JP4977032B2 - スルホ基を含有する高分子化合物、および該化合物を含有する有機電界発光素子 - Google Patents
スルホ基を含有する高分子化合物、および該化合物を含有する有機電界発光素子 Download PDFInfo
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- JP4977032B2 JP4977032B2 JP2007539977A JP2007539977A JP4977032B2 JP 4977032 B2 JP4977032 B2 JP 4977032B2 JP 2007539977 A JP2007539977 A JP 2007539977A JP 2007539977 A JP2007539977 A JP 2007539977A JP 4977032 B2 JP4977032 B2 JP 4977032B2
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- polymer compound
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- sulfo
- Prior art date
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- 150000001875 compounds Chemical class 0.000 title claims description 217
- 125000000020 sulfo group Chemical group O=S(=O)([*])O[H] 0.000 title claims description 163
- 229920000642 polymer Polymers 0.000 title claims description 156
- 238000002347 injection Methods 0.000 claims description 73
- 239000007924 injection Substances 0.000 claims description 73
- 125000004432 carbon atom Chemical group C* 0.000 claims description 32
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 31
- 239000000463 material Substances 0.000 claims description 30
- 125000003118 aryl group Chemical group 0.000 claims description 26
- 125000001424 substituent group Chemical group 0.000 claims description 24
- 125000002029 aromatic hydrocarbon group Chemical group 0.000 claims description 20
- 238000005401 electroluminescence Methods 0.000 claims description 16
- 125000006615 aromatic heterocyclic group Chemical group 0.000 claims description 15
- 125000006165 cyclic alkyl group Chemical group 0.000 claims description 13
- 125000003277 amino group Chemical group 0.000 claims description 12
- 125000005843 halogen group Chemical group 0.000 claims description 10
- 125000003545 alkoxy group Chemical group 0.000 claims description 7
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 125000004453 alkoxycarbonyl group Chemical group 0.000 claims description 4
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 4
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 4
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 4
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical group C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 claims description 3
- 125000000217 alkyl group Chemical group 0.000 claims description 3
- 125000003710 aryl alkyl group Chemical group 0.000 claims description 3
- 125000005708 carbonyloxy group Chemical group [*:2]OC([*:1])=O 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 167
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 105
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 87
- 239000007787 solid Substances 0.000 description 81
- -1 2-anthracenyl group Chemical group 0.000 description 75
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 73
- 238000001914 filtration Methods 0.000 description 73
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 69
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 69
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 59
- 239000002244 precipitate Substances 0.000 description 53
- 239000000243 solution Substances 0.000 description 52
- QAOWNCQODCNURD-UHFFFAOYSA-N sulfuric acid Substances OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 41
- 238000000034 method Methods 0.000 description 40
- 229910052757 nitrogen Inorganic materials 0.000 description 40
- 239000000706 filtrate Substances 0.000 description 36
- BWHDROKFUHTORW-UHFFFAOYSA-N tritert-butylphosphane Chemical compound CC(C)(C)P(C(C)(C)C)C(C)(C)C BWHDROKFUHTORW-UHFFFAOYSA-N 0.000 description 34
- 229940078552 o-xylene Drugs 0.000 description 33
- MFRIHAYPQRLWNB-UHFFFAOYSA-N sodium tert-butoxide Chemical compound [Na+].CC(C)(C)[O-] MFRIHAYPQRLWNB-UHFFFAOYSA-N 0.000 description 32
- 238000006243 chemical reaction Methods 0.000 description 29
- 229910052782 aluminium Inorganic materials 0.000 description 26
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 26
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 24
- 238000004458 analytical method Methods 0.000 description 22
- 239000000203 mixture Substances 0.000 description 21
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 19
- 239000012043 crude product Substances 0.000 description 19
- 238000004364 calculation method Methods 0.000 description 18
- 239000002904 solvent Substances 0.000 description 18
- 239000012299 nitrogen atmosphere Substances 0.000 description 17
- 239000010408 film Substances 0.000 description 16
- AKEJUJNQAAGONA-UHFFFAOYSA-N sulfur trioxide Chemical compound O=S(=O)=O AKEJUJNQAAGONA-UHFFFAOYSA-N 0.000 description 16
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 15
- 238000003756 stirring Methods 0.000 description 14
- CYPYTURSJDMMMP-WVCUSYJESA-N (1e,4e)-1,5-diphenylpenta-1,4-dien-3-one;palladium Chemical compound [Pd].[Pd].C=1C=CC=CC=1\C=C\C(=O)\C=C\C1=CC=CC=C1.C=1C=CC=CC=1\C=C\C(=O)\C=C\C1=CC=CC=C1.C=1C=CC=CC=1\C=C\C(=O)\C=C\C1=CC=CC=C1 CYPYTURSJDMMMP-WVCUSYJESA-N 0.000 description 13
- 238000010438 heat treatment Methods 0.000 description 13
- 239000002198 insoluble material Substances 0.000 description 13
- 229920001467 poly(styrenesulfonates) Polymers 0.000 description 13
- 239000000758 substrate Substances 0.000 description 13
- 239000007983 Tris buffer Substances 0.000 description 12
- PSHMTKQTHXXOKM-UHFFFAOYSA-N 2,5-bis(4-bromophenyl)-3,4-diphenylthiophene Chemical compound C1=CC(Br)=CC=C1C1=C(C=2C=CC=CC=2)C(C=2C=CC=CC=2)=C(C=2C=CC(Br)=CC=2)S1 PSHMTKQTHXXOKM-UHFFFAOYSA-N 0.000 description 10
- 239000007772 electrode material Substances 0.000 description 10
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 9
- 239000011347 resin Substances 0.000 description 9
- 229920005989 resin Polymers 0.000 description 9
- 239000010409 thin film Substances 0.000 description 9
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 8
- UTGQNNCQYDRXCH-UHFFFAOYSA-N N,N'-diphenyl-1,4-phenylenediamine Chemical compound C=1C=C(NC=2C=CC=CC=2)C=CC=1NC1=CC=CC=C1 UTGQNNCQYDRXCH-UHFFFAOYSA-N 0.000 description 8
- AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical class [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 description 8
- 239000003957 anion exchange resin Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 238000007740 vapor deposition Methods 0.000 description 8
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 7
- 239000011230 binding agent Substances 0.000 description 7
- 238000000576 coating method Methods 0.000 description 7
- 125000002524 organometallic group Chemical group 0.000 description 7
- 239000002356 single layer Substances 0.000 description 7
- 229910052717 sulfur Inorganic materials 0.000 description 7
- QPFMBZIOSGYJDE-UHFFFAOYSA-N 1,1,2,2-tetrachloroethane Chemical compound ClC(Cl)C(Cl)Cl QPFMBZIOSGYJDE-UHFFFAOYSA-N 0.000 description 6
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 6
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 6
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 6
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 6
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 6
- 229920000123 polythiophene Polymers 0.000 description 6
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 6
- 239000000047 product Substances 0.000 description 6
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 5
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 5
- 239000004793 Polystyrene Substances 0.000 description 5
- 229920001940 conductive polymer Polymers 0.000 description 5
- 238000000151 deposition Methods 0.000 description 5
- 125000005678 ethenylene group Chemical group [H]C([*:1])=C([H])[*:2] 0.000 description 5
- 229910052731 fluorine Inorganic materials 0.000 description 5
- 238000005227 gel permeation chromatography Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 239000003446 ligand Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 150000002894 organic compounds Chemical class 0.000 description 5
- 239000003960 organic solvent Substances 0.000 description 5
- 229920002223 polystyrene Polymers 0.000 description 5
- 125000005259 triarylamine group Chemical group 0.000 description 5
- 239000001211 (E)-4-phenylbut-3-en-2-one Substances 0.000 description 4
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical group [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 4
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 4
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical group [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 4
- 239000002585 base Substances 0.000 description 4
- 229930008407 benzylideneacetone Natural products 0.000 description 4
- 229910052801 chlorine Inorganic materials 0.000 description 4
- 125000001309 chloro group Chemical group Cl* 0.000 description 4
- ZYGHJZDHTFUPRJ-UHFFFAOYSA-N coumarin Chemical compound C1=CC=C2OC(=O)C=CC2=C1 ZYGHJZDHTFUPRJ-UHFFFAOYSA-N 0.000 description 4
- 230000008021 deposition Effects 0.000 description 4
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 4
- 125000001153 fluoro group Chemical group F* 0.000 description 4
- 230000009477 glass transition Effects 0.000 description 4
- 230000005525 hole transport Effects 0.000 description 4
- 229910052740 iodine Inorganic materials 0.000 description 4
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 4
- 125000001624 naphthyl group Chemical group 0.000 description 4
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 4
- 229920003227 poly(N-vinyl carbazole) Polymers 0.000 description 4
- 239000004417 polycarbonate Substances 0.000 description 4
- 239000002861 polymer material Substances 0.000 description 4
- 239000011241 protective layer Substances 0.000 description 4
- 150000003839 salts Chemical class 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- PJANXHGTPQOBST-UHFFFAOYSA-N stilbene Chemical class C=1C=CC=CC=1C=CC1=CC=CC=C1 PJANXHGTPQOBST-UHFFFAOYSA-N 0.000 description 4
- 125000004434 sulfur atom Chemical group 0.000 description 4
- XTHPWXDJESJLNJ-UHFFFAOYSA-N sulfurochloridic acid Chemical compound OS(Cl)(=O)=O XTHPWXDJESJLNJ-UHFFFAOYSA-N 0.000 description 4
- BWHOZHOGCMHOBV-BQYQJAHWSA-N trans-benzylideneacetone Chemical compound CC(=O)\C=C\C1=CC=CC=C1 BWHOZHOGCMHOBV-BQYQJAHWSA-N 0.000 description 4
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 4
- 238000001771 vacuum deposition Methods 0.000 description 4
- NAWXUBYGYWOOIX-SFHVURJKSA-N (2s)-2-[[4-[2-(2,4-diaminoquinazolin-6-yl)ethyl]benzoyl]amino]-4-methylidenepentanedioic acid Chemical compound C1=CC2=NC(N)=NC(N)=C2C=C1CCC1=CC=C(C(=O)N[C@@H](CC(=C)C(O)=O)C(O)=O)C=C1 NAWXUBYGYWOOIX-SFHVURJKSA-N 0.000 description 3
- 125000001140 1,4-phenylene group Chemical group [H]C1=C([H])C([*:2])=C([H])C([H])=C1[*:1] 0.000 description 3
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- IYBLVRRCNVHZQJ-UHFFFAOYSA-N 5-Hydroxyflavone Chemical compound C=1C(=O)C=2C(O)=CC=CC=2OC=1C1=CC=CC=C1 IYBLVRRCNVHZQJ-UHFFFAOYSA-N 0.000 description 3
- WFDIJRYMOXRFFG-UHFFFAOYSA-N Acetic anhydride Chemical compound CC(=O)OC(C)=O WFDIJRYMOXRFFG-UHFFFAOYSA-N 0.000 description 3
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- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 3
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- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 3
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- DKGAVHZHDRPRBM-UHFFFAOYSA-N Tert-Butanol Chemical compound CC(C)(C)O DKGAVHZHDRPRBM-UHFFFAOYSA-N 0.000 description 3
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- 229910052790 beryllium Inorganic materials 0.000 description 3
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- HVQAJTFOCKOKIN-UHFFFAOYSA-N flavonol Chemical compound O1C2=CC=CC=C2C(=O)C(O)=C1C1=CC=CC=C1 HVQAJTFOCKOKIN-UHFFFAOYSA-N 0.000 description 3
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- 239000011734 sodium Substances 0.000 description 3
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- 238000006467 substitution reaction Methods 0.000 description 3
- 239000011593 sulfur Substances 0.000 description 3
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 description 3
- TVIVIEFSHFOWTE-UHFFFAOYSA-K tri(quinolin-8-yloxy)alumane Chemical compound [Al+3].C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1 TVIVIEFSHFOWTE-UHFFFAOYSA-K 0.000 description 3
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- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 description 2
- 125000001989 1,3-phenylene group Chemical group [H]C1=C([H])C([*:1])=C([H])C([*:2])=C1[H] 0.000 description 2
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- LXCOEGHBLWHLIP-UHFFFAOYSA-N 1-n,4-n-bis(3-methoxyphenyl)benzene-1,4-diamine Chemical compound COC1=CC=CC(NC=2C=CC(NC=3C=C(OC)C=CC=3)=CC=2)=C1 LXCOEGHBLWHLIP-UHFFFAOYSA-N 0.000 description 2
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- 229910000846 In alloy Inorganic materials 0.000 description 2
- 239000002841 Lewis acid Substances 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 2
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- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 2
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- 238000005481 NMR spectroscopy Methods 0.000 description 2
- NQRYJNQNLNOLGT-UHFFFAOYSA-N Piperidine Chemical compound C1CCNCC1 NQRYJNQNLNOLGT-UHFFFAOYSA-N 0.000 description 2
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- NRCMAYZCPIVABH-UHFFFAOYSA-N Quinacridone Chemical class N1C2=CC=CC=C2C(=O)C2=C1C=C1C(=O)C3=CC=CC=C3NC1=C2 NRCMAYZCPIVABH-UHFFFAOYSA-N 0.000 description 2
- RAHZWNYVWXNFOC-UHFFFAOYSA-N Sulphur dioxide Chemical compound O=S=O RAHZWNYVWXNFOC-UHFFFAOYSA-N 0.000 description 2
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- 239000002253 acid Substances 0.000 description 2
- FZEYVTFCMJSGMP-UHFFFAOYSA-N acridone Chemical class C1=CC=C2C(=O)C3=CC=CC=C3NC2=C1 FZEYVTFCMJSGMP-UHFFFAOYSA-N 0.000 description 2
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- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920000767 polyaniline Polymers 0.000 description 1
- 229920001230 polyarylate Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920000128 polypyrrole Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- BITYAPCSNKJESK-UHFFFAOYSA-N potassiosodium Chemical compound [Na].[K] BITYAPCSNKJESK-UHFFFAOYSA-N 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 150000003216 pyrazines Chemical class 0.000 description 1
- 150000003219 pyrazolines Chemical class 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 125000000246 pyrimidin-2-yl group Chemical group [H]C1=NC(*)=NC([H])=C1[H] 0.000 description 1
- 125000004527 pyrimidin-4-yl group Chemical group N1=CN=C(C=C1)* 0.000 description 1
- FYNROBRQIVCIQF-UHFFFAOYSA-N pyrrolo[3,2-b]pyrrole-5,6-dione Chemical class C1=CN=C2C(=O)C(=O)N=C21 FYNROBRQIVCIQF-UHFFFAOYSA-N 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 150000003248 quinolines Chemical class 0.000 description 1
- 125000001567 quinoxalinyl group Chemical class N1=C(C=NC2=CC=CC=C12)* 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000001953 recrystallisation Methods 0.000 description 1
- 238000001226 reprecipitation Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000001223 reverse osmosis Methods 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000010802 sludge Substances 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- IIACRCGMVDHOTQ-UHFFFAOYSA-N sulfamic acid Chemical compound NS(O)(=O)=O IIACRCGMVDHOTQ-UHFFFAOYSA-N 0.000 description 1
- 150000004763 sulfides Chemical class 0.000 description 1
- 150000003871 sulfonates Chemical class 0.000 description 1
- 238000006277 sulfonation reaction Methods 0.000 description 1
- HIFJUMGIHIZEPX-UHFFFAOYSA-N sulfuric acid;sulfur trioxide Chemical compound O=S(=O)=O.OS(O)(=O)=O HIFJUMGIHIZEPX-UHFFFAOYSA-N 0.000 description 1
- YBBRCQOCSYXUOC-UHFFFAOYSA-N sulfuryl dichloride Chemical compound ClS(Cl)(=O)=O YBBRCQOCSYXUOC-UHFFFAOYSA-N 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 229940042055 systemic antimycotics triazole derivative Drugs 0.000 description 1
- IFLREYGFSNHWGE-UHFFFAOYSA-N tetracene Chemical compound C1=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C21 IFLREYGFSNHWGE-UHFFFAOYSA-N 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 150000003918 triazines Chemical class 0.000 description 1
- OPSWAWSNPREEFQ-UHFFFAOYSA-K triphenoxyalumane Chemical compound [Al+3].[O-]C1=CC=CC=C1.[O-]C1=CC=CC=C1.[O-]C1=CC=CC=C1 OPSWAWSNPREEFQ-UHFFFAOYSA-K 0.000 description 1
- WGWZJNILGYTDHU-UHFFFAOYSA-K tris(3,5-dimethylphenoxy)alumane Chemical compound CC=1C=C([O-])C=C(C1)C.[Al+3].CC=1C=C([O-])C=C(C1)C.CC=1C=C([O-])C=C(C1)C WGWZJNILGYTDHU-UHFFFAOYSA-K 0.000 description 1
- CWBQQLSTRZUWOM-UHFFFAOYSA-K tris(3-methylphenoxy)alumane Chemical compound [Al+3].CC1=CC=CC([O-])=C1.CC1=CC=CC([O-])=C1.CC1=CC=CC([O-])=C1 CWBQQLSTRZUWOM-UHFFFAOYSA-K 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229910021642 ultra pure water Inorganic materials 0.000 description 1
- 238000000108 ultra-filtration Methods 0.000 description 1
- 239000012498 ultrapure water Substances 0.000 description 1
- 238000004506 ultrasonic cleaning Methods 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
- 239000010457 zeolite Substances 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Images
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Description
(1)一般式(1):
で表される繰り返し単位からなる高分子化合物に対してスルホ基を導入した構造であることを特徴とするスルホ基含有高分子化合物が提供される。
(2)一般式(1)中、Yで表される基が一般式(a)で表される基であり、Wで表される基が一般式(b−1)〜(b−8)から選ばれるいずれかの基である(1)項に記載のスルホ基含有高分子化合物。
Y:
W:
(3)一般式(2):
で表される繰り返し単位において、Ar1、Ar2、Y、およびチオフェン環に結合した4つのベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有することを特徴とする(1)項に記載のスルホ基含有高分子化合物。
(4)一般式(3):
で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有することを特徴とする(3)項に記載のスルホ基含有高分子化合物。
(5)一般式(3a):
で表される繰り返し単位において、ベンゼン環およびナフタレン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有することを特徴とする請求項3記載のスルホ基含有高分子化合物。
(6)前記Z1〜Z4は、互いに同一であっても異なっていてもよく、それぞれカルボキシル基、アルコキシカルボニル基、カルボニルオキシ基、ヒドロキシル基、アミノ基、一置換アミノ基、二置換アミノ基、および一般式(1a):
-(O)L-D (1a)
(式中、Dは無置換または置換された直鎖状、分岐鎖状または環状の炭素数1〜8のアルキル基、無置換または置換された炭素数4〜12の一価の芳香族基、無置換または置換された炭素数5〜20のアラルキル基を示し、Lは0または1を示す)で表される基からなる群から選択される基である(2)項から(5)項のいずれかに記載のスルホ基含有高分子化合物。
(7)(1)、(3)、(4)、(5)項のいずれかに記載のスルホ基含有高分子化合物からなる有機電界発光材料。
(8)一対の電極間に、(1)、(3)、(4)、(5)項のいずれかに記載のスルホ基含有高分子化合物を少なくとも一種含有する層を、少なくとも一層挟持してなる有機電界発光素子。
(9)(1)、(3)、(4)、(5)項のいずれかに記載のスルホ基含有高分子化合物を含有する層が、電荷注入輸送層である(8)項に記載の有機電界発光素子。
(10)電荷注入輸送層が正孔注入輸送層である(9)項に記載の有機電界発光素子。
(11)(1)、(3)、(4)、(5)項のいずれかに記載のスルホ基含有高分子化合物を含有する層が、発光層である(8)項に記載の有機電界発光素子。
(12)一対の電極間に、さらに、発光層を有する(8)〜(11)項のいずれかに記載の有機電界発光素子。
(13)一対の電極間に、さらに、電子注入輸送層を有する(8)〜(12)項のいずれかに記載の有機電界発光素子。
(14)一般式(2):
で表される繰り返し単位からなる高分子化合物をスルホン化するスルホ基含有高分子化合物の製造方法が提供される。
一般式(1):
Y:
W:
-(O)L-D (1a)
(式中、Dは無置換または置換された直鎖状、分岐鎖状または環状の炭素数1〜8のアルキル基、無置換または置換された炭素数4〜12の一価の芳香族基、無置換または置換された炭素数5〜20のアラルキル基を示し、Lは0または1を示す)で表される基を挙げることができる。置換基の置換位置は特に制限されない。また、置換数は制限されないが、好ましくは0〜5である。
16のものが好ましい。無置換または置換された芳香族炭化水素基としては、環を構成する炭素数が6〜30のものが好ましい。無置換または置換された芳香族複素環基としては、環を構成する炭素数が3〜30のものが好ましい。無置換または置換された芳香族炭化水素基または芳香族複素環基の具体例としては、Ar1とAr2の具体例として示したものを挙げることができる。
-A-B-A- (1b)
(式中、Aは二価の芳香族基を示し、-B-は、単結合、-O-、-S-、-CH2-、-CMe2-、-CO-、-SO-、-SO2-、-SiH2-、-SiMe2-、および一般式(1c):
-A-B-A-B-A- (1d)
(式中、AおよびBは、前記一般式(1b)中のAおよびBと同義である。)で表される基も包含される。
次に、本発明の一般式(1)で表される繰り返し単位からなる高分子化合物にスルホ基が導入された化合物の製造方法について説明する。
H-N(Ar1)-Y-N(Ar2)-H (4)
(式中、Ar1、Ar2およびYは一般式(1)の通り。)で表される化合物と一般式(5):
X1-W-X1 (5)
(式中、X1はハロゲン原子を示し、Wは一般式(1)の通り。)で表される化合物を塩基存在下、Pd触媒などで重合させることにより製造することができる。
また、一般式(2)で表される繰り返し単位からなる高分子化合物は、例えば、前記一般式(4)で表される化合物と一般式(6):
本発明の有機電界発光材料は、前述したスルホ基含有高分子化合物、例えば一般式(1)、一般式(2)、一般式(3)または一般式(3a)のいずれかスルホ基含有高分子化合物からなり、有機電界発光素子に用いられる正孔注入輸送材料、発光材料、電子注入輸送材料である。
(式中、Eは無置換または置換された8-キノリノラート配位子を表す。)
(E)2-Al-O-M (b)
(式中、Eは前記の通り、O-Mはフェノラート配位子を表し、Mはフェニル基を有する炭素数6〜24の炭化水素基を表す。)
(E)2-Al-O-Al-(E)2 (c)
(式中、Eは前記の通り。)
装置:ゲル浸透クロマトグラフGPC 101(Shodex社製)
検出器:示差屈折率計
カラム:GPC K-806LX3(8.0mmI.D.×30cm、Shodex社製)
カラム温度:40℃
溶媒:クロロホルム
注入量:100μl
流速 :1ml/min
標準物質:単分散ポリスチレン(Shodex社製)
装置:日本電子製ECP500型核磁気共鳴装置
測定核:13C(125MHz)
測定温度:45℃
測定溶媒:CDCl3
島津製作所製示差走査熱量計DSC−60を用いて測定した。
(UV(λmax))
島津製作所製紫外可視分光光度計UV−2500PCを用いて測定した。
(式(7)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:9800
13C−NMR:147.2、142.8、139.0、137.6、137.0、130.9、129.6、129.2、127.8、127.7、126.5、125.6、124.6、123.0、122.3ppm
ガラス転移温度:250℃
UV(λmax):382(CHCl3)
平均スルホ基数 ={(式7)の繰り返し単位分子量X硫黄元素分析値(%)−(式7)の繰り返し単位中の硫黄数X硫黄原子量X100}÷{硫黄原子量X100−硫黄元素分析値(%)X(スルホ基分子量―水素原子量)}
硫黄元素分析値 11.3%
繰り返し単位あたりの平均スルホ基数:1.8
UV(λmax):380(MeOH)
(式(8)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:13700
ガラス転移温度:283℃
UV(λmax):381(CHCl3)
繰り返し単位あたりの平均スルホ基数:1.0
(式(9)で表される繰り返し単位において、ベンゼン環およびナフタレン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:10100
ガラス転移温度:256℃
UV(λmax):387(テトラクロロエタン)
繰り返し単位あたりの平均スルホ基数:3.3
UV(λmax):341(MeOH)
(式(10)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:11600
繰り返し単位あたりの平均スルホ基数:2.1
(式(11)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:8900
繰り返し単位あたりの平均スルホ基数:1.7
(式(12)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:10500
繰り返し単位あたりの平均スルホ基数:1.8
(式(13)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:4300
繰り返し単位あたりの平均スルホ基数:2.0
(式(14)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:3500
繰り返し単位あたりの平均スルホ基数:1.6
(式(15)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:4300
繰り返し単位あたりの平均スルホ基数:1.5
(式(16)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:3900
繰り返し単位あたりの平均スルホ基数:1.8
(式(17)で表される繰り返し単位において、ベンゼン環およびフルオレン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
繰り返し単位あたりの平均スルホ基数:0.5
(式(18)で表される繰り返し単位において、ベンゼン環およびフルオレン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:5800
繰り返し単位あたりの平均スルホ基数:0.74
(式(19)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
繰り返し単位あたりの平均スルホ基数:0.2
(式(20)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:4100
繰り返し単位あたりの平均スルホ基数:0.20
(式(21)で表される繰り返し単位において、ベンゼン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:1000
繰り返し単位あたりの平均スルホ基数:1.8
(式(22)で表される繰り返し単位において、ベンゼン環およびナフタレン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:4900
繰り返し単位あたりの平均スルホ基数:0.24
(式(23)で表される繰り返し単位において、ベンゼン環およびアントラセン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:1400
繰り返し単位あたりの平均スルホ基数:2.0
(式(24)で表される繰り返し単位において、ベンゼン環およびカルバゾール環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:2500
繰り返し単位あたりの平均スルホ基数:0.7
(式(25)で表される繰り返し単位において、ベンゼン環およびジベンゾチオフェン環の少なくとも一つがスルホ基で置換された繰り返し単位を高分子鎖中に少なくとも一つ有するスルホ基含有高分子化合物)
分子量:2700
繰り返し単位あたりの平均スルホ基数:0.8
(有機電界発光素子の作製)
厚さ200nmのITO透明電極(陽極)を有するガラス基板を、中性洗剤、セミコクリーン(フルウチ化学製)、超純水、アセトン、エタノールを用いて超音波洗浄した。この基板を窒素ガスにて乾燥し、さらにUV/オゾン洗浄した。先ずITO透明電極上に、正孔注入材料として実施例1で得たスルホ基含有高分子化合物のメタノール溶液(高分子化合物20mgをメタノール4mLに溶解させた溶液)を用いて、スピンコート法により、20nmの厚みで成膜し、ホットプレート上で減圧乾燥(100℃、30分)して層を形成した。次に、このガラス基板を蒸着装置の基板ホルダーに固定し、蒸着槽を3×10-4Paに減圧した。N,N'-ジ(1-ナフチル)-N,N'-ジフェニルベンジジンを蒸着速度0.2nm/secで40nmの厚さに蒸着し、次にトリス(8-キノリノラート)アルミニウムを蒸着速度0.2nm/secで50nmの厚さに蒸着した。さらにフッ化リチウムを0.2nm/secで0.5nmの厚さに蒸着した。その上にアルミニウムを蒸着して陰極とし、有機電界発光素子を作製した(有機EL素子-1)。
ガラス基板に、実施例1で得た高分子化合物のメタノール溶液(高分子化合物20mgをメタノール4mLに溶解させた溶液)を用いて、スピンコート法により50nmの厚みで成膜した。ホットプレート上で減圧乾燥(100℃、30分)して得た膜を観察したところ、均一な膜が形成されていた。
実施例1で得た高分子化合物の代わりに、PEDOT/PSS(バイエル社、商品名 BaytronP)を用いて参考例と同様の方法で成膜し観察したところ、実施例1で得た高分子化合物を用いて成膜したものに比べて膜厚にバラツキが認められた。
実施例20において、正孔注入材料として実施例1で得たスルホ基含有高分子化合物を前記PEDOT/PSSに替えた以外は実施例20と同様にして有機電界発光素子を作成(有機EL素子-2)し、素子の発光寿命を比較した。
発光輝度が初期輝度に対して20%および50%減衰するまでの時間を、有機EL素子―1を100とした場合の相対値として表1に示した。
Claims (14)
- 前記Z1〜Z4は、互いに同一であっても異なっていてもよく、それぞれカルボキシル基、アルコキシカルボニル基、カルボニルオキシ基、ヒドロキシル基、アミノ基、一置換アミノ基、二置換アミノ基、および一般式(1a):
-(O)L-D (1a)
(式中、Dは無置換または置換された直鎖状、分岐鎖状または環状の炭素数1〜8のアルキル基、無置換または置換された炭素数4〜12の一価の芳香族基、無置換または置換された炭素数5〜20のアラルキル基を示し、Lは0または1を示す)で表される基からなる群から選択される基である請求項2から5のいずれかに記載のスルホ基含有高分子化合物。 - 請求項1、3、4、5のいずれかに記載のスルホ基含有高分子化合物からなる有機電界発光材料。
- 一対の電極間に、請求項1、3、4、5のいずれかに記載のスルホ基含有高分子化合物を少なくとも一種含有する層を、少なくとも一層挟持してなる有機電界発光素子。
- 請求項1、3、4、5のいずれかに記載のスルホ基含有高分子化合物を含有する層が、電荷注入輸送層である請求項8記載の有機電界発光素子。
- 電荷注入輸送層が正孔注入輸送層である請求項9記載の有機電界発光素子。
- 請求項1、3、4、5のいずれかに記載のスルホ基含有高分子化合物を含有する層が、発光層である請求項8記載の有機電界発光素子。
- 一対の電極間に、さらに、発光層を有する請求項8〜11のいずれかに記載の有機電界発光素子。
- 一対の電極間に、さらに、電子注入輸送層を有する請求項8〜12のいずれかに記載の有機電界発光素子。
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JP5018043B2 (ja) * | 2005-12-01 | 2012-09-05 | 住友化学株式会社 | 高分子化合物およびそれを用いた高分子発光素子 |
TW200902592A (en) * | 2007-03-29 | 2009-01-16 | Mitsui Chemicals Inc | Polymers containing sulfo group and intermediate thereof, and organic electroluminescent element containing the polymer |
TW200906909A (en) * | 2007-04-04 | 2009-02-16 | Mitsui Chemicals Inc | Polymers containing sulfo group and intermediate thereof, and organic electroluminescent element containing the polymer |
JP5113663B2 (ja) * | 2008-07-31 | 2013-01-09 | 三井化学株式会社 | 有機酸含有組成物及びそれを用いた有機エレクトロルミネッセンス素子 |
DE102009014856A1 (de) * | 2009-03-30 | 2010-10-07 | H.C. Starck Clevios Gmbh | Polymerbeschichtungen mit verbesserter UV- und Temperaturstabilität |
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JP6168515B2 (ja) * | 2013-05-30 | 2017-07-26 | 小西化学工業株式会社 | スチレン系ポリマーのスルホン化物の製造方法 |
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