JP5489096B2 - 蛍光ｘ線分析装置 - Google Patents

蛍光ｘ線分析装置 Download PDF

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JP5489096B2
JP5489096B2 JP2009245377A JP2009245377A JP5489096B2 JP 5489096 B2 JP5489096 B2 JP 5489096B2 JP 2009245377 A JP2009245377 A JP 2009245377A JP 2009245377 A JP2009245377 A JP 2009245377A JP 5489096 B2 JP5489096 B2 JP 5489096B2
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sample
component
concentration
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glass bead
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JP2011089952A5 (enExample
JP2011089952A (ja
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由行 片岡
寿 本間
泰彦 名越
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Rigaku Corp
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Rigaku Corp
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JP2009245377A 2009-10-26 2009-10-26 蛍光ｘ線分析装置 Active JP5489096B2 (ja)

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JP2009245377A JP5489096B2 (ja) 2009-10-26 2009-10-26 蛍光ｘ線分析装置

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JP2009245377A JP5489096B2 (ja) 2009-10-26 2009-10-26 蛍光ｘ線分析装置

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JP2011089952A JP2011089952A (ja) 2011-05-06
JP2011089952A5 JP2011089952A5 (enExample) 2012-07-26
JP5489096B2 true JP5489096B2 (ja) 2014-05-14

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Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5920841A (ja) * 1982-07-28 1984-02-02 Sumitomo Metal Ind Ltd 「けい」光ｘ線分析方法
JP2626857B2 (ja) * 1992-05-15 1997-07-02 理学電機工業株式会社 ガラスビード法を用いた蛍光ｘ線分析方法
JP3384010B2 (ja) * 1992-12-28 2003-03-10 ティーディーケイ株式会社 蛍光ｘ線分析用標準試料の作成方法
JP3284195B2 (ja) * 1998-07-31 2002-05-20 理学電機工業株式会社 ガラスビード法による蛍光ｘ線分析システム
JP3527955B2 (ja) * 1999-08-26 2004-05-17 理学電機工業株式会社 蛍光ｘ線分析装置
JP4287073B2 (ja) * 2001-05-31 2009-07-01 株式会社リガク ガラスビードの希釈率の算出装置およびプログラムならびに前記算出装置を有するｘ線分析装置

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