JP4968996B2 - 半導体装置の作製方法 - Google Patents

半導体装置の作製方法 Download PDF

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Publication number
JP4968996B2
JP4968996B2 JP2001260094A JP2001260094A JP4968996B2 JP 4968996 B2 JP4968996 B2 JP 4968996B2 JP 2001260094 A JP2001260094 A JP 2001260094A JP 2001260094 A JP2001260094 A JP 2001260094A JP 4968996 B2 JP4968996 B2 JP 4968996B2
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Japan
Prior art keywords
semiconductor layer
laser
film
substrate
laser beam
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Expired - Fee Related
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JP2001260094A
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English (en)
Japanese (ja)
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JP2002151525A (ja
JP2002151525A5 (enExample
Inventor
英人 大沼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Priority to JP2001260094A priority Critical patent/JP4968996B2/ja
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Publication of JP2002151525A5 publication Critical patent/JP2002151525A5/ja
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  • Liquid Crystal (AREA)
  • Recrystallisation Techniques (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Thin Film Transistor (AREA)
JP2001260094A 2000-09-01 2001-08-29 半導体装置の作製方法 Expired - Fee Related JP4968996B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001260094A JP4968996B2 (ja) 2000-09-01 2001-08-29 半導体装置の作製方法

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2000265613 2000-09-01
JP2000-265613 2000-09-01
JP2000265613 2000-09-01
JP2001260094A JP4968996B2 (ja) 2000-09-01 2001-08-29 半導体装置の作製方法

Publications (3)

Publication Number Publication Date
JP2002151525A JP2002151525A (ja) 2002-05-24
JP2002151525A5 JP2002151525A5 (enExample) 2008-09-18
JP4968996B2 true JP4968996B2 (ja) 2012-07-04

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JP2001260094A Expired - Fee Related JP4968996B2 (ja) 2000-09-01 2001-08-29 半導体装置の作製方法

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JP (1) JP4968996B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100778514B1 (ko) * 2006-08-09 2007-11-22 삼성에스디아이 주식회사 유기 발광 표시 장치
CN102082098A (zh) * 2010-12-15 2011-06-01 四川虹视显示技术有限公司 生产低温多晶硅薄膜晶体管的方法
CN102751200B (zh) * 2012-06-29 2015-06-10 京东方科技集团股份有限公司 薄膜晶体管、阵列基板及其制造方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS639978A (ja) * 1986-06-30 1988-01-16 Nec Corp 薄膜トランジスタの製造方法
JPH03171776A (ja) * 1989-11-30 1991-07-25 Casio Comput Co Ltd 薄膜トランジスタおよびその製造方法
JP3535205B2 (ja) * 1993-03-22 2004-06-07 株式会社半導体エネルギー研究所 薄膜トランジスタの作製方法
JP3105396B2 (ja) * 1994-05-20 2000-10-30 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
JPH07333546A (ja) * 1994-06-03 1995-12-22 Nec Corp 立体画像表示装置
JP3190520B2 (ja) * 1994-06-14 2001-07-23 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
JPH08250736A (ja) * 1995-03-09 1996-09-27 Toshiba Electron Eng Corp 多結晶シリコン薄膜トランジスタの製造方法
JPH09172186A (ja) * 1996-12-02 1997-06-30 Casio Comput Co Ltd 薄膜トランジスタの製造方法
JPH118394A (ja) * 1997-06-18 1999-01-12 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法
JPH1187724A (ja) * 1997-09-11 1999-03-30 Matsushita Electric Ind Co Ltd 半導体素子の製造方法
JP2000003875A (ja) * 1998-06-12 2000-01-07 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法
JP2000133594A (ja) * 1998-08-18 2000-05-12 Semiconductor Energy Lab Co Ltd 半導体装置の作製方法
JPH11330488A (ja) * 1999-01-29 1999-11-30 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法

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JP2002151525A (ja) 2002-05-24

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