TWI350810B - - Google Patents

Info

Publication number
TWI350810B
TWI350810B TW097113778A TW97113778A TWI350810B TW I350810 B TWI350810 B TW I350810B TW 097113778 A TW097113778 A TW 097113778A TW 97113778 A TW97113778 A TW 97113778A TW I350810 B TWI350810 B TW I350810B
Authority
TW
Taiwan
Application number
TW097113778A
Other versions
TW200911658A (en
Inventor
Ikeda Hiroki
Kogure Yoshinari
Yamashita Tsuyoshi
Takahashi Hiroyuki
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200911658A publication Critical patent/TW200911658A/zh
Application granted granted Critical
Publication of TWI350810B publication Critical patent/TWI350810B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Warehouses Or Storage Devices (AREA)
TW097113778A 2007-05-18 2008-04-16 Means for storing trays, electronic part tester and tray-storing method TW200911658A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/060211 WO2008142753A1 (ja) 2007-05-18 2007-05-18 トレイ格納装置、電子部品試験装置及びトレイ格納方法

Publications (2)

Publication Number Publication Date
TW200911658A TW200911658A (en) 2009-03-16
TWI350810B true TWI350810B (zh) 2011-10-21

Family

ID=40031480

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097113778A TW200911658A (en) 2007-05-18 2008-04-16 Means for storing trays, electronic part tester and tray-storing method

Country Status (3)

Country Link
JP (1) JP5282032B2 (zh)
TW (1) TW200911658A (zh)
WO (1) WO2008142753A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5172750B2 (ja) * 2009-03-19 2013-03-27 ヤマハ発動機株式会社 ホットエアブロー機構および部品移載装置
TWI779892B (zh) * 2021-10-20 2022-10-01 鴻勁精密股份有限公司 承盤模組、置料裝置及作業機
TWI800330B (zh) * 2022-03-25 2023-04-21 鴻勁精密股份有限公司 置盤裝置及作業機

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0989982A (ja) * 1995-09-28 1997-04-04 Toshiba Corp Ｉｃハンドラ
US6112905A (en) * 1996-07-31 2000-09-05 Aseco Corporation Automatic semiconductor part handler
JPH11190757A (ja) * 1997-12-26 1999-07-13 Ando Electric Co Ltd テストバーンインボードハンドラ
JP2001356144A (ja) * 2000-06-13 2001-12-26 Advantest Corp 電子部品試験装置
JP2007064991A (ja) * 2006-12-13 2007-03-15 Advantest Corp 電子部品試験装置

Also Published As

Publication number Publication date
WO2008142753A1 (ja) 2008-11-27
TW200911658A (en) 2009-03-16
JP5282032B2 (ja) 2013-09-04
JPWO2008142753A1 (ja) 2010-08-05

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