JP5305987B2 - 放熱ユニット及び露光装置 - Google Patents
放熱ユニット及び露光装置 Download PDFInfo
- Publication number
- JP5305987B2 JP5305987B2 JP2009047466A JP2009047466A JP5305987B2 JP 5305987 B2 JP5305987 B2 JP 5305987B2 JP 2009047466 A JP2009047466 A JP 2009047466A JP 2009047466 A JP2009047466 A JP 2009047466A JP 5305987 B2 JP5305987 B2 JP 5305987B2
- Authority
- JP
- Japan
- Prior art keywords
- heat sink
- heat
- light
- light source
- portions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
- G03F7/70891—Temperature
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/10—Arrangements for heating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/20—Arrangements for cooling
- H10W40/25—Arrangements for cooling characterised by their materials
- H10W40/259—Ceramics or glasses
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Atmospheric Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Thermal Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Discharge Lamps And Accessories Thereof (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009047466A JP5305987B2 (ja) | 2009-03-02 | 2009-03-02 | 放熱ユニット及び露光装置 |
| KR1020100014924A KR101240018B1 (ko) | 2009-03-02 | 2010-02-19 | 방열 유닛 및 노광 장치 |
| TW099105351A TWI459439B (zh) | 2009-03-02 | 2010-02-24 | 熱輻射單元及曝光裝置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009047466A JP5305987B2 (ja) | 2009-03-02 | 2009-03-02 | 放熱ユニット及び露光装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010205806A JP2010205806A (ja) | 2010-09-16 |
| JP2010205806A5 JP2010205806A5 (https=) | 2012-04-19 |
| JP5305987B2 true JP5305987B2 (ja) | 2013-10-02 |
Family
ID=42967051
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009047466A Expired - Fee Related JP5305987B2 (ja) | 2009-03-02 | 2009-03-02 | 放熱ユニット及び露光装置 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP5305987B2 (https=) |
| KR (1) | KR101240018B1 (https=) |
| TW (1) | TWI459439B (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101238453B1 (ko) * | 2012-07-26 | 2013-02-28 | 유버 주식회사 | 광 경화 장치 |
| JP2022119372A (ja) * | 2021-02-04 | 2022-08-17 | キヤノン株式会社 | 放熱ユニット、露光装置、及び物品の製造方法 |
| KR102726822B1 (ko) | 2022-10-12 | 2024-11-07 | 한국광기술원 | 다중 히트싱크를 구비한 자외선 광원 조립체 및 이를 이용한 광원장치 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05326762A (ja) * | 1992-05-20 | 1993-12-10 | Ibiden Co Ltd | 半導体素子搭載装置用放熱板 |
| JP2002097372A (ja) * | 2000-09-20 | 2002-04-02 | Polymatech Co Ltd | 熱伝導性高分子組成物及び熱伝導性成形体 |
| JP2002329651A (ja) * | 2001-04-27 | 2002-11-15 | Nikon Corp | 露光装置、露光装置の製造方法、及びマイクロデバイスの製造方法 |
| GB0209069D0 (en) * | 2002-04-20 | 2002-05-29 | Ewington Christopher D | Lighting module |
| JP2004157219A (ja) * | 2002-11-05 | 2004-06-03 | Fuji Photo Film Co Ltd | 露光ヘッドおよび露光装置 |
| JP4548317B2 (ja) * | 2004-11-18 | 2010-09-22 | 三菱マテリアル株式会社 | 絶縁回路基板及びこれを備えるパワーモジュール構造体 |
| CN2833884Y (zh) * | 2005-06-27 | 2006-11-01 | 杨开艳 | 一种散热器的结构改良 |
| JP2007242820A (ja) | 2006-03-08 | 2007-09-20 | Asahi Kasei Corp | 発光デバイス及び発光デバイスモジュール |
| JP2007323879A (ja) * | 2006-05-31 | 2007-12-13 | Fujitsu General Ltd | 光源装置及び光源装置を用いたプロジェクタ |
| JP5188120B2 (ja) * | 2007-08-10 | 2013-04-24 | 新光電気工業株式会社 | 半導体装置 |
| JP4692908B2 (ja) | 2008-04-14 | 2011-06-01 | 電気化学工業株式会社 | モジュール構造体 |
-
2009
- 2009-03-02 JP JP2009047466A patent/JP5305987B2/ja not_active Expired - Fee Related
-
2010
- 2010-02-19 KR KR1020100014924A patent/KR101240018B1/ko not_active Expired - Fee Related
- 2010-02-24 TW TW099105351A patent/TWI459439B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR20100099050A (ko) | 2010-09-10 |
| JP2010205806A (ja) | 2010-09-16 |
| KR101240018B1 (ko) | 2013-03-06 |
| TW201034559A (en) | 2010-09-16 |
| TWI459439B (zh) | 2014-11-01 |
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| LAPS | Cancellation because of no payment of annual fees |