JP5528662B2 - 半導体集積回路 - Google Patents
半導体集積回路 Download PDFInfo
- Publication number
- JP5528662B2 JP5528662B2 JP2007241517A JP2007241517A JP5528662B2 JP 5528662 B2 JP5528662 B2 JP 5528662B2 JP 2007241517 A JP2007241517 A JP 2007241517A JP 2007241517 A JP2007241517 A JP 2007241517A JP 5528662 B2 JP5528662 B2 JP 5528662B2
- Authority
- JP
- Japan
- Prior art keywords
- switch
- line
- block
- voltage
- semiconductor integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/6871—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor
- H03K17/6872—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor using complementary field-effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/0185—Coupling arrangements; Interface arrangements using field effect transistors only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/01—Details
- H03K3/012—Modifications of generator to improve response time or to decrease power consumption
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/10—Integrated device layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/90—Masterslice integrated circuits
- H10D84/903—Masterslice integrated circuits comprising field effect technology
- H10D84/907—CMOS gate arrays
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Priority Applications (11)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007241517A JP5528662B2 (ja) | 2007-09-18 | 2007-09-18 | 半導体集積回路 |
| US12/230,098 US7940080B2 (en) | 2007-09-18 | 2008-08-22 | Semiconductor integrated circuit |
| TW097134560A TWI430398B (zh) | 2007-09-18 | 2008-09-09 | 半導體積體電路 |
| CN201110068579.1A CN102157521B (zh) | 2007-09-18 | 2008-09-18 | 半导体集成电路 |
| CN2008101494840A CN101393910B (zh) | 2007-09-18 | 2008-09-18 | 半导体集成电路 |
| US12/929,180 US8143914B2 (en) | 2007-09-18 | 2011-01-06 | Semiconductor integrated circuit |
| US13/371,994 US8890568B2 (en) | 2007-09-18 | 2012-02-13 | Semiconductor integrated circuit |
| US14/263,598 US9058979B2 (en) | 2007-09-18 | 2014-04-28 | Semiconductor integrated circuit having a switch, an electrically-conductive electrode line and an electrically-conductive virtual line |
| US14/665,662 US9252763B2 (en) | 2007-09-18 | 2015-03-23 | Semiconductor integrated circuit having a switch, an electrically- conductive electrode line and an electrically-conductive virtual line |
| US14/956,250 US9735775B2 (en) | 2007-09-18 | 2015-12-01 | Semiconductor integrated circuit having a switch, an electrically- conductive electrode line and an electrically-conductive virtual line |
| US15/664,393 US10263617B2 (en) | 2007-09-18 | 2017-07-31 | Semiconductor integrated circuit having a switch, an electrically-conductive electrode line and an electrically-conductive virtual line |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007241517A JP5528662B2 (ja) | 2007-09-18 | 2007-09-18 | 半導体集積回路 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013029163A Division JP5549752B2 (ja) | 2013-02-18 | 2013-02-18 | 半導体集積回路 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009076501A JP2009076501A (ja) | 2009-04-09 |
| JP2009076501A5 JP2009076501A5 (enExample) | 2010-11-18 |
| JP5528662B2 true JP5528662B2 (ja) | 2014-06-25 |
Family
ID=40453812
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007241517A Active JP5528662B2 (ja) | 2007-09-18 | 2007-09-18 | 半導体集積回路 |
Country Status (4)
| Country | Link |
|---|---|
| US (7) | US7940080B2 (enExample) |
| JP (1) | JP5528662B2 (enExample) |
| CN (2) | CN102157521B (enExample) |
| TW (1) | TWI430398B (enExample) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5528662B2 (ja) * | 2007-09-18 | 2014-06-25 | ソニー株式会社 | 半導体集積回路 |
| US8495547B2 (en) * | 2009-11-11 | 2013-07-23 | International Business Machines Corporation | Providing secondary power pins in integrated circuit design |
| JP5404678B2 (ja) * | 2011-03-10 | 2014-02-05 | 株式会社東芝 | 電源制御装置 |
| US8451026B2 (en) * | 2011-05-13 | 2013-05-28 | Arm Limited | Integrated circuit, method of generating a layout of an integrated circuit using standard cells, and a standard cell library providing such standard cells |
| US8902625B2 (en) * | 2011-11-22 | 2014-12-02 | Marvell World Trade Ltd. | Layouts for memory and logic circuits in a system-on-chip |
| US8823399B1 (en) | 2013-10-07 | 2014-09-02 | Cypress Semiconductor Corporation | Detect and differentiate touches from different size conductive objects on a capacitive button |
| JP6264860B2 (ja) | 2013-11-27 | 2018-01-24 | セイコーエプソン株式会社 | 記録装置 |
| US9305898B2 (en) | 2014-01-23 | 2016-04-05 | Freescale Semiconductor, Inc. | Semiconductor device with combined power and ground ring structure |
| US9177834B2 (en) | 2014-02-19 | 2015-11-03 | Freescale Semiconductor, Inc. | Power bar design for lead frame-based packages |
| CN109155284B (zh) * | 2016-06-01 | 2022-09-23 | 株式会社索思未来 | 半导体集成电路装置 |
| KR102630392B1 (ko) | 2016-12-06 | 2024-01-29 | 삼성전자주식회사 | 반도체 장치, 반도체 장치의 레이아웃 설계 방법, 및 반도체 장치의 제조 방법 |
| US10417371B2 (en) * | 2017-01-27 | 2019-09-17 | Arm Limited | Power grid healing techniques |
| US10452803B2 (en) * | 2017-01-27 | 2019-10-22 | Arm Limited | Power grid insertion technique |
| JP7041368B2 (ja) * | 2017-03-29 | 2022-03-24 | 株式会社ソシオネクスト | 半導体集積回路装置 |
| US10346574B2 (en) * | 2017-06-16 | 2019-07-09 | Qualcomm Incorporated | Effective substitution of global distributed head switch cells with cluster head switch cells |
| JP7077816B2 (ja) | 2018-06-25 | 2022-05-31 | 株式会社ソシオネクスト | 半導体装置 |
| WO2020217400A1 (ja) | 2019-04-25 | 2020-10-29 | 株式会社ソシオネクスト | 半導体装置 |
| WO2020217396A1 (ja) | 2019-04-25 | 2020-10-29 | 株式会社ソシオネクスト | 半導体装置 |
| CN112864127B (zh) * | 2019-11-28 | 2024-03-08 | 扬智科技股份有限公司 | 集成电路的导线互连结构 |
| CN116472605B (zh) * | 2020-11-27 | 2025-06-24 | 株式会社索思未来 | 半导体集成电路装置的设计方法、半导体集成电路装置以及计算机可读记录介质 |
| CN113515826B (zh) * | 2021-04-09 | 2022-11-25 | 云南电网有限责任公司昆明供电局 | 配电网合环线路拓扑搜索方法及系统 |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2888898B2 (ja) * | 1990-02-23 | 1999-05-10 | 株式会社日立製作所 | 半導体集積回路 |
| TW382164B (en) | 1996-04-08 | 2000-02-11 | Hitachi Ltd | Semiconductor IC device with tunnel current free MOS transistors for power supply intercept of main logic |
| JP4056107B2 (ja) | 1997-06-20 | 2008-03-05 | エルピーダメモリ株式会社 | 半導体集積回路 |
| JP3847147B2 (ja) | 2001-11-22 | 2006-11-15 | 富士通株式会社 | マルチスレショールド電圧mis集積回路装置及びその回路設計方法 |
| JP3786608B2 (ja) * | 2002-01-28 | 2006-06-14 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
| JP3951773B2 (ja) | 2002-03-28 | 2007-08-01 | 富士通株式会社 | リーク電流遮断回路を有する半導体集積回路 |
| US7078932B2 (en) * | 2003-04-25 | 2006-07-18 | Stmicroelectronics Pvt. Ltd. | Programmable logic device with reduced power consumption |
| US6861753B1 (en) * | 2003-10-09 | 2005-03-01 | International Business Machines Corporation | Method and apparatus for performing power routing on a voltage island within an integrated circuit chip |
| JP4435553B2 (ja) * | 2003-12-12 | 2010-03-17 | パナソニック株式会社 | 半導体装置 |
| JP4200926B2 (ja) * | 2004-03-10 | 2008-12-24 | ソニー株式会社 | 半導体集積回路 |
| JP4428514B2 (ja) * | 2004-03-30 | 2010-03-10 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
| WO2005104233A1 (en) | 2004-04-27 | 2005-11-03 | Koninklijke Philips Electronics N.V. | Integrated circuit layout for virtual power supply |
| JP2005327862A (ja) * | 2004-05-13 | 2005-11-24 | Toshiba Corp | 半導体集積回路及び半導体集積回路の設計方法 |
| US7279926B2 (en) * | 2004-05-27 | 2007-10-09 | Qualcomm Incoporated | Headswitch and footswitch circuitry for power management |
| EP1638145A1 (en) * | 2004-09-20 | 2006-03-22 | Infineon Technologies AG | Embedded switchable power ring |
| US20090079465A1 (en) * | 2005-04-21 | 2009-03-26 | Toshio Sasaki | Semiconductor integrated circuit |
| JP2007158035A (ja) * | 2005-12-06 | 2007-06-21 | Seiko Epson Corp | 半導体集積回路 |
