JP5341999B2 - ワークの寸法測定用治具 - Google Patents

ワークの寸法測定用治具 Download PDF

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Publication number
JP5341999B2
JP5341999B2 JP2011524592A JP2011524592A JP5341999B2 JP 5341999 B2 JP5341999 B2 JP 5341999B2 JP 2011524592 A JP2011524592 A JP 2011524592A JP 2011524592 A JP2011524592 A JP 2011524592A JP 5341999 B2 JP5341999 B2 JP 5341999B2
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JP
Japan
Prior art keywords
workpiece
chuck mechanism
base
jig
shaft
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2011524592A
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English (en)
Japanese (ja)
Other versions
JPWO2011013239A1 (ja
Inventor
隆史 東尾
浩幸 中澤
晃正 須田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Wiring Systems Ltd
Suzuki Co Ltd
Original Assignee
Sumitomo Wiring Systems Ltd
Suzuki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Wiring Systems Ltd, Suzuki Co Ltd filed Critical Sumitomo Wiring Systems Ltd
Publication of JPWO2011013239A1 publication Critical patent/JPWO2011013239A1/ja
Application granted granted Critical
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Expired - Fee Related legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T82/00—Turning
    • Y10T82/25—Lathe
    • Y10T82/2572—Attachment
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T82/00—Turning
    • Y10T82/25—Lathe
    • Y10T82/2593—Work rest

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP2011524592A 2009-07-31 2009-07-31 ワークの寸法測定用治具 Expired - Fee Related JP5341999B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2009/063647 WO2011013239A1 (ja) 2009-07-31 2009-07-31 ワークの寸法測定用治具

Publications (2)

Publication Number Publication Date
JPWO2011013239A1 JPWO2011013239A1 (ja) 2013-01-07
JP5341999B2 true JP5341999B2 (ja) 2013-11-13

Family

ID=43528915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011524592A Expired - Fee Related JP5341999B2 (ja) 2009-07-31 2009-07-31 ワークの寸法測定用治具

Country Status (6)

Country Link
US (1) US8757036B2 (enExample)
EP (1) EP2460621B1 (enExample)
JP (1) JP5341999B2 (enExample)
CN (1) CN102481670A (enExample)
IN (1) IN2012DN00745A (enExample)
WO (1) WO2011013239A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103753077B (zh) * 2013-12-16 2015-12-09 唐山轨道客车有限责任公司 构架侧梁定位装置
JP6267154B2 (ja) * 2015-05-19 2018-01-24 ファナック株式会社 モータの出力軸の精度を測定する軸精度測定装置
CN106767556B (zh) * 2016-12-26 2023-06-06 重庆越发机械制造有限公司 高精度变档拨叉同心度检测设备
US10976363B2 (en) * 2017-12-15 2021-04-13 Mpi Corporation Wafer inspection method and wafer probing system
US11353501B2 (en) 2017-12-15 2022-06-07 Mpi Corporation Wafer inspection method and wafer probing system
USD969180S1 (en) 2019-12-26 2022-11-08 Nagase Integrex Co., Ltd. Machine tool
CN113418427B (zh) * 2021-06-01 2025-01-28 广州市电力工程有限公司 一种滑动式t形高压输电电缆终端头工艺检测尺
CN114166085B (zh) * 2021-10-26 2024-04-09 山东鲁玉减震系统技术有限公司 一种横梁管焊接总成检具
CN114211516B (zh) * 2021-12-31 2023-05-09 重庆电子工程职业学院 一种柔性机器触觉传感装置
CN115235311A (zh) * 2022-07-28 2022-10-25 重庆长安汽车股份有限公司 一种动力输出端子空间尺寸检测工装
CN114993139B (zh) * 2022-08-01 2022-10-04 四川丹齿精工科技有限公司 一种汽车后桥齿轮厚度检测装置
CN115468506B (zh) * 2022-10-13 2025-02-11 安徽环友科技有限公司 一种pcb铣刀生产用棒料自动抽检装置
CN119533246B (zh) * 2024-12-31 2025-11-11 武汉东方骏驰精密制造有限公司 一种斜齿外径及中心孔同步检测装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61277004A (ja) * 1985-05-31 1986-12-08 Tokyo Optical Co Ltd 寸法測定装置
JPH0593730U (ja) * 1991-09-17 1993-12-21 日本電気ホームエレクトロニクス株式会社 チャッキング機構
JPH0712534A (ja) * 1993-04-26 1995-01-17 Koyo Seiko Co Ltd ３次元形状測定装置
JPH09178437A (ja) * 1995-12-21 1997-07-11 Yunisun:Kk ３次元計測装置
JP2005138275A (ja) * 2003-10-17 2005-06-02 Sankyo Mfg Co Ltd 傾斜回転テーブル装置
JP2006150539A (ja) * 2004-11-30 2006-06-15 Tsudakoma Corp 傾斜テーブル装置
WO2009093349A1 (ja) * 2008-01-23 2009-07-30 Sumitomo Wiring Systems, Ltd. 外観検査装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8001037A (nl) * 1980-02-20 1981-09-16 Foell Remswerk Inrichting voor het bewerken van buizen, staven of soortgelijke werkstukken op het gebied van sanitaire- en verwarmingsinstallatie.
JPS6025652A (ja) * 1983-07-25 1985-02-08 Citizen Watch Co Ltd 研削盤
JPS61165644A (ja) * 1985-01-17 1986-07-26 Shin Meiwa Ind Co Ltd 端子圧着電線の端子圧着部検査装置
KR920009967B1 (ko) * 1990-11-01 1992-11-09 삼성전자 주식회사 선삭 가공물의 크램핑장치
JP2934801B2 (ja) 1991-09-30 1999-08-16 愛三工業株式会社 電磁誘導式回転検出器
JPH11173817A (ja) 1997-12-10 1999-07-02 Tsubakimoto Chain Co 寸法測定方法及びその実施に使用する装置
US6199462B1 (en) * 1998-07-28 2001-03-13 Thomas A. M. Hallett Method of repairing cylindrical workpieces and lathe therefor
JP2001255922A (ja) * 2000-03-08 2001-09-21 Fuji Mach Mfg Co Ltd 機械加工方法およびシステム
SE518837C2 (sv) * 2000-10-04 2002-11-26 Decim Ab Förfarande och anordning av tandpreparationer och deras dentala omgivning
JP3531599B2 (ja) * 2000-10-27 2004-05-31 セイコーエプソン株式会社 透孔検査装置用ワークホルダ
DE10344922B4 (de) * 2003-09-25 2008-06-26 Siemens Audiologische Technik Gmbh Rundum-Scanner
EP1574817A1 (de) * 2004-03-10 2005-09-14 Diener&AG&Precision&Machining Verfahren und Abtastanordnung zum berührungslosen Abtasten dreidimensionaler Objekte und Haltevorrichtung für Objekte
KR100672819B1 (ko) * 2004-06-24 2007-01-22 주식회사 케이씨아이 삼차원 스캐닝 시스템용 구동장치 및 이를 이용한 치아컴퓨터 모델링용 삼차원 스캐닝 시스템
US7191540B1 (en) * 2005-10-31 2007-03-20 Mitutoyo Corporation Work piece holder for surface measuring apparatus
US7597513B2 (en) * 2007-03-16 2009-10-06 Vance Chiang Upright inclined-hole drilling jig

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61277004A (ja) * 1985-05-31 1986-12-08 Tokyo Optical Co Ltd 寸法測定装置
JPH0593730U (ja) * 1991-09-17 1993-12-21 日本電気ホームエレクトロニクス株式会社 チャッキング機構
JPH0712534A (ja) * 1993-04-26 1995-01-17 Koyo Seiko Co Ltd ３次元形状測定装置
JPH09178437A (ja) * 1995-12-21 1997-07-11 Yunisun:Kk ３次元計測装置
JP2005138275A (ja) * 2003-10-17 2005-06-02 Sankyo Mfg Co Ltd 傾斜回転テーブル装置
JP2006150539A (ja) * 2004-11-30 2006-06-15 Tsudakoma Corp 傾斜テーブル装置
WO2009093349A1 (ja) * 2008-01-23 2009-07-30 Sumitomo Wiring Systems, Ltd. 外観検査装置

Also Published As

Publication number Publication date
CN102481670A (zh) 2012-05-30
IN2012DN00745A (enExample) 2015-06-19
EP2460621B1 (en) 2016-06-29
US20120134573A1 (en) 2012-05-31
JPWO2011013239A1 (ja) 2013-01-07
US8757036B2 (en) 2014-06-24
WO2011013239A1 (ja) 2011-02-03
EP2460621A1 (en) 2012-06-06
EP2460621A4 (en) 2015-07-22

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