JP5243550B2 - シリコンウエハを処理するための方法及びデバイス - Google Patents
シリコンウエハを処理するための方法及びデバイス Download PDFInfo
- Publication number
- JP5243550B2 JP5243550B2 JP2010538475A JP2010538475A JP5243550B2 JP 5243550 B2 JP5243550 B2 JP 5243550B2 JP 2010538475 A JP2010538475 A JP 2010538475A JP 2010538475 A JP2010538475 A JP 2010538475A JP 5243550 B2 JP5243550 B2 JP 5243550B2
- Authority
- JP
- Japan
- Prior art keywords
- silicon wafer
- etching solution
- texturing
- etching
- polishing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 67
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 67
- 239000010703 silicon Substances 0.000 title claims abstract description 67
- 238000000034 method Methods 0.000 title claims abstract description 59
- 235000012431 wafers Nutrition 0.000 title abstract description 49
- 238000005530 etching Methods 0.000 claims abstract description 91
- 238000005498 polishing Methods 0.000 claims description 17
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 6
- 238000005507 spraying Methods 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 2
- 230000032258 transport Effects 0.000 claims 10
- 238000001039 wet etching Methods 0.000 claims 1
- 239000007921 spray Substances 0.000 abstract description 2
- 239000007788 liquid Substances 0.000 description 7
- 238000005520 cutting process Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000009736 wetting Methods 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/6708—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C1/00—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating
- B05C1/02—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating for applying liquid or other fluent material to separate articles
- B05C1/025—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating for applying liquid or other fluent material to separate articles to flat rectangular articles, e.g. flat sheets
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C1/00—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating
- B05C1/04—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating for applying liquid or other fluent material to work of indefinite length
- B05C1/08—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating for applying liquid or other fluent material to work of indefinite length using a roller or other rotating member which contacts the work along a generating line
- B05C1/0813—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating for applying liquid or other fluent material to work of indefinite length using a roller or other rotating member which contacts the work along a generating line characterised by means for supplying liquid or other fluent material to the roller
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/67086—Apparatus for fluid treatment for etching for wet etching with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Weting (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Photovoltaic Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102007063202A DE102007063202A1 (de) | 2007-12-19 | 2007-12-19 | Verfahren und Vorrichtung zur Behandlung von Silizium-Wafern |
