JP5255759B2 - 半導体デバイス用超格子歪緩衝層 - Google Patents
半導体デバイス用超格子歪緩衝層 Download PDFInfo
- Publication number
- JP5255759B2 JP5255759B2 JP2006302240A JP2006302240A JP5255759B2 JP 5255759 B2 JP5255759 B2 JP 5255759B2 JP 2006302240 A JP2006302240 A JP 2006302240A JP 2006302240 A JP2006302240 A JP 2006302240A JP 5255759 B2 JP5255759 B2 JP 5255759B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- gan
- substrate
- aln
- led
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/0242—Crystalline insulating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02455—Group 13/15 materials
- H01L21/02458—Nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02494—Structure
- H01L21/02496—Layer structure
- H01L21/02505—Layer structure consisting of more than two layers
- H01L21/02507—Alternating layers, e.g. superlattice
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/0254—Nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/12—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a stress relaxation structure, e.g. buffer layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of group III and group V of the periodic system
- H01L33/32—Materials of the light emitting region containing only elements of group III and group V of the periodic system containing nitrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
- H01L21/02573—Conductivity type
- H01L21/02576—N-type
Description
Claims (4)
- 基板と、基板上に被着形成されたテンプレート層と、テンプレート層上に被着形成された超格子構造と、を備え、上記超格子構造がAlN層及びGaN層を70から90ペア有し、且つ、前記AlN層及び前記GaN層の厚みがそれぞれ0.7nmである半導体構造。
- 請求項1記載の半導体構造であって、上記基板がAl2O3を含む半導体構造。
- 請求項2記載の半導体構造であって、上記テンプレート層がGaNを含む半導体構造。
- 請求項1乃至3の何れか一項記載の半導体構造であって、更に、超格子構造の上方に形成された多重量子井戸へテロ構造を備え、以て半導体LED構造として構成された半導体構造。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US73636205P | 2005-11-14 | 2005-11-14 | |
US60/736,362 | 2005-11-14 | ||
US11/356,769 US7547925B2 (en) | 2005-11-14 | 2006-02-17 | Superlattice strain relief layer for semiconductor devices |
US11/356,769 | 2006-02-17 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007142397A JP2007142397A (ja) | 2007-06-07 |
JP5255759B2 true JP5255759B2 (ja) | 2013-08-07 |
Family
ID=37820657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006302240A Active JP5255759B2 (ja) | 2005-11-14 | 2006-11-08 | 半導体デバイス用超格子歪緩衝層 |
Country Status (2)
Country | Link |
---|---|
EP (2) | EP1990841B1 (ja) |
JP (1) | JP5255759B2 (ja) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7547925B2 (en) | 2005-11-14 | 2009-06-16 | Palo Alto Research Center Incorporated | Superlattice strain relief layer for semiconductor devices |
JP2010507262A (ja) * | 2006-10-18 | 2010-03-04 | ナイテック インコーポレイテッド | 垂直深紫外線発光ダイオード |
JP2010537408A (ja) * | 2007-08-14 | 2010-12-02 | ナイテック インコーポレイテッド | マイクロピクセル紫外発光ダイオード |
KR101438808B1 (ko) | 2007-10-08 | 2014-09-05 | 엘지이노텍 주식회사 | 반도체 발광소자 및 그 제조방법 |
JP5288852B2 (ja) * | 2008-03-21 | 2013-09-11 | スタンレー電気株式会社 | 半導体素子の製造方法 |
US8847203B2 (en) | 2009-11-04 | 2014-09-30 | Dowa Electronics Materials Co, Ltd. | Group III nitride epitaxial laminate substrate |
JP5334057B2 (ja) * | 2009-11-04 | 2013-11-06 | Dowaエレクトロニクス株式会社 | Iii族窒化物積層基板 |
JP5353802B2 (ja) * | 2010-04-12 | 2013-11-27 | 豊田合成株式会社 | 半導体発光素子の製造方法およびランプ、電子機器、機械装置 |
US8865565B2 (en) | 2011-08-02 | 2014-10-21 | Kabushiki Kaisha Toshiba | LED having a low defect N-type layer that has grown on a silicon substrate |
CN105006505B (zh) | 2014-04-15 | 2019-03-15 | 传感器电子技术股份有限公司 | 具有应力管理的半导体异质结构 |
US9799793B2 (en) | 2014-04-15 | 2017-10-24 | Sensor Electronics Technology, Inc. | Semiconductor heterostructure with stress management |
KR102237154B1 (ko) * | 2015-02-25 | 2021-04-07 | 엘지이노텍 주식회사 | 발광 소자 및 이를 구비한 라이트 유닛 |
KR102416010B1 (ko) * | 2015-03-31 | 2022-07-05 | 서울바이오시스 주식회사 | 자외선 발광 소자 |
KR102355604B1 (ko) * | 2015-07-03 | 2022-01-26 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | 발광 소자 및 이를 구비한 라이트 유닛 |
JP7003058B2 (ja) | 2016-04-15 | 2022-02-04 | スージョウ レキン セミコンダクター カンパニー リミテッド | 発光素子、発光素子パッケージおよび発光モジュール |
DE102016120335A1 (de) * | 2016-10-25 | 2018-04-26 | Osram Opto Semiconductors Gmbh | Halbleiterschichtenfolge und Verfahren zur Herstellung einer Halbleiterschichtenfolge |
