JP2011089952A5 - - Google Patents

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Publication number
JP2011089952A5
JP2011089952A5 JP2009245377A JP2009245377A JP2011089952A5 JP 2011089952 A5 JP2011089952 A5 JP 2011089952A5 JP 2009245377 A JP2009245377 A JP 2009245377A JP 2009245377 A JP2009245377 A JP 2009245377A JP 2011089952 A5 JP2011089952 A5 JP 2011089952A5
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Japan
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concentration
component
converted
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JP2009245377A
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English (en)
Japanese (ja)
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JP5489096B2 (ja
JP2011089952A (ja
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Priority to JP2009245377A priority Critical patent/JP5489096B2/ja
Priority claimed from JP2009245377A external-priority patent/JP5489096B2/ja
Publication of JP2011089952A publication Critical patent/JP2011089952A/ja
Publication of JP2011089952A5 publication Critical patent/JP2011089952A5/ja
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Publication of JP5489096B2 publication Critical patent/JP5489096B2/ja
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JP2009245377A 2009-10-26 2009-10-26 蛍光ｘ線分析装置 Active JP5489096B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009245377A JP5489096B2 (ja) 2009-10-26 2009-10-26 蛍光ｘ線分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009245377A JP5489096B2 (ja) 2009-10-26 2009-10-26 蛍光ｘ線分析装置

Publications (3)

Publication Number Publication Date
JP2011089952A JP2011089952A (ja) 2011-05-06
JP2011089952A5 true JP2011089952A5 (enExample) 2012-07-26
JP5489096B2 JP5489096B2 (ja) 2014-05-14

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ID=44108324

Family Applications (1)

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JP2009245377A Active JP5489096B2 (ja) 2009-10-26 2009-10-26 蛍光ｘ線分析装置

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JP (1) JP5489096B2 (enExample)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5920841A (ja) * 1982-07-28 1984-02-02 Sumitomo Metal Ind Ltd 「けい」光ｘ線分析方法
JP2626857B2 (ja) * 1992-05-15 1997-07-02 理学電機工業株式会社 ガラスビード法を用いた蛍光ｘ線分析方法
JP3384010B2 (ja) * 1992-12-28 2003-03-10 ティーディーケイ株式会社 蛍光ｘ線分析用標準試料の作成方法
JP3284195B2 (ja) * 1998-07-31 2002-05-20 理学電機工業株式会社 ガラスビード法による蛍光ｘ線分析システム
JP3527955B2 (ja) * 1999-08-26 2004-05-17 理学電機工業株式会社 蛍光ｘ線分析装置
JP4287073B2 (ja) * 2001-05-31 2009-07-01 株式会社リガク ガラスビードの希釈率の算出装置およびプログラムならびに前記算出装置を有するｘ線分析装置

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