JP5156970B2 - 電気的検査のためのプローブユニット、電気的検査装置および点灯検査装置 - Google Patents

電気的検査のためのプローブユニット、電気的検査装置および点灯検査装置 Download PDF

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Publication number
JP5156970B2
JP5156970B2 JP2008287580A JP2008287580A JP5156970B2 JP 5156970 B2 JP5156970 B2 JP 5156970B2 JP 2008287580 A JP2008287580 A JP 2008287580A JP 2008287580 A JP2008287580 A JP 2008287580A JP 5156970 B2 JP5156970 B2 JP 5156970B2
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JP
Japan
Prior art keywords
probe
base member
support base
inspection
suspension mechanism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2008287580A
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English (en)
Japanese (ja)
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JP2010112919A (ja
JP2010112919A5 (ko
Inventor
智昭 久我
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2008287580A priority Critical patent/JP5156970B2/ja
Priority to TW098128171A priority patent/TWI396848B/zh
Priority to KR1020090082936A priority patent/KR101074660B1/ko
Publication of JP2010112919A publication Critical patent/JP2010112919A/ja
Publication of JP2010112919A5 publication Critical patent/JP2010112919A5/ja
Application granted granted Critical
Publication of JP5156970B2 publication Critical patent/JP5156970B2/ja
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Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Liquid Crystal (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP2008287580A 2008-11-10 2008-11-10 電気的検査のためのプローブユニット、電気的検査装置および点灯検査装置 Active JP5156970B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2008287580A JP5156970B2 (ja) 2008-11-10 2008-11-10 電気的検査のためのプローブユニット、電気的検査装置および点灯検査装置
TW098128171A TWI396848B (zh) 2008-11-10 2009-08-21 Electrical inspection probe unit, electrical inspection device and lighting inspection device
KR1020090082936A KR101074660B1 (ko) 2008-11-10 2009-09-03 전기적 검사를 위한 프로브 유닛, 전기적 검사장치 및 점등 검사장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008287580A JP5156970B2 (ja) 2008-11-10 2008-11-10 電気的検査のためのプローブユニット、電気的検査装置および点灯検査装置

Publications (3)

Publication Number Publication Date
JP2010112919A JP2010112919A (ja) 2010-05-20
JP2010112919A5 JP2010112919A5 (ko) 2011-11-24
JP5156970B2 true JP5156970B2 (ja) 2013-03-06

Family

ID=42277762

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008287580A Active JP5156970B2 (ja) 2008-11-10 2008-11-10 電気的検査のためのプローブユニット、電気的検査装置および点灯検査装置

Country Status (3)

Country Link
JP (1) JP5156970B2 (ko)
KR (1) KR101074660B1 (ko)
TW (1) TWI396848B (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI614548B (zh) * 2013-10-28 2018-02-11 高雄晶傑達光電科技股份有限公司 點燈測試裝置
JP6184301B2 (ja) * 2013-11-14 2017-08-23 株式会社日本マイクロニクス 検査装置
CN106597706B (zh) * 2016-12-23 2023-03-03 苏州凌云视界智能设备有限责任公司 液晶屏自动点灯治具
CN108535900A (zh) * 2018-06-13 2018-09-14 广东速美达自动化股份有限公司 一种检测夹治具

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148280A (ja) * 2000-11-08 2002-05-22 Soushiyou Tec:Kk 検査用プローブブロックの並列搭載ユニット
TWI231964B (en) * 2003-03-10 2005-05-01 Phicom Corp LCD panel auto gripping apparatus and method for use in a panel carrier for an automatic probe unit
KR100776177B1 (ko) * 2004-12-17 2007-11-16 주식회사 디이엔티 평판 표시패널 검사장치용 워크 테이블
KR100650273B1 (ko) * 2005-06-03 2006-11-27 주식회사 파이컴 액정표시패널 검사 장비
KR100653746B1 (ko) 2005-06-30 2006-12-06 (주)큐엠씨 디스플레이 패널의 검사 장비
KR100733276B1 (ko) * 2005-07-29 2007-06-28 주식회사 파이컴 디스플레이 패널의 검사 장비와 이를 이용한 디스플레이패널 검사 방법
KR101147120B1 (ko) * 2005-08-30 2012-05-25 엘지디스플레이 주식회사 Ｌｃｄ 검사 장비 및 ｌｃｄ 검사 방법
KR100611608B1 (ko) * 2005-11-15 2006-08-11 주식회사 코디에스 평판형 디스플레이 검사 방법 및 평판형 디스플레이 검사용유닛
JP4758826B2 (ja) * 2006-05-30 2011-08-31 株式会社日本マイクロニクス プローブユニット及び検査装置
JP2008028103A (ja) * 2006-07-20 2008-02-07 Fujifilm Corp ウエハプローバ
JP4903624B2 (ja) * 2007-04-17 2012-03-28 株式会社日本マイクロニクス プローブユニット及び検査装置

Also Published As

Publication number Publication date
JP2010112919A (ja) 2010-05-20
TW201018919A (en) 2010-05-16
KR20100052401A (ko) 2010-05-19
KR101074660B1 (ko) 2011-10-19
TWI396848B (zh) 2013-05-21

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