| DE102007063202.0 | 2007-12-19 | ||
| PCT/EP2008/010894 WO2009077201A2 (de) | 2007-12-19 | 2008-12-18 | Verfahren und vorrichtung zur behandlung von silizium-wafern |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011512645A JP2011512645A (ja) | 2011-04-21 |
| JP2011512645A5 JP2011512645A5 (enExample) | 2011-10-13 |
| JP5243550B2 true JP5243550B2 (ja) | 2013-07-24 |
Family
ID=40409901
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010538475A Active JP5243550B2 (ja) | 2007-12-19 | 2008-12-18 | シリコンウエハを処理するための方法及びデバイス |
Country Status (14)
| Country | Link |
|---|---|
| US (1) | US8623232B2 (enExample) |
| EP (1) | EP2232526B1 (enExample) |
| JP (1) | JP5243550B2 (enExample) |
| KR (1) | KR101622752B1 (enExample) |
| CN (1) | CN101983415B (enExample) |
| AT (1) | ATE508472T1 (enExample) |
| AU (1) | AU2008337880B2 (enExample) |
| CA (1) | CA2709384A1 (enExample) |
| DE (2) | DE102007063202A1 (enExample) |
| ES (1) | ES2366894T3 (enExample) |
| IL (1) | IL206426A0 (enExample) |
| MX (1) | MX2010006778A (enExample) |
| MY (1) | MY157503A (enExample) |
| WO (1) | WO2009077201A2 (enExample) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010025125A1 (en) * | 2008-08-29 | 2010-03-04 | Evergreen Solar, Inc. | Single-sided textured sheet wafer and manufactoring method therefore |
| DE102009032217A1 (de) * | 2009-07-06 | 2011-01-13 | Gebr. Schmid Gmbh & Co. | Verfahren und Vorrichtung zur Behandlung von Substraten |
| KR20120135185A (ko) * | 2009-09-21 | 2012-12-12 | 바스프 에스이 | 단결정 및 다결정 규소 기판의 표면을 조직화하기 위한 산성 에칭 수용액 및 방법 |
| DE102009050845A1 (de) | 2009-10-19 | 2011-04-21 | Gebr. Schmid Gmbh & Co. | Verfahren und Vorrichtung zur Behandlung einer Substratoberfläche eines Substrats |
| DE102009051847A1 (de) * | 2009-10-29 | 2011-05-19 | Gebr. Schmid Gmbh & Co. | Verfahren und Vorrichtung zur Behandlung einer Substratoberlfäche eines Substrats |
| DE102009060931A1 (de) | 2009-12-23 | 2011-06-30 | Gebr. Schmid GmbH & Co., 72250 | Verfahren und Vorrichtung zur Behandlung von Siliziumsubstraten |
| WO2012020274A1 (en) * | 2010-08-10 | 2012-02-16 | Rena Gmbh | Process and apparatus for texturizing a flat semiconductor substrate |
| CN102185011A (zh) * | 2010-12-02 | 2011-09-14 | 江阴浚鑫科技有限公司 | 太阳能电池片的制绒方法 |
| DE102011109568A1 (de) * | 2011-08-05 | 2013-02-07 | Rena Gmbh | Abluftsystem und Verfahren dazu |
| DE102013202138A1 (de) * | 2013-02-08 | 2014-08-14 | Gebr. Schmid Gmbh | Vorrichtung zur Substratnassbehandlung und Verwendung |
| CN103258918A (zh) * | 2013-05-31 | 2013-08-21 | 英利集团有限公司 | 硅片的制绒方法、太阳能电池片及其制作方法 |
| CN105745578B (zh) | 2013-09-18 | 2018-04-06 | 富林特集团德国有限公司 | 可数字曝光的柔版印刷元件和制造柔版印刷版的方法 |
| DE102013218693A1 (de) | 2013-09-18 | 2015-03-19 | lP RENA GmbH | Vorrichtung und Verfahren zur asymmetrischen alkalischen Textur von Oberflächen |
| CN103985630A (zh) * | 2014-06-03 | 2014-08-13 | 天津源天晟科技发展有限公司 | 液体内吸附传输方法 |
| DE102014110222B4 (de) * | 2014-07-21 | 2016-06-23 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zur Strukturierung von Ober- und Unterseite eines Halbleitersubstrats |
| DE102015205437A1 (de) * | 2015-03-25 | 2016-09-29 | Rct Solutions Gmbh | Vorrichtung und Verfahren zur chemischen Behandlung eines Halbleiter-Substrats |
| DE102015223227A1 (de) * | 2015-11-24 | 2017-05-24 | Rct Solutions Gmbh | Vorrichtung und Verfahren zur chemischen Behandlung eines Halbleiter-Substrats |
| CN105696083B (zh) * | 2016-01-29 | 2018-03-09 | 盐城阿特斯协鑫阳光电力科技有限公司 | 一种太阳能电池绒面的制备方法 |
| DE102016210883A1 (de) | 2016-06-17 | 2017-12-21 | Singulus Technologies Ag | Vorrichtung und Verfahren zur Behandlung von Substraten unter Verwendung einer Auflagerolle mit porösem Material |
| DE102017203977A1 (de) | 2017-03-10 | 2018-09-13 | Gebr. Schmid Gmbh | Verfahren zur Herstellung texturierter Wafer und Aufrausprühstrahlbehandlungsvorrichtung |
| DE102017212442A1 (de) * | 2017-07-20 | 2019-01-24 | Singulus Technologies Ag | Verfahren und Vorrichtung zum Texturieren einer Oberfläche eines multikristallinen Diamantdraht-gesägten Siliziumsubstrats unter Verwendung von ozonhaltigem Medium |
| DE102018206980A1 (de) | 2018-01-26 | 2019-08-01 | Singulus Technologies Ag | Verfahren und Vorrichtung zur Reinigung von geätzten Oberflächen eines Halbleitersubstrats |
| DE102018206978A1 (de) | 2018-01-26 | 2019-08-01 | Singulus Technologies Ag | Verfahren und Vorrichtung zur Behandlung von geätzten Oberflächen eines Halbleitersubstrats unter Verwendung von ozonhaltigem Medium |
| FR3084601B1 (fr) * | 2018-07-31 | 2020-06-26 | Safran Aircraft Engines | Procede et dispositif pour l'amelioration de l'etat de surface d'une piece de turbomachine |
| DE202018005266U1 (de) | 2018-11-14 | 2019-03-22 | H2GEMINI Technology Consulting GmbH | Vorrichtung zur Ätzung von Silizium Substraten |
| CN109340251A (zh) * | 2018-12-13 | 2019-02-15 | 武汉华星光电半导体显示技术有限公司 | 轴承和蚀刻机台及蚀刻方法 |
| CN119092438B (zh) * | 2024-08-30 | 2025-02-21 | 苏州冠礼科技有限公司 | 一种半导体芯片湿法刻蚀装置 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4107464A1 (de) * | 1991-03-08 | 1992-09-10 | Schmid Gmbh & Co Geb | Verfahren und vorrichtung zum einseitigen behandeln von plattenfoermigen gegenstaenden |
| US5753135A (en) | 1995-10-23 | 1998-05-19 | Jablonsky; Julius James | Apparatus and method for recovering photoresist developers and strippers |
| EP0836370A1 (en) | 1996-10-08 | 1998-04-15 | Takanori Tsubaki | Method and system for etching substrates for printed circuit boards |
| JP2001210615A (ja) * | 2000-01-27 | 2001-08-03 | Seiko Epson Corp | 電気光学装置の製造方法および電気光学装置の製造装置 |
| JP2003170086A (ja) * | 2001-12-11 | 2003-06-17 | Sumitomo Precision Prod Co Ltd | ノズル装置及びこれを備えた基板処理装置 |
| DE10225848A1 (de) | 2002-06-04 | 2003-12-24 | Schmid Gmbh & Co Geb | Vorrichtung und Verfahren zum Lösen von Schichten von der Oberseite von flächigen Substraten |
| KR100675628B1 (ko) * | 2002-10-16 | 2007-02-01 | 엘지.필립스 엘시디 주식회사 | 절연막 식각장치 및 식각방법 |
| DE20304601U1 (de) * | 2003-03-19 | 2003-06-26 | Gebr. Schmid GmbH & Co., 72250 Freudenstadt | Vorrichtung zum Transport von flexiblem Flachmaterial, insbesondere Leiterplatten |
| DE20321702U1 (de) * | 2003-05-07 | 2008-12-24 | Universität Konstanz | Vorrichtung zum Texturieren von Oberflächen von Silizium-Scheiben |
| JP4323252B2 (ja) * | 2003-08-04 | 2009-09-02 | 住友精密工業株式会社 | レジスト除去装置 |
| JP2005136081A (ja) * | 2003-10-29 | 2005-05-26 | Sharp Corp | 太陽電池の製造方法 |
| JP2005175106A (ja) * | 2003-12-10 | 2005-06-30 | Sumitomo Mitsubishi Silicon Corp | シリコンウェーハの加工方法 |
| DE102004017680B4 (de) * | 2004-04-10 | 2008-01-24 | Forschungszentrum Jülich GmbH | Verfahren zur Behandlung von Substraten mit vorstrukturierten Zinkoxidschichten |
| JP4205062B2 (ja) * | 2005-01-12 | 2009-01-07 | 三井金属鉱業株式会社 | 液処理装置 |
| JP2006196783A (ja) * | 2005-01-14 | 2006-07-27 | Sharp Corp | 基板表面処理装置 |
| JP2006294696A (ja) * | 2005-04-06 | 2006-10-26 | Sharp Corp | 太陽電池の製造方法および太陽電池用シリコン基板 |
| DE102005057109A1 (de) * | 2005-11-26 | 2007-05-31 | Kunze-Concewitz, Horst, Dipl.-Phys. | Vorrichtung und Verfahren für mechanisches Prozessieren flacher, dünner Substrate im Durchlaufverfahren |
| DE102005062528A1 (de) * | 2005-12-16 | 2007-06-21 | Gebr. Schmid Gmbh & Co. | Vorrichtung und Verfahren zur Oberflächenbehandlung von Substraten |
| JP4776380B2 (ja) * | 2006-01-20 | 2011-09-21 | 株式会社東芝 | 処理装置及び処理方法 |
| US20080041526A1 (en) * | 2006-08-16 | 2008-02-21 | Pass Thomas P | Single-sided etching |
-
2007
- 2007-12-19 DE DE102007063202A patent/DE102007063202A1/de not_active Withdrawn
-
2008
- 2008-12-18 DE DE502008003460T patent/DE502008003460D1/de active Active
- 2008-12-18 ES ES08861689T patent/ES2366894T3/es active Active
- 2008-12-18 CN CN200880127394XA patent/CN101983415B/zh active Active
- 2008-12-18 CA CA2709384A patent/CA2709384A1/en not_active Abandoned
- 2008-12-18 MX MX2010006778A patent/MX2010006778A/es not_active Application Discontinuation
- 2008-12-18 WO PCT/EP2008/010894 patent/WO2009077201A2/de not_active Ceased
- 2008-12-18 AT AT08861689T patent/ATE508472T1/de active
- 2008-12-18 MY MYPI2010002824A patent/MY157503A/en unknown
- 2008-12-18 KR KR1020107015754A patent/KR101622752B1/ko active Active
- 2008-12-18 AU AU2008337880A patent/AU2008337880B2/en not_active Ceased
- 2008-12-18 EP EP08861689A patent/EP2232526B1/de active Active
- 2008-12-18 JP JP2010538475A patent/JP5243550B2/ja active Active
-
2010
- 2010-06-16 IL IL206426A patent/IL206426A0/en unknown
- 2010-06-18 US US12/818,853 patent/US8623232B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| KR101622752B1 (ko) | 2016-05-31 |
| CA2709384A1 (en) | 2009-06-25 |
| US20100311247A1 (en) | 2010-12-09 |
| DE102007063202A1 (de) | 2009-06-25 |
| KR20100105688A (ko) | 2010-09-29 |
| WO2009077201A3 (de) | 2009-09-11 |
| AU2008337880A1 (en) | 2009-06-25 |
| AU2008337880B2 (en) | 2013-07-11 |
| ES2366894T3 (es) | 2011-10-26 |
| CN101983415B (zh) | 2012-08-08 |
| MY157503A (en) | 2016-06-15 |
| EP2232526B1 (de) | 2011-05-04 |
| WO2009077201A2 (de) | 2009-06-25 |
| EP2232526A2 (de) | 2010-09-29 |
| IL206426A0 (en) | 2010-12-30 |
| DE502008003460D1 (de) | 2011-06-16 |
| MX2010006778A (es) | 2010-08-10 |
| ATE508472T1 (de) | 2011-05-15 |
| CN101983415A (zh) | 2011-03-02 |
| US8623232B2 (en) | 2014-01-07 |
| JP2011512645A (ja) | 2011-04-21 |
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| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |