JP5336772B2 - 顕微鏡システム、及び、変倍方法 - Google Patents

顕微鏡システム、及び、変倍方法 Download PDF

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Publication number
JP5336772B2
JP5336772B2 JP2008146573A JP2008146573A JP5336772B2 JP 5336772 B2 JP5336772 B2 JP 5336772B2 JP 2008146573 A JP2008146573 A JP 2008146573A JP 2008146573 A JP2008146573 A JP 2008146573A JP 5336772 B2 JP5336772 B2 JP 5336772B2
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JP
Japan
Prior art keywords
magnification
field
field stop
diameter
speed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008146573A
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English (en)
Japanese (ja)
Other versions
JP2009294340A (ja
JP2009294340A5 (enExample
Inventor
雅善 唐澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2008146573A priority Critical patent/JP5336772B2/ja
Priority to US12/475,775 priority patent/US8179596B2/en
Priority to EP09007305A priority patent/EP2131224A3/en
Publication of JP2009294340A publication Critical patent/JP2009294340A/ja
Publication of JP2009294340A5 publication Critical patent/JP2009294340A5/ja
Application granted granted Critical
Publication of JP5336772B2 publication Critical patent/JP5336772B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Lens Barrels (AREA)
JP2008146573A 2008-06-04 2008-06-04 顕微鏡システム、及び、変倍方法 Expired - Fee Related JP5336772B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2008146573A JP5336772B2 (ja) 2008-06-04 2008-06-04 顕微鏡システム、及び、変倍方法
US12/475,775 US8179596B2 (en) 2008-06-04 2009-06-01 Microscope system and its magnification modifying method
EP09007305A EP2131224A3 (en) 2008-06-04 2009-06-02 Microscope system and its magnication modifying method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008146573A JP5336772B2 (ja) 2008-06-04 2008-06-04 顕微鏡システム、及び、変倍方法

Publications (3)

Publication Number Publication Date
JP2009294340A JP2009294340A (ja) 2009-12-17
JP2009294340A5 JP2009294340A5 (enExample) 2011-10-27
JP5336772B2 true JP5336772B2 (ja) 2013-11-06

Family

ID=41211667

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008146573A Expired - Fee Related JP5336772B2 (ja) 2008-06-04 2008-06-04 顕微鏡システム、及び、変倍方法

Country Status (3)

Country Link
US (1) US8179596B2 (enExample)
EP (1) EP2131224A3 (enExample)
JP (1) JP5336772B2 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5567911B2 (ja) * 2009-06-25 2014-08-06 オリンパス株式会社 照明光学系及びそれを用いた蛍光顕微鏡
JP5665369B2 (ja) 2010-05-27 2015-02-04 キヤノン株式会社 撮像装置
DE102010036790A1 (de) * 2010-08-02 2012-02-02 Leica Microsystems Cms Gmbh Einrichtung zur lückenlosen Einstellung von Spektrometer-Spaltbreiten
TW201211580A (en) * 2010-09-15 2012-03-16 Anmo Electronics Corp Digital microscope with coaxial light output
CN102411200A (zh) * 2010-09-21 2012-04-11 安鹏科技股份有限公司 同轴出光式数字显微镜
DE102010041484A1 (de) * 2010-09-27 2012-03-29 Carl Zeiss Microimaging Gmbh Autofokussierverfahren und Autofokussiervorrichtung
US9494783B2 (en) * 2010-11-30 2016-11-15 Etaluma Inc. Compact, high-resolution fluorescence and brightfield microscope and methods of use
DE102011003603B4 (de) * 2011-02-03 2019-12-24 Leica Microsystems (Schweiz) Ag Durchlichtbeleuchtungseinrichtung für ein Mikroskop
DE102011114210A1 (de) * 2011-09-23 2013-03-28 Carl Zeiss Microscopy Gmbh Vorrichtung und Verfahren zur Durchlichtbeleuchtung für Lichtmikroskope und Mikroskopsystem
CN104160264A (zh) * 2012-03-07 2014-11-19 索尼公司 观测设备、观测程序和观测方法
DE102014114467A1 (de) * 2014-10-06 2016-04-07 Leica Microsystems (Schweiz) Ag Mikroskop mit überdimensioniertem Zoomsystem
DE102014114471C5 (de) * 2014-10-06 2021-02-18 Leica Microsystems (Schweiz) Ag Mikroskop mit sich automatisch anpassender Irisblende

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59172617A (ja) 1983-03-22 1984-09-29 Olympus Optical Co Ltd 自動制御式照明光学系を備えた顕微鏡
JPH05116006A (ja) 1991-10-29 1993-05-14 Mitsubishi Materials Corp 耐熱塑性変形性のすぐれた炭窒化チタン基サーメツト製切削工具
JP3447357B2 (ja) * 1994-03-11 2003-09-16 オリンパス光学工業株式会社 顕微鏡システム
JP3497229B2 (ja) * 1994-04-11 2004-02-16 オリンパス株式会社 顕微鏡システム
JPH10123425A (ja) * 1996-10-22 1998-05-15 Nikon Corp ズーム機能付き蛍光顕微鏡
JP3783888B2 (ja) 1996-11-11 2006-06-07 株式会社ニコン コンデンサレンズおよびこれを用いた顕微鏡照明光学系
US6741394B1 (en) 1998-03-12 2004-05-25 Nikon Corporation Optical integrator, illumination optical apparatus, exposure apparatus and observation apparatus
JP4503761B2 (ja) * 2000-02-08 2010-07-14 オリンパス株式会社 顕微鏡光学系
JP2002182118A (ja) * 2000-12-15 2002-06-26 Nikon Corp 顕微鏡
JP2003029130A (ja) 2001-07-11 2003-01-29 Sony Corp 光学式顕微鏡
US7446882B2 (en) 2005-01-20 2008-11-04 Zygo Corporation Interferometer for determining characteristics of an object surface

Also Published As

Publication number Publication date
US20090303582A1 (en) 2009-12-10
EP2131224A3 (en) 2010-09-29
JP2009294340A (ja) 2009-12-17
EP2131224A2 (en) 2009-12-09
US8179596B2 (en) 2012-05-15

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