JP5339934B2 - 光断層撮像装置および光断層撮像方法 - Google Patents
光断層撮像装置および光断層撮像方法 Download PDFInfo
- Publication number
- JP5339934B2 JP5339934B2 JP2009011619A JP2009011619A JP5339934B2 JP 5339934 B2 JP5339934 B2 JP 5339934B2 JP 2009011619 A JP2009011619 A JP 2009011619A JP 2009011619 A JP2009011619 A JP 2009011619A JP 5339934 B2 JP5339934 B2 JP 5339934B2
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- Japan
- Prior art keywords
- focusing
- light
- tomographic image
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
- A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
- A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02048—Rough and fine measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02063—Active error reduction, i.e. varying with time by particular alignment of focus position, e.g. dynamic focussing in optical coherence tomography
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biomedical Technology (AREA)
- Surgery (AREA)
- Engineering & Computer Science (AREA)
- Biophysics (AREA)
- Heart & Thoracic Surgery (AREA)
- Medical Informatics (AREA)
- Molecular Biology (AREA)
- Ophthalmology & Optometry (AREA)
- Animal Behavior & Ethology (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Eye Examination Apparatus (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Endoscopes (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009011619A JP5339934B2 (ja) | 2009-01-22 | 2009-01-22 | 光断層撮像装置および光断層撮像方法 |
| US12/683,461 US8274660B2 (en) | 2009-01-22 | 2010-01-07 | Optical tomographic imaging apparatus |
| CN2010100054215A CN101791213B (zh) | 2009-01-22 | 2010-01-19 | 光学断层图像形成装置 |
| EP10151279.6A EP2211140B1 (en) | 2009-01-22 | 2010-01-21 | Optical tomographic imaging apparatus |
| US13/568,418 US8749795B2 (en) | 2009-01-22 | 2012-08-07 | Optical tomographic imaging apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009011619A JP5339934B2 (ja) | 2009-01-22 | 2009-01-22 | 光断層撮像装置および光断層撮像方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010169503A JP2010169503A (ja) | 2010-08-05 |
| JP2010169503A5 JP2010169503A5 (enExample) | 2012-02-02 |
| JP5339934B2 true JP5339934B2 (ja) | 2013-11-13 |
Family
ID=42154597
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009011619A Expired - Fee Related JP5339934B2 (ja) | 2009-01-22 | 2009-01-22 | 光断層撮像装置および光断層撮像方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US8274660B2 (enExample) |
| EP (1) | EP2211140B1 (enExample) |
| JP (1) | JP5339934B2 (enExample) |
| CN (1) | CN101791213B (enExample) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5627260B2 (ja) | 2009-05-22 | 2014-11-19 | キヤノン株式会社 | 撮像装置および撮像方法 |
| JP4902721B2 (ja) * | 2009-10-23 | 2012-03-21 | キヤノン株式会社 | 光断層画像生成装置及び光断層画像生成方法 |
| JP5036785B2 (ja) * | 2009-10-23 | 2012-09-26 | キヤノン株式会社 | 光断層画像生成方法及び光断層画像生成装置 |
| US8792105B2 (en) * | 2010-01-19 | 2014-07-29 | Si-Ware Systems | Interferometer with variable optical path length reference mirror using overlapping depth scan signals |
| JP5808119B2 (ja) | 2010-04-13 | 2015-11-10 | キヤノン株式会社 | 模型眼、光断層画像撮像装置の調整方法、及び評価方法 |
| CN102364297B (zh) * | 2010-06-15 | 2016-09-28 | Juki株式会社 | 电子部件安装装置 |
| JP5663240B2 (ja) * | 2010-08-31 | 2015-02-04 | 株式会社トプコン | 光断層画像化装置及びその作動方法 |
| JP5663241B2 (ja) * | 2010-08-31 | 2015-02-04 | 株式会社トプコン | 光断層画像化装置及びその作動方法 |
| JP5822485B2 (ja) * | 2011-02-25 | 2015-11-24 | キヤノン株式会社 | 画像処理装置、画像処理方法、画像処理システム、slo装置、およびプログラム |
| JP5220156B2 (ja) | 2011-03-31 | 2013-06-26 | キヤノン株式会社 | 医療装置および医療システム |
| JP5728302B2 (ja) * | 2011-06-14 | 2015-06-03 | キヤノン株式会社 | 眼科装置、眼科システム、眼科装置の制御方法、及び該制御方法のプログラム |
| JP5955163B2 (ja) | 2011-09-06 | 2016-07-20 | キヤノン株式会社 | 画像処理装置および画像処理方法 |
| JP5210442B1 (ja) | 2012-01-26 | 2013-06-12 | キヤノン株式会社 | 光断層撮像装置および制御方法 |
| JP2014001925A (ja) * | 2012-06-14 | 2014-01-09 | Canon Inc | 測定装置及び方法、トモグラフィ装置及び方法 |
| JP6279682B2 (ja) * | 2012-10-01 | 2018-02-14 | 株式会社トプコン | 眼科観察装置 |
| FR2996925B1 (fr) | 2012-10-17 | 2017-06-16 | Office Nat D Etudes Et De Rech Aerospatiales | Procede de conception d'un imageur monovoie passif capable d'estimer la profondeur |
| DE102012022058A1 (de) * | 2012-11-08 | 2014-05-08 | Carl Zeiss Meditec Ag | Flexibles, multimodales Retina-Bildaufnahme- und Messsystem |
| US9400169B2 (en) | 2012-12-06 | 2016-07-26 | Lehigh University | Apparatus and method for space-division multiplexing optical coherence tomography |
| JP2014113422A (ja) * | 2012-12-12 | 2014-06-26 | Canon Inc | 眼科撮影装置、眼科撮影装置の制御方法、およびプログラム |
| WO2014149839A1 (en) | 2013-03-15 | 2014-09-25 | Amo Wavefront Sciences, Llc | Angular multiplexed optical coherence tomography systems and methods |
| CN103251382B (zh) * | 2013-04-17 | 2015-10-14 | 温州医学院 | 一种全眼频域光学相干层析成像系统及其方法 |
| JP5696178B2 (ja) * | 2013-05-29 | 2015-04-08 | 株式会社トプコン | 光断層画像化装置及びその作動方法 |
| JP6186215B2 (ja) * | 2013-09-04 | 2017-08-23 | 株式会社日立エルジーデータストレージ | 光計測装置及び光断層観察方法 |
| US9545199B2 (en) * | 2013-09-24 | 2017-01-17 | Carl Zeiss Meditec, Inc. | Apparatus and methods for detecting optical components and their misalignment in optical coherence tomographic systems |
| CN104970765A (zh) * | 2014-04-01 | 2015-10-14 | 明达医学科技股份有限公司 | 光学测量装置及方法 |
| JP6442903B2 (ja) * | 2014-07-31 | 2018-12-26 | 株式会社ニデック | 眼科装置 |
| JP6462432B2 (ja) * | 2015-03-11 | 2019-01-30 | 株式会社日立エルジーデータストレージ | 光計測装置及び光計測方法 |
| JP6518132B2 (ja) * | 2015-05-26 | 2019-05-22 | 株式会社トプコン | 眼科撮影装置 |
| CN109310328B (zh) * | 2016-03-25 | 2022-05-17 | 统雷有限公司 | 用于3d测量应用的mems可调vcsel驱动的扫频光源oct |
| JP6728007B2 (ja) * | 2016-09-23 | 2020-07-22 | 株式会社Screenホールディングス | 撮像装置および撮像方法 |
| EP3305175A3 (en) | 2016-10-05 | 2018-07-25 | Canon Kabushiki Kaisha | Tomographic image acquisition apparatus and tomographic image acquisition method |