| US7712066B2 (en) * | 2005-12-29 | 2010-05-04 | Agere Systems, Inc. | Area-efficient power switching cell |
| US7509613B2 (en) * | 2006-01-13 | 2009-03-24 | Sequence Design, Inc. | Design method and architecture for power gate switch placement and interconnection using tapless libraries |
| JP4188974B2 (ja) | 2006-02-06 | 2008-12-03 | 株式会社ルネサステクノロジ | 半導体集積回路 |
| JP2007243077A (ja) * | 2006-03-13 | 2007-09-20 | Renesas Technology Corp | 半導体集積回路装置 |
| KR100780750B1 (ko) * | 2006-05-11 | 2007-11-30 | 한국과학기술원 | 표준 셀과 파워 게이팅 셀을 이용한 파워 네트워크 및 이를가지는 반도체 장치 |
| US7723867B2 (en) * | 2007-05-31 | 2010-05-25 | Arm Limited | Power gating of circuits |
| JP5528662B2 (ja) * | 2007-09-18 | 2014-06-25 | ソニー株式会社 | 半導体集積回路 |
| JP4636077B2 (ja) * | 2007-11-07 | 2011-02-23 | ソニー株式会社 | 半導体集積回路 |
| JP4535134B2 (ja) * | 2008-01-16 | 2010-09-01 | ソニー株式会社 | 半導体集積回路およびその電源制御方法 |
| JP4535136B2 (ja) * | 2008-01-17 | 2010-09-01 | ソニー株式会社 | 半導体集積回路、および、スイッチの配置配線方法 |
-
2007
- 2007-09-18 JP JP2007241517A patent/JP5528662B2/ja active Active
-
2008
- 2008-08-22 US US12/230,098 patent/US7940080B2/en active Active
- 2008-09-09 TW TW097134560A patent/TWI430398B/zh active
- 2008-09-18 CN CN201110068579.1A patent/CN102157521B/zh active Active
- 2008-09-18 CN CN2008101494840A patent/CN101393910B/zh not_active Expired - Fee Related
-
2011
- 2011-01-06 US US12/929,180 patent/US8143914B2/en not_active Expired - Fee Related
-
2012
- 2012-02-13 US US13/371,994 patent/US8890568B2/en active Active
-
2014
- 2014-04-28 US US14/263,598 patent/US9058979B2/en active Active
-
2015
- 2015-03-23 US US14/665,662 patent/US9252763B2/en active Active
- 2015-12-01 US US14/956,250 patent/US9735775B2/en active Active
-
2017
- 2017-07-31 US US15/664,393 patent/US10263617B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN102157521A (zh) | 2011-08-17 |
| CN102157521B (zh) | 2014-08-20 |
| US20120256683A1 (en) | 2012-10-11 |
| US10263617B2 (en) | 2019-04-16 |
| CN101393910B (zh) | 2011-05-18 |
| US8890568B2 (en) | 2014-11-18 |
| US9058979B2 (en) | 2015-06-16 |
| US20150194955A1 (en) | 2015-07-09 |
| JP2009076501A (ja) | 2009-04-09 |
| US7940080B2 (en) | 2011-05-10 |
| US20170331472A1 (en) | 2017-11-16 |
| CN101393910A (zh) | 2009-03-25 |
| TW200935559A (en) | 2009-08-16 |
| US9252763B2 (en) | 2016-02-02 |
| US20160156349A1 (en) | 2016-06-02 |
| US8143914B2 (en) | 2012-03-27 |
| US9735775B2 (en) | 2017-08-15 |
| US20140232448A1 (en) | 2014-08-21 |
| US20110102076A1 (en) | 2011-05-05 |
| US20090072888A1 (en) | 2009-03-19 |
| TWI430398B (zh) | 2014-03-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5528662B2 (ja) | 半導体集積回路 | |
| JP4535136B2 (ja) | 半導体集積回路、および、スイッチの配置配線方法 | |
| US10748933B2 (en) | Semiconductor device | |
| US6900478B2 (en) | Multi-threshold MIS integrated circuit device and circuit design method thereof | |
| US20020030510A1 (en) | Semiconductor integrated circuit for low power and high speed operation | |
| JP2013030602A (ja) | 半導体集積回路装置 | |
| JP4492736B2 (ja) | 半導体集積回路 | |
| JP5486172B2 (ja) | 半導体記憶装置 | |
| JP5842946B2 (ja) | 半導体集積回路 | |
| JP5549752B2 (ja) | 半導体集積回路 | |
| JP5029272B2 (ja) | 半導体集積回路 | |
| JP2004172627A (ja) | 半導体集積回路装置およびセルライブラリを記憶した記憶媒体および半導体集積回路の設計方法 | |
| JP4229207B2 (ja) | 半導体集積回路 | |
| JP5715716B2 (ja) | 半導体記憶装置 | |
| JP2009135264A (ja) | スタンダードセル、スタンダードセルライブラリ、半導体集積回路およびその設計方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20100315 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100930 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20121130 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20121218 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130218 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20130917 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20140416 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5528662 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |