JP5282032B2 - トレイ格納装置、電子部品試験装置及びトレイ格納方法 - Google Patents

トレイ格納装置、電子部品試験装置及びトレイ格納方法 Download PDF

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Publication number
JP5282032B2
JP5282032B2 JP2009515023A JP2009515023A JP5282032B2 JP 5282032 B2 JP5282032 B2 JP 5282032B2 JP 2009515023 A JP2009515023 A JP 2009515023A JP 2009515023 A JP2009515023 A JP 2009515023A JP 5282032 B2 JP5282032 B2 JP 5282032B2
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JP
Japan
Prior art keywords
tray
stocker
test
customer
customer tray
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP2009515023A
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English (en)
Japanese (ja)
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JPWO2008142753A1 (ja
Inventor
浩樹 池田
吉成 小暮
毅 山下
弘行 高橋
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Advantest Corp
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Advantest Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Warehouses Or Storage Devices (AREA)
JP2009515023A 2007-05-18 2007-05-18 トレイ格納装置、電子部品試験装置及びトレイ格納方法 Expired - Fee Related JP5282032B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/060211 WO2008142753A1 (ja) 2007-05-18 2007-05-18 トレイ格納装置、電子部品試験装置及びトレイ格納方法

Publications (2)

Publication Number Publication Date
JPWO2008142753A1 JPWO2008142753A1 (ja) 2010-08-05
JP5282032B2 true JP5282032B2 (ja) 2013-09-04

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JP2009515023A Expired - Fee Related JP5282032B2 (ja) 2007-05-18 2007-05-18 トレイ格納装置、電子部品試験装置及びトレイ格納方法

Country Status (3)

Country Link
JP (1) JP5282032B2 (zh)
TW (1) TW200911658A (zh)
WO (1) WO2008142753A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5172750B2 (ja) * 2009-03-19 2013-03-27 ヤマハ発動機株式会社 ホットエアブロー機構および部品移載装置
TWI779892B (zh) * 2021-10-20 2022-10-01 鴻勁精密股份有限公司 承盤模組、置料裝置及作業機
TWI800330B (zh) * 2022-03-25 2023-04-21 鴻勁精密股份有限公司 置盤裝置及作業機

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0989982A (ja) * 1995-09-28 1997-04-04 Toshiba Corp Ｉｃハンドラ
JPH11190757A (ja) * 1997-12-26 1999-07-13 Ando Electric Co Ltd テストバーンインボードハンドラ
JP2001356144A (ja) * 2000-06-13 2001-12-26 Advantest Corp 電子部品試験装置
JP2007064991A (ja) * 2006-12-13 2007-03-15 Advantest Corp 電子部品試験装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6112905A (en) * 1996-07-31 2000-09-05 Aseco Corporation Automatic semiconductor part handler

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0989982A (ja) * 1995-09-28 1997-04-04 Toshiba Corp Ｉｃハンドラ
JPH11190757A (ja) * 1997-12-26 1999-07-13 Ando Electric Co Ltd テストバーンインボードハンドラ
JP2001356144A (ja) * 2000-06-13 2001-12-26 Advantest Corp 電子部品試験装置
JP2007064991A (ja) * 2006-12-13 2007-03-15 Advantest Corp 電子部品試験装置

Also Published As

Publication number Publication date
WO2008142753A1 (ja) 2008-11-27
TW200911658A (en) 2009-03-16
JPWO2008142753A1 (ja) 2010-08-05
TWI350810B (zh) 2011-10-21

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