IN2012DN00745A - - Google Patents

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Publication number
IN2012DN00745A
IN2012DN00745A IN745DEN2012A IN2012DN00745A IN 2012DN00745 A IN2012DN00745 A IN 2012DN00745A IN 745DEN2012 A IN745DEN2012 A IN 745DEN2012A IN 2012DN00745 A IN2012DN00745 A IN 2012DN00745A
Authority
IN
India
Prior art keywords
base
workpiece
drive mechanism
rotation axis
holding
Prior art date
Application number
Other languages
English (en)
Inventor
Higashio Takafumi
Nakazawa Hiroyuki
Suda Akimasa
Original Assignee
Sumitomo Wiring Systems
Suzuki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Wiring Systems, Suzuki Co Ltd filed Critical Sumitomo Wiring Systems
Publication of IN2012DN00745A publication Critical patent/IN2012DN00745A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T82/00—Turning
    • Y10T82/25—Lathe
    • Y10T82/2572—Attachment
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T82/00—Turning
    • Y10T82/25—Lathe
    • Y10T82/2593—Work rest

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
IN745DEN2012 2009-07-31 2009-07-31 IN2012DN00745A (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2009/063647 WO2011013239A1 (ja) 2009-07-31 2009-07-31 ワークの寸法測定用治具

Publications (1)

Publication Number Publication Date
IN2012DN00745A true IN2012DN00745A (enExample) 2015-06-19

Family

ID=43528915

Family Applications (1)

Application Number Title Priority Date Filing Date
IN745DEN2012 IN2012DN00745A (enExample) 2009-07-31 2009-07-31

Country Status (6)

Country Link
US (1) US8757036B2 (enExample)
EP (1) EP2460621B1 (enExample)
JP (1) JP5341999B2 (enExample)
CN (1) CN102481670A (enExample)
IN (1) IN2012DN00745A (enExample)
WO (1) WO2011013239A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103753077B (zh) * 2013-12-16 2015-12-09 唐山轨道客车有限责任公司 构架侧梁定位装置
JP6267154B2 (ja) * 2015-05-19 2018-01-24 ファナック株式会社 モータの出力軸の精度を測定する軸精度測定装置
CN106767556B (zh) * 2016-12-26 2023-06-06 重庆越发机械制造有限公司 高精度变档拨叉同心度检测设备
US10976363B2 (en) * 2017-12-15 2021-04-13 Mpi Corporation Wafer inspection method and wafer probing system
US11353501B2 (en) 2017-12-15 2022-06-07 Mpi Corporation Wafer inspection method and wafer probing system
USD969180S1 (en) 2019-12-26 2022-11-08 Nagase Integrex Co., Ltd. Machine tool
CN113418427B (zh) * 2021-06-01 2025-01-28 广州市电力工程有限公司 一种滑动式t形高压输电电缆终端头工艺检测尺
CN114166085B (zh) * 2021-10-26 2024-04-09 山东鲁玉减震系统技术有限公司 一种横梁管焊接总成检具
CN114211516B (zh) * 2021-12-31 2023-05-09 重庆电子工程职业学院 一种柔性机器触觉传感装置
CN115235311A (zh) * 2022-07-28 2022-10-25 重庆长安汽车股份有限公司 一种动力输出端子空间尺寸检测工装
CN114993139B (zh) * 2022-08-01 2022-10-04 四川丹齿精工科技有限公司 一种汽车后桥齿轮厚度检测装置
CN115468506B (zh) * 2022-10-13 2025-02-11 安徽环友科技有限公司 一种pcb铣刀生产用棒料自动抽检装置
CN119533246B (zh) * 2024-12-31 2025-11-11 武汉东方骏驰精密制造有限公司 一种斜齿外径及中心孔同步检测装置

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8001037A (nl) * 1980-02-20 1981-09-16 Foell Remswerk Inrichting voor het bewerken van buizen, staven of soortgelijke werkstukken op het gebied van sanitaire- en verwarmingsinstallatie.
JPS6025652A (ja) * 1983-07-25 1985-02-08 Citizen Watch Co Ltd 研削盤
JPS61165644A (ja) * 1985-01-17 1986-07-26 Shin Meiwa Ind Co Ltd 端子圧着電線の端子圧着部検査装置
JPS61277004A (ja) 1985-05-31 1986-12-08 Tokyo Optical Co Ltd 寸法測定装置
KR920009967B1 (ko) * 1990-11-01 1992-11-09 삼성전자 주식회사 선삭 가공물의 크램핑장치
JPH0593730U (ja) * 1991-09-17 1993-12-21 日本電気ホームエレクトロニクス株式会社 チャッキング機構
JP2934801B2 (ja) 1991-09-30 1999-08-16 愛三工業株式会社 電磁誘導式回転検出器
JPH0712534A (ja) * 1993-04-26 1995-01-17 Koyo Seiko Co Ltd ３次元形状測定装置
JP3602632B2 (ja) * 1995-12-21 2004-12-15 株式会社ユニスン ３次元計測装置
JPH11173817A (ja) 1997-12-10 1999-07-02 Tsubakimoto Chain Co 寸法測定方法及びその実施に使用する装置
US6199462B1 (en) * 1998-07-28 2001-03-13 Thomas A. M. Hallett Method of repairing cylindrical workpieces and lathe therefor
JP2001255922A (ja) * 2000-03-08 2001-09-21 Fuji Mach Mfg Co Ltd 機械加工方法およびシステム
SE518837C2 (sv) * 2000-10-04 2002-11-26 Decim Ab Förfarande och anordning av tandpreparationer och deras dentala omgivning
JP3531599B2 (ja) * 2000-10-27 2004-05-31 セイコーエプソン株式会社 透孔検査装置用ワークホルダ
DE10344922B4 (de) * 2003-09-25 2008-06-26 Siemens Audiologische Technik Gmbh Rundum-Scanner
JP4538292B2 (ja) 2003-10-17 2010-09-08 株式会社三共製作所 傾斜回転テーブル装置
EP1574817A1 (de) * 2004-03-10 2005-09-14 Diener&AG&Precision&Machining Verfahren und Abtastanordnung zum berührungslosen Abtasten dreidimensionaler Objekte und Haltevorrichtung für Objekte
KR100672819B1 (ko) * 2004-06-24 2007-01-22 주식회사 케이씨아이 삼차원 스캐닝 시스템용 구동장치 및 이를 이용한 치아컴퓨터 모델링용 삼차원 스캐닝 시스템
JP4615976B2 (ja) * 2004-11-30 2011-01-19 津田駒工業株式会社 傾斜テーブル装置
US7191540B1 (en) * 2005-10-31 2007-03-20 Mitutoyo Corporation Work piece holder for surface measuring apparatus
US7597513B2 (en) * 2007-03-16 2009-10-06 Vance Chiang Upright inclined-hole drilling jig
JP2009174943A (ja) 2008-01-23 2009-08-06 Sumitomo Wiring Syst Ltd 外観検査装置

Also Published As

Publication number Publication date
CN102481670A (zh) 2012-05-30
EP2460621B1 (en) 2016-06-29
US20120134573A1 (en) 2012-05-31
JPWO2011013239A1 (ja) 2013-01-07
US8757036B2 (en) 2014-06-24
WO2011013239A1 (ja) 2011-02-03
EP2460621A1 (en) 2012-06-06
EP2460621A4 (en) 2015-07-22
JP5341999B2 (ja) 2013-11-13

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