JP5545065B2 - フーリエ変換赤外分光光度計 - Google Patents

フーリエ変換赤外分光光度計 Download PDF

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JP5545065B2
JP5545065B2 JP2010143307A JP2010143307A JP5545065B2 JP 5545065 B2 JP5545065 B2 JP 5545065B2 JP 2010143307 A JP2010143307 A JP 2010143307A JP 2010143307 A JP2010143307 A JP 2010143307A JP 5545065 B2 JP5545065 B2 JP 5545065B2
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mirror
control means
interferometer
parameter
fixed mirror
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JP2012007964A (ja
JP2012007964A5 (enExample
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久人 福田
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Shimadzu Corp
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Shimadzu Corp
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JP2010143307A 2010-06-24 2010-06-24 フーリエ変換赤外分光光度計 Active JP5545065B2 (ja)

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JP2010143307A JP5545065B2 (ja) 2010-06-24 2010-06-24 フーリエ変換赤外分光光度計

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JP2010143307A JP5545065B2 (ja) 2010-06-24 2010-06-24 フーリエ変換赤外分光光度計

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JP2012007964A JP2012007964A (ja) 2012-01-12
JP2012007964A5 JP2012007964A5 (enExample) 2012-11-08
JP5545065B2 true JP5545065B2 (ja) 2014-07-09

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Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014119290A (ja) * 2012-12-14 2014-06-30 Mitsubishi Electric Corp 膜厚測定装置
JP6195459B2 (ja) * 2013-03-19 2017-09-13 日本分光株式会社 干渉計用可動ミラーの速度制御装置、フーリエ変換分光光度計
JP6242718B2 (ja) * 2013-06-27 2017-12-06 株式会社リガク 熱刺激電流測定装置、熱刺激電流測定プログラムおよび熱刺激電流測定方法
JP6278205B2 (ja) * 2015-01-29 2018-02-14 株式会社島津製作所 フーリエ変換型分光光度計
JP6575363B2 (ja) * 2016-01-08 2019-09-18 株式会社島津製作所 分析装置
JP6885233B2 (ja) 2017-07-07 2021-06-09 株式会社島津製作所 フーリエ変換赤外分光光度計
US20240385105A1 (en) * 2021-09-14 2024-11-21 Shimadzu Corporation Fourier transform infrared spectrophotometer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63168502A (ja) * 1986-12-30 1988-07-12 Shimadzu Corp 干渉計の調整装置
JPH01185475A (ja) * 1988-01-20 1989-07-25 Yaskawa Electric Mfg Co Ltd レーザ測長装置
JPH07119564B2 (ja) * 1989-03-27 1995-12-20 株式会社島津製作所 二光束干渉計
JPH04109127A (ja) * 1990-08-29 1992-04-10 Shimadzu Corp 二光束干渉計
JP2009139352A (ja) * 2007-12-11 2009-06-25 Shimadzu Corp フーリエ変換型赤外分光光度計

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