JP5194508B2 - Ｓｏｉウエーハの製造方法 - Google Patents

Ｓｏｉウエーハの製造方法 Download PDF

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Publication number
JP5194508B2
JP5194508B2 JP2007080313A JP2007080313A JP5194508B2 JP 5194508 B2 JP5194508 B2 JP 5194508B2 JP 2007080313 A JP2007080313 A JP 2007080313A JP 2007080313 A JP2007080313 A JP 2007080313A JP 5194508 B2 JP5194508 B2 JP 5194508B2
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JP
Japan
Prior art keywords
wafer
film
soi
oxide film
bond
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2007080313A
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English (en)
Japanese (ja)
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JP2008244019A (ja
JP2008244019A5 (enrdf_load_stackoverflow
Inventor
功 横川
博 竹野
宣彦 能登
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Handotai Co Ltd
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Priority to JP2007080313A priority Critical patent/JP5194508B2/ja
Priority to PCT/JP2008/000339 priority patent/WO2008117509A1/ja
Publication of JP2008244019A publication Critical patent/JP2008244019A/ja
Publication of JP2008244019A5 publication Critical patent/JP2008244019A5/ja
Application granted granted Critical
Publication of JP5194508B2 publication Critical patent/JP5194508B2/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76—Making of isolation regions between components
    • H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
    • H01L21/76251—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques
    • H01L21/76256—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques using silicon etch back techniques, e.g. BESOI, ELTRAN

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Element Separation (AREA)
  • Recrystallisation Techniques (AREA)
JP2007080313A 2007-03-26 2007-03-26 Ｓｏｉウエーハの製造方法 Active JP5194508B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007080313A JP5194508B2 (ja) 2007-03-26 2007-03-26 Ｓｏｉウエーハの製造方法
PCT/JP2008/000339 WO2008117509A1 (ja) 2007-03-26 2008-02-26 Ｓｏｉウエーハの製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007080313A JP5194508B2 (ja) 2007-03-26 2007-03-26 Ｓｏｉウエーハの製造方法

Publications (3)

Publication Number Publication Date
JP2008244019A JP2008244019A (ja) 2008-10-09
JP2008244019A5 JP2008244019A5 (enrdf_load_stackoverflow) 2009-10-22
JP5194508B2 true JP5194508B2 (ja) 2013-05-08

Family

ID=39788251

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007080313A Active JP5194508B2 (ja) 2007-03-26 2007-03-26 Ｓｏｉウエーハの製造方法

Country Status (2)

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JP (1) JP5194508B2 (enrdf_load_stackoverflow)
WO (1) WO2008117509A1 (enrdf_load_stackoverflow)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5643488B2 (ja) * 2009-04-28 2014-12-17 信越化学工業株式会社 低応力膜を備えたｓｏｉウェーハの製造方法
JP2011071193A (ja) * 2009-09-24 2011-04-07 Sumco Corp 貼合せｓｏｉウェーハ及びその製造方法
GB2484506A (en) * 2010-10-13 2012-04-18 Univ Warwick Heterogrowth
JP5978764B2 (ja) * 2012-05-24 2016-08-24 信越半導体株式会社 Ｓｏｉウェーハの製造方法
JP6186984B2 (ja) 2013-07-25 2017-08-30 三菱電機株式会社 半導体装置の製造方法
JP7334698B2 (ja) * 2020-09-11 2023-08-29 信越半導体株式会社 Ｓｏｉウェーハの製造方法及びｓｏｉウェーハ
JP7380517B2 (ja) * 2020-10-21 2023-11-15 信越半導体株式会社 Ｓｏｉウェーハの製造方法及びｓｏｉウェーハ

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01186612A (ja) * 1988-01-14 1989-07-26 Fujitsu Ltd 半導体基板の製造方法
JP3237888B2 (ja) * 1992-01-31 2001-12-10 キヤノン株式会社 半導体基体及びその作製方法
JPH0837286A (ja) * 1994-07-21 1996-02-06 Toshiba Microelectron Corp 半導体基板および半導体基板の製造方法
JPH098124A (ja) * 1995-06-15 1997-01-10 Nippondenso Co Ltd 絶縁分離基板及びその製造方法
KR970052024A (ko) * 1995-12-30 1997-07-29 김주용 에스 오 아이 기판 제조방법
JPH10116897A (ja) * 1996-10-09 1998-05-06 Mitsubishi Materials Shilicon Corp 張り合わせ基板およびその製造方法
JP3395661B2 (ja) * 1998-07-07 2003-04-14 信越半導体株式会社 Ｓｏｉウエーハの製造方法
WO2005022610A1 (ja) * 2003-09-01 2005-03-10 Sumco Corporation 貼り合わせウェーハの製造方法
JP2007059704A (ja) * 2005-08-25 2007-03-08 Sumco Corp 貼合せ基板の製造方法及び貼合せ基板

Also Published As

Publication number Publication date
JP2008244019A (ja) 2008-10-09
WO2008117509A1 (ja) 2008-10-02

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