CN115050866B (zh) * | 2022-08-16 | 2022-11-08 | 江苏第三代半导体研究院有限公司 | 极化可控的量子点Micro-LED同质外延结构及其制备方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6744800B1 (en) | 1998-12-30 | 2004-06-01 | Xerox Corporation | Method and structure for nitride based laser diode arrays on an insulating substrate |
JP3454181B2 (ja) * | 1999-03-23 | 2003-10-06 | 松下電器産業株式会社 | 窒化物半導体素子 |
JP3773713B2 (ja) * | 1999-08-24 | 2006-05-10 | 三洋電機株式会社 | 量子箱の形成方法 |
JP2001077412A (ja) * | 1999-09-02 | 2001-03-23 | Sanyo Electric Co Ltd | 半導体素子およびその製造方法 |
US6570898B2 (en) | 1999-09-29 | 2003-05-27 | Xerox Corporation | Structure and method for index-guided buried heterostructure AlGalnN laser diodes |
JP2002100837A (ja) * | 2000-09-25 | 2002-04-05 | Sharp Corp | 窒化物半導体発光素子およびその製造方法 |
US6906352B2 (en) * | 2001-01-16 | 2005-06-14 | Cree, Inc. | Group III nitride LED with undoped cladding layer and multiple quantum well |
US6958497B2 (en) * | 2001-05-30 | 2005-10-25 | Cree, Inc. | Group III nitride based light emitting diode structures with a quantum well and superlattice, group III nitride based quantum well structures and group III nitride based superlattice structures |
JP2003077835A (ja) * | 2001-09-06 | 2003-03-14 | Ngk Insulators Ltd | Iii族窒化物素子及びiii族窒化物エピタキシャル基板 |
US20040140474A1 (en) * | 2002-06-25 | 2004-07-22 | Matsushita Electric Industrial Co., Ltd. | Semiconductor light-emitting device, method for fabricating the same and method for bonding the same |
JP4438277B2 (ja) * | 2002-09-27 | 2010-03-24 | 日亜化学工業株式会社 | 窒化物半導体結晶の成長方法及びそれを用いた素子 |
JP2005012063A (ja) * | 2003-06-20 | 2005-01-13 | Fujitsu Ltd | 紫外発光素子およびその製造方法 |
-
2006
- 2006-11-08 JP JP2006302240A patent/JP5255759B2/ja active Active
- 2006-11-10 EP EP08014020.5A patent/EP1990841B1/en not_active Expired - Fee Related
- 2006-11-10 EP EP06123849.9A patent/EP1786044B1/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP1786044A1 (en) | 2007-05-16 |
EP1990841A3 (en) | 2009-11-11 |
JP2007142397A (ja) | 2007-06-07 |
EP1990841B1 (en) | 2020-01-08 |
EP1990841A2 (en) | 2008-11-12 |
EP1786044B1 (en) | 2016-01-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5255759B2 (ja) | 半導体デバイス用超格子歪緩衝層 | |
US8154009B1 (en) | Light emitting structure including high-al content MQWH | |
US7153715B2 (en) | Semiconductor device and method for fabricating the same | |
US7268372B2 (en) | Vertical GaN light emitting diode and method for manufacturing the same | |
JP3784785B2 (ja) | 垂直構造窒化ガリウム系発光ダイオードの製造方法 | |
JP4624131B2 (ja) | 窒化物系半導体素子の製造方法 | |
JP4653804B2 (ja) | 発光半導体チップの製造方法および半導体チップ | |
KR102209263B1 (ko) | 반도체 광디바이스의 제조 방법 및 반도체 광디바이스 | |
JP2004072052A (ja) | 半導体装置及びその製造方法 | |
US7759219B2 (en) | Method of manufacturing nitride semiconductor device | |
JP2013542608A (ja) | 複合基板の形成方法 | |
JP2019186539A (ja) | 半導体光デバイスの製造方法及び半導体光デバイスの中間体 | |
JP2007221051A (ja) | 窒化物系半導体素子の製造方法 | |
US20110024775A1 (en) | Methods for and devices made using multiple stage growths | |
JP2002009003A (ja) | 半導体基板およびその作製方法および発光素子 | |
JP2009238834A (ja) | 窒化物系半導体層を有する支持基板およびその形成方法 | |
JP2010056457A (ja) | 発光素子アレイの製造方法 | |
KR102649711B1 (ko) | 초박형 반도체 다이의 제조 방법 | |
US20220278250A1 (en) | Semiconductor light emitting element and method of manufacturing semiconductor light emitting element | |
CN116802349A (zh) | 半导体基板及其制造方法、制造装置、电子部件以及电子设备 | |
JP2022163956A (ja) | 窒化ガリウム系半導体発光素子とその製造方法 | |
JP4601944B2 (ja) | 窒化物半導体発光素子の位置決め方法と、この位置決め方法を用いた窒化物半導体装置の製造方法 | |
JP2007300146A (ja) | 半導体装置及びその製造方法 | |
JP2006237386A (ja) | 窒化物系半導体発光ダイオード |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20091105 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20110928 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20111025 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120124 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20120327 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120724 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20120731 |
|
A912 | Re-examination (zenchi) completed and case transferred to appeal board |
Free format text: JAPANESE INTERMEDIATE CODE: A912 Effective date: 20120914 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20130422 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5255759 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20160426 Year of fee payment: 3 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |