JP5080174B2 - 半導体記憶装置の遅延ロックループ回路 - Google Patents
半導体記憶装置の遅延ロックループ回路 Download PDFInfo
- Publication number
- JP5080174B2 JP5080174B2 JP2007224001A JP2007224001A JP5080174B2 JP 5080174 B2 JP5080174 B2 JP 5080174B2 JP 2007224001 A JP2007224001 A JP 2007224001A JP 2007224001 A JP2007224001 A JP 2007224001A JP 5080174 B2 JP5080174 B2 JP 5080174B2
- Authority
- JP
- Japan
- Prior art keywords
- pulse width
- output
- delay
- unit
- memory device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims description 45
- 238000001514 detection method Methods 0.000 claims description 37
- 238000012937 correction Methods 0.000 claims description 21
- 238000005191 phase separation Methods 0.000 claims description 14
- 230000001934 delay Effects 0.000 claims description 9
- 230000007423 decrease Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 5
- 230000003111 delayed effect Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/156—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern
- H03K5/1565—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern the output pulses having a constant duty cycle
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Dram (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
- Pulse Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020060129582A KR100857429B1 (ko) | 2006-12-18 | 2006-12-18 | 반도체 메모리 장치의 지연 고정 루프 회로 |
| KR10-2006-0129582 | 2006-12-18 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008154210A JP2008154210A (ja) | 2008-07-03 |
| JP2008154210A5 JP2008154210A5 (enExample) | 2010-09-30 |
| JP5080174B2 true JP5080174B2 (ja) | 2012-11-21 |
Family
ID=39526387
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007224001A Expired - Fee Related JP5080174B2 (ja) | 2006-12-18 | 2007-08-30 | 半導体記憶装置の遅延ロックループ回路 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7548101B2 (enExample) |
| JP (1) | JP5080174B2 (enExample) |
| KR (1) | KR100857429B1 (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101374336B1 (ko) * | 2007-10-11 | 2014-03-17 | 삼성전자주식회사 | 메모리 시스템 및 이 시스템을 위한 반도체 메모리 장치와제어부 |
| KR100894486B1 (ko) * | 2007-11-02 | 2009-04-22 | 주식회사 하이닉스반도체 | 디지털 필터, 클록 데이터 복구 회로 및 그 동작방법, 반도체 메모리 장치 및 그의 동작방법 |
| KR100956771B1 (ko) * | 2007-12-11 | 2010-05-12 | 주식회사 하이닉스반도체 | 디엘엘 클럭 생성 회로 |
| KR20090074412A (ko) * | 2008-01-02 | 2009-07-07 | 삼성전자주식회사 | 분주회로 및 이를 이용한 위상 동기 루프 |
| US7642827B2 (en) * | 2008-05-28 | 2010-01-05 | Micron Technology, Inc. | Apparatus and method for multi-phase clock generation |
| US7719334B2 (en) * | 2008-05-28 | 2010-05-18 | Micron Technology, Inc. | Apparatus and method for multi-phase clock generation |
| KR101062741B1 (ko) * | 2009-01-06 | 2011-09-06 | 주식회사 하이닉스반도체 | Dll 회로 및 그 제어 방법 |
| KR101027759B1 (ko) | 2009-12-22 | 2011-04-07 | 연세대학교 산학협력단 | 지연 동기 루프 및 그것의 듀티 사이클 보정 회로 |
| US8471617B2 (en) | 2010-06-17 | 2013-06-25 | Hynix Semiconductor Inc. | Duty cycle correction in a delay-locked loop |
| KR20120012119A (ko) * | 2010-07-30 | 2012-02-09 | 주식회사 하이닉스반도체 | 레이턴시 제어 회로 및 그의 동작 방법 |
| US8428204B2 (en) * | 2010-08-20 | 2013-04-23 | Raytheon Company | Recovering distorted digital data |
| US8643418B2 (en) | 2011-06-02 | 2014-02-04 | Micron Technology, Inc. | Apparatus and methods for altering the timing of a clock signal |
| US8786338B2 (en) * | 2011-11-14 | 2014-07-22 | Texas Instruments Incorporated | Delay locked loop |
| KR102467451B1 (ko) * | 2016-06-17 | 2022-11-17 | 에스케이하이닉스 주식회사 | 반도체 장치 및 반도체 시스템 |
| CN109900971B (zh) * | 2017-12-11 | 2023-01-24 | 长鑫存储技术有限公司 | 脉冲信号的处理方法、装置以及半导体存储器 |
| KR102880562B1 (ko) * | 2021-09-27 | 2025-11-05 | 에스케이하이닉스 주식회사 | 듀티보정회로를 포함하는 듀티보정장치 및 이를 포함하는 반도체 장치 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0693216B2 (ja) * | 1987-04-27 | 1994-11-16 | 株式会社日立製作所 | 情報処理装置 |
| US5133064A (en) * | 1987-04-27 | 1992-07-21 | Hitachi, Ltd. | Data processing system generating clock signal from an input clock, phase locked to the input clock and used for clocking logic devices |
| JPH05100763A (ja) * | 1991-10-04 | 1993-04-23 | Hitachi Ltd | クロツク制御回路 |
| JPH1069769A (ja) * | 1996-08-29 | 1998-03-10 | Fujitsu Ltd | 半導体集積回路 |
| KR100224718B1 (ko) * | 1996-10-30 | 1999-10-15 | 윤종용 | 동기식 메모리장치의 내부 클락 발생기 |
| KR100502675B1 (ko) | 2001-12-12 | 2005-07-22 | 주식회사 하이닉스반도체 | 레지스터 제어형 지연고정루프회로 |
| KR100527399B1 (ko) | 2002-05-10 | 2005-11-15 | 주식회사 하이닉스반도체 | 반도체메모리장치의 디엘엘구동회로 |
| KR100486268B1 (ko) * | 2002-10-05 | 2005-05-03 | 삼성전자주식회사 | 내부에서 자체적으로 듀티싸이클 보정을 수행하는지연동기루프 회로 및 이의 듀티싸이클 보정방법 |
| US6798248B2 (en) * | 2002-12-20 | 2004-09-28 | Intel Corporation | Non-overlapping clock generation |
| JP2004273660A (ja) * | 2003-03-07 | 2004-09-30 | Renesas Technology Corp | 半導体集積回路 |
| KR100525096B1 (ko) * | 2003-04-23 | 2005-11-01 | 주식회사 하이닉스반도체 | Dll 회로 |
| KR100515074B1 (ko) * | 2003-04-29 | 2005-09-16 | 주식회사 하이닉스반도체 | Dll 회로 |
| KR100596433B1 (ko) | 2003-12-29 | 2006-07-05 | 주식회사 하이닉스반도체 | 반도체 기억 장치에서의 지연 고정 루프 및 그의 록킹 방법 |
| KR100605588B1 (ko) | 2004-03-05 | 2006-07-28 | 주식회사 하이닉스반도체 | 반도체 기억 소자에서의 지연 고정 루프 및 그의 클럭록킹 방법 |
| KR100596781B1 (ko) | 2004-04-28 | 2006-07-04 | 주식회사 하이닉스반도체 | 온 다이 터미네이션의 종단 전압 조절 장치 |
| KR100696957B1 (ko) * | 2005-03-31 | 2007-03-20 | 주식회사 하이닉스반도체 | 클럭 듀티 조정 회로, 이를 이용한 지연 고정 루프 회로 및그 방법 |
| KR100709475B1 (ko) | 2005-05-30 | 2007-04-18 | 주식회사 하이닉스반도체 | Dll 회로의 듀티 사이클 보정회로 |
-
2006
- 2006-12-18 KR KR1020060129582A patent/KR100857429B1/ko not_active Expired - Fee Related
-
2007
- 2007-07-19 US US11/826,916 patent/US7548101B2/en active Active
- 2007-08-30 JP JP2007224001A patent/JP5080174B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US7548101B2 (en) | 2009-06-16 |
| JP2008154210A (ja) | 2008-07-03 |
| US20080143404A1 (en) | 2008-06-19 |
| KR20080056544A (ko) | 2008-06-23 |
| KR100857429B1 (ko) | 2008-09-09 |
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