JP5127372B2 - 蒸着装置 - Google Patents
蒸着装置 Download PDFInfo
- Publication number
- JP5127372B2 JP5127372B2 JP2007227408A JP2007227408A JP5127372B2 JP 5127372 B2 JP5127372 B2 JP 5127372B2 JP 2007227408 A JP2007227408 A JP 2007227408A JP 2007227408 A JP2007227408 A JP 2007227408A JP 5127372 B2 JP5127372 B2 JP 5127372B2
- Authority
- JP
- Japan
- Prior art keywords
- vapor deposition
- pipe
- flow rate
- pipes
- film formation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000007740 vapor deposition Methods 0.000 title claims description 93
- 239000000463 material Substances 0.000 claims description 93
- 239000000758 substrate Substances 0.000 claims description 42
- 230000015572 biosynthetic process Effects 0.000 claims description 31
- 238000000151 deposition Methods 0.000 claims description 24
- 230000008021 deposition Effects 0.000 claims description 20
- 238000010438 heat treatment Methods 0.000 claims description 17
- 238000001704 evaporation Methods 0.000 claims description 13
- 239000010408 film Substances 0.000 description 51
- 230000007246 mechanism Effects 0.000 description 20
- 230000008020 evaporation Effects 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 150000002894 organic compounds Chemical class 0.000 description 5
- 238000001771 vacuum deposition Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 4
- 238000003860 storage Methods 0.000 description 3
- 230000000903 blocking effect Effects 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 239000003513 alkali Substances 0.000 description 1
- 238000010549 co-Evaporation Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/243—Crucibles for source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/12—Organic material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/164—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
- Physical Vapour Deposition (AREA)
Description
図1に示す蒸着装置を用いて以下の蒸着方法によって基板上に有機EL素子を製造した。蒸着源5の材料収容部7は、コンダクタンスの大きい配管8を1本と、コンダクタンスの小さい配管9を2本備える。
図3の(a)に示す蒸着源を用いて基板上に有機EL素子を製造した。蒸着源は、材料収容部27にコンダクタンスを等しくした配管28を6本備えた。これらは材料収容部27の上面の中心から等距離、等間隔に配置した。6本の配管28のうちの2本に対して、蒸着材料の流量を制御する流量調整機構30としてニードルバルブを設置した。
図2の(b)に示す蒸着源を用いて基板上に有機EL素子を製造した。蒸着源は、材料収容部117に配管118を1本のみ備えた。この配管118は、蒸着材料の流量を制御する流量調整機構120としてニードルバルブを設置した。目標成膜速度は20[Å/s]とした。蒸着源以外の構成は、参考例1と同様のものを用いた。
2 基板
3 素子分離膜
4 マスク
5 蒸着源
6 蒸着材料
7 材料収容部
8、9、18、28、38、39a、39b 配管
10、20、30、40 流量調整機構
11 連結空間
12 放出部
Claims (4)
- 蒸発又は昇華した蒸着材料を被成膜基板に付着させて成膜する蒸着装置において、
成膜を行う成膜空間を有する真空チャンバーと、
前記蒸着材料を充填する材料収容部と、
前記材料収容部を加熱して前記蒸着材料を蒸発又は昇華させる手段と、
1個の前記材料収容部から前記真空チャンバーの前記成膜空間に配置された前記被成膜基板に向けて前記蒸着材料を供給するためのコンダクタンスの異なる複数本の配管と、を備え、
前記複数本の配管のうち、コンダクタンスの最も大きい配管に対して相対的にコンダクタンスの小さい配管に、前記蒸着材料の流れを流量制御又は開放・遮断する手段を設けることを特徴とする蒸着装置。 - 前記複数本の配管を連結する連結部と、
前記連結部から前記蒸着材料を前記真空チャンバーの前記成膜空間に放出する放出部と、を備えることを特徴とする請求項1に記載の蒸着装置。 - 前記複数の配管を加熱する手段を備えることを特徴とする請求項1又は2に記載の蒸着装置。
- 前記材料収容部を前記真空チャンバーの外に配置することを特徴とする請求項1ないし3のいずれかに記載の蒸着装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007227408A JP5127372B2 (ja) | 2007-09-03 | 2007-09-03 | 蒸着装置 |
US12/193,612 US20090061084A1 (en) | 2007-09-03 | 2008-08-18 | Vapor deposition system and vapor deposition method |
KR1020080086172A KR101037121B1 (ko) | 2007-09-03 | 2008-09-02 | 증착장치 및 증착방법 |
CN2008102148949A CN101381859B (zh) | 2007-09-03 | 2008-09-03 | 气相沉积系统和气相沉积方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007227408A JP5127372B2 (ja) | 2007-09-03 | 2007-09-03 | 蒸着装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009057614A JP2009057614A (ja) | 2009-03-19 |
JP2009057614A5 JP2009057614A5 (ja) | 2010-10-21 |
JP5127372B2 true JP5127372B2 (ja) | 2013-01-23 |
Family
ID=40407929
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007227408A Expired - Fee Related JP5127372B2 (ja) | 2007-09-03 | 2007-09-03 | 蒸着装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20090061084A1 (ja) |
JP (1) | JP5127372B2 (ja) |
KR (1) | KR101037121B1 (ja) |
CN (1) | CN101381859B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103430625B (zh) * | 2011-03-15 | 2015-09-23 | 夏普株式会社 | 蒸镀装置、蒸镀方法和有机el显示装置的制造方法 |
DE102014014970B4 (de) | 2014-10-14 | 2020-01-02 | NICE Solar Energy GmbH | Vorrichtung und Verfahren zur Schichtdickenmessung für Dampfabscheideverfahren |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0290662U (ja) * | 1988-12-27 | 1990-07-18 | ||
US6749906B2 (en) * | 2002-04-25 | 2004-06-15 | Eastman Kodak Company | Thermal physical vapor deposition apparatus with detachable vapor source(s) and method |
JP4366226B2 (ja) * | 2004-03-30 | 2009-11-18 | 東北パイオニア株式会社 | 有機elパネルの製造方法、有機elパネルの成膜装置 |
JP4476019B2 (ja) * | 2004-05-20 | 2010-06-09 | 東北パイオニア株式会社 | 成膜源、真空成膜装置、有機el素子の製造方法 |
JP2006057173A (ja) * | 2004-08-24 | 2006-03-02 | Tohoku Pioneer Corp | 成膜源、真空成膜装置、有機elパネルの製造方法 |
JP4560394B2 (ja) * | 2004-12-13 | 2010-10-13 | 長州産業株式会社 | 薄膜形成用分子供給装置 |
JP4545028B2 (ja) * | 2005-03-30 | 2010-09-15 | 日立造船株式会社 | 蒸着装置 |
JP5064810B2 (ja) * | 2006-01-27 | 2012-10-31 | キヤノン株式会社 | 蒸着装置および蒸着方法 |
JP4966028B2 (ja) * | 2007-01-15 | 2012-07-04 | パナソニック株式会社 | 真空蒸着装置 |
-
2007
- 2007-09-03 JP JP2007227408A patent/JP5127372B2/ja not_active Expired - Fee Related
-
2008
- 2008-08-18 US US12/193,612 patent/US20090061084A1/en not_active Abandoned
- 2008-09-02 KR KR1020080086172A patent/KR101037121B1/ko active IP Right Grant
- 2008-09-03 CN CN2008102148949A patent/CN101381859B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN101381859A (zh) | 2009-03-11 |
US20090061084A1 (en) | 2009-03-05 |
KR101037121B1 (ko) | 2011-05-26 |
CN101381859B (zh) | 2011-03-02 |
KR20090024081A (ko) | 2009-03-06 |
JP2009057614A (ja) | 2009-03-19 |
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