JP5079874B2 - 位置測定装置 - Google Patents

位置測定装置 Download PDF

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Publication number
JP5079874B2
JP5079874B2 JP2010507821A JP2010507821A JP5079874B2 JP 5079874 B2 JP5079874 B2 JP 5079874B2 JP 2010507821 A JP2010507821 A JP 2010507821A JP 2010507821 A JP2010507821 A JP 2010507821A JP 5079874 B2 JP5079874 B2 JP 5079874B2
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Japan
Prior art keywords
scale
measuring device
position measuring
movable
reference scale
Prior art date
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JP2010507821A
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English (en)
Japanese (ja)
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JP2010527013A (ja
JP2010527013A5 (enExample
Inventor
ホルツアプフェル・ヴォルフガング
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Dr Johannes Heidenhain GmbH
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Dr Johannes Heidenhain GmbH
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Publication of JP2010527013A5 publication Critical patent/JP2010527013A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/347—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
    • G01D5/34707—Scales; Discs, e.g. fixation, fabrication, compensation
    • G01D5/34715—Scale reading or illumination devices
    • G01D5/34723—Scale reading or illumination devices involving light-guides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/36—Forming the light into pulses
    • G01D5/38—Forming the light into pulses by diffraction gratings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Transform (AREA)
  • Vehicle Body Suspensions (AREA)
  • Body Structure For Vehicles (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2010507821A 2007-05-16 2008-05-02 位置測定装置 Active JP5079874B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102007023300A DE102007023300A1 (de) 2007-05-16 2007-05-16 Positionsmesseinrichtung und Anordnung derselben
DE102007023300.2 2007-05-16
PCT/EP2008/003552 WO2008138501A1 (de) 2007-05-16 2008-05-02 Positionsmesseinrichtung

Publications (3)

Publication Number Publication Date
JP2010527013A JP2010527013A (ja) 2010-08-05
JP2010527013A5 JP2010527013A5 (enExample) 2011-05-19
JP5079874B2 true JP5079874B2 (ja) 2012-11-21

Family

ID=39651082

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2010507821A Active JP5079874B2 (ja) 2007-05-16 2008-05-02 位置測定装置
JP2010507822A Active JP5253498B2 (ja) 2007-05-16 2008-05-02 光学位置測定装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2010507822A Active JP5253498B2 (ja) 2007-05-16 2008-05-02 光学位置測定装置

Country Status (7)

Country Link
US (2) US7907286B2 (enExample)
EP (2) EP2149036B1 (enExample)
JP (2) JP5079874B2 (enExample)
CN (2) CN101680745B (enExample)
AT (1) ATE487109T1 (enExample)
DE (2) DE102007023300A1 (enExample)
WO (2) WO2008138501A1 (enExample)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0613902D0 (en) * 2006-07-13 2006-08-23 Renishaw Plc Scale and readhead
DE102007023300A1 (de) * 2007-05-16 2008-11-20 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Anordnung derselben
US10259607B2 (en) * 2008-03-04 2019-04-16 Vanrx Pharmasystems Inc. Aseptic robotic filling system and method
JP5268529B2 (ja) * 2008-09-29 2013-08-21 キヤノン株式会社 変位計測装置及び半導体製造装置
US8449483B2 (en) * 2008-12-02 2013-05-28 Patrick Eddy Compression device and control system for applying pressure to a limb of a living being
DE102010003157B4 (de) * 2010-03-23 2019-10-24 Dr. Johannes Heidenhain Gmbh Vorrichtung zur interferentiellen Abstandsmessung
JP2013534319A (ja) * 2010-08-19 2013-09-02 エレスタ・リレイズ・ゲーエムベーハー 位置測定デバイス
CA2815094C (en) * 2010-10-25 2018-01-16 Nikon Corporation Apparatus, optical assembly, method for inspection or measurement of an object and method for manufacturing a structure
DE102011081879A1 (de) * 2010-11-03 2012-05-03 Dr. Johannes Heidenhain Gmbh Optische Winkelmesseinrichtung
DE102010043469A1 (de) * 2010-11-05 2012-05-10 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102011082156A1 (de) * 2010-12-16 2012-06-21 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102010063253A1 (de) 2010-12-16 2012-06-21 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102011076055A1 (de) * 2011-05-18 2012-11-22 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102011076178B4 (de) * 2011-05-20 2022-03-31 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US8604413B2 (en) * 2011-06-13 2013-12-10 Mitutoyo Corporation Optical encoder including displacement sensing normal to the encoder scale grating surface
NL2009197A (en) 2011-08-25 2013-02-27 Asml Netherlands Bv System for detection motion, lithographic apparatus and device manufacturing method.
DE102011111900A1 (de) * 2011-08-30 2013-02-28 Dr. Johannes Heidenhain Gmbh Vorrichtung zur interferometrischen Abstandsbestimmung
US8724095B2 (en) 2011-10-25 2014-05-13 Nikon Corporation Optical assembly for laser radar
EP2629325B1 (de) 2012-02-17 2014-10-22 Dr. Johannes Heidenhain GmbH Anordnung und Verfahren zur Positionierung eines Bearbeitungswerkzeuges gegenüber einem Werkstück
SG11201503261TA (en) 2012-11-19 2015-05-28 Asml Netherlands Bv Position measurement system, grating for a position measurement system and method
CN103148779B (zh) * 2013-01-30 2016-01-13 中国科学院长春光学精密机械与物理研究所 位置测量设备中光源的调整装置
DE102014208988A1 (de) * 2013-09-11 2015-03-12 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102013220214A1 (de) * 2013-10-07 2015-04-09 Dr. Johannes Heidenhain Gmbh Anordnung zur Positionierung eines Werkzeugs relativ zu einem Werkstück
DE102013220196A1 (de) * 2013-10-07 2015-04-09 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102013221898A1 (de) * 2013-10-29 2015-04-30 Dr. Johannes Heidenhain Gmbh Vorrichtung zur Positionsbestimmung
JP6359340B2 (ja) * 2014-05-27 2018-07-18 株式会社ミツトヨ スケール及び光学式エンコーダ
JP6088466B2 (ja) * 2014-06-09 2017-03-01 ファナック株式会社 反射型の光学式エンコーダ
DE102014211004A1 (de) 2014-06-10 2015-12-17 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102015200293A1 (de) * 2015-01-13 2016-07-14 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102015219810A1 (de) * 2015-10-13 2017-04-13 Dr. Johannes Heidenhain Gmbh X-Y-Tisch mit einer Positionsmesseinrichtung
US10126560B2 (en) * 2016-02-18 2018-11-13 National Engineering Research Center for Optical Instrumentation Spectrum-generation system based on multiple-diffraction optical phasometry
DE102016214456A1 (de) * 2016-08-04 2018-02-08 Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung Positionsmesseinrichtung und Verfahren zum Betreiben einer Positionsmesseinrichtung
TWI648520B (zh) 2016-10-21 2019-01-21 財團法人工業技術研究院 光學編碼裝置
DE102017201257A1 (de) * 2017-01-26 2018-07-26 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
TWI680648B (zh) 2018-12-26 2019-12-21 財團法人工業技術研究院 編碼盤、檢光器、光學絕對式旋轉編碼器及編碼值輸出、偵錯與除錯的方法
DE102019206937A1 (de) 2019-05-14 2020-11-19 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
TWI716246B (zh) 2019-12-31 2021-01-11 財團法人工業技術研究院 光學編碼器
DE102020202080A1 (de) 2020-02-19 2021-08-19 Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung Optische Positionsmesseinrichtung
CN115993088A (zh) 2021-10-20 2023-04-21 约翰内斯.海德汉博士有限公司 光学位置测量设备

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3884580A (en) * 1973-09-07 1975-05-20 Gerber Scientific Instr Co Apparatus for measuring and positioning by interferometry
DE2521618B1 (de) * 1975-05-15 1976-03-11 Zeiss Carl Fa Vorrichtung zum Messen oder Einstellen von zweidimensionalen Lagekoordinaten
GB8413955D0 (en) 1984-05-31 1984-07-04 Pa Consulting Services Displacement measuring apparatus
DE8628805U1 (de) 1986-10-29 1989-01-26 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Lichtelektrische Längen- oder Winkelmeßeinrichtung
DE3905730C2 (de) 1989-02-24 1995-06-14 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
DE4033013C2 (de) * 1990-10-18 1994-11-17 Heidenhain Gmbh Dr Johannes Polarisationsoptische Anordnung
DE4033556A1 (de) 1990-10-22 1992-04-23 Suess Kg Karl Messanordnung fuer x,y,(phi)-koordinatentische
JP3028716B2 (ja) * 1993-09-29 2000-04-04 キヤノン株式会社 光学式変位センサ
ATE192566T1 (de) * 1994-02-23 2000-05-15 Heidenhain Gmbh Dr Johannes Positionsmessvorrichtung
JP3530573B2 (ja) * 1994-04-27 2004-05-24 キヤノン株式会社 光学式変位センサ
JP3158878B2 (ja) * 1994-07-28 2001-04-23 松下電器産業株式会社 光学式エンコーダ
DE19521295C2 (de) * 1995-06-10 2000-07-13 Heidenhain Gmbh Dr Johannes Lichtelektrische Positionsmeßeinrichtung
DE19748802B4 (de) * 1996-11-20 2010-09-09 Dr. Johannes Heidenhain Gmbh Optische Positionsmeßeinrichtung
DE19652563A1 (de) * 1996-12-17 1998-06-18 Heidenhain Gmbh Dr Johannes Lichtelektrische Positionsmeßeinrichtung
EP0978708B1 (de) * 1998-08-01 2005-10-05 Dr. Johannes Heidenhain GmbH Rotatorische Positionsmesseinrichtung
DE29916394U1 (de) * 1999-09-17 2001-02-15 Dr. Johannes Heidenhain Gmbh, 83301 Traunreut Optische Positionsmeßeinrichtung
DE19962278A1 (de) * 1999-12-23 2001-08-02 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
DE10022619A1 (de) * 2000-04-28 2001-12-06 Heidenhain Gmbh Dr Johannes Abtasteinheit für eine optische Positionsmesseinrichtung
JP2002090114A (ja) * 2000-07-10 2002-03-27 Mitsutoyo Corp 光スポット位置センサ及び変位測定装置
EP1319170B1 (de) * 2000-09-14 2005-03-09 Dr. Johannes Heidenhain GmbH Positionsmesseinrichtung
JP3720751B2 (ja) * 2001-10-23 2005-11-30 オリンパス株式会社 光学式エンコーダ
CN1253699C (zh) 2002-03-18 2006-04-26 株式会社三丰 对偏移具有低灵敏度的光学位移传感装置
DE10333772A1 (de) * 2002-08-07 2004-02-26 Dr. Johannes Heidenhain Gmbh Interferenzielle Positionsmesseinrichtung
DE102005006247A1 (de) * 2005-02-11 2006-08-17 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US7512452B2 (en) 2005-06-13 2009-03-31 Mauro George E Positioning system for eliminating lost motion effect
DE102005029917A1 (de) * 2005-06-28 2007-01-04 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102005043569A1 (de) * 2005-09-12 2007-03-22 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
KR20080045219A (ko) 2005-09-21 2008-05-22 코닌클리케 필립스 일렉트로닉스 엔.브이. 물체의 움직임을 검출하기 위한 시스템
US7636165B2 (en) * 2006-03-21 2009-12-22 Asml Netherlands B.V. Displacement measurement systems lithographic apparatus and device manufacturing method
DE102006042743A1 (de) * 2006-09-12 2008-03-27 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102007023300A1 (de) * 2007-05-16 2008-11-20 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Anordnung derselben
JP5095475B2 (ja) * 2008-04-14 2012-12-12 株式会社森精機製作所 光学式変位測定装置

Also Published As

Publication number Publication date
JP5253498B2 (ja) 2013-07-31
ATE487109T1 (de) 2010-11-15
EP2149029B1 (de) 2010-11-03
JP2010527013A (ja) 2010-08-05
EP2149029A1 (de) 2010-02-03
CN101680745A (zh) 2010-03-24
US7907286B2 (en) 2011-03-15
WO2008138502A1 (de) 2008-11-20
WO2008138501A1 (de) 2008-11-20
EP2149036A1 (de) 2010-02-03
DE502008001727D1 (de) 2010-12-16
US20080285058A1 (en) 2008-11-20
CN101680745B (zh) 2012-03-21
US7796272B2 (en) 2010-09-14
US20080282566A1 (en) 2008-11-20
DE102007023300A1 (de) 2008-11-20
CN101688795B (zh) 2011-09-14
CN101688795A (zh) 2010-03-31
EP2149036B1 (de) 2015-02-11
JP2010527014A (ja) 2010-08-05

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