JP5142001B2 - 薄膜音響共振子の形成方法 - Google Patents
薄膜音響共振子の形成方法 Download PDFInfo
- Publication number
- JP5142001B2 JP5142001B2 JP2001145259A JP2001145259A JP5142001B2 JP 5142001 B2 JP5142001 B2 JP 5142001B2 JP 2001145259 A JP2001145259 A JP 2001145259A JP 2001145259 A JP2001145259 A JP 2001145259A JP 5142001 B2 JP5142001 B2 JP 5142001B2
- Authority
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- Japan
- Prior art keywords
- resonator
- shape
- forming
- film acoustic
- frequency thin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 40
- 239000010409 thin film Substances 0.000 title claims description 28
- 239000000463 material Substances 0.000 claims description 56
- 239000000758 substrate Substances 0.000 claims description 19
- 238000005530 etching Methods 0.000 claims description 16
- 230000008569 process Effects 0.000 claims description 14
- 238000001020 plasma etching Methods 0.000 claims description 9
- 238000005498 polishing Methods 0.000 claims description 8
- 239000000126 substance Substances 0.000 claims description 8
- 229920002120 photoresistant polymer Polymers 0.000 claims description 7
- 238000006243 chemical reaction Methods 0.000 claims description 6
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- 238000006073 displacement reaction Methods 0.000 claims 2
- 239000007772 electrode material Substances 0.000 claims 1
- 238000003631 wet chemical etching Methods 0.000 claims 1
- 239000010408 film Substances 0.000 description 18
- 238000004519 manufacturing process Methods 0.000 description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 150000002500 ions Chemical class 0.000 description 5
- 238000000206 photolithography Methods 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- ZBSCCQXBYNSKPV-UHFFFAOYSA-N oxolead;oxomagnesium;2,4,5-trioxa-1$l^{5},3$l^{5}-diniobabicyclo[1.1.1]pentane 1,3-dioxide Chemical compound [Mg]=O.[Pb]=O.[Pb]=O.[Pb]=O.O1[Nb]2(=O)O[Nb]1(=O)O2 ZBSCCQXBYNSKPV-UHFFFAOYSA-N 0.000 description 2
- 230000000644 propagated effect Effects 0.000 description 2
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- 239000004065 semiconductor Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- WLAMNBDJUVNPJU-UHFFFAOYSA-N 2-methylbutyric acid Chemical compound CCC(C)C(O)=O WLAMNBDJUVNPJU-UHFFFAOYSA-N 0.000 description 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 206010027339 Menstruation irregular Diseases 0.000 description 1
- LPOUEVYXAMBSRF-UHFFFAOYSA-N [Zr].[Ta].[Co].[Fe] Chemical compound [Zr].[Ta].[Co].[Fe] LPOUEVYXAMBSRF-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
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- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
- 230000002463 transducing effect Effects 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 238000007704 wet chemistry method Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/175—Acoustic mirrors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/571919 | 2000-05-16 | ||
| US09/571,919 US6420202B1 (en) | 2000-05-16 | 2000-05-16 | Method for shaping thin film resonators to shape acoustic modes therein |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002043879A JP2002043879A (ja) | 2002-02-08 |
| JP2002043879A5 JP2002043879A5 (enExample) | 2008-11-13 |
| JP5142001B2 true JP5142001B2 (ja) | 2013-02-13 |
Family
ID=24285591
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001145259A Expired - Fee Related JP5142001B2 (ja) | 2000-05-16 | 2001-05-15 | 薄膜音響共振子の形成方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6420202B1 (enExample) |
| EP (1) | EP1156584B1 (enExample) |
| JP (1) | JP5142001B2 (enExample) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1280025C (zh) * | 2001-06-01 | 2006-10-18 | 利特斯公司 | 微沉积系统以及在衬底上沉积精确量的流体材料的方法 |
| DE10135872A1 (de) * | 2001-07-24 | 2003-02-27 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung einer Linse |
| US20030048041A1 (en) * | 2001-09-07 | 2003-03-13 | Hiroyuki Kita | Piezoelectric thin-film element and a manufacturing method thereof |
| JP3969224B2 (ja) * | 2002-01-08 | 2007-09-05 | 株式会社村田製作所 | 圧電共振子及びそれを用いた圧電フィルタ・デュプレクサ・通信装置 |
| US20100107389A1 (en) * | 2002-01-11 | 2010-05-06 | Avago Technologies Wireless Ip (Singapore) Pte. Ltd. | Method of fabricating an electrode for a bulk acoustic resonator |
| DE10200741A1 (de) * | 2002-01-11 | 2003-07-24 | Infineon Technologies Ag | Verfahren zur Herstellung einer topologieoptimierten Elektrode für einen Resonator in Dünnfilmtechnologie |
| US20040173144A1 (en) * | 2002-05-31 | 2004-09-09 | Edwards Charles O. | Formation of printed circuit board structures using piezo microdeposition |
| JP3829861B2 (ja) | 2002-08-07 | 2006-10-04 | 松下電器産業株式会社 | 角速度センサ |
| EP1540819A1 (en) * | 2002-09-12 | 2005-06-15 | Philips Intellectual Property & Standards GmbH | Bulk acoustic waver resonator with means for suppression of pass-band ripple in bulk acoustic wave filters |
| JP2004304704A (ja) * | 2003-04-01 | 2004-10-28 | Matsushita Electric Ind Co Ltd | 薄膜音響共振子、及び、薄膜音響共振子回路 |
| JP4133580B2 (ja) * | 2003-05-21 | 2008-08-13 | 独立行政法人科学技術振興機構 | 圧電材料の加工方法 |
| JP4012156B2 (ja) * | 2004-02-02 | 2007-11-21 | 独立行政法人科学技術振興機構 | 圧電素子の製造方法 |
| JP4149416B2 (ja) * | 2004-05-31 | 2008-09-10 | 富士通メディアデバイス株式会社 | 圧電薄膜共振子およびフィルタならびにそれらの製造方法 |
| JP2006140370A (ja) * | 2004-11-15 | 2006-06-01 | Oki Electric Ind Co Ltd | マイクロレンズの製造方法 |
| US7541893B2 (en) * | 2005-05-23 | 2009-06-02 | Cts Corporation | Ceramic RF filter and duplexer having improved third harmonic response |
| EP1887688A4 (en) * | 2005-06-02 | 2009-08-05 | Murata Manufacturing Co | PIEZOELECTRIC RESONATOR AND PIEZOELECTRIC THIN-FILTER FILTER |
| US7889027B2 (en) * | 2005-09-09 | 2011-02-15 | Sony Corporation | Film bulk acoustic resonator shaped as an ellipse with a part cut off |
| US7544612B1 (en) | 2006-01-20 | 2009-06-09 | Skyworks Solutions, Inc. | Method and structure for reducing the effect of vertical steps in patterned layers in semiconductor structures |
| US7598827B2 (en) | 2006-06-19 | 2009-10-06 | Maxim Integrated Products | Harmonic termination of power amplifiers using BAW filter output matching circuits |
| US7586389B2 (en) * | 2006-06-19 | 2009-09-08 | Maxim Integrated Products, Inc. | Impedance transformation and filter using bulk acoustic wave technology |
| JP2008078717A (ja) * | 2006-09-19 | 2008-04-03 | Nec Tokin Corp | ノイズフィルタおよびスイッチング電源 |
| US7385334B1 (en) | 2006-11-20 | 2008-06-10 | Sandia Corporation | Contour mode resonators with acoustic reflectors |
| DE112008002181B4 (de) * | 2007-08-14 | 2023-08-03 | Avago Technologies International Sales Pte. Limited | Bulkakustikwellenstruktur mit einer piezoelektrischen Aluminiumkupfernitrid-Schicht und darauf bezogenes Verfahren |
| WO2009023100A2 (en) * | 2007-08-14 | 2009-02-19 | Skyworks Solutions, Inc. | Method for forming a multi-layer electrode underlying a piezoelectric layer and related structure |
| US7777596B2 (en) * | 2007-12-18 | 2010-08-17 | Robert Bosch Gmbh | MEMS resonator structure and method |
| US7602102B1 (en) | 2008-04-24 | 2009-10-13 | Skyworks Solutions, Inc. | Bulk acoustic wave resonator with controlled thickness region having controlled electromechanical coupling |
| US7795781B2 (en) * | 2008-04-24 | 2010-09-14 | Avago Technologies Wireless Ip (Singapore) Pte. Ltd. | Bulk acoustic wave resonator with reduced energy loss |
| US7889025B1 (en) * | 2008-06-10 | 2011-02-15 | The United States Of America As Represented By The Secretary Of The Army | Anti-reflective acoustic diffuser for SAW and BAW devices |
