JP5670915B2 - 外観検査装置 - Google Patents

外観検査装置 Download PDF

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Publication number
JP5670915B2
JP5670915B2 JP2011545210A JP2011545210A JP5670915B2 JP 5670915 B2 JP5670915 B2 JP 5670915B2 JP 2011545210 A JP2011545210 A JP 2011545210A JP 2011545210 A JP2011545210 A JP 2011545210A JP 5670915 B2 JP5670915 B2 JP 5670915B2
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JP
Japan
Prior art keywords
inspection
unit
inspection object
image
pattern
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JP2011545210A
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English (en)
Japanese (ja)
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JPWO2011071035A1 (ja
Inventor
晋也 松田
晋也 松田
青木　広志
広志 青木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daiichi Jitsugyo Viswill Co Ltd
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Daiichi Jitsugyo Viswill Co Ltd
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Priority to JP2011545210A priority Critical patent/JP5670915B2/ja
Publication of JPWO2011071035A1 publication Critical patent/JPWO2011071035A1/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9508—Capsules; Tablets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2011545210A 2009-12-11 2010-12-07 外観検査装置 Active JP5670915B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011545210A JP5670915B2 (ja) 2009-12-11 2010-12-07 外観検査装置

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2009281087 2009-12-11
JP2009281087 2009-12-11
PCT/JP2010/071886 WO2011071035A1 (ja) 2009-12-11 2010-12-07 外観検査装置
JP2011545210A JP5670915B2 (ja) 2009-12-11 2010-12-07 外観検査装置

Publications (2)

Publication Number Publication Date
JPWO2011071035A1 JPWO2011071035A1 (ja) 2013-04-22
JP5670915B2 true JP5670915B2 (ja) 2015-02-18

Family

ID=44145579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011545210A Active JP5670915B2 (ja) 2009-12-11 2010-12-07 外観検査装置

Country Status (4)

Country Link
JP (1) JP5670915B2 (ko)
KR (1) KR101762165B1 (ko)
CN (1) CN102713579B (ko)
WO (1) WO2011071035A1 (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5978002B2 (ja) * 2012-05-22 2016-08-24 リコーエレメックス株式会社 検査方法及び外観検査装置
JP2015094707A (ja) * 2013-11-13 2015-05-18 リコーエレメックス株式会社 外観検査装置
JP6861825B2 (ja) * 2017-08-22 2021-04-21 富士フイルム富山化学株式会社 薬剤識別装置、画像処理装置、画像処理方法及びプログラム
EP3726203A4 (en) * 2017-12-15 2021-07-14 Japan Tobacco Inc. CIGARETTE FILTER INSPECTION PROCEDURE, CIGARETTE FILTER INSPECTION DEVICE AND CIGARETTE FILTER INSPECTION PROGRAM
JP6978970B2 (ja) * 2018-03-26 2021-12-08 株式会社Ｓｃｒｅｅｎホールディングス 印刷装置および印刷方法
DE102018107689A1 (de) * 2018-03-29 2019-10-02 Krones Ag Verfahren und Vorrichtung zum Inspizieren von Behältnissen
JP6616040B1 (ja) * 2019-07-08 2019-12-04 西進商事株式会社 外観検査装置
KR20220117060A (ko) 2021-02-16 2022-08-23 동우 화인켐 주식회사 결함 검사 장치

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5667567A (en) * 1979-11-09 1981-06-06 Yamanouchi Pharma Co Ltd Method and device for selecting faulty article of mark printing of tablet* etc*
JPS6353452A (ja) * 1986-08-25 1988-03-07 Kanebo Ltd 検査用照明装置
JPH0693776B2 (ja) * 1987-04-03 1994-11-16 協和醗酵工業株式会社 高精度外観ビデオ検査法
JP3640247B2 (ja) * 2002-06-21 2005-04-20 シーケーディ株式会社 錠剤の外観検査装置及びｐｔｐ包装機
JP2005164272A (ja) * 2003-11-28 2005-06-23 Toshiba Solutions Corp シート包装検査装置
JP2009139297A (ja) * 2007-12-10 2009-06-25 Bridgestone Corp タイヤ形状検査方法とその装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3472750B2 (ja) * 2000-04-10 2003-12-02 シーシーエス株式会社 表面検査装置
JP3344995B2 (ja) * 2000-09-22 2002-11-18 東芝アイティー・ソリューション株式会社 錠剤表面検査装置
JP2004317126A (ja) 2003-04-10 2004-11-11 Renesas Technology Corp はんだ印刷装置
JP4318292B2 (ja) * 2003-08-13 2009-08-19 静岡シブヤ精機株式会社 農産物の外観検査装置
WO2005036148A1 (en) * 2003-10-14 2005-04-21 Mirtec Co., Ltd. Printed circuit board inspection system combining x-ray inspection and visual inspection
JP4001855B2 (ja) * 2003-10-28 2007-10-31 日本碍子株式会社 ハニカム構造体の隔壁表面の凹凸検査方法及び検査装置
JP4894628B2 (ja) 2007-05-28 2012-03-14 パナソニック電工株式会社 外観検査方法および外観検査装置
JP4374051B2 (ja) * 2007-12-28 2009-12-02 ライオンエンジニアリング株式会社 物品の外観検査装置および表面検査装置
EP2599556B1 (en) * 2011-11-29 2021-06-30 General Electric Technology GmbH A method for cleaning an electrostatic precipitator

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5667567A (en) * 1979-11-09 1981-06-06 Yamanouchi Pharma Co Ltd Method and device for selecting faulty article of mark printing of tablet* etc*
JPS6353452A (ja) * 1986-08-25 1988-03-07 Kanebo Ltd 検査用照明装置
JPH0693776B2 (ja) * 1987-04-03 1994-11-16 協和醗酵工業株式会社 高精度外観ビデオ検査法
JP3640247B2 (ja) * 2002-06-21 2005-04-20 シーケーディ株式会社 錠剤の外観検査装置及びｐｔｐ包装機
JP2005164272A (ja) * 2003-11-28 2005-06-23 Toshiba Solutions Corp シート包装検査装置
JP2009139297A (ja) * 2007-12-10 2009-06-25 Bridgestone Corp タイヤ形状検査方法とその装置

Also Published As

Publication number Publication date
WO2011071035A1 (ja) 2011-06-16
CN102713579B (zh) 2014-12-10
JPWO2011071035A1 (ja) 2013-04-22
KR20120109548A (ko) 2012-10-08
CN102713579A (zh) 2012-10-03
KR101762165B1 (ko) 2017-07-27

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