JP5259343B2 - メモリ装置 - Google Patents

メモリ装置 Download PDF

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Publication number
JP5259343B2
JP5259343B2 JP2008281316A JP2008281316A JP5259343B2 JP 5259343 B2 JP5259343 B2 JP 5259343B2 JP 2008281316 A JP2008281316 A JP 2008281316A JP 2008281316 A JP2008281316 A JP 2008281316A JP 5259343 B2 JP5259343 B2 JP 5259343B2
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JP
Japan
Prior art keywords
error
equation
calculation
syndrome
finite field
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Expired - Fee Related
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JP2008281316A
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English (en)
Japanese (ja)
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JP2010108569A (ja
JP2010108569A5 (enExample
Inventor
春希 戸田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
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Toshiba Corp
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Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP2008281316A priority Critical patent/JP5259343B2/ja
Priority to US12/555,507 priority patent/US7962838B2/en
Publication of JP2010108569A publication Critical patent/JP2010108569A/ja
Publication of JP2010108569A5 publication Critical patent/JP2010108569A5/ja
Application granted granted Critical
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Expired - Fee Related legal-status Critical Current
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/13—Linear codes
    • H03M13/15—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes
    • H03M13/151—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes using error location or error correction polynomials
    • H03M13/152—Bose-Chaudhuri-Hocquenghem [BCH] codes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/13—Linear codes
    • H03M13/15—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes
    • H03M13/151—Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes using error location or error correction polynomials
    • H03M13/1575—Direct decoding, e.g. by a direct determination of the error locator polynomial from syndromes and subsequent analysis or by matrix operations involving syndromes, e.g. for codes with a small minimum Hamming distance
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/37—Decoding methods or techniques, not specific to the particular type of coding provided for in groups H03M13/03 - H03M13/35
    • H03M13/3707—Adaptive decoding and hybrid decoding, e.g. decoding methods or techniques providing more than one decoding algorithm for one code
    • H03M13/3715—Adaptation to the number of estimated errors or to the channel state

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Pure & Applied Mathematics (AREA)
  • Algebra (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Error Detection And Correction (AREA)
JP2008281316A 2008-10-31 2008-10-31 メモリ装置 Expired - Fee Related JP5259343B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008281316A JP5259343B2 (ja) 2008-10-31 2008-10-31 メモリ装置
US12/555,507 US7962838B2 (en) 2008-10-31 2009-09-08 Memory device with an ECC system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008281316A JP5259343B2 (ja) 2008-10-31 2008-10-31 メモリ装置

Publications (3)

Publication Number Publication Date
JP2010108569A JP2010108569A (ja) 2010-05-13
JP2010108569A5 JP2010108569A5 (enExample) 2011-04-28
JP5259343B2 true JP5259343B2 (ja) 2013-08-07

Family

ID=42132983

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008281316A Expired - Fee Related JP5259343B2 (ja) 2008-10-31 2008-10-31 メモリ装置

Country Status (2)

Country Link
US (1) US7962838B2 (enExample)
JP (1) JP5259343B2 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
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JP4846384B2 (ja) * 2006-02-20 2011-12-28 株式会社東芝 半導体記憶装置
JP4836608B2 (ja) 2006-02-27 2011-12-14 株式会社東芝 半導体記憶装置
JP2007305267A (ja) * 2006-05-15 2007-11-22 Toshiba Corp 半導体記憶装置
JP4621715B2 (ja) * 2007-08-13 2011-01-26 株式会社東芝 メモリ装置
JP2011165026A (ja) * 2010-02-12 2011-08-25 Toshiba Corp エラー検出訂正システム
JP4982580B2 (ja) * 2010-03-23 2012-07-25 株式会社東芝 メモリシステム及びメモリシステムのデータ書き込み・読み出し方法
JP5682253B2 (ja) * 2010-11-22 2015-03-11 富士通株式会社 プログラムおよび通信装置
JP2012123600A (ja) 2010-12-08 2012-06-28 Toshiba Corp メモリシステム及びメモリコントローラ
JP5204868B2 (ja) * 2011-04-12 2013-06-05 シャープ株式会社 半導体記憶装置
KR101814476B1 (ko) 2011-07-15 2018-01-05 삼성전자주식회사 비휘발성 메모리 장치 및 그 구동 방법
JP5458064B2 (ja) 2011-07-14 2014-04-02 株式会社東芝 不揮発性半導体メモリ
US9904595B1 (en) 2016-08-23 2018-02-27 Texas Instruments Incorporated Error correction hardware with fault detection
CN107124187B (zh) * 2017-05-05 2020-08-11 南京大学 一种应用于闪存的基于等差校验矩阵的ldpc码译码器
US10833707B2 (en) * 2019-02-12 2020-11-10 International Business Machines Corporation Error trapping in memory structures
CN116192164A (zh) 2022-12-30 2023-05-30 紫光同芯微电子有限公司 一种纠错码的译码方法、装置、设备及介质

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Publication number Publication date
JP2010108569A (ja) 2010-05-13
US20100115383A1 (en) 2010-05-06
US7962838B2 (en) 2011-06-14

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