| JP5288920B2 (ja) * | 2008-07-16 | 2013-09-11 | 日本電波工業株式会社 | 水晶振動用素子の製造方法 |
| CN101477194B (zh) * | 2009-02-17 | 2011-07-06 | 东南大学 | 一种转子碰摩声发射源定位方法 |
| US9608589B2 (en) | 2010-10-26 | 2017-03-28 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Method of forming acoustic resonator using intervening seed layer |
| US10763823B2 (en) | 2015-12-30 | 2020-09-01 | 3M Innovative Properties Company | Elliptically-shaped resonator markers with enhanced frequency stability and gain |
| EP3863176B1 (en) * | 2018-10-23 | 2022-12-07 | Huawei Technologies Co., Ltd. | Method for preparing monolithic integrated baw resonator |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52658B2 (enExample) * | 1971-12-30 | 1977-01-10 | ||
| JPS58137317A (ja) * | 1982-02-09 | 1983-08-15 | Nec Corp | 圧電薄膜複合振動子 |
| US4556812A (en) * | 1983-10-13 | 1985-12-03 | The United States Of America As Represented By The United States Department Of Energy | Acoustic resonator with Al electrodes on an AlN layer and using a GaAs substrate |
| US4719383A (en) * | 1985-05-20 | 1988-01-12 | The United States Of America As Represented By The United States Department Of Energy | Piezoelectric shear wave resonator and method of making same |
| JP2644855B2 (ja) * | 1988-10-24 | 1997-08-25 | 株式会社日立製作所 | 弾性波フィルタ、及びそれを用いたアンテナ分波器 |
| US4966446A (en) | 1989-04-28 | 1990-10-30 | At&T Bell Laboratories | Mask controlled coupling of inter-substrate optical components |
| US4966447A (en) | 1989-04-28 | 1990-10-30 | At&T Bell Laboratories | Integration of free-space planar optical components |
| US5074646A (en) | 1989-04-28 | 1991-12-24 | At&T Bell Laboratories | Planar reflective optical devices |
| US5011254A (en) | 1989-11-30 | 1991-04-30 | At&T Bell Laboratories | Coupling of optical devices to optical fibers by means of microlenses |
| US5079130A (en) | 1990-05-25 | 1992-01-07 | At&T Bell Laboratories | Partially or fully recessed microlens fabrication |
| US5075641A (en) * | 1990-12-04 | 1991-12-24 | Iowa State University Research Foundation, Inc. | High frequency oscillator comprising cointegrated thin film resonator and active device |
| JP3362860B2 (ja) * | 1991-01-09 | 2003-01-07 | 大日本印刷株式会社 | 表面弾性波素子の製造方法 |
| JPH04322508A (ja) * | 1991-04-22 | 1992-11-12 | Matsushita Electric Ind Co Ltd | 水晶振動子の製造方法 |
| US5348617A (en) * | 1991-12-23 | 1994-09-20 | Iowa State University Research Foundation, Inc. | Selective etching process |
| US5412506A (en) | 1992-03-09 | 1995-05-02 | At&T Corp. | Free-space optical interconnection arrangement |
| US5286338A (en) | 1993-03-01 | 1994-02-15 | At&T Bell Laboratories | Methods for making microlens arrays |
| US5650075A (en) * | 1995-05-30 | 1997-07-22 | Motorola, Inc. | Method for etching photolithographically produced quartz crystal blanks for singulation |
| US5696423A (en) * | 1995-06-29 | 1997-12-09 | Motorola, Inc. | Temperature compenated resonator and method |
| US5918354A (en) * | 1996-04-02 | 1999-07-06 | Seiko Epson Corporation | Method of making a piezoelectric element |
| JPH10107573A (ja) * | 1996-09-30 | 1998-04-24 | Kyocera Corp | 弾性表面波装置 |
| JP2000040931A (ja) * | 1998-07-23 | 2000-02-08 | Matsushita Electric Ind Co Ltd | 圧電共振子、圧電共振子の製造方法および圧電共振子の周波数調整方法 |
| JP4036544B2 (ja) * | 1998-09-22 | 2008-01-23 | Tdk株式会社 | 電圧制御発振器 |
-
2000
- 2000-05-16 US US09/571,919 patent/US6420202B1/en not_active Expired - Lifetime
-
2001
- 2001-05-08 EP EP01304145A patent/EP1156584B1/en not_active Expired - Lifetime
- 2001-05-15 JP JP2001145259A patent/JP5142001B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP1156584B1 (en) | 2012-12-26 |
| US6420202B1 (en) | 2002-07-16 |
| US20020022292A1 (en) | 2002-02-21 |
| JP2002043879A (ja) | 2002-02-08 |
| EP1156584A1 (en) | 2001-11-21 |
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