| JP6702851B2 (ja) * | 2016-12-26 | 2020-06-03 | 株式会社Screenホールディングス | 撮像装置および撮像方法 |
| CN110300541A (zh) | 2017-01-17 | 2019-10-01 | 杜克大学 | 光学相干断层扫描装置和系统 |
| JP6731868B2 (ja) * | 2017-02-17 | 2020-07-29 | 株式会社Screenホールディングス | 撮像方法および撮像装置 |
| JP7119287B2 (ja) * | 2017-03-31 | 2022-08-17 | 株式会社ニデック | 断層画像撮影装置、および断層画像撮影プログラム |
| JP7028623B2 (ja) * | 2017-12-07 | 2022-03-02 | Ckd株式会社 | 三次元計測装置 |
| JP7187777B2 (ja) * | 2018-02-05 | 2022-12-13 | 株式会社ニデック | Oct装置、およびoct制御プログラム |
| US10922877B2 (en) | 2019-07-01 | 2021-02-16 | Samsung Electronics Co., Ltd. | Higher-order function networks for learning composable three-dimensional (3D) object and operating method thereof |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6449048B1 (en) * | 2000-05-11 | 2002-09-10 | Veeco Instruments, Inc. | Lateral-scanning interferometer with tilted optical axis |
| US6293674B1 (en) * | 2000-07-11 | 2001-09-25 | Carl Zeiss, Inc. | Method and apparatus for diagnosing and monitoring eye disease |
| DE10360570B4 (de) * | 2003-12-22 | 2006-01-12 | Carl Zeiss | Optisches Meßsystem und optisches Meßverfahren |
| JP4409331B2 (ja) * | 2004-03-30 | 2010-02-03 | 株式会社トプコン | 光画像計測装置 |
| JP2005351839A (ja) * | 2004-06-14 | 2005-12-22 | Fujinon Corp | 断層映像装置 |
| KR101393171B1 (ko) * | 2005-04-05 | 2014-05-08 | 퀘드 테크놀러지즈 인터내셔날, 인크. | 비구면을 정밀 고해상도로 측정하는 방법 |
| JP4892719B2 (ja) | 2005-08-24 | 2012-03-07 | 国立大学法人大阪大学 | 断層計測装置及び断層計測方法 |
| JP2007101250A (ja) * | 2005-09-30 | 2007-04-19 | Fujifilm Corp | 光断層画像化方法 |
| JP4850495B2 (ja) | 2005-10-12 | 2012-01-11 | 株式会社トプコン | 眼底観察装置及び眼底観察プログラム |
| JP4823693B2 (ja) * | 2006-01-11 | 2011-11-24 | 株式会社トプコン | 光画像計測装置 |
| JP5058627B2 (ja) * | 2007-02-26 | 2012-10-24 | 株式会社トプコン | 眼底観察装置 |
| JP2008253493A (ja) * | 2007-04-04 | 2008-10-23 | Fujifilm Corp | 断層画像処理方法および装置ならびにプログラム |
| JP5448353B2 (ja) * | 2007-05-02 | 2014-03-19 | キヤノン株式会社 | 光干渉断層計を用いた画像形成方法、及び光干渉断層装置 |
-
2009
- 2009-01-22 JP JP2009011619A patent/JP5339934B2/ja not_active Expired - Fee Related
-
2010
- 2010-01-07 US US12/683,461 patent/US8274660B2/en not_active Expired - Fee Related
- 2010-01-19 CN CN2010100054215A patent/CN101791213B/zh not_active Expired - Fee Related
- 2010-01-21 EP EP10151279.6A patent/EP2211140B1/en not_active Not-in-force
-
2012
- 2012-08-07 US US13/568,418 patent/US8749795B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN101791213B (zh) | 2012-05-09 |
| US20100181462A1 (en) | 2010-07-22 |
| EP2211140A2 (en) | 2010-07-28 |
| EP2211140A3 (en) | 2011-04-20 |
| JP2010169503A (ja) | 2010-08-05 |
| US20120293807A1 (en) | 2012-11-22 |
| EP2211140B1 (en) | 2018-10-31 |
| CN101791213A (zh) | 2010-08-04 |
| US8274660B2 (en) | 2012-09-25 |
| US8749795B2 (en) | 2014-06-10 |
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