JP4927542B2 - ナノ構造を沈着、配向させる方法、装置及び組成物 - Google Patents
ナノ構造を沈着、配向させる方法、装置及び組成物 Download PDFInfo
- Publication number
- JP4927542B2 JP4927542B2 JP2006528061A JP2006528061A JP4927542B2 JP 4927542 B2 JP4927542 B2 JP 4927542B2 JP 2006528061 A JP2006528061 A JP 2006528061A JP 2006528061 A JP2006528061 A JP 2006528061A JP 4927542 B2 JP4927542 B2 JP 4927542B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- receiving substrate
- semiconductor nanowires
- semiconductor
- transfer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims description 80
- 238000000151 deposition Methods 0.000 title claims description 26
- 239000002086 nanomaterial Substances 0.000 title description 117
- 239000000203 mixture Substances 0.000 title description 10
- 239000000758 substrate Substances 0.000 claims description 377
- 239000002070 nanowire Substances 0.000 claims description 145
- 239000000463 material Substances 0.000 claims description 127
- 238000012546 transfer Methods 0.000 claims description 121
- 239000004065 semiconductor Substances 0.000 claims description 74
- 239000000853 adhesive Substances 0.000 claims description 73
- 230000001070 adhesive effect Effects 0.000 claims description 73
- 230000001464 adherent effect Effects 0.000 claims description 20
- 230000008021 deposition Effects 0.000 claims description 14
- 229920002120 photoresistant polymer Polymers 0.000 claims description 13
- 229920000642 polymer Polymers 0.000 claims description 13
- 239000002904 solvent Substances 0.000 claims description 9
- 238000004140 cleaning Methods 0.000 claims description 6
- 230000008569 process Effects 0.000 claims description 6
- 238000003825 pressing Methods 0.000 claims description 3
- 238000000926 separation method Methods 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 17
- 229910052710 silicon Inorganic materials 0.000 description 13
- 238000004519 manufacturing process Methods 0.000 description 12
- 235000012431 wafers Nutrition 0.000 description 12
- 239000002019 doping agent Substances 0.000 description 9
- 239000000126 substance Substances 0.000 description 9
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 239000010703 silicon Substances 0.000 description 8
- 239000002073 nanorod Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 239000013078 crystal Substances 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 5
- 239000004926 polymethyl methacrylate Substances 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 239000000084 colloidal system Substances 0.000 description 4
- 239000002131 composite material Substances 0.000 description 4
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 4
- 239000012530 fluid Substances 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 4
- 239000002071 nanotube Substances 0.000 description 4
- 229910052711 selenium Inorganic materials 0.000 description 4
- 239000007787 solid Substances 0.000 description 4
- 229910052714 tellurium Inorganic materials 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 239000012808 vapor phase Substances 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 239000012790 adhesive layer Substances 0.000 description 3
- 239000002041 carbon nanotube Substances 0.000 description 3
- 229910021393 carbon nanotube Inorganic materials 0.000 description 3
- 125000003636 chemical group Chemical group 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 229910052738 indium Inorganic materials 0.000 description 3
- 230000005693 optoelectronics Effects 0.000 description 3
- 238000005096 rolling process Methods 0.000 description 3
- 238000004528 spin coating Methods 0.000 description 3
- 229910052717 sulfur Inorganic materials 0.000 description 3
- 238000004381 surface treatment Methods 0.000 description 3
- 238000001308 synthesis method Methods 0.000 description 3
- 229910052718 tin Inorganic materials 0.000 description 3
- CFAKWWQIUFSQFU-UHFFFAOYSA-N 2-hydroxy-3-methylcyclopent-2-en-1-one Chemical compound CC1=C(O)C(=O)CC1 CFAKWWQIUFSQFU-UHFFFAOYSA-N 0.000 description 2
- XLLIQLLCWZCATF-UHFFFAOYSA-N 2-methoxyethyl acetate Chemical compound COCCOC(C)=O XLLIQLLCWZCATF-UHFFFAOYSA-N 0.000 description 2
- 229910017115 AlSb Inorganic materials 0.000 description 2
- 229910005542 GaSb Inorganic materials 0.000 description 2
- 229910000673 Indium arsenide Inorganic materials 0.000 description 2
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000005137 deposition process Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 229940116333 ethyl lactate Drugs 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 2
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 230000000873 masking effect Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000002121 nanofiber Substances 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 2
- 239000002096 quantum dot Substances 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- 230000002194 synthesizing effect Effects 0.000 description 2
- YBNMDCCMCLUHBL-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 4-pyren-1-ylbutanoate Chemical compound C=1C=C(C2=C34)C=CC3=CC=CC4=CC=C2C=1CCCC(=O)ON1C(=O)CCC1=O YBNMDCCMCLUHBL-UHFFFAOYSA-N 0.000 description 1
- 239000001837 2-hydroxy-3-methylcyclopent-2-en-1-one Substances 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910015894 BeTe Inorganic materials 0.000 description 1
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 239000004821 Contact adhesive Substances 0.000 description 1
- 229910021589 Copper(I) bromide Inorganic materials 0.000 description 1
- 229910021591 Copper(I) chloride Inorganic materials 0.000 description 1
- 229910021593 Copper(I) fluoride Inorganic materials 0.000 description 1
- 229910021595 Copper(I) iodide Inorganic materials 0.000 description 1
- VMQMZMRVKUZKQL-UHFFFAOYSA-N Cu+ Chemical compound [Cu+] VMQMZMRVKUZKQL-UHFFFAOYSA-N 0.000 description 1
- 229910016344 CuSi Inorganic materials 0.000 description 1
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Natural products CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 1
- XXRCUYVCPSWGCC-UHFFFAOYSA-N Ethyl pyruvate Chemical compound CCOC(=O)C(C)=O XXRCUYVCPSWGCC-UHFFFAOYSA-N 0.000 description 1
- 229910005829 GeS Inorganic materials 0.000 description 1
- 229910005866 GeSe Inorganic materials 0.000 description 1
- 229910005900 GeTe Inorganic materials 0.000 description 1
- 229910005939 Ge—Sn Inorganic materials 0.000 description 1
- 229920000209 Hexadimethrine bromide Polymers 0.000 description 1
- 229910004262 HgTe Inorganic materials 0.000 description 1
- 108010039918 Polylysine Proteins 0.000 description 1
- 229910018540 Si C Inorganic materials 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 229910021607 Silver chloride Inorganic materials 0.000 description 1
- 229910021608 Silver(I) fluoride Inorganic materials 0.000 description 1
- 229910008310 Si—Ge Inorganic materials 0.000 description 1
- 229910005642 SnTe Inorganic materials 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 238000005411 Van der Waals force Methods 0.000 description 1
- 229910007709 ZnTe Inorganic materials 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 239000012190 activator Substances 0.000 description 1
- 239000002998 adhesive polymer Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 229910002091 carbon monoxide Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- OXBLHERUFWYNTN-UHFFFAOYSA-M copper(I) chloride Chemical compound [Cu]Cl OXBLHERUFWYNTN-UHFFFAOYSA-M 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 229940117360 ethyl pyruvate Drugs 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 229920005570 flexible polymer Polymers 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000004434 industrial solvent Substances 0.000 description 1
- 238000007641 inkjet printing Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 125000005647 linker group Chemical group 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 229910003465 moissanite Inorganic materials 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 239000002159 nanocrystal Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 229920000656 polylysine Polymers 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 102000004169 proteins and genes Human genes 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000010187 selection method Methods 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- ADZWSOLPGZMUMY-UHFFFAOYSA-M silver bromide Chemical compound [Ag]Br ADZWSOLPGZMUMY-UHFFFAOYSA-M 0.000 description 1
- HKZLPVFGJNLROG-UHFFFAOYSA-M silver monochloride Chemical compound [Cl-].[Ag+] HKZLPVFGJNLROG-UHFFFAOYSA-M 0.000 description 1
- REYHXKZHIMGNSE-UHFFFAOYSA-M silver monofluoride Chemical compound [F-].[Ag+] REYHXKZHIMGNSE-UHFFFAOYSA-M 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000009718 spray deposition Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- 238000007669 thermal treatment Methods 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02422—Non-crystalline insulating materials, e.g. glass, polymers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B7/00—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02603—Nanowires
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/762—Nanowire or quantum wire, i.e. axially elongated structure having two dimensions of 100 nm or less
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/827—Nanostructure formed from hybrid organic/inorganic semiconductor compositions
Description
本出願は2003年9月25日出願の“ナノ構造を沈着、配向する方法、装置及び組成物”と題する米国出願No.10/673,092の一部継続出願である。本出願は、該出願による利益及び優先権を主張する。
ナノテクノロジーは、次の大きな技術的跳躍として、電子的、光学的及び構造的特性等の材料特性の点で種々の実質的な利点が得られることが予言される前触れとなっていた。ナノテクノロジーの進歩は、Mooreの法則の寿命を延ばすための最良の希望であると予測した者もいる。
本発明は一般には、通常、機能的な装置又は組成物中に一体化するため、基体の表面にナノ構造を配置し、任意に配向又は配列する方法、物品、組成物、システム、キット等を提供する。
図1は、本発明によるナノ構造沈着方法の概略図である。
本発明は一般にはナノ材料、特に他の基体材料上に高アスペクト比を有するナノ材料の配置及び/又は配向に使用する装置、システム及び方法に向けたものである。概括的な言葉では本発明は、ナノ材料を“移送基体”とも呼ばれる第一基体から、“受取基体”とも呼ばれる第二基体への移送を含む。ここで、第二基体上にはナノ材料を配置することが望ましい。こうして、まず、ナノ材料は、移送基体の表面上に供給する。移送は、受取基体の表面上に付着した付着性材料を供給することにより行われる。ここで、受取基体上にはナノ材料を沈着、配置及び/又は配向させることが望ましい。次いで移送基体上のナノ材料は、受取基体上の付着性材料と接触させ、両基体表面を共に接触させることにより、ナノ材料を受取基体上に付着させる。
ナノワイヤーを基体上にほぼ整列した配向で沈着させるため、ここで説明した方法を使用した。特に、受取基体として、4インチシリコンウエーハーを使用し、感圧接着剤の溶液(PolySciences534028の30%イソプロパノール溶液)を直径約50μmの接着剤スポットでパターン化した。スポット化はXYZロボット及びピペッターを用いて行った。沈着後、スポットを60℃で乾燥して、ウエーハーの表面上に約10μm厚の接着剤パッドを形成した。
104 移送基体表面
106 ナノワイヤー
108 受取基体
110 受取基体表面
200 単一ナノワイヤートランジスター装置
204 ソース電極
206 ドレン電極
208 ゲート電極
202 ナノワイヤー
210 ベース基体
300 トランジスター配列
302 トランジスター
304 配向ナノワイヤー
306 基体表面
308 ソース電極
310 ドレン電極
312 ゲート電極
314 パターン化領域
402 移送基体
406 ナノワイヤー
408 受取基体
414 ナノワイヤー
500 設備
502 移送基体
504 ドラム又はローラー
506 受取基体
508 第二ドラム又はローラー
510 基体表面
512 アプリケーター
514、516 供給ローラー
518、520 供給ローラー
522、524 ドラムプレス
526、528 引取ドラム
Claims (39)
- 移送基体上に配置した複数の半導体ナノワイヤーを供給する工程、
受取基体の1箇所以上の選択領域に沈着した高分子付着性材料を有する受取基体を供給する工程、
移送基体と受取基体とを合体させ、そこで移送基体上の半導体ナノワイヤーを受取基体の1箇所以上の選択領域上の高分子付着材料と接触させる工程、
移送基体及び受取基体の少なくとも一方を、他方の移送基体及び受取基体に対しほぼ平行に、移送基体上の半導体ナノワイヤーの平均長の範囲内で移動し、受取基体に付着した該半導体ナノワイヤーをほぼ整列させる工程、及び
受取基体の1箇所以上の選択領域に付着した半導体ナノワイヤーの集団を残すため、受取基体から移送基体を分離する工程、を含む、
半導体ナノワイヤーを基体上に沈着させる方法。 - 複数の半導体ナノワイヤーが第II族−第VI族半導体、第III族−第V族半導体又は第IV族半導体から選ばれた半導体材料を含む請求項1に記載の方法。
- 半導体ナノワイヤーが移送基体上で合成される請求項1に記載の方法。
- 合体工程が、移送基体を受取基体の選択領域に押圧する工程を含む請求項1に記載の方法。
- 移送基体が可とう性平坦シート基体を含む請求項1に記載の方法。
- 移送基体がロール上に配置される請求項5に記載の方法。
- 移送基体のロールが受取基体上で転がる請求項6に記載の方法。
- 受取基体が可とう性平坦シート基体を含む請求項1に記載の方法。
- 受取基体がロール上に配置される請求項8に記載の方法。
- 受取基体の1箇所以上の選択領域に付着した半導体ナノワイヤー集団中の半導体ナノワイヤーの少なくとも50%が共通軸に対し30°未満内に整列する請求項1に記載の方法。
- 受取基体の1箇所以上の選択領域に付着した半導体ナノワイヤー集団中の半導体ナノワイヤーの少なくとも50%が共通軸に対し10°未満内に整列する請求項1に記載の方法。
- 受取基体の1箇所以上の選択領域に付着した半導体ナノワイヤー集団中の半導体ナノワイヤーの少なくとも50%が共通軸に対し5°未満内に整列する請求項1に記載の方法。
- 受取基体の1箇所以上の選択領域に付着した半導体ナノワイヤー集団中の半導体ナノワイヤーの少なくとも80%が共通軸に対し30°未満内に整列する請求項1に記載の方法。
- 受取基体の1箇所以上の選択領域に付着した半導体ナノワイヤー集団中の半導体ナノワイヤーの少なくとも80%が共通軸に対し10°未満内に整列する請求項1に記載の方法。
- 受取基体の1箇所以上の選択領域に付着した半導体ナノワイヤー集団中の半導体ナノワイヤーの少なくとも90%が共通軸に対し30°未満内に整列する請求項1に記載の方法。
- 受取基体の1箇所以上の選択領域に付着した半導体ナノワイヤー集団中の半導体ナノワイヤーの少なくとも90%が共通軸に対し10°未満内に整列する請求項1に記載の方法。
- 分離工程に続いて、受取基体の表面から高分子付着性材料が除去される請求項1に記載の方法。
- 除去工程が受取基体のプラズマ清掃工程を含む請求項17に記載の方法。
- 除去工程が受取基体表面の溶剤による清掃工程を含む請求項17に記載の方法。
- 高分子付着性材料がホトレジストを含み、かつ除去工程が高分子付着性材料を露光する工程及び高分子付着性材料を現像液と接触させる工程を含む請求項17に記載の方法。
- 第一表面を有する基体と、
該第一表面に沈着した高分子付着性材料と、
各々、主軸を有すると共に、第一表面上に沈着し、かつ高分子付着性材料に付着してなり、複数の半導体ナノワイヤーが、前記基体の前記第1表面に対して非垂直である共通軸と平行にほぼ配向された該複数の半導体ナノワイヤーと、
を備えた物品。 - 複数の半導体ナノワイヤーの少なくとも50%が、共通軸に対し、30°以内に配向されている請求項21に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも50%が、共通軸に対し、10°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも50%が、共通軸に対し、5°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも60%が、共通軸に対し、30°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも60%が、共通軸に対し、10°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも60%が、共通軸に対し、5°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも80%が、共通軸に対し、30°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも80%が、共通軸に対し、10°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも80%が、共通軸に対し、5°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも90%が、共通軸に対し、30°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも90%が、共通軸に対し、10°以内に配向されている請求項22に記載の物品。
- 複数の半導体ナノワイヤーの少なくとも90%が、共通軸に対し、5°以内に配向されている請求項22に記載の物品。
- 高分子付着性材料がレジストを含む請求項22に記載の物品。
- レジストがホトレジストを含む請求項34に記載の物品。
- 高分子付着性材料及び高分子付着性材料に付着した半導体ナノワイヤーが、第一表面の選択領域に配置される請求項22に記載の物品。
- 第一表面に複数の半導体ナノワイヤーを配置してなる移送基体と、
該移送基体の第一表面とは対向面に第一表面を配置してなる受取基体であって、当該受取基体の前記第一表面に高分子付着材料を有する、受取基体と、
移送基体及び受取基体の少なくとも一方の基体に連結し、移送基体の第一表面と受取基体の第一表面とを互いに接触させた後、受取基体の第一表面から移送基体の第一表面を分離するための自動移動モジュール、とを備えたシステムであって、
該自動移動モジュールは、移送基体及び受取基体の少なくとも一方を、他方の移送基体及び受取基体に対しほぼ平行に、移送基体上の半導体ナノワイヤーの平均長の範囲内で移動させて、受取基体に付着した半導体ナノワイヤーをほぼ整列させる、該システム。 - 自動移動モジュールが、移送基体のシートを受取基体のシートと接触させる方向に向けるため、1個以上のローラーを有する請求項37に記載のシステム。
- 自動移動モジュールが移動して移送基体の第一表面を受取基体の第一表面と接触させる前に受取基体の第一表面上に高分子付着性材料を沈着させるため、受取基体の第一表面上に配置された高分子付着性材料沈着用アプリケーターを更に備える請求項37に記載のシステム。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/673,092 US7067328B2 (en) | 2003-09-25 | 2003-09-25 | Methods, devices and compositions for depositing and orienting nanostructures |
US10/673,092 | 2003-09-25 | ||
PCT/US2004/030234 WO2005030636A2 (en) | 2003-09-25 | 2004-09-15 | Methods, devices and compositions for depositing and orienting nanostructures |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007516093A JP2007516093A (ja) | 2007-06-21 |
JP2007516093A5 JP2007516093A5 (ja) | 2011-12-22 |
JP4927542B2 true JP4927542B2 (ja) | 2012-05-09 |
Family
ID=34376545
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006528061A Active JP4927542B2 (ja) | 2003-09-25 | 2004-09-15 | ナノ構造を沈着、配向させる方法、装置及び組成物 |
Country Status (9)
Country | Link |
---|---|
US (3) | US7067328B2 (ja) |
EP (1) | EP1663853A4 (ja) |
JP (1) | JP4927542B2 (ja) |
KR (1) | KR101126899B1 (ja) |
CN (1) | CN101023026B (ja) |
AU (1) | AU2004276234A1 (ja) |
CA (1) | CA2538262A1 (ja) |
TW (1) | TWI375730B (ja) |
WO (1) | WO2005030636A2 (ja) |
Families Citing this family (126)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9056783B2 (en) | 1998-12-17 | 2015-06-16 | Hach Company | System for monitoring discharges into a waste water collection system |
US7454295B2 (en) | 1998-12-17 | 2008-11-18 | The Watereye Corporation | Anti-terrorism water quality monitoring system |
US8958917B2 (en) | 1998-12-17 | 2015-02-17 | Hach Company | Method and system for remote monitoring of fluid quality and treatment |
US7301199B2 (en) * | 2000-08-22 | 2007-11-27 | President And Fellows Of Harvard College | Nanoscale wires and related devices |
US20060175601A1 (en) * | 2000-08-22 | 2006-08-10 | President And Fellows Of Harvard College | Nanoscale wires and related devices |
KR100995457B1 (ko) * | 2000-08-22 | 2010-11-18 | 프레지던트 앤드 펠로우즈 오브 하버드 칼리지 | 나노센서 제조 방법 |
KR20030055346A (ko) * | 2000-12-11 | 2003-07-02 | 프레지던트 앤드 펠로우즈 오브 하버드 칼리지 | 나노센서 |
US8294025B2 (en) * | 2002-06-08 | 2012-10-23 | Solarity, Llc | Lateral collection photovoltaics |
US6933222B2 (en) * | 2003-01-02 | 2005-08-23 | Intel Corporation | Microcircuit fabrication and interconnection |
US9574290B2 (en) | 2003-01-13 | 2017-02-21 | Nantero Inc. | Methods for arranging nanotube elements within nanotube fabrics and films |
US8920619B2 (en) | 2003-03-19 | 2014-12-30 | Hach Company | Carbon nanotube sensor |
US20060122596A1 (en) * | 2003-04-17 | 2006-06-08 | Nanosys, Inc. | Structures, systems and methods for joining articles and materials and uses therefor |
US7972616B2 (en) | 2003-04-17 | 2011-07-05 | Nanosys, Inc. | Medical device applications of nanostructured surfaces |
US7056409B2 (en) * | 2003-04-17 | 2006-06-06 | Nanosys, Inc. | Structures, systems and methods for joining articles and materials and uses therefor |
US7803574B2 (en) | 2003-05-05 | 2010-09-28 | Nanosys, Inc. | Medical device applications of nanostructured surfaces |
US7067328B2 (en) * | 2003-09-25 | 2006-06-27 | Nanosys, Inc. | Methods, devices and compositions for depositing and orienting nanostructures |
US7553371B2 (en) * | 2004-02-02 | 2009-06-30 | Nanosys, Inc. | Porous substrates, articles, systems and compositions comprising nanofibers and methods of their use and production |
US8025960B2 (en) * | 2004-02-02 | 2011-09-27 | Nanosys, Inc. | Porous substrates, articles, systems and compositions comprising nanofibers and methods of their use and production |
US20110039690A1 (en) | 2004-02-02 | 2011-02-17 | Nanosys, Inc. | Porous substrates, articles, systems and compositions comprising nanofibers and methods of their use and production |
US20090227107A9 (en) * | 2004-02-13 | 2009-09-10 | President And Fellows Of Havard College | Nanostructures Containing Metal Semiconductor Compounds |
US7057881B2 (en) * | 2004-03-18 | 2006-06-06 | Nanosys, Inc | Nanofiber surface based capacitors |
US7327037B2 (en) * | 2004-04-01 | 2008-02-05 | Lucent Technologies Inc. | High density nanostructured interconnection |
US20050279274A1 (en) * | 2004-04-30 | 2005-12-22 | Chunming Niu | Systems and methods for nanowire growth and manufacturing |
US7785922B2 (en) | 2004-04-30 | 2010-08-31 | Nanosys, Inc. | Methods for oriented growth of nanowires on patterned substrates |
US7105428B2 (en) * | 2004-04-30 | 2006-09-12 | Nanosys, Inc. | Systems and methods for nanowire growth and harvesting |
US20070264623A1 (en) * | 2004-06-15 | 2007-11-15 | President And Fellows Of Harvard College | Nanosensors |
JP2008506254A (ja) * | 2004-07-07 | 2008-02-28 | ナノシス・インコーポレイテッド | ナノワイヤーの集積及び組み込みのためのシステムおよび方法 |
US8558311B2 (en) | 2004-09-16 | 2013-10-15 | Nanosys, Inc. | Dielectrics using substantially longitudinally oriented insulated conductive wires |
US7365395B2 (en) * | 2004-09-16 | 2008-04-29 | Nanosys, Inc. | Artificial dielectrics using nanostructures |
US8089152B2 (en) * | 2004-09-16 | 2012-01-03 | Nanosys, Inc. | Continuously variable graded artificial dielectrics using nanostructures |
US7608446B2 (en) * | 2004-09-30 | 2009-10-27 | Alcatel-Lucent Usa Inc. | Nanostructured surface for microparticle analysis and manipulation |
US8154002B2 (en) * | 2004-12-06 | 2012-04-10 | President And Fellows Of Harvard College | Nanoscale wire-based data storage |
US7939218B2 (en) * | 2004-12-09 | 2011-05-10 | Nanosys, Inc. | Nanowire structures comprising carbon |
US7842432B2 (en) | 2004-12-09 | 2010-11-30 | Nanosys, Inc. | Nanowire structures comprising carbon |
EP1829141B1 (en) | 2004-12-09 | 2013-05-29 | Nanosys, Inc. | Nanowire-based membrane electrode assemblies for fuel cells |
US8278011B2 (en) | 2004-12-09 | 2012-10-02 | Nanosys, Inc. | Nanostructured catalyst supports |
KR101138865B1 (ko) * | 2005-03-09 | 2012-05-14 | 삼성전자주식회사 | 나노 와이어 및 그 제조 방법 |
JP2008538728A (ja) * | 2005-04-13 | 2008-11-06 | ナノシス・インク. | ナノワイヤー分散組成物およびその使用 |
US20100227382A1 (en) | 2005-05-25 | 2010-09-09 | President And Fellows Of Harvard College | Nanoscale sensors |
WO2006132659A2 (en) * | 2005-06-06 | 2006-12-14 | President And Fellows Of Harvard College | Nanowire heterostructures |
US7608471B2 (en) * | 2005-08-09 | 2009-10-27 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Method and apparatus for integrating III-V semiconductor devices into silicon processes |
SG183720A1 (en) * | 2005-08-12 | 2012-09-27 | Cambrios Technologies Corp | Nanowires-based transparent conductors |
EP1938381A2 (en) * | 2005-09-23 | 2008-07-02 | Nanosys, Inc. | Methods for nanostructure doping |
EP1952467B9 (en) | 2005-11-21 | 2012-03-14 | Nanosys, Inc. | Nanowire structures comprising carbon |
US7767564B2 (en) * | 2005-12-09 | 2010-08-03 | Zt3 Technologies, Inc. | Nanowire electronic devices and method for producing the same |
JP2009522197A (ja) * | 2005-12-29 | 2009-06-11 | ナノシス・インコーポレイテッド | パターン形成された基板上のナノワイヤの配向した成長のための方法 |
US7741197B1 (en) | 2005-12-29 | 2010-06-22 | Nanosys, Inc. | Systems and methods for harvesting and reducing contamination in nanowires |
WO2007100551A2 (en) * | 2006-02-22 | 2007-09-07 | The Regents Of The University Of California | Very large scale integration of field effect transistors on si nanowires |
GB2436398B (en) * | 2006-03-23 | 2011-08-24 | Univ Bath | Growth method using nanostructure compliant layers and HVPE for producing high quality compound semiconductor materials |
WO2007117698A2 (en) | 2006-04-07 | 2007-10-18 | Qd Vision, Inc. | Composition including material, methods of depositing material, articles including same and systems for depositing material |
US7923281B2 (en) * | 2006-04-13 | 2011-04-12 | Solopower, Inc. | Roll-to-roll processing method and tools for electroless deposition of thin layers |
EP2441884A1 (en) | 2006-05-19 | 2012-04-18 | Massachusetts Institute Of Technology | Nanostructure-reinforced composite articles and methods |
US8337979B2 (en) * | 2006-05-19 | 2012-12-25 | Massachusetts Institute Of Technology | Nanostructure-reinforced composite articles and methods |
JP2009540333A (ja) * | 2006-06-12 | 2009-11-19 | プレジデント アンド フェロウズ オブ ハーバード カレッジ | ナノセンサーおよび関連技術 |
WO2008111947A1 (en) | 2006-06-24 | 2008-09-18 | Qd Vision, Inc. | Methods and articles including nanomaterial |
US7629694B2 (en) * | 2006-08-16 | 2009-12-08 | Blaise Laurent Mouttet | Interconnections for crosswire arrays |
US8058640B2 (en) | 2006-09-11 | 2011-11-15 | President And Fellows Of Harvard College | Branched nanoscale wires |
WO2008033388A2 (en) * | 2006-09-12 | 2008-03-20 | Qd Vision, Inc. | A composite including nanoparticles, methods, and products including a composite |
US8018568B2 (en) | 2006-10-12 | 2011-09-13 | Cambrios Technologies Corporation | Nanowire-based transparent conductors and applications thereof |
SG10201502808UA (en) * | 2006-10-12 | 2015-05-28 | Cambrios Technologies Corp | Nanowire-Based Transparent Conductors And Applications Thereof |
KR100848263B1 (ko) * | 2006-10-16 | 2008-07-25 | 전자부품연구원 | 나노와이어 자동 전사시스템 및 그의 구동방법 |
US7608905B2 (en) * | 2006-10-17 | 2009-10-27 | Hewlett-Packard Development Company, L.P. | Independently addressable interdigitated nanowires |
JP2010509171A (ja) * | 2006-11-07 | 2010-03-25 | ナノシス・インク. | ナノワイヤー成長用システム及び方法 |
JP5009993B2 (ja) | 2006-11-09 | 2012-08-29 | ナノシス・インク. | ナノワイヤの配列方法および堆積方法 |
EP2095100B1 (en) | 2006-11-22 | 2016-09-21 | President and Fellows of Harvard College | Method of operating a nanowire field effect transistor sensor |
US7786024B2 (en) | 2006-11-29 | 2010-08-31 | Nanosys, Inc. | Selective processing of semiconductor nanowires by polarized visible radiation |
US8258047B2 (en) * | 2006-12-04 | 2012-09-04 | General Electric Company | Nanostructures, methods of depositing nanostructures and devices incorporating the same |
GB0701069D0 (en) * | 2007-01-19 | 2007-02-28 | Univ Bath | Nanostructure template and production of semiconductors using the template |
US7692198B2 (en) * | 2007-02-19 | 2010-04-06 | Alcatel-Lucent Usa Inc. | Wide-bandgap semiconductor devices |
US7816906B2 (en) * | 2007-04-02 | 2010-10-19 | Rf Nano Corporation | Method for determining anisotropy of 1-D conductor or semiconductor synthesis |
JP6098860B2 (ja) | 2007-04-20 | 2017-03-22 | シーエーエム ホールディング コーポレーション | 複合透明導電体、及び機器 |
US7892610B2 (en) * | 2007-05-07 | 2011-02-22 | Nanosys, Inc. | Method and system for printing aligned nanowires and other electrical devices |
JP5773646B2 (ja) | 2007-06-25 | 2015-09-02 | キユーデイー・ビジヨン・インコーポレーテツド | ナノ材料を被着させることを含む組成物および方法 |
US20110023955A1 (en) * | 2007-06-26 | 2011-02-03 | Fonash Stephen J | Lateral collection photovoltaics |
US8652947B2 (en) * | 2007-09-26 | 2014-02-18 | Wang Nang Wang | Non-polar III-V nitride semiconductor and growth method |
KR101272012B1 (ko) * | 2007-11-28 | 2013-06-07 | 삼성전자주식회사 | 반도체 장치의 제조 방법 |
US8319002B2 (en) | 2007-12-06 | 2012-11-27 | Nanosys, Inc. | Nanostructure-enhanced platelet binding and hemostatic structures |
EP2219572A4 (en) | 2007-12-06 | 2014-05-28 | Nanosys Inc | RESORBABLE HEMOSTATIC STRUCTURES ENHANCED BY NANOMATERIAL AND BANDING MATERIALS |
GB2458906A (en) * | 2008-04-01 | 2009-10-07 | Sharp Kk | Nanowire manufacture |
GB2459251A (en) * | 2008-04-01 | 2009-10-21 | Sharp Kk | Semiconductor nanowire devices |
GB2458907A (en) * | 2008-04-01 | 2009-10-07 | Sharp Kk | Device interconnects |
TWI403457B (zh) * | 2008-05-28 | 2013-08-01 | Univ Nat Taiwan | One - dimensional micro - nanometer structure transplantation method |
US8163205B2 (en) * | 2008-08-12 | 2012-04-24 | The Boeing Company | Durable transparent conductors on polymeric substrates |
TWI381536B (zh) * | 2008-08-29 | 2013-01-01 | Univ Nat Taiwan | 微奈米結構pn二極體陣列薄膜太陽能電池及其製作方法 |
US9006133B2 (en) | 2008-10-24 | 2015-04-14 | Oned Material Llc | Electrochemical catalysts for fuel cells |
US8237150B2 (en) * | 2009-04-03 | 2012-08-07 | International Business Machines Corporation | Nanowire devices for enhancing mobility through stress engineering |
US7902541B2 (en) * | 2009-04-03 | 2011-03-08 | International Business Machines Corporation | Semiconductor nanowire with built-in stress |
US8013324B2 (en) * | 2009-04-03 | 2011-09-06 | International Business Machines Corporation | Structurally stabilized semiconductor nanowire |
US7943530B2 (en) * | 2009-04-03 | 2011-05-17 | International Business Machines Corporation | Semiconductor nanowires having mobility-optimized orientations |
JP5686988B2 (ja) * | 2009-05-04 | 2015-03-18 | シャープ株式会社 | 燃料電池用膜電極複合体に用いられる触媒層、それを用いる燃料電池用膜電極複合体、燃料電池、およびその製造方法 |
DK3859830T3 (da) | 2009-05-19 | 2022-04-11 | Oned Mat Inc | Nanostrukturerede materialer til batterianvendelser |
US20120135158A1 (en) | 2009-05-26 | 2012-05-31 | Sharp Kabushiki Kaisha | Methods and systems for electric field deposition of nanowires and other devices |
US8623288B1 (en) | 2009-06-29 | 2014-01-07 | Nanosys, Inc. | Apparatus and methods for high density nanowire growth |
TWI394708B (zh) * | 2009-07-06 | 2013-05-01 | Nat Univ Tsing Hua | 一維奈米材料之轉印方法 |
US8368125B2 (en) | 2009-07-20 | 2013-02-05 | International Business Machines Corporation | Multiple orientation nanowires with gate stack stressors |
US20110012177A1 (en) * | 2009-07-20 | 2011-01-20 | International Business Machines Corporation | Nanostructure For Changing Electric Mobility |
WO2011038228A1 (en) | 2009-09-24 | 2011-03-31 | President And Fellows Of Harvard College | Bent nanowires and related probing of species |
TW201116606A (en) * | 2009-11-03 | 2011-05-16 | Nat Univ Tsing Hua | Method and an apparatus for transferring carbonaceous material layer |
CN102834472B (zh) * | 2010-02-05 | 2015-04-22 | 凯博瑞奥斯技术公司 | 光敏墨组合物和透明导体以及它们的使用方法 |
EP2552826A4 (en) | 2010-03-30 | 2013-11-13 | Nantero Inc | METHOD FOR ARRANGING NANOSCOPIC ELEMENTS IN NETWORKS, FIBERS AND FILMS |
US10661304B2 (en) | 2010-03-30 | 2020-05-26 | Nantero, Inc. | Microfluidic control surfaces using ordered nanotube fabrics |
CN102294852B (zh) * | 2010-06-24 | 2014-07-16 | 鸿富锦精密工业(深圳)有限公司 | 纳米线薄膜及其制造方法 |
EP2562135A1 (de) * | 2011-08-22 | 2013-02-27 | ETH Zurich | Verfahren zur Herstellung und Ausrichtung von Nanowires und Anwendungen eines solchen Verfahrens |
KR101403091B1 (ko) * | 2012-03-21 | 2014-07-01 | 주식회사 포스코 | 나노 구조체를 구비한 소자의 제조방법 |
KR101403254B1 (ko) * | 2012-03-21 | 2014-06-03 | 주식회사 포스코 | 나노 구조체를 구비한 소자의 제조방법 |
US20150183188A1 (en) * | 2012-06-22 | 2015-07-02 | Cornell University | Group iv nanowire structures, methods and applications |
CN102810360B (zh) * | 2012-07-31 | 2016-03-30 | 中国科学院物理研究所 | 一种减薄碳纳米管薄膜的方法 |
ES2663666T3 (es) | 2013-02-28 | 2018-04-16 | N12 Technologies, Inc. | Dispensación basada en cartucho de películas de nanoestructura |
US9574135B2 (en) * | 2013-08-22 | 2017-02-21 | Nanoco Technologies Ltd. | Gas phase enhancement of emission color quality in solid state LEDs |
US10006085B2 (en) | 2013-11-04 | 2018-06-26 | The Regents Of The University Of California | Nanostructured arrays on flexible polymer films |
EP2871678A1 (en) * | 2013-11-07 | 2015-05-13 | University College Cork | Method of fabrication of ordered nanorod arrays |
CN105399044B (zh) * | 2014-06-13 | 2017-07-07 | 清华大学 | 碳纳米管膜的制备方法 |
US9942979B2 (en) * | 2014-11-03 | 2018-04-10 | Samsung Electronics Co., Ltd. | Flexible printed circuit board |
JP6704229B2 (ja) | 2015-09-14 | 2020-06-03 | リンテック オブ アメリカ インコーポレーテッドLintec of America, Inc. | 柔軟性シート、熱伝導部材、導電性部材、帯電防止部材、発熱体、電磁波遮蔽体、及び柔軟性シートの製造方法 |
EP3463826B1 (en) | 2016-05-31 | 2023-07-05 | Massachusetts Institute of Technology | Composite articles comprising non-linear elongated nanostructures and associated methods |
KR102144867B1 (ko) * | 2016-06-10 | 2020-08-14 | 린텍 오브 아메리카, 인크. | 나노섬유 시트 |
KR101917927B1 (ko) * | 2016-11-09 | 2019-01-30 | 한국기술교육대학교 산학협력단 | 나노구조체의 이동방법 |
JP7105234B2 (ja) | 2017-02-24 | 2022-07-22 | リンテック・オヴ・アメリカ,インコーポレイテッド | ナノファイバー熱界面材料 |
CN107146760A (zh) * | 2017-05-11 | 2017-09-08 | 中国科学院物理研究所 | 基于拓扑绝缘体纳米线的场效应管、其制备方法及应用 |
ES2952962T3 (es) * | 2017-06-16 | 2023-11-07 | Carrier Corp | Método de fabricación de artículos electrocalóricos |
US20190085138A1 (en) | 2017-09-15 | 2019-03-21 | Massachusetts Institute Of Technology | Low-defect fabrication of composite materials |
WO2019108616A1 (en) | 2017-11-28 | 2019-06-06 | Massachusetts Institute Of Technology | Separators comprising elongated nanostructures and associated devices and methods for energy storage and/or use |
JP7054734B2 (ja) | 2017-12-07 | 2022-04-14 | リンテック・オヴ・アメリカ,インコーポレイテッド | 基材間のナノファイバーフォレストの転写 |
US11135827B2 (en) * | 2018-10-11 | 2021-10-05 | Lintec Of America, Inc. | Patterning a nanofiber forest |
CN112513344A (zh) | 2019-08-21 | 2021-03-16 | 眉山博雅新材料有限公司 | 上提拉开放式单晶炉 |
KR102184173B1 (ko) * | 2019-12-09 | 2020-11-27 | 전남대학교 산학협력단 | 반도체 나노와이어 전사방법 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10149760A (ja) * | 1996-09-18 | 1998-06-02 | Toshiba Corp | 電界放出型冷陰極装置、その製造方法及び真空マイクロ装置 |
JP2000249712A (ja) * | 1998-12-31 | 2000-09-14 | Yoshikazu Nakayama | 電子装置の表面信号操作用融着プローブ及びその製造方法 |
JP2002141633A (ja) * | 2000-10-25 | 2002-05-17 | Lucent Technol Inc | 垂直にナノ相互接続された回路デバイスからなる製品及びその製造方法 |
JP2002172599A (ja) * | 2000-12-07 | 2002-06-18 | Yoshikazu Nakayama | ナノチューブカートリッジ及びその製造方法 |
JP2004281388A (ja) * | 2003-02-26 | 2004-10-07 | Mitsubishi Gas Chem Co Inc | 電界放出型冷陰極の製造方法 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5505928A (en) | 1991-11-22 | 1996-04-09 | The Regents Of University Of California | Preparation of III-V semiconductor nanocrystals |
US6440880B2 (en) * | 1993-10-29 | 2002-08-27 | 3M Innovative Properties Company | Pressure-sensitive adhesives having microstructured surfaces |
US5776674A (en) * | 1995-06-05 | 1998-07-07 | Seq, Ltd | Chemical biochemical and biological processing in thin films |
JP2000516708A (ja) * | 1996-08-08 | 2000-12-12 | ウィリアム・マーシュ・ライス・ユニバーシティ | ナノチューブ組立体から作製された巨視的操作可能なナノ規模の装置 |
US7416699B2 (en) | 1998-08-14 | 2008-08-26 | The Board Of Trustees Of The Leland Stanford Junior University | Carbon nanotube devices |
US6232706B1 (en) * | 1998-11-12 | 2001-05-15 | The Board Of Trustees Of The Leland Stanford Junior University | Self-oriented bundles of carbon nanotubes and method of making same |
AUPQ064999A0 (en) * | 1999-05-28 | 1999-06-24 | Commonwealth Scientific And Industrial Research Organisation | Patterned carbon nanotube films |
AUPQ304199A0 (en) * | 1999-09-23 | 1999-10-21 | Commonwealth Scientific And Industrial Research Organisation | Patterned carbon nanotubes |
US6340822B1 (en) * | 1999-10-05 | 2002-01-22 | Agere Systems Guardian Corp. | Article comprising vertically nano-interconnected circuit devices and method for making the same |
US6790425B1 (en) * | 1999-10-27 | 2004-09-14 | Wiliam Marsh Rice University | Macroscopic ordered assembly of carbon nanotubes |
US6225198B1 (en) | 2000-02-04 | 2001-05-01 | The Regents Of The University Of California | Process for forming shaped group II-VI semiconductor nanocrystals, and product formed using process |
US6306736B1 (en) | 2000-02-04 | 2001-10-23 | The Regents Of The University Of California | Process for forming shaped group III-V semiconductor nanocrystals, and product formed using process |
US7301199B2 (en) | 2000-08-22 | 2007-11-27 | President And Fellows Of Harvard College | Nanoscale wires and related devices |
KR100995457B1 (ko) | 2000-08-22 | 2010-11-18 | 프레지던트 앤드 펠로우즈 오브 하버드 칼리지 | 나노센서 제조 방법 |
US20020193096A1 (en) | 2000-09-08 | 2002-12-19 | Dwyer Christopher Brian | System and method for permitting maintenance of privacy of main number assigned to wireless device |
US6518194B2 (en) * | 2000-12-28 | 2003-02-11 | Thomas Andrew Winningham | Intermediate transfer layers for nanoscale pattern transfer and nanostructure formation |
KR101008294B1 (ko) | 2001-03-30 | 2011-01-13 | 더 리전트 오브 더 유니버시티 오브 캘리포니아 | 나노구조체 및 나노와이어의 제조 방법 및 그로부터 제조되는 디바이스 |
US6887450B2 (en) * | 2002-01-02 | 2005-05-03 | Zyvex Corporation | Directional assembly of carbon nanotube strings |
US6872645B2 (en) | 2002-04-02 | 2005-03-29 | Nanosys, Inc. | Methods of positioning and/or orienting nanostructures |
US6849558B2 (en) * | 2002-05-22 | 2005-02-01 | The Board Of Trustees Of The Leland Stanford Junior University | Replication and transfer of microstructures and nanostructures |
US7175762B1 (en) * | 2002-06-06 | 2007-02-13 | California Institute Of Technology | Nanocarpets for trapping particulates, bacteria and spores |
US7150801B2 (en) * | 2003-02-26 | 2006-12-19 | Mitsubishi Gas Chemical Company, Inc. | Process for producing cold field-emission cathodes |
US20050129928A1 (en) * | 2003-09-16 | 2005-06-16 | Koila, Inc. | Nanostructure augmentation of surfaces for enhanced thermal transfer with increased surface area |
US7067328B2 (en) * | 2003-09-25 | 2006-06-27 | Nanosys, Inc. | Methods, devices and compositions for depositing and orienting nanostructures |
-
2003
- 2003-09-25 US US10/673,092 patent/US7067328B2/en not_active Expired - Lifetime
-
2004
- 2004-09-15 EP EP04784184A patent/EP1663853A4/en not_active Withdrawn
- 2004-09-15 CN CN2004800277803A patent/CN101023026B/zh not_active Expired - Fee Related
- 2004-09-15 AU AU2004276234A patent/AU2004276234A1/en not_active Abandoned
- 2004-09-15 KR KR1020067008013A patent/KR101126899B1/ko active IP Right Grant
- 2004-09-15 JP JP2006528061A patent/JP4927542B2/ja active Active
- 2004-09-15 CA CA002538262A patent/CA2538262A1/en not_active Abandoned
- 2004-09-15 WO PCT/US2004/030234 patent/WO2005030636A2/en active Application Filing
- 2004-09-21 TW TW093128549A patent/TWI375730B/zh active
-
2005
- 2005-09-14 US US11/226,027 patent/US7754524B2/en active Active
-
2006
- 2006-08-21 US US11/507,631 patent/US7829351B2/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10149760A (ja) * | 1996-09-18 | 1998-06-02 | Toshiba Corp | 電界放出型冷陰極装置、その製造方法及び真空マイクロ装置 |
JP2000249712A (ja) * | 1998-12-31 | 2000-09-14 | Yoshikazu Nakayama | 電子装置の表面信号操作用融着プローブ及びその製造方法 |
JP2002141633A (ja) * | 2000-10-25 | 2002-05-17 | Lucent Technol Inc | 垂直にナノ相互接続された回路デバイスからなる製品及びその製造方法 |
JP2002172599A (ja) * | 2000-12-07 | 2002-06-18 | Yoshikazu Nakayama | ナノチューブカートリッジ及びその製造方法 |
JP2004281388A (ja) * | 2003-02-26 | 2004-10-07 | Mitsubishi Gas Chem Co Inc | 電界放出型冷陰極の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
US7754524B2 (en) | 2010-07-13 |
CN101023026A (zh) | 2007-08-22 |
AU2004276234A1 (en) | 2005-04-07 |
KR20060094973A (ko) | 2006-08-30 |
US20080023693A1 (en) | 2008-01-31 |
JP2007516093A (ja) | 2007-06-21 |
WO2005030636A3 (en) | 2007-05-18 |
CN101023026B (zh) | 2011-01-19 |
TW200516166A (en) | 2005-05-16 |
TWI375730B (en) | 2012-11-01 |
US7829351B2 (en) | 2010-11-09 |
KR101126899B1 (ko) | 2012-03-19 |
US20050066883A1 (en) | 2005-03-31 |
WO2005030636A2 (en) | 2005-04-07 |
CA2538262A1 (en) | 2005-04-07 |
EP1663853A2 (en) | 2006-06-07 |
US7067328B2 (en) | 2006-06-27 |
US20100075468A1 (en) | 2010-03-25 |
EP1663853A4 (en) | 2011-06-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4927542B2 (ja) | ナノ構造を沈着、配向させる方法、装置及び組成物 | |
EP1759422B1 (en) | Electrical device comprising printable semiconductor elements | |
US7943491B2 (en) | Pattern transfer printing by kinetic control of adhesion to an elastomeric stamp | |
US7622371B2 (en) | Fused nanocrystal thin film semiconductor and method | |
JP5578509B2 (ja) | エラストマ基板に伸縮性コンポーネントを接着する方法 | |
JP5297581B2 (ja) | エラストマースタンプへの接着の動的コントロールによるパターン転送印刷 | |
US7767102B2 (en) | Systems and methods for harvesting and integrating nanowires | |
WO2007105405A1 (ja) | 異方性形状部材のマウント方法およびマウント装置と、電子デバイスの製造方法と、電子デバイスと、表示装置 | |
JP2011101047A (ja) | 大面積ナノ可能マクロエレクトロニクス基板およびその使用 | |
Dattoli et al. | Hierarchical 3D Nanostructure Organization for Next-Generation Devices | |
KR20110074500A (ko) | 나노선 배열 방법 | |
Forces | Nano-and M | |
Sun et al. | Materials and patterning techniques for macroelectronics |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070802 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070809 |
|
RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20090727 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100318 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20100615 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20100622 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100709 |
|
RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20100830 |
|
RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20100831 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100915 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20101130 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20110224 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20110303 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110330 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20110705 |
|
A524 | Written submission of copy of amendment under article 19 pct |
Free format text: JAPANESE INTERMEDIATE CODE: A524 Effective date: 20111104 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20111114 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120110 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120118 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20120207 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20120209 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20150217 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4927542 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |