JP5376706B2 - 半導体装置の作製方法 - Google Patents
半導体装置の作製方法 Download PDFInfo
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- JP5376706B2 JP5376706B2 JP2007294261A JP2007294261A JP5376706B2 JP 5376706 B2 JP5376706 B2 JP 5376706B2 JP 2007294261 A JP2007294261 A JP 2007294261A JP 2007294261 A JP2007294261 A JP 2007294261A JP 5376706 B2 JP5376706 B2 JP 5376706B2
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- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/481—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs integrated with passive devices, e.g. auxiliary capacitors
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- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
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- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
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- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
- H01L21/02675—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth using laser beams
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- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
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- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
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- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007294261A JP5376706B2 (ja) | 2006-11-17 | 2007-11-13 | 半導体装置の作製方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006310883 | 2006-11-17 | ||
| JP2006310883 | 2006-11-17 | ||
| JP2007294261A JP5376706B2 (ja) | 2006-11-17 | 2007-11-13 | 半導体装置の作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008147640A JP2008147640A (ja) | 2008-06-26 |
| JP2008147640A5 JP2008147640A5 (enExample) | 2010-12-24 |
| JP5376706B2 true JP5376706B2 (ja) | 2013-12-25 |
Family
ID=39416072
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007294261A Expired - Fee Related JP5376706B2 (ja) | 2006-11-17 | 2007-11-13 | 半導体装置の作製方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US8759946B2 (enExample) |
| JP (1) | JP5376706B2 (enExample) |
| KR (1) | KR101416876B1 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7872934B2 (en) * | 2007-12-14 | 2011-01-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for writing data into memory |
| JP5371400B2 (ja) * | 2007-12-14 | 2013-12-18 | 株式会社半導体エネルギー研究所 | メモリ及び半導体装置 |
| JP5358324B2 (ja) | 2008-07-10 | 2013-12-04 | 株式会社半導体エネルギー研究所 | 電子ペーパー |
| WO2011010702A1 (ja) * | 2009-07-22 | 2011-01-27 | 株式会社村田製作所 | アンチヒューズ素子 |
| JP5641840B2 (ja) * | 2009-10-01 | 2014-12-17 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| WO2011074407A1 (en) | 2009-12-18 | 2011-06-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| SG10201500220TA (en) * | 2010-01-15 | 2015-03-30 | Semiconductor Energy Lab | Semiconductor device and method for driving the same |
| CN102754163B (zh) * | 2010-02-19 | 2015-11-25 | 株式会社半导体能源研究所 | 半导体器件 |
| US8634228B2 (en) * | 2010-09-02 | 2014-01-21 | Semiconductor Energy Laboratory Co., Ltd. | Driving method of semiconductor device |
| JP5731369B2 (ja) | 2010-12-28 | 2015-06-10 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| WO2012090799A1 (en) | 2010-12-28 | 2012-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| US9443984B2 (en) | 2010-12-28 | 2016-09-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| JP5975635B2 (ja) | 2010-12-28 | 2016-08-23 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| US8883556B2 (en) | 2010-12-28 | 2014-11-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| US8941112B2 (en) | 2010-12-28 | 2015-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| US8802493B2 (en) | 2011-09-13 | 2014-08-12 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of oxide semiconductor device |
| US9082663B2 (en) | 2011-09-16 | 2015-07-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| US9991392B2 (en) * | 2013-12-03 | 2018-06-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
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| JP2913768B2 (ja) | 1990-05-23 | 1999-06-28 | 日本電気株式会社 | 半導体装置 |
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2007
- 2007-10-30 KR KR1020070109342A patent/KR101416876B1/ko not_active Expired - Fee Related
- 2007-11-13 US US11/979,992 patent/US8759946B2/en not_active Expired - Fee Related
- 2007-11-13 JP JP2007294261A patent/JP5376706B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US8759946B2 (en) | 2014-06-24 |
| JP2008147640A (ja) | 2008-06-26 |
| KR20080044763A (ko) | 2008-05-21 |
| KR101416876B1 (ko) | 2014-07-08 |
| US20080116500A1 (en) | 2008-05-22 |
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