-22 Układ do pomiaru ładunku elektrycznego
PL393985 2011-02-22
PCT/IB2012/050816 WO2012114291A1 (en) 2011-02-22 2012-02-22 A system for measuring electrical charge

Publications (2)

Publication Number Publication Date
CN103518140A CN103518140A (zh) 2014-01-15
CN103518140B true CN103518140B (zh) 2016-06-01

Family

ID=46045036

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280009795.1A Expired - Fee Related CN103518140B (zh) 2011-02-22 2012-02-22 用于测量电荷的系统

Country Status (7)

Country Link
US (1) US9103860B2 (enExample)
EP (1) EP2678697B1 (enExample)
JP (1) JP5808026B2 (enExample)
KR (1) KR101606964B1 (enExample)
CN (1) CN103518140B (enExample)
PL (1) PL220994B1 (enExample)
WO (1) WO2012114291A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8810262B2 (en) * 2012-11-13 2014-08-19 National Tsing Hua University Integrated low-noise sensing circuit with efficient bias stabilization
PL227598B1 (pl) * 2013-12-14 2018-01-31 Uniwersytet Jagiellonski Sposób pomiaru wolnozmiennego ładunku elektrycznego i układ do pomiaru wolnozmiennego ładunku elektrycznego
CN112557777B (zh) * 2019-09-09 2024-07-09 戴尔产品有限公司 电力转换器设备健康检查系统
CN111751632B (zh) * 2020-07-22 2023-03-14 北京卫星环境工程研究所 一种空间环境微弱电荷测量系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4047113A (en) * 1976-05-13 1977-09-06 Sheller-Globe Corporation Feedback circuitry for charge digitizer
US5537078A (en) * 1995-03-31 1996-07-16 Linear Technology Corporation Operational amplifier with JFET inputs having low input bias current and methods for using same
US5610426A (en) * 1994-07-21 1997-03-11 Nippondenso Co., Ltd. Semiconductor integrated circuit device having excellent dual polarity overvoltage protection characteristics
US20090045816A1 (en) * 2007-08-15 2009-02-19 Electrostatic Answers, Llc Electrometer with in-measurement range adjustment and methods thereof for measuring electrostatic charge
US20100049459A1 (en) * 2008-08-22 2010-02-25 Brookhaven Science Associates, Llc High Dynamic Range Charge Measurements

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58201410A (ja) * 1982-05-20 1983-11-24 Matsushita Electric Ind Co Ltd 増幅器
JPS60117639A (ja) * 1983-11-30 1985-06-25 Fujitsu Ltd 電荷積分回路
JPH01183905A (ja) * 1988-01-18 1989-07-21 Nec Corp 差動増幅回路
US5374897A (en) * 1993-10-21 1994-12-20 National Semiconductor Corporation Balanced, high-speed differential input stage for Op-amps
DE19841308A1 (de) * 1998-09-10 2000-04-06 Schwerionenforsch Gmbh Vorrichtung und Verfahren zum Umwandeln von Ladungsfluß in ein Frequenzsignal
US6307223B1 (en) 1998-12-11 2001-10-23 Lovoltech, Inc. Complementary junction field effect transistors
US6680837B1 (en) * 2001-06-14 2004-01-20 Analog Devices, Inc. Hiccup-mode short circuit protection circuit and method for linear voltage regulators
DE102005038875A1 (de) * 2005-05-25 2006-11-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kapazitätsmessschaltung
US7339402B2 (en) * 2006-02-13 2008-03-04 Texas Instruments Incorporated Differential amplifier with over-voltage protection and method
TWI385616B (zh) * 2006-12-29 2013-02-11 Novatek Microelectronics Corp 驅動裝置及其驅動方法
JP4366540B2 (ja) * 2007-09-10 2009-11-18 オンキヨー株式会社 パルス幅変調回路及びそれを用いたスイッチングアンプ

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4047113A (en) * 1976-05-13 1977-09-06 Sheller-Globe Corporation Feedback circuitry for charge digitizer
US5610426A (en) * 1994-07-21 1997-03-11 Nippondenso Co., Ltd. Semiconductor integrated circuit device having excellent dual polarity overvoltage protection characteristics
US5537078A (en) * 1995-03-31 1996-07-16 Linear Technology Corporation Operational amplifier with JFET inputs having low input bias current and methods for using same
US20090045816A1 (en) * 2007-08-15 2009-02-19 Electrostatic Answers, Llc Electrometer with in-measurement range adjustment and methods thereof for measuring electrostatic charge
US20100049459A1 (en) * 2008-08-22 2010-02-25 Brookhaven Science Associates, Llc High Dynamic Range Charge Measurements

Also Published As

Publication number Publication date
KR101606964B1 (ko) 2016-04-11
EP2678697A1 (en) 2014-01-01
PL220994B1 (pl) 2016-02-29
KR20140004735A (ko) 2014-01-13
EP2678697B1 (en) 2016-02-17
US9103860B2 (en) 2015-08-11
WO2012114291A1 (en) 2012-08-30
CN103518140A (zh) 2014-01-15
PL393985A1 (pl) 2012-08-27
US20140049269A1 (en) 2014-02-20
JP5808026B2 (ja) 2015-11-10
JP2014506094A (ja) 2014-03-06

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Granted publication date: 20160601

Termination date: 20200222