JP5500954B2 - 粘着材供給装置及びその製造方法 - Google Patents
粘着材供給装置及びその製造方法 Download PDFInfo
- Publication number
- JP5500954B2 JP5500954B2 JP2009264314A JP2009264314A JP5500954B2 JP 5500954 B2 JP5500954 B2 JP 5500954B2 JP 2009264314 A JP2009264314 A JP 2009264314A JP 2009264314 A JP2009264314 A JP 2009264314A JP 5500954 B2 JP5500954 B2 JP 5500954B2
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- JP
- Japan
- Prior art keywords
- silicon
- adhesive material
- material supply
- flux
- resin layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000463 material Substances 0.000 title claims description 138
- 239000000853 adhesive Substances 0.000 title claims description 136
- 230000001070 adhesive effect Effects 0.000 title claims description 136
- 238000004519 manufacturing process Methods 0.000 title claims description 39
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 255
- 229910052710 silicon Inorganic materials 0.000 claims description 255
- 239000010703 silicon Substances 0.000 claims description 255
- 229920005989 resin Polymers 0.000 claims description 145
- 239000011347 resin Substances 0.000 claims description 145
- 238000012546 transfer Methods 0.000 claims description 113
- 230000004907 flux Effects 0.000 claims description 105
- 239000000758 substrate Substances 0.000 claims description 68
- 238000000034 method Methods 0.000 claims description 54
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 33
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 33
- 239000010410 layer Substances 0.000 description 138
- 229910000679 solder Inorganic materials 0.000 description 68
- 239000004065 semiconductor Substances 0.000 description 23
- 239000011295 pitch Substances 0.000 description 15
- 238000010438 heat treatment Methods 0.000 description 11
- 238000001312 dry etching Methods 0.000 description 10
- 238000005530 etching Methods 0.000 description 9
- 238000003825 pressing Methods 0.000 description 9
- 238000000059 patterning Methods 0.000 description 8
- 238000000206 photolithography Methods 0.000 description 8
- 229920001721 polyimide Polymers 0.000 description 6
- 239000009719 polyimide resin Substances 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 229920002050 silicone resin Polymers 0.000 description 6
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 230000008602 contraction Effects 0.000 description 4
- 238000005520 cutting process Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000000149 penetrating effect Effects 0.000 description 3
- 238000007639 printing Methods 0.000 description 3
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000005489 elastic deformation Effects 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1517—Multilayer substrate
- H01L2924/15172—Fan-out arrangement of the internal vias
- H01L2924/15174—Fan-out arrangement of the internal vias in different layers of the multilayer substrate
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009264314A JP5500954B2 (ja) | 2009-11-19 | 2009-11-19 | 粘着材供給装置及びその製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009264314A JP5500954B2 (ja) | 2009-11-19 | 2009-11-19 | 粘着材供給装置及びその製造方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2011108948A JP2011108948A (ja) | 2011-06-02 |
JP2011108948A5 JP2011108948A5 (enrdf_load_stackoverflow) | 2012-10-04 |
JP5500954B2 true JP5500954B2 (ja) | 2014-05-21 |
Family
ID=44232099
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009264314A Active JP5500954B2 (ja) | 2009-11-19 | 2009-11-19 | 粘着材供給装置及びその製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5500954B2 (enrdf_load_stackoverflow) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6088789B2 (ja) * | 2012-10-26 | 2017-03-01 | 新光電気工業株式会社 | 粘着材供給装置及びその製造方法 |
KR102060831B1 (ko) | 2013-02-27 | 2019-12-30 | 삼성전자주식회사 | 플립 칩 패키징 방법, 그리고 상기 플립 칩 패키징 방법에 적용되는 플럭스 헤드 및 그 제조 방법 |
KR101575641B1 (ko) | 2014-04-21 | 2015-12-08 | 주식회사 루멘스 | 솔더 패터닝 시스템 및 솔더 패터닝 방법 |
WO2021194093A1 (ko) * | 2020-03-27 | 2021-09-30 | (주) 에스에스피 | 탄성패드를 이용한 플럭스툴 |
KR102206228B1 (ko) * | 2020-03-27 | 2021-01-22 | (주)에스에스피 | 탄성패드를 이용한 플럭스툴 |
JP7698537B2 (ja) * | 2021-09-22 | 2025-06-25 | ファスフォードテクノロジ株式会社 | ディッピング装置、ダイボンディング装置および半導体装置の製造方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0720383Y2 (ja) * | 1987-07-21 | 1995-05-15 | 株式会社明電舎 | 水車ガイドベ−ンの異常検出装置 |
JP2001135925A (ja) * | 1999-11-04 | 2001-05-18 | Nec Corp | フラックス供給装置及び供給方法 |
JP2004047874A (ja) * | 2002-07-15 | 2004-02-12 | Nec Semiconductors Kyushu Ltd | フラックス転写装置 |
JP4653787B2 (ja) * | 2007-08-08 | 2011-03-16 | 株式会社東芝 | 複製スタンパおよびその製造方法 |
-
2009
- 2009-11-19 JP JP2009264314A patent/JP5500954B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
JP2011108948A (ja) | 2011-06-02 |
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