JP5610895B2 - 発光素子の検査方法および発光素子の作製方法 - Google Patents
発光素子の検査方法および発光素子の作製方法 Download PDFInfo
- Publication number
- JP5610895B2 JP5610895B2 JP2010167125A JP2010167125A JP5610895B2 JP 5610895 B2 JP5610895 B2 JP 5610895B2 JP 2010167125 A JP2010167125 A JP 2010167125A JP 2010167125 A JP2010167125 A JP 2010167125A JP 5610895 B2 JP5610895 B2 JP 5610895B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- emitting element
- layer
- light emitting
- abbreviation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
- G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/11—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
- H10K50/125—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers specially adapted for multicolour light emission, e.g. for emitting white light
- H10K50/13—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers specially adapted for multicolour light emission, e.g. for emitting white light comprising stacked EL layers within one EL unit
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/19—Tandem OLEDs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/60—Forming conductive regions or layers, e.g. electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/70—Testing, e.g. accelerated lifetime tests
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/861—Repairing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Optics & Photonics (AREA)
- Electroluminescent Light Sources (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010167125A JP5610895B2 (ja) | 2009-07-28 | 2010-07-26 | 発光素子の検査方法および発光素子の作製方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009175377 | 2009-07-28 | ||
| JP2009175377 | 2009-07-28 | ||
| JP2010167125A JP5610895B2 (ja) | 2009-07-28 | 2010-07-26 | 発光素子の検査方法および発光素子の作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011049159A JP2011049159A (ja) | 2011-03-10 |
| JP2011049159A5 JP2011049159A5 (https=) | 2013-09-05 |
| JP5610895B2 true JP5610895B2 (ja) | 2014-10-22 |
Family
ID=43527418
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010167125A Expired - Fee Related JP5610895B2 (ja) | 2009-07-28 | 2010-07-26 | 発光素子の検査方法および発光素子の作製方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8415174B2 (https=) |
| JP (1) | JP5610895B2 (https=) |
| KR (2) | KR101720077B1 (https=) |
| TW (1) | TWI539864B (https=) |
| WO (1) | WO2011013493A1 (https=) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5690333B2 (ja) | 2010-04-27 | 2015-03-25 | パナソニック株式会社 | 有機el表示装置の検査方法 |
| US8557614B2 (en) | 2010-12-28 | 2013-10-15 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing lighting device |
| US9040968B2 (en) | 2011-04-20 | 2015-05-26 | Joled Inc | Method for manufacturing organic electroluminescence device and organic electroluminescence device |
| TWI585880B (zh) * | 2011-11-10 | 2017-06-01 | 應用材料股份有限公司 | 透過雷射繞射測量3d半導體結構之溫度的設備及方法 |
| KR101876540B1 (ko) | 2011-12-28 | 2018-07-10 | 삼성디스플레이 주식회사 | 가요성 표시 장치 및 가요성 표시 장치의 제조 방법 |
| WO2013129611A1 (ja) * | 2012-02-29 | 2013-09-06 | 昭和電工株式会社 | エレクトロルミネッセント素子の製造方法 |
| JP5888096B2 (ja) * | 2012-04-26 | 2016-03-16 | コニカミノルタ株式会社 | 表示装置 |
| JP2013234864A (ja) * | 2012-05-07 | 2013-11-21 | Sinto S-Precision Ltd | 検査機 |
| DE102012017216B4 (de) * | 2012-08-31 | 2016-06-16 | Laser Zentrum Hannover E.V. | Verfahren und Vorrichtung zum Herstellen einer elektrischen Schichtstruktur |
| KR101398692B1 (ko) * | 2012-09-11 | 2014-05-27 | 삼성디스플레이 주식회사 | 표시 장치의 수리 장치 및 그 방법 |
| JP6186134B2 (ja) * | 2013-02-25 | 2017-08-23 | 株式会社カネカ | 有機el装置の検査装置、有機el装置の検査方法及び有機el装置の製造方法 |
| US9311860B2 (en) * | 2013-09-06 | 2016-04-12 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Liquid crystal display using backlight intensity to compensate for pixel damage |
| WO2015114720A1 (ja) * | 2014-01-28 | 2015-08-06 | 株式会社Joled | 有機el表示パネル検査方法及び有機el表示パネル検査装置 |
| JP6417632B2 (ja) * | 2014-05-13 | 2018-11-07 | パナソニックIpマネジメント株式会社 | 有機発光素子およびその製造方法 |
| KR102192572B1 (ko) * | 2014-06-09 | 2020-12-18 | 삼성전자주식회사 | 광원 모듈의 불량 검사방법, 광원 모듈의 제조 방법 및 광원 모듈 검사장치 |
| JP2017062884A (ja) | 2015-09-24 | 2017-03-30 | ソニー株式会社 | 表示装置及び発光装置 |
| KR102627073B1 (ko) * | 2016-11-30 | 2024-01-19 | 삼성디스플레이 주식회사 | 백라이트 유닛, 표시 장치 및 표시 장치의 제조 방법 |
| US10678076B2 (en) * | 2017-01-30 | 2020-06-09 | Facebook Technologies, Llc | Treating display panel using laser |
| KR102446211B1 (ko) | 2017-12-11 | 2022-09-23 | 삼성디스플레이 주식회사 | 발광 소자의 검사 방법 및 발광 소자의 검사 장치 |
| JP6954142B2 (ja) * | 2018-01-17 | 2021-10-27 | オムロン株式会社 | 画像検査装置および照明装置 |
| CN110867390B (zh) * | 2018-08-28 | 2024-11-19 | 三星显示有限公司 | 用于制造显示装置的方法 |
| US11822422B2 (en) * | 2020-02-06 | 2023-11-21 | Oracle International Corporation | Remote display failure detection |
| WO2022255599A1 (ko) * | 2021-06-02 | 2022-12-08 | 마이크로 인스펙션 주식회사 | 초소형 발광다이오드의 점등 검사 장치 |
| JP7710326B2 (ja) * | 2021-07-12 | 2025-07-18 | Jswアクティナシステム株式会社 | レーザ照射装置、レーザ照射方法、及びプログラム |
| TWI850686B (zh) * | 2022-06-27 | 2024-08-01 | 住華科技股份有限公司 | 測試元件及其形成方法與測試方法 |
| CN118155562A (zh) * | 2024-04-18 | 2024-06-07 | 合肥京东方卓印科技有限公司 | 像素电路、显示基板及其暗点修复方法 |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4739414A (en) * | 1986-07-15 | 1988-04-19 | Ovonic Imaging Systems, Inc. | Large area array of thin film photosensitive elements for image detection |
| JPH07263143A (ja) * | 1994-03-25 | 1995-10-13 | Nippondenso Co Ltd | エレクトロルミネッセンス素子の製造方法 |
| JP2900858B2 (ja) * | 1995-09-28 | 1999-06-02 | 日本電気株式会社 | Cmos論理回路の故障箇所特定方法 |
| JP3725266B2 (ja) * | 1996-11-07 | 2005-12-07 | 株式会社半導体エネルギー研究所 | 配線形成方法 |
| US6049167A (en) * | 1997-02-17 | 2000-04-11 | Tdk Corporation | Organic electroluminescent display device, and method and system for making the same |
| JPH1145779A (ja) * | 1997-07-25 | 1999-02-16 | Tdk Corp | 有機el素子の製造方法および装置 |
| US6420031B1 (en) * | 1997-11-03 | 2002-07-16 | The Trustees Of Princeton University | Highly transparent non-metallic cathodes |
| US6127363A (en) * | 1997-10-28 | 2000-10-03 | Vivus, Inc. | Local administration of Type IV phosphodiesterase inhibitors for the treatment of erectile dysfunction |
| US6232248B1 (en) * | 1998-07-03 | 2001-05-15 | Tokyo Electron Limited | Single-substrate-heat-processing method for performing reformation and crystallization |
| JP2000150149A (ja) * | 1998-11-13 | 2000-05-30 | Rohm Co Ltd | 有機el素子の製造方法 |
| JP2000208252A (ja) | 1999-01-14 | 2000-07-28 | Tdk Corp | 有機el素子 |
| JP2000349078A (ja) * | 1999-06-03 | 2000-12-15 | Mitsubishi Electric Corp | 化学気相成長装置および半導体装置の製造方法 |
| JP4472056B2 (ja) * | 1999-07-23 | 2010-06-02 | 株式会社半導体エネルギー研究所 | エレクトロルミネッセンス表示装置及びその作製方法 |
| US6512385B1 (en) * | 1999-07-26 | 2003-01-28 | Paul Pfaff | Method for testing a device under test including the interference of two beams |
| US6641933B1 (en) * | 1999-09-24 | 2003-11-04 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting EL display device |
| TW480722B (en) * | 1999-10-12 | 2002-03-21 | Semiconductor Energy Lab | Manufacturing method of electro-optical device |
| JP3840010B2 (ja) * | 1999-10-19 | 2006-11-01 | 東北パイオニア株式会社 | 発光ディスプレイの製造方法 |
| US6909111B2 (en) * | 2000-12-28 | 2005-06-21 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a light emitting device and thin film forming apparatus |
| JP2002260857A (ja) * | 2000-12-28 | 2002-09-13 | Semiconductor Energy Lab Co Ltd | 発光装置の作製方法および薄膜形成装置 |
| JP4831874B2 (ja) * | 2001-02-26 | 2011-12-07 | 株式会社半導体エネルギー研究所 | 発光装置及び電子機器 |
| JP2003007747A (ja) * | 2001-06-18 | 2003-01-10 | Toshiba Mach Co Ltd | 表面に多数の微小突起を有する構造体の製造方法 |
| JP3933591B2 (ja) | 2002-03-26 | 2007-06-20 | 淳二 城戸 | 有機エレクトロルミネッセント素子 |
| JP2005083951A (ja) | 2003-09-10 | 2005-03-31 | Aitesu:Kk | エミッション・マイクロスコープ法による有機el素子の検査法 |
| JP4882091B2 (ja) * | 2004-04-23 | 2012-02-22 | 日本精機株式会社 | 有機elパネルの製造方法 |
| JP4884747B2 (ja) * | 2004-10-29 | 2012-02-29 | 株式会社半導体エネルギー研究所 | 発光装置の作製方法 |
| WO2006093171A1 (en) | 2005-02-28 | 2006-09-08 | Semiconductor Energy Laboratory Co., Ltd. | Composite material, light emitting element, light emitting device and electronic appliance using the composite material |
| JP4954623B2 (ja) * | 2005-07-08 | 2012-06-20 | 株式会社半導体エネルギー研究所 | 発光装置 |
| JP2007042492A (ja) | 2005-08-04 | 2007-02-15 | Aitesu:Kk | 有機elリペア方法とリペア装置 |
| JP2007042498A (ja) * | 2005-08-04 | 2007-02-15 | Aitesu:Kk | 有機elレーザリペア方法及びレーザリペア装置 |
| JP2007207703A (ja) * | 2006-02-06 | 2007-08-16 | Sharp Corp | 有機エレクトロルミネッセンス装置の修復方法 |
| JP4853072B2 (ja) * | 2006-03-27 | 2012-01-11 | 株式会社デンソー | 有機el素子の製造方法 |
| JP2008021441A (ja) | 2006-07-11 | 2008-01-31 | Aitesu:Kk | 検査装置と検査方法 |
-
2010
- 2010-07-01 KR KR1020127000256A patent/KR101720077B1/ko not_active Expired - Fee Related
- 2010-07-01 WO PCT/JP2010/061569 patent/WO2011013493A1/en not_active Ceased
- 2010-07-01 KR KR1020177007556A patent/KR101839292B1/ko not_active Expired - Fee Related
- 2010-07-21 TW TW099123973A patent/TWI539864B/zh not_active IP Right Cessation
- 2010-07-22 US US12/841,394 patent/US8415174B2/en not_active Expired - Fee Related
- 2010-07-26 JP JP2010167125A patent/JP5610895B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011049159A (ja) | 2011-03-10 |
| US8415174B2 (en) | 2013-04-09 |
| US20110027918A1 (en) | 2011-02-03 |
| KR101720077B1 (ko) | 2017-03-27 |
| KR20170034931A (ko) | 2017-03-29 |
| TWI539864B (zh) | 2016-06-21 |
| TW201125428A (en) | 2011-07-16 |
| KR20120051633A (ko) | 2012-05-22 |
| WO2011013493A1 (en) | 2011-02-03 |
| KR101839292B1 (ko) | 2018-03-19 |
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