JP4820586B2 - 半導体集積回路装置 - Google Patents

半導体集積回路装置 Download PDF

Info

Publication number
JP4820586B2
JP4820586B2 JP2005189102A JP2005189102A JP4820586B2 JP 4820586 B2 JP4820586 B2 JP 4820586B2 JP 2005189102 A JP2005189102 A JP 2005189102A JP 2005189102 A JP2005189102 A JP 2005189102A JP 4820586 B2 JP4820586 B2 JP 4820586B2
Authority
JP
Japan
Prior art keywords
semiconductor integrated
level
integrated circuit
circuit device
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2005189102A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007013349A5 (enExample
JP2007013349A (ja
Inventor
雅文 小野内
雄介 菅野
弘之 水野
靖久 島崎
哲也 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Electronics Corp
Original Assignee
Renesas Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Electronics Corp filed Critical Renesas Electronics Corp
Priority to JP2005189102A priority Critical patent/JP4820586B2/ja
Priority to US11/476,040 priority patent/US7443218B2/en
Priority to KR1020060059564A priority patent/KR101184182B1/ko
Publication of JP2007013349A publication Critical patent/JP2007013349A/ja
Publication of JP2007013349A5 publication Critical patent/JP2007013349A5/ja
Application granted granted Critical
Publication of JP4820586B2 publication Critical patent/JP4820586B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01Details
    • H03K3/012Modifications of generator to improve response time or to decrease power consumption
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01Details
    • H03K3/017Adjustment of width or dutycycle of pulses
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037Bistable circuits
JP2005189102A 2005-06-29 2005-06-29 半導体集積回路装置 Expired - Fee Related JP4820586B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2005189102A JP4820586B2 (ja) 2005-06-29 2005-06-29 半導体集積回路装置
US11/476,040 US7443218B2 (en) 2005-06-29 2006-06-28 Semiconductor integrated circuit with pulsed clock data latch
KR1020060059564A KR101184182B1 (ko) 2005-06-29 2006-06-29 반도체 집적회로 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005189102A JP4820586B2 (ja) 2005-06-29 2005-06-29 半導体集積回路装置

Publications (3)

Publication Number Publication Date
JP2007013349A JP2007013349A (ja) 2007-01-18
JP2007013349A5 JP2007013349A5 (enExample) 2008-05-01
JP4820586B2 true JP4820586B2 (ja) 2011-11-24

Family

ID=37588699

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005189102A Expired - Fee Related JP4820586B2 (ja) 2005-06-29 2005-06-29 半導体集積回路装置

Country Status (3)

Country Link
US (1) US7443218B2 (enExample)
JP (1) JP4820586B2 (enExample)
KR (1) KR101184182B1 (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7694242B1 (en) * 2006-12-11 2010-04-06 Cadence Design Systems, Inc. System and method of replacing flip-flops with pulsed latches in circuit designs
JP5211310B2 (ja) * 2007-03-07 2013-06-12 セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー 半導体集積回路
US7671629B2 (en) * 2008-04-08 2010-03-02 Freescale Semiconductor, Inc. Single-supply, single-ended level conversion circuit for an integrated circuit having multiple power supply domains
JP2010273322A (ja) * 2009-04-23 2010-12-02 Nec Engineering Ltd 多数決回路付きフリップフロップ回路
US8120406B2 (en) * 2009-07-06 2012-02-21 Ati Technologies Ulc Sequential circuit with dynamic pulse width control
FR2963687A1 (fr) * 2010-08-06 2012-02-10 Dolphin Integration Sa Arbre d'horloge pour bascules commandees par impulsions
US8432195B2 (en) * 2010-11-05 2013-04-30 Qualcomm Incorporated Latch circuits with synchronous data loading and self-timed asynchronous data capture
US8487681B2 (en) * 2011-02-23 2013-07-16 Nvidia Corporation Dual-trigger low-energy flip-flop circuit
KR20130087302A (ko) * 2012-01-27 2013-08-06 삼성전자주식회사 반도체 집적 회로와 이를 포함하는 장치의 동작 방법
US9473123B2 (en) 2012-03-16 2016-10-18 Samsung Electronics Co., Ltd. Semiconductor circuit and method of operating the circuit
KR101928271B1 (ko) 2012-03-16 2018-12-13 삼성전자 주식회사 스캔 플립-플롭, 이의 동작 방법, 및 이를 포함하는 데이터 처리 장치들
US9473117B2 (en) * 2015-02-13 2016-10-18 Samsung Electronics Co., Ltd. Multi-bit flip-flops and scan chain circuits
JP2017130556A (ja) * 2016-01-20 2017-07-27 国立大学法人京都大学 半導体装置及び半導体装置の製造方法
US10248155B2 (en) 2016-01-25 2019-04-02 Samsung Electronics Co., Ltd. Semiconductor device including clock generating circuit and channel management circuit
KR102467172B1 (ko) 2016-01-25 2022-11-14 삼성전자주식회사 반도체 장치
US10296066B2 (en) 2016-01-25 2019-05-21 Samsung Electronics Co., Ltd. Semiconductor device, semiconductor system, and method of operating the semiconductor device
DE102017110821A1 (de) 2016-01-25 2018-07-26 Samsung Electronics Co., Ltd. Halbleitervorrichtung
US10303203B2 (en) 2016-01-25 2019-05-28 Samsung Electronics Co., Ltd. Semiconductor device, semiconductor system and method for operating semiconductor device
KR102462506B1 (ko) 2016-02-05 2022-11-02 삼성전자주식회사 저전력을 위한 클락 게이트된 싱크로나이저를 포함하는 집적 회로와 이를 포함하는 데이터 처리 시스템
US10291211B2 (en) * 2016-09-08 2019-05-14 Qualcomm Incorporated Adaptive pulse generation circuits for clocking pulse latches with minimum hold time
US10211832B1 (en) 2017-12-05 2019-02-19 Micron Technology, Inc. Input buffer circuit
KR102340775B1 (ko) * 2020-03-16 2021-12-21 국방과학연구소 에스-박스의 임계화 구현을 위한 동기화 회로
CN111600607B (zh) * 2020-05-13 2022-04-15 清华大学 一种宽带低功耗比较器电路
US11799458B2 (en) 2021-06-08 2023-10-24 Samsung Electronics Co., Ltd. Flip flop circuit
CN116521248B (zh) * 2023-07-03 2023-12-15 深圳砺驰半导体科技有限公司 芯片唤醒电路、芯片唤醒方法、芯片、部件及电子设备

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS607224A (ja) * 1983-06-27 1985-01-16 Toshiba Corp デ−タラツチ回路
JPS6214523A (ja) * 1985-07-12 1987-01-23 Toshiba Corp 排他的論理和回路
JPH08274594A (ja) * 1995-03-28 1996-10-18 Nippon Telegr & Teleph Corp <Ntt> フリップフロップ回路
JPH10163820A (ja) * 1996-12-05 1998-06-19 Kawasaki Steel Corp 半導体装置
US5861762A (en) * 1997-03-07 1999-01-19 Sun Microsystems, Inc. Inverse toggle XOR and XNOR circuit
JP3339562B2 (ja) * 1998-05-22 2002-10-28 日本電気株式会社 フリップフロップ回路
JP2000013195A (ja) * 1998-06-24 2000-01-14 Nec Corp 低消費電力回路及びこれを含む集積回路
JP3580736B2 (ja) * 1998-08-26 2004-10-27 株式会社東芝 クロック信号制御機能付フリップフロップ回路、及び、クロック制御回路
TW419825B (en) * 1998-08-26 2001-01-21 Toshiba Corp Flip-flop circuit with clock signal control function and clock control signal
JP2000165208A (ja) * 1998-11-27 2000-06-16 Kawasaki Steel Corp フリップフロップ
JP2001185999A (ja) * 1999-12-22 2001-07-06 Sony Corp 差動型センスアンプ回路およびそれを用いた動的論理回路
JP2001308686A (ja) * 2000-04-24 2001-11-02 Fujitsu Ltd フリップフロップ
JP2002300010A (ja) * 2001-03-29 2002-10-11 Toshiba Corp 半導体記憶保持装置
US6456116B1 (en) * 2001-04-11 2002-09-24 Hewlett-Packard Company Dynamic comparator circuit
US6822478B2 (en) * 2001-07-03 2004-11-23 Texas Instruments Incorporated Data-driven clock gating for a sequential data-capture device
US6734707B2 (en) * 2002-01-11 2004-05-11 Samsung Electronics Co., Ltd. Data input circuit for reducing loading difference between fetch signal and multiple data in semiconductor device
JP4095367B2 (ja) * 2002-07-23 2008-06-04 株式会社東芝 半導体集積回路装置
JP2004246525A (ja) * 2003-02-13 2004-09-02 Matsushita Electric Ind Co Ltd 順序回路、記憶素子、クロック発生回路およびクロック制御方法、ならびに回路変更方法および回路設計支援装置、半導体集積回路およびそれを備えた電子装置、ならびに電子制御装置およびそれを備えた移動体

Also Published As

Publication number Publication date
KR20070001843A (ko) 2007-01-04
US7443218B2 (en) 2008-10-28
KR101184182B1 (ko) 2012-09-18
US20070001734A1 (en) 2007-01-04
JP2007013349A (ja) 2007-01-18

Similar Documents

Publication Publication Date Title
JP4820586B2 (ja) 半導体集積回路装置
US9362910B2 (en) Low clock-power integrated clock gating cell
EP3465911B1 (en) Low clock power data-gated flip-flop
JP5175399B2 (ja) 改良クロック・ゲーティング・セルを用いるシステム、及び方法
US7746138B2 (en) Semiconductor integrated circuit with flip-flop circuits mounted thereon
US9979381B1 (en) Semi-data gated flop with low clock power/low internal power with minimal area overhead
JP2005527166A (ja) リーク電流制御を用いた非揮発性多しきい値cmosラッチ
EP2031757A1 (en) Sequential circuit element including a single clocked transistor
CN108233894B (zh) 一种基于双模冗余的低功耗双边沿触发器
US9678154B2 (en) Circuit techniques for efficient scan hold path design
TWI827389B (zh) 時脈門控單元
US8736332B2 (en) Leakage current reduction in a sequential circuit
EP3308462B1 (en) Feedback latch circuit
US20150236676A1 (en) Reduced dynamic power d flip-flop
US10033356B2 (en) Reduced power set-reset latch based flip-flop
US8593192B2 (en) Semiconductor device and method for controlling flip-flop
KR20120051406A (ko) 다이나믹 논리 게이트를 가지는 디지털 논리 회로
Mahmoodi-Meimand et al. Self-precharging flip-flop (SPFF): A new level converting flip-flop
JP2013012797A (ja) レベルシフト回路
Mahmoodi-Meimand et al. Dual-edge triggered level converting flip-flops
WO2018094728A1 (zh) 动态电源电路及芯片
JP5627163B2 (ja) 動作モード及びスリープモードでのデータ保持方法および回路
JP4276513B2 (ja) フリップフロップ回路
JP4603089B2 (ja) 動的な電源レール選択を有する静的パルス・バス回路及び方法
KR100690992B1 (ko) 데이터 입/출력 버퍼 회로

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080317

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20080317

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A712

Effective date: 20100528

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20100824

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20101012

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20101208

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20110809

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20110905

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140